JP5567887B2 - 分光装置 - Google Patents

分光装置 Download PDF

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Publication number
JP5567887B2
JP5567887B2 JP2010099600A JP2010099600A JP5567887B2 JP 5567887 B2 JP5567887 B2 JP 5567887B2 JP 2010099600 A JP2010099600 A JP 2010099600A JP 2010099600 A JP2010099600 A JP 2010099600A JP 5567887 B2 JP5567887 B2 JP 5567887B2
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JP
Japan
Prior art keywords
order diffracted
diffracted light
diffraction grating
vph diffraction
wavelength
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JP2010099600A
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English (en)
Japanese (ja)
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JP2011232032A5 (enExample
JP2011232032A (ja
Inventor
林　　真市
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Olympus Corp
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Olympus Corp
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Priority to JP2010099600A priority Critical patent/JP5567887B2/ja
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Publication of JP2011232032A5 publication Critical patent/JP2011232032A5/ja
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Publication of JP5567887B2 publication Critical patent/JP5567887B2/ja
Expired - Fee Related legal-status Critical Current
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  • Spectrometry And Color Measurement (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
JP2010099600A 2010-04-23 2010-04-23 分光装置 Expired - Fee Related JP5567887B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010099600A JP5567887B2 (ja) 2010-04-23 2010-04-23 分光装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010099600A JP5567887B2 (ja) 2010-04-23 2010-04-23 分光装置

Related Child Applications (1)

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JP2014016864A Division JP5731031B2 (ja) 2014-01-31 2014-01-31 分光装置

Publications (3)

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JP2011232032A JP2011232032A (ja) 2011-11-17
JP2011232032A5 JP2011232032A5 (enExample) 2013-05-23
JP5567887B2 true JP5567887B2 (ja) 2014-08-06

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ID=45321514

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JP2010099600A Expired - Fee Related JP5567887B2 (ja) 2010-04-23 2010-04-23 分光装置

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JP (1) JP5567887B2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5988691B2 (ja) * 2012-05-18 2016-09-07 オリンパス株式会社 分光装置、及び、それを備えた共焦点走査型顕微鏡
US9291501B2 (en) * 2012-07-26 2016-03-22 Raytheon Company High efficiency multi-channel spectrometer
JP6166049B2 (ja) * 2013-01-25 2017-07-19 浜松ホトニクス株式会社 光検出装置および光検出方法
US20150369665A1 (en) * 2013-02-01 2015-12-24 Tornado Spectral Systems Inc. Multi backend ultra-broadband dispersive spectrometer
JP6168968B2 (ja) * 2013-11-14 2017-07-26 オリンパス株式会社 分光装置、及び、それを備えた共焦点走査型顕微鏡
DE112014007080B4 (de) * 2014-12-22 2021-09-09 Spectro Analytical Instruments Gmbh Gitterspektrometer mit umschaltbarem Lichtweg
CZ308009B6 (cs) * 2018-07-11 2019-10-16 Univerzita PalackĂ©ho v Olomouci Zobrazovací spektrograf využívající nultý spektrální řád difrakční mřížky
CN114599946B (zh) * 2019-08-23 2025-07-22 安斯威雷有限公司 光谱仪和成像装置
CN110646089A (zh) * 2019-09-24 2020-01-03 安吉九恒健康科技有限公司 一种基于体布拉格光栅的高光谱成像系统
EP4414671A1 (en) * 2023-02-07 2024-08-14 Hitachi High-Tech Analytical Science GmbH An optical spectrometer assembly
WO2025043473A1 (zh) * 2023-08-29 2025-03-06 杭州电子科技大学技术转移有限公司 一种光学测温装置和测温方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2519427A1 (fr) * 1982-01-04 1983-07-08 Instruments Sa Dispositif de spectrometrie
CN1650151B (zh) * 2002-07-12 2010-08-04 河流诊断公司 光学分光计
DE102006017705B4 (de) * 2006-04-15 2010-01-07 Carl Zeiss Microimaging Gmbh Spektralanalytische Einheit mit einem Beugungsgitter und Laserscanning-Mikroskop
JP5205242B2 (ja) * 2008-05-15 2013-06-05 浜松ホトニクス株式会社 分光器の製造方法

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Publication number Publication date
JP2011232032A (ja) 2011-11-17

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