JP5556733B2 - Light irradiation device - Google Patents

Light irradiation device Download PDF

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JP5556733B2
JP5556733B2 JP2011091463A JP2011091463A JP5556733B2 JP 5556733 B2 JP5556733 B2 JP 5556733B2 JP 2011091463 A JP2011091463 A JP 2011091463A JP 2011091463 A JP2011091463 A JP 2011091463A JP 5556733 B2 JP5556733 B2 JP 5556733B2
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light
workpiece
observation hole
transparent member
light irradiation
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JP2012225690A (en
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茂樹 増村
隆士 大澤
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CCS Inc
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Description

本発明は、製品の表面検査やマーク検出等に好適に用いられる光照射装置に関するものである。   The present invention relates to a light irradiation apparatus that is suitably used for product surface inspection, mark detection, and the like.

同軸照明が可能な光照射装置としては、例えば、特許文献1に開示されているような無影照明装置が知られている。この種の無影照明装置は、製品等に対し表面検査等を行う目的から無影で照明するとき等に用いられるものである。このような光照射装置のうち面発光装置を用いたものとしては、例えば、図9に示すようなものが挙げられる。   As a light irradiation device capable of coaxial illumination, for example, a shadowless illumination device as disclosed in Patent Document 1 is known. This type of shadowless illumination device is used when illuminating a product or the like with no shadow for the purpose of surface inspection or the like. As such a light irradiation device using a surface light emitting device, for example, the one shown in FIG.

すなわち、当該光照射装置100は、例えば製品等のワークWを覆うように配置される平面状の発光面(第1光源部)101を備えており、その中央部分にワークWを外部から視認するための観察孔101aが設けられている。そして、この観察孔101aからもワークWに光が照射されるようにするため、同軸照明機構を設けている。この同軸照明機構は、観察孔101aのほぼ直上に45°の傾斜姿勢でハーフミラー103を配置するとともに、そのハーフミラー103の側方に平面状の発光面(第2光源部)102を配置し、当該第2光源部102から射出された光が、ハーフミラー103で反射し観察孔101aを通って、ワークWに照射されるように構成したものである。   That is, the light irradiation apparatus 100 includes a planar light emitting surface (first light source unit) 101 disposed so as to cover a workpiece W such as a product, and visually recognizes the workpiece W from the outside at a central portion thereof. An observation hole 101a is provided. A coaxial illumination mechanism is provided in order to irradiate the work W with light also from the observation hole 101a. In this coaxial illumination mechanism, the half mirror 103 is arranged at an inclination of 45 ° almost directly above the observation hole 101a, and a planar light emitting surface (second light source unit) 102 is arranged on the side of the half mirror 103. The light emitted from the second light source unit 102 is reflected by the half mirror 103, passes through the observation hole 101a, and is irradiated onto the workpiece W.

特開2001−215115号公報JP 2001-215115 A

当該光照射装置100のようにハーフミラー103を備えていて、ハーフミラー103で反射した光をワークW表面に照射して、ワークW表面で反射した光を捕捉して撮像を行う場合、ワークW表面の一部に暗いムラ部分ができることがあり、精密な表面検査等では当該ムラ部分が問題になる。   When the half mirror 103 is provided like the light irradiation apparatus 100 and the light reflected by the half mirror 103 is irradiated on the surface of the work W, and the light reflected by the surface of the work W is captured and imaged, the work W A dark uneven portion may be formed on a part of the surface, and the uneven portion becomes a problem in precise surface inspection or the like.

このムラ部分が生じる要因の1つとして、ハーフミラー103にワークW側の像が映り込むことによる。すなわち、図10及び図12に示すように、ワークWの周縁部から観察孔101aを介してハーフミラー103を見ると、第2光源部102が映らずにワークW側の像が映る領域が生じていることがわかる。   One of the factors that cause this uneven portion is that an image on the workpiece W side is reflected on the half mirror 103. That is, as shown in FIGS. 10 and 12, when the half mirror 103 is viewed from the peripheral portion of the workpiece W through the observation hole 101 a, an area in which an image on the workpiece W side is reflected without the second light source unit 102 being reflected is generated. You can see that

一方、ワークWの中央部から観察孔101aを介してハーフミラー103を見ると、図11及び図13に示すように、全視野において第2光源部102が映っているのが見える。   On the other hand, when the half mirror 103 is viewed from the center of the workpiece W through the observation hole 101a, it can be seen that the second light source 102 is reflected in the entire field of view as shown in FIGS.

これは、ワークWの中央部から見たときに比べて、ワークWの周縁部から見たときの方が、第2光源部102の輝度にムラがあるように見えることを意味する。これが、ワークW表面をその正反射光を捕捉して明視野で観察する場合に、ワークW表面の一部に暗いムラ部分が生じる一因である。これは、明視野でワークW表面を観察する場合は、ワークW表面の明るさは光源の輝度で決まるので、ワークW側から光源を見たときに均一な輝度で光源が見えないと、その輝度のムラがそのままワークW表面の濃淡として観察されてしまうことによる。この濃淡が最も問題になるのは表面に凹凸がある反射率の高いワークWを明視野で観察する場合である。   This means that the brightness of the second light source 102 appears to be more uneven when viewed from the peripheral edge of the work W than when viewed from the center of the work W. This is one reason why dark uneven portions are generated on a part of the surface of the workpiece W when the surface of the workpiece W is captured in the bright field by capturing the regular reflection light. This is because when the surface of the work W is observed in a bright field, the brightness of the surface of the work W is determined by the luminance of the light source. This is because the unevenness in luminance is observed as the shade of the surface of the workpiece W as it is. This shading is the most problematic when observing in a bright field a work W having a high reflectivity with irregularities on the surface.

これを解消するには、ワークW側に更に第3の光源部を設置すればよいが、このようにすると、装置が肥大化するうえに、光量ロスが大きくなって効率が悪くなる。   In order to solve this problem, a third light source unit may be further installed on the workpiece W side. However, if this is done, the apparatus will be enlarged, and the loss of light quantity will increase and the efficiency will deteriorate.

また、発光体104から発して透明板105内を進行する光は、観察孔101aの側周面の内面で全反射するため、観察孔101aの側周面は暗く見え、これもワークW表面に明るさのムラができる原因となる。   Further, since the light emitted from the light emitter 104 and traveling through the transparent plate 105 is totally reflected by the inner surface of the side peripheral surface of the observation hole 101a, the side peripheral surface of the observation hole 101a looks dark and this also appears on the surface of the workpiece W. This can cause uneven brightness.

本発明はかかる問題点に鑑みなされたものであって、簡単な構成でありながら、ワーク表面の明るさのムラを効果的に抑制し、無影照明等をより好適に行うことができる光照射装置を提供することをその主たる所期課題としたものである。   The present invention has been made in view of such a problem, and has a simple configuration, but effectively suppresses unevenness of the brightness of the work surface and can perform lightless illumination and the like more suitably. Providing a device is the main intended task.

すなわち本発明に係る光照射装置は、光の照射対象である製品等のワークと外部観察点との間であって、かつ、それらを結ぶ観察軸線上に設けられた観察孔と、前記観察孔の周囲に設けられ前記ワークに光を照射する第1光源部と、前記外部観察点側であって前記観察孔に臨む位置に、前記観察軸線に対して斜めに設けられたハーフミラーと、射出された光が前記ハーフミラーで反射し、前記観察孔を通って前記ワークに照射される位置に設けられた第2光源部と、前記観察孔内に嵌入された透明部材と、を備えていることを特徴とする。   That is, the light irradiation apparatus according to the present invention includes an observation hole provided between a workpiece such as a product to be irradiated with light and an external observation point and on an observation axis connecting them, and the observation hole. A first light source unit that irradiates the workpiece with light, a half mirror that is provided obliquely with respect to the observation axis at a position facing the observation hole on the external observation point side, and emission And a second light source part provided at a position where the light reflected by the half mirror is irradiated onto the workpiece through the observation hole, and a transparent member fitted into the observation hole. It is characterized by that.

このようなものであれば、前記透明部材が反射用部材として機能して、例えば、その側周面の内面やワーク対向面の内面で第2光源部からの光を全反射して、第2光源部からの光をワークの周縁部にまで良好に導くことができる。このため、簡便な構成でワーク表面全体にムラなく光を照射することができ、より輝度ムラの少ない照明機構を構築できる。   If it is such, the said transparent member functions as a member for reflection, for example, totally reflects the light from a 2nd light source part in the inner surface of the side peripheral surface, or the inner surface of a workpiece | work opposing surface, and 2nd The light from the light source part can be guided well to the peripheral part of the workpiece. For this reason, it is possible to irradiate the entire workpiece surface with light with a simple configuration and to construct an illumination mechanism with less luminance unevenness.

前記ハーフミラーとしては、例えば、中実透明体からなるビームスプリッターに内包されている態様が挙げられる。   Examples of the half mirror include a mode in which the half mirror is included in a beam splitter made of a solid transparent body.

前記ハーフミラーが中実透明体からなるビームスプリッターに内包されている場合、第2光源部からの光をワークの周縁部のうち第2光源部の下方にも良好に導くためには、前記ビームスプリッターを構成する中実透明体として、前記透明部材より絶対屈折率が大きいものを用いることが好ましい。このようなものであれば、第2光源部からの光をビームスプリッターの下端面の内面で全反射してその進行方向を変えることができる。   In the case where the half mirror is contained in a beam splitter made of a solid transparent body, in order to guide the light from the second light source part well below the second light source part in the peripheral part of the work, the beam As the solid transparent body constituting the splitter, it is preferable to use one having an absolute refractive index larger than that of the transparent member. If it is such, the light from a 2nd light source part can be totally reflected by the inner surface of the lower end surface of a beam splitter, and the advancing direction can be changed.

前記第1光源部が、前記観察孔が形成された平板状の透明体と、前記透明体に光を導入する複数の発光体とを備え、前記透明板の前記ワークに対向する面より光を導出する面発光装置である場合、前記透明部材の前記ワークに対向する端面は、前記透明体の前記ワークに対向する面と面一であることが好ましい。このようなものであれば、第1光源部からの光の導出面と第2光源部からの光の導出面とに不連続部分がなく、ワーク表面全体にムラなく光を照射することができる。   The first light source unit includes a flat transparent body in which the observation hole is formed, and a plurality of light emitters that introduce light into the transparent body, and emits light from a surface of the transparent plate facing the workpiece. In the case of the surface light emitting device to be led out, it is preferable that an end surface of the transparent member facing the workpiece is flush with a surface of the transparent body facing the workpiece. If it is such, there will be no discontinuous part in the derivation | leading-out surface of the light from a 1st light source part, and the derivation | leading-out surface of the light from a 2nd light source part, and light can be irradiated to the whole workpiece | work surface uniformly. .

前記第1光源部が上記のような面発光装置である場合、前記複数の発光体から発して前記透明板内を進行する光は、観察孔の側周面の内面で全反射するため、観察孔の側周面は暗く見え、これもワーク表面に明るさのムラができる原因となる。しかし、前記透明部材の側周端面の内面が光反射面であれば、このような観察孔の側周面が暗く見える現象を防止することができる。また、前記透明部材の側周端面の外面が光反射面であれば、観察孔の側周面からの光の漏出をより確実に防止することができるので、前記透明板のワーク対向面を観察孔側の端に至るまで均一な明るさで光を導出する光導出面とすることができる。そして、前記透明部材の側周端面の内面及び外面の両方が光反射面であることがより好ましい。   When the first light source unit is a surface light emitting device as described above, the light emitted from the plurality of light emitters and traveling through the transparent plate is totally reflected on the inner surface of the side peripheral surface of the observation hole. The side peripheral surface of the hole looks dark, which also causes uneven brightness on the workpiece surface. However, if the inner surface of the side peripheral end surface of the transparent member is a light reflecting surface, such a phenomenon that the side peripheral surface of the observation hole looks dark can be prevented. Further, if the outer surface of the side peripheral end surface of the transparent member is a light reflecting surface, light leakage from the side peripheral surface of the observation hole can be more reliably prevented, so that the workpiece facing surface of the transparent plate is observed. It can be set as the light derivation surface which derives light with uniform brightness up to the end on the hole side. And it is more preferable that both the inner surface and the outer surface of the side peripheral end surface of the transparent member are light reflecting surfaces.

前記透明部材の側周面内面で第2光源部からの光を全反射するためには、前記透明部材の絶対屈折率が前記平板状の透明体の絶対屈折率より大きいことが好ましい。又は、前記透明部材の前記観察孔の側周面に対向する面が、前記透明部材を構成する材料より絶対屈折率が小さい材料により被覆されていてもよく、前記観察孔と前記透明部材との間に間隙が形成されていてもよい。   In order to totally reflect the light from the second light source unit on the inner surface of the side surface of the transparent member, it is preferable that the absolute refractive index of the transparent member is larger than the absolute refractive index of the flat transparent body. Alternatively, a surface of the transparent member facing the side peripheral surface of the observation hole may be covered with a material having an absolute refractive index smaller than that of the material constituting the transparent member, and the observation hole and the transparent member A gap may be formed between them.

前記透明部材は、前記ビームスプリッターと一体となって、そのワークに対向する側の端部を構成していてもよい。   The transparent member may be integrated with the beam splitter and constitute an end portion on the side facing the workpiece.

このような構成の本発明によれば、簡単な構成によりワークから観察孔を見たときの光源部のない領域を効果的に減少させることができる。   According to the present invention having such a configuration, it is possible to effectively reduce the area without the light source portion when the observation hole is viewed from the workpiece with a simple configuration.

本発明の一実施形態に係る光照射装置の中央縦断面図である。It is a center longitudinal cross-sectional view of the light irradiation apparatus which concerns on one Embodiment of this invention. 同実施形態における光照射装置の平面図である。It is a top view of the light irradiation apparatus in the embodiment. 同実施形態における光学部材の部分縦断面図である。It is a fragmentary longitudinal cross-sectional view of the optical member in the embodiment. 同実施形態に係る光照射装置の光路を説明する光路説明図である。It is an optical path explanatory drawing explaining the optical path of the light irradiation apparatus concerning the embodiment. 他の実施形態に係る光照射装置の中央縦断面図である。It is a center longitudinal cross-sectional view of the light irradiation apparatus which concerns on other embodiment. 他の実施形態に係る光照射装置の中央縦断面図である。It is a center longitudinal cross-sectional view of the light irradiation apparatus which concerns on other embodiment. 他の実施形態に係る光照射装置の中央縦断面図である。It is a center longitudinal cross-sectional view of the light irradiation apparatus which concerns on other embodiment. 他の実施形態に係る光照射装置の中央縦断面図である。It is a center longitudinal cross-sectional view of the light irradiation apparatus which concerns on other embodiment. 従来の光照射装置を示す模式的構造図である。It is a typical structure figure showing the conventional light irradiation device. 従来の光照射装置の光路を説明する光路説明図である。It is an optical path explanatory drawing explaining the optical path of the conventional light irradiation apparatus. 従来の光照射装置の光路を説明する光路説明図である。It is an optical path explanatory drawing explaining the optical path of the conventional light irradiation apparatus. 従来の光照射装置の光路を説明する光路説明図である。It is an optical path explanatory drawing explaining the optical path of the conventional light irradiation apparatus. 従来の光照射装置の光路を説明する光路説明図である。It is an optical path explanatory drawing explaining the optical path of the conventional light irradiation apparatus.

以下に本発明の一実施形態について図面を参照して説明する。   An embodiment of the present invention will be described below with reference to the drawings.

本実施形態に係る光照射装置1は、例えば、工場等において製品等の対象物(ワーク)に光を照射し、その表面の傷やマーク等を自動検査する際に用いるためのもので、図1及び図2に示すように、第1光照射部2と第2光照射部6とを備えている。   The light irradiation apparatus 1 according to the present embodiment is for use in, for example, irradiating light on an object (workpiece) such as a product in a factory or the like and automatically inspecting scratches or marks on the surface thereof. As shown in FIG. 1 and FIG. 2, the first light irradiation unit 2 and the second light irradiation unit 6 are provided.

以下に各部を詳述する。
第1光照射部2は、矩形板状をなす光学部材3と、その光学部材3の側周囲から光を照射する第1光源部5と、光学部材3及び第1光源部5を保持する枠体4とを備えている。
Each part is described in detail below.
The first light irradiation unit 2 includes a rectangular plate-shaped optical member 3, a first light source unit 5 that emits light from the periphery of the optical member 3, and a frame that holds the optical member 3 and the first light source unit 5. And a body 4.

光学部材3は、一方の面をワーク対向面31aとして、光の照射対象であるワークWに向けて設置される透明板31と、透明板31における他方の面(反ワーク対向面)31bに並べ設けた多数の反射部32とからなる。   The optical member 3 has one surface as a workpiece facing surface 31a and is arranged on a transparent plate 31 installed toward the workpiece W that is a light irradiation target, and the other surface (anti-work facing surface) 31b of the transparent plate 31. It is composed of a large number of reflection portions 32 provided.

透明板31は、等厚で平面視正方形状の平板状をなす無色透明体であり、撮像装置MとワークWとを結ぶ観察軸線C上に観察孔311が形成してあり、例えばアクリルやガラス等からなるものである。   The transparent plate 31 is a colorless transparent body having an equal thickness and a square shape in plan view, and an observation hole 311 is formed on an observation axis C connecting the imaging device M and the workpiece W. For example, acrylic or glass is used. Etc.

反射部32は、その一つ一つは、例えば平面視円形状をなし、径が数十〜数百μm、厚みがミクロンオーダーの極めて小さく薄いものである。そして、図3に示すように、当該反射部32を、互いの間に微細な隙間Sが形成されるように、透明板31における反ワーク対向面31bの、側周縁部を除く略全面に亘って、等ピッチ(例えば約0.4mmピッチ)で縦横に多数並べ設けてある。反射部32は、例えば、光拡散部材である粒子状の反射フィラを含有した白色の顔料から形成したもので、その表面である光反射面において、主として光を反射するとともに、内部に侵入した光の一部を、前記反射フィラで拡散させて反射する。   Each of the reflecting portions 32 has, for example, a circular shape in plan view, and is extremely small and thin with a diameter of several tens to several hundreds μm and a thickness of the order of microns. And as shown in FIG. 3, the said reflection part 32 is covered over the substantially whole surface except the side peripheral part of the anti-work opposing surface 31b in the transparent plate 31 so that the fine clearance S may be formed between each other. A large number of them are arranged in the vertical and horizontal directions at an equal pitch (for example, about 0.4 mm pitch). The reflecting portion 32 is formed from, for example, a white pigment containing a particulate reflecting filler that is a light diffusing member. The reflecting portion 32 mainly reflects light on the light reflecting surface, which is the surface of the reflecting portion 32, and enters the inside. A part of the light is diffused and reflected by the reflection filler.

第1光源部5は、図2に示すように、透明板31の4つの側周端面31cにそれぞれ対応する4つのユニットからなる。各ユニットは、帯状をなす1つの配線基板52とその配線基板52に等間隔1列で搭載した複数のLED51からなり、それらLED51が、透明板31の側周端面31cに臨むように配置され、当該側周端面31cから透明板31の内部に向かって光を照射する。   As shown in FIG. 2, the first light source unit 5 includes four units respectively corresponding to the four side peripheral end surfaces 31 c of the transparent plate 31. Each unit is composed of a single wiring board 52 in the form of a strip and a plurality of LEDs 51 mounted on the wiring board 52 in a line at equal intervals, and these LEDs 51 are arranged so as to face the side peripheral end face 31c of the transparent plate 31, Light is irradiated from the side peripheral end face 31 c toward the inside of the transparent plate 31.

枠体4は、正方形環状をなし、例えば内周面に開口する周回溝を有した金属製のもので、その周回溝の中に第1光源部5を保持収容する。またその溝の開口縁部で、透明板31の側周縁部を厚み方向から挟み込んで保持する。   The frame body 4 has a square ring shape, and is made of metal having a circumferential groove that opens to the inner circumferential surface, for example, and holds and accommodates the first light source unit 5 in the circumferential groove. Further, the side peripheral edge of the transparent plate 31 is sandwiched from the thickness direction and held by the opening edge of the groove.

第2光照射部6は、キューブ型ビームスプリッター7と、キューブ型ビームスプリッター7の下端に連続して設けられた透明部材7´と、キューブ型ビームスプリッター7の側端面7aから光を照射する第2光源部8と、キューブ型ビームスプリッター7及び第2光源部8を保持する枠体9とを備えている。   The second light irradiation unit 6 irradiates light from a cube beam splitter 7, a transparent member 7 ′ provided continuously at the lower end of the cube beam splitter 7, and a side end surface 7 a of the cube beam splitter 7. The light source unit 8 includes a cube-type beam splitter 7 and a frame 9 that holds the second light source unit 8.

キューブ型ビームスプリッター7は、ハーフミラー71が内包された直方体状の中実透明体であり、全面が透明なものであって、その内面で光が全反射可能なものである。本実施形態で用いるキューブ型ビームスプリッター7は、具体的には、直角プリズムを二つ貼り合わせ、その接合面に誘電体多層膜や金属薄膜等からなるコーティングを施すことによりハーフミラー71を形成してなるものである。キューブ型ビームスプリッター7は、そのハーフミラー(接合面)71が観察孔311と撮像装置Mとの間の観察軸線C上に、観察軸線Cに対して斜め45度の角度となるように配置されている。   The cube-type beam splitter 7 is a rectangular parallelepiped solid transparent body in which a half mirror 71 is included, the entire surface is transparent, and light can be totally reflected on the inner surface thereof. Specifically, the cube-type beam splitter 7 used in this embodiment forms a half mirror 71 by bonding two rectangular prisms and applying a coating made of a dielectric multilayer film or a metal thin film to the joint surface. It will be. The cube-type beam splitter 7 is disposed on the observation axis C between the observation hole 311 and the imaging device M so that the half mirror (joint surface) 71 is inclined at an angle of 45 degrees with respect to the observation axis C. ing.

キューブ型ビームスプリッター7の下端には別体からなる直方体状の透明部材7´が連続して設けられており、キューブ型ビームスプリッター7の下端面7dと透明部材7´の上端面とは隙間なく密接している。当該透明部材7´は具体的にはロッドレンズからなり、当該ロッドレンズはキューブ型ビームスプリッター7を構成するプリズムの材料より絶対屈折率が小さい材料から形成されている。透明部材7´は、透明板31に設けられた観察孔311を塞ぐように観察孔311内に挿入されており、観察孔311の側周面と透明部材7´の側周端面7cとは隙間なく密接している。また、透明部材7´は、その下端面7bと透明板31のワーク対向面31aとが面一に連続面を形成するように配置してある。   A separate rectangular parallelepiped transparent member 7 'is continuously provided at the lower end of the cube beam splitter 7, and there is no gap between the lower end surface 7d of the cube beam splitter 7 and the upper end surface of the transparent member 7'. Close. Specifically, the transparent member 7 ′ is made of a rod lens, and the rod lens is made of a material having an absolute refractive index smaller than that of the prism constituting the cube-type beam splitter 7. The transparent member 7 ′ is inserted into the observation hole 311 so as to close the observation hole 311 provided in the transparent plate 31, and a gap is formed between the side peripheral surface of the observation hole 311 and the side peripheral end surface 7 c of the transparent member 7 ′. Not close. Further, the transparent member 7 ′ is arranged so that the lower end surface 7 b and the work facing surface 31 a of the transparent plate 31 form a continuous surface.

透明部材7´を構成するロッドレンズの材料としては、透明板31を構成する材料より絶対屈折率が大きいものが用いてある。これは、透明部材7´の4つの各側周端面7c内面における全反射を担保するためである。また、透明部材7´の4つの各側周端面7cにはアルミ蒸着等による鏡面処理が施されており、外向きの光反射面が構成されている。   As a material of the rod lens constituting the transparent member 7 ′, a material having an absolute refractive index larger than that of the material constituting the transparent plate 31 is used. This is to ensure total reflection on the inner surfaces of the four side peripheral end faces 7c of the transparent member 7 '. Further, each of the four side peripheral end surfaces 7c of the transparent member 7 'is subjected to mirror treatment by aluminum vapor deposition or the like, and an outward light reflecting surface is configured.

第2光源部8は、矩形状をなす基板81と当該基板81上に並べ設けた複数(多数)のLED82からなり、基板81は観察軸線Cと平行に設置してあり、LED82はキューブ型ビームスプリッター7の側端面7aに臨むように配置され、当該側端面7aからハーフミラー71に向かって光を射出する。   The second light source unit 8 includes a rectangular substrate 81 and a plurality (a large number) of LEDs 82 arranged on the substrate 81. The substrate 81 is installed in parallel with the observation axis C, and the LED 82 is a cube beam. It arrange | positions so that it may face the side end surface 7a of the splitter 7, and inject | emits light toward the half mirror 71 from the said side end surface 7a.

枠体9は、側面視矩形状をなし、例えば側端面に開口する凹部を有した金属製のものであり、凹部の内側面に形成された溝の中に第2光源部8を保持し、当該凹部の開口縁部でキューブ型ビームスプリッター7の側端部を挟みこんで保持する。   The frame body 9 has a rectangular shape in a side view, and is made of a metal having, for example, a recess opening in a side end surface, and holds the second light source unit 8 in a groove formed on the inner surface of the recess. The side edge of the cube-type beam splitter 7 is sandwiched and held by the opening edge of the recess.

次に、このように構成した光照射装置1の作用を以下に説明する。   Next, the operation of the light irradiation device 1 configured as described above will be described below.

まず、図1に示すように、ワークWと撮像装置Mとを対向させて設置し、その間に、光照射装置1を、そのワーク対向面31aがワークWに向くようにして、観察軸線C上に設置する。   First, as shown in FIG. 1, the workpiece W and the imaging device M are installed facing each other, and the light irradiation device 1 is placed on the observation axis C so that the workpiece facing surface 31 a faces the workpiece W therebetween. Install in.

この状態で、第2光源部8から光が射出されると、その光はキューブ型ビームスプリッター7の側端面7aから内部に進入し、ハーフミラー71に向かってキューブ型ビームスプリッター7の内面で全反射しながら進行する。そして、ハーフミラー71に到達した光は、そこで反射して観察孔311に向かってキューブ型ビームスプリッター7の内面で全反射しながら進行する。   In this state, when light is emitted from the second light source unit 8, the light enters the inside from the side end surface 7 a of the cube-type beam splitter 7, and is entirely incident on the inner surface of the cube-type beam splitter 7 toward the half mirror 71. Progress while reflecting. The light reaching the half mirror 71 is reflected there and travels toward the observation hole 311 while being totally reflected by the inner surface of the cube beam splitter 7.

具体的には、第2光源部8から発した光は、キューブ型ビームスプリッター7の側端面7aの各側辺からハーフミラー71の各側辺に至るまでの対向する側部内面において、全反射しながら進行する。そして、均一化された拡散光として下端面7bから出て、ワークWに向かって照射される。   Specifically, the light emitted from the second light source unit 8 is totally reflected on the inner surfaces of the opposing side portions from each side of the side end surface 7 a of the cube beam splitter 7 to each side of the half mirror 71. While proceeding. Then, it exits from the lower end surface 7b as uniformed diffused light and is irradiated toward the workpiece W.

一方、第1光源部5から発した光は、透明板31の側周端面31cから内部に進入し、図3に示すように、中央部に向かって、ワーク対向面31aの内面と反ワーク対向面31bの内面との間で全反射しながら進行する。その過程で、反ワーク対向面31bに貼り付けられた反射部32に到達した光は、そこで乱反射し、均一化された拡散光としてワーク対向面31aから出て、ワークWに向かって照射される。   On the other hand, the light emitted from the first light source unit 5 enters the inside from the side peripheral end surface 31c of the transparent plate 31, and, as shown in FIG. 3, faces the inner surface of the workpiece facing surface 31a and the opposite workpiece toward the center portion. It proceeds while being totally reflected between the inner surface of the surface 31b. In that process, the light that has reached the reflecting portion 32 attached to the anti-work facing surface 31b is diffusely reflected there, exits from the work facing surface 31a as uniformed diffused light, and is irradiated toward the work W. .

そして、撮像装置Mは、ワークWで反射し、観察孔311を通過した光を捕捉することにより、ワークWを撮像し、当該ワークWの表面検査や記号読取を行う。   The imaging device M captures the light reflected by the work W and passed through the observation hole 311 to pick up an image of the work W, and performs surface inspection and symbol reading of the work W.

この際、図4に示すように、ワークWからの反射光のうち、透明部材7´の下端面7bを通過してハーフミラー71で反射しキューブ型ビームスプリッター7の下端面7dの内面に向かった光L1は、当該内面で全反射して第2光源部8に向かうので、ワークWの周縁部から観察孔311を介してハーフミラー71を見ると、全視野において第2光源部8が映っているのが見える。このため、ワークWから観察孔311を見たときの光源部のない領域を減少させることができる。   At this time, as shown in FIG. 4, the reflected light from the workpiece W passes through the lower end surface 7 b of the transparent member 7 ′ and is reflected by the half mirror 71 toward the inner surface of the lower end surface 7 d of the cube beam splitter 7. Since the reflected light L1 is totally reflected by the inner surface and travels toward the second light source unit 8, the second light source unit 8 is reflected in the entire field of view when the half mirror 71 is viewed from the peripheral edge of the work W through the observation hole 311. I can see it. For this reason, when the observation hole 311 is viewed from the workpiece W, it is possible to reduce the area without the light source part.

また、ワークWからの反射光のうち、透明部材7´の下端面7bを通過し、次いで、透明部材7´の側周端面7cの内面で全反射し、更に、ハーフミラー71に向かった光L2は、ハーフミラー71で反射して第2光源部8に向かうので、ワークWの周縁部から観察孔311の側周面を見ると、やはり、第2光源部8が映っているのが見える。このため、ワークW表面における明るさのムラを低減することができる。   Of the reflected light from the workpiece W, the light that has passed through the lower end surface 7b of the transparent member 7 ′, then totally reflected by the inner surface of the side peripheral end surface 7c of the transparent member 7 ′, and further toward the half mirror 71 Since L2 is reflected by the half mirror 71 and travels toward the second light source unit 8, when the side peripheral surface of the observation hole 311 is viewed from the peripheral part of the workpiece W, it can be seen that the second light source unit 8 is reflected. . For this reason, unevenness in brightness on the surface of the workpiece W can be reduced.

このような実施形態に係る光照射装置1であれば、第2光源部8からの光の一部はキューブ型ビームスプリッター7の下端面7dや透明部材7´の側周端面7cの内面で全反射して進行方向を変えるので、第2光源部8からの光をワークWの周縁部にも良好に導くことができる。このため、ワークW表面の明るさのムラを低減することができる。   In the light irradiation device 1 according to such an embodiment, a part of the light from the second light source unit 8 is entirely on the inner surface of the lower end surface 7d of the cube-type beam splitter 7 and the side peripheral end surface 7c of the transparent member 7 ′. Since the direction of travel is changed by reflection, the light from the second light source unit 8 can be guided well to the peripheral portion of the workpiece W. For this reason, the unevenness of the brightness of the surface of the workpiece W can be reduced.

また、第2光源部8からハーフミラー71までの光路及びハーフミラー71から観察孔311までの光路において、第2光源部8から発した光がキューブ型ビームスプリッター7内面において全反射するので、ワークWの周縁部にも観察孔311の全天方向から光が照射され、そのためワークWの周縁部で生じていた明るさのムラを大きく軽減でき、ワークW表面全体に亘ってより均一な光を照射することができるようになる。   Further, in the optical path from the second light source unit 8 to the half mirror 71 and the optical path from the half mirror 71 to the observation hole 311, the light emitted from the second light source unit 8 is totally reflected on the inner surface of the cube-type beam splitter 7. The peripheral edge of W is also irradiated with light from all directions of the observation hole 311, so that the unevenness of brightness occurring at the peripheral edge of the work W can be greatly reduced, and more uniform light can be emitted over the entire surface of the work W. It becomes possible to irradiate.

更に、従来の光照射装置では、第1光源部5から発して透明板31内を進行する光は、観察孔311の側周面の内面で全反射するため、観察孔311の側周面の外面は暗く見え、これもワークW表面に明るさのムラができる原因となるが、本実施形態によれば、第2光源部8から発した光のうち透明部材7´の側周端面7cの内面で全反射した光が観察孔311の側周面の方向からもワークW表面に照射されるので、上述の明るさのムラを低減することができる。   Further, in the conventional light irradiation device, the light emitted from the first light source unit 5 and traveling through the transparent plate 31 is totally reflected by the inner surface of the side peripheral surface of the observation hole 311, and therefore the light on the side peripheral surface of the observation hole 311. Although the outer surface looks dark and this also causes unevenness of brightness on the surface of the workpiece W, according to the present embodiment, of the light emitted from the second light source unit 8, the side peripheral end surface 7 c of the transparent member 7 ′. Since the light totally reflected from the inner surface is irradiated on the surface of the work W also from the direction of the side peripheral surface of the observation hole 311, the above-described brightness unevenness can be reduced.

また、観察孔311の側周面と隙間なく密接する透明部材7´の側周端面7cに外向きの鏡面処理が施してあることにより、観察孔311の側周面からの光の漏出がより確実に防止されて、その結果、透明板31のワーク対向面31aは観察孔311側の端に至るまで均一な明るさでワークWを照らすことができる。   Further, since the outer peripheral surface 7c of the transparent member 7 ′ that is in close contact with the side peripheral surface of the observation hole 311 is subjected to an external mirror surface treatment, light leakage from the side peripheral surface of the observation hole 311 is further reduced. As a result, the workpiece facing surface 31a of the transparent plate 31 can illuminate the workpiece W with uniform brightness up to the end on the observation hole 311 side.

なお、本発明は前記実施形態に限られるものではない。   The present invention is not limited to the above embodiment.

例えば、図5に示すように、キューブ型ビームスプリッター7の下端部72が延伸されており、この延伸された下端部72が、透明板31に設けられた観察孔311内に挿入してあってもよい。   For example, as shown in FIG. 5, the lower end portion 72 of the cube-type beam splitter 7 is extended, and the extended lower end portion 72 is inserted into the observation hole 311 provided in the transparent plate 31. Also good.

また、透明部材7´の側周端面7c内面における全反射を担保するために、透明部材7´の材料として、透明板31を構成する材料より絶対屈折率が大きいものを用いる代わりに、透明部材7´の側周端面7cが、透明部材7´の材料より絶対屈折率が小さい材料により被覆されていてもよい。そして、全反射の担保とともに、透明部材7´の表面からの光の漏出をより確実に防止するためには、透明部材7´の側周端面7cにアルミ蒸着等による内向きの鏡面処理が施されていてもよい。   Moreover, in order to ensure total reflection in the inner surface of the side peripheral end face 7c of the transparent member 7 ′, instead of using a material having a higher absolute refractive index than the material constituting the transparent plate 31 as the material of the transparent member 7 ′, a transparent member 7 'side peripheral end surface 7c may be covered with a material having an absolute refractive index smaller than that of the transparent member 7'. Then, in order to prevent the leakage of light from the surface of the transparent member 7 ′ together with ensuring the total reflection, the inward mirror surface treatment such as aluminum deposition is performed on the side peripheral end surface 7 c of the transparent member 7 ′. May be.

更に、透明部材7´の側周端面7c内面における全反射を担保するための他の方策としては、透明部材7´と観察孔311とを密接させずに、これらの間に間隙を設けることが挙げられる。このようにして、透明部材7´と観察孔311との間に空気を介在させることによっても、透明部材7´の側周端面7c内面における全反射を担保することができる。   Furthermore, as another measure for ensuring total reflection on the inner surface of the side peripheral end surface 7c of the transparent member 7 ', a gap is provided between the transparent member 7' and the observation hole 311 without bringing them into close contact with each other. Can be mentioned. In this way, total reflection on the inner surface of the side peripheral end face 7c of the transparent member 7 'can be ensured also by interposing air between the transparent member 7' and the observation hole 311.

また、キューブ型ビームスプリッター7の表面からの光の漏出をより確実に防止するためには、その表面にアルミ蒸着等による内向きの鏡面処理が施されていてもよい。   Further, in order to prevent light leakage from the surface of the cube-type beam splitter 7 more reliably, the surface may be subjected to an inward mirror surface treatment by aluminum vapor deposition or the like.

更に、第1光照射部2は、図6に示すように、ドーム型照明であってもよく、図7に示すように、リング型照明であってもよい。   Furthermore, the first light irradiation unit 2 may be a dome-type illumination as shown in FIG. 6, or may be a ring-type illumination as shown in FIG.

また、第2光照射部6は、図8に示すように、筐体11と、その筐体11に取り付けられたハーフミラー71、観察孔311に嵌入された透明部材7´、第2光源部8及び拡散板10からなるものであってもよい。   As shown in FIG. 8, the second light irradiation unit 6 includes a housing 11, a half mirror 71 attached to the housing 11, a transparent member 7 ′ fitted in the observation hole 311, and a second light source unit. 8 and the diffusion plate 10 may be used.

ここで、筐体11は、透明板31に設けられた観察孔311を覆うように、透明板31上に取り付けられる平面視矩形状のものであり、ハーフミラー71は、観察孔311と撮像装置Mとの間の観察軸線C上に、当該観測軸線Cに対して斜め45度の角度で配置してある。   Here, the housing 11 has a rectangular shape in a plan view attached to the transparent plate 31 so as to cover the observation hole 311 provided in the transparent plate 31, and the half mirror 71 includes the observation hole 311 and the imaging device. On the observation axis C with respect to M, it is arranged at an angle of 45 degrees with respect to the observation axis C.

拡散板10は、第2光源部8とハーフミラー71との間に介在させた矩形薄板であり、第2光源部8の発光面と平行に配置してある。この拡散板10は、透光性と光拡散性を有したくもりガラスのようなものであり、一方の面10aから入射した第2光源部8からの光をより均一化して他方の面10bからハーフミラー71に向かって射出する。そしてこの他方の面10bから出た光がハーフミラー71で反射して観察孔311を通り、ワークWに照射される。   The diffusion plate 10 is a rectangular thin plate interposed between the second light source unit 8 and the half mirror 71, and is disposed in parallel with the light emitting surface of the second light source unit 8. This diffusing plate 10 is like a cloudy glass having translucency and light diffusibility, and makes the light from the second light source unit 8 incident from one surface 10a more uniform, and half from the other surface 10b. The light is emitted toward the mirror 71. Then, the light emitted from the other surface 10 b is reflected by the half mirror 71, passes through the observation hole 311, and is irradiated onto the work W.

そして、この実施形態では、この筐体11の内面のうち、第2光源部8からハーフミラー71までの光路及びハーフミラー71から観察孔311までの光路を覆う光路壁内面A1、A2、A3、A4を鏡面にしている。   In this embodiment, among the inner surface of the housing 11, the optical path wall inner surfaces A1, A2, A3, which cover the optical path from the second light source unit 8 to the half mirror 71 and the optical path from the half mirror 71 to the observation hole 311, A4 is a mirror surface.

具体的には、他方の面10bの頂辺からハーフミラー71の頂辺に至るまでの頂部光路壁内面A2、他方の面10bの底辺から観察孔311に至るまでの底部光路壁内面A1、他方の面10bの各側辺からハーフミラー71の各側辺に至るまでの対向する側部光路壁内面A3(図示しない。)及びハーフミラー71の底辺から観察孔311に至るまでの底部光路壁内面A4に電解研磨等を施して非常に面精度のよい鏡面としている。   Specifically, the top optical path wall inner surface A2 from the top of the other surface 10b to the top of the half mirror 71, the bottom optical path wall inner surface A1 from the bottom of the other surface 10b to the observation hole 311, the other The opposite side optical path wall inner surface A3 (not shown) from each side of the surface 10b to each side of the half mirror 71 and the bottom optical path wall inner surface from the bottom of the half mirror 71 to the observation hole 311 A4 is subjected to electrolytic polishing or the like to obtain a mirror surface with very good surface accuracy.

なお、光路壁内面A1、A2、A3、A4の全てが鏡面でなくともよく、そのいずれか1つ以上が鏡面であってもよい。   All of the optical path wall inner surfaces A1, A2, A3, and A4 may not be mirror surfaces, and any one or more of them may be mirror surfaces.

その他、本発明は上記の各実施形態に限られず、その趣旨を逸脱しない限り、前述した種々の構成の一部又は全部を適宜組み合わせて構成してもよい。   In addition, the present invention is not limited to the above-described embodiments, and may be configured by appropriately combining some or all of the various configurations described above without departing from the spirit of the present invention.

1・・・光照射装置
311・・・観察孔
5・・・第1光源部
7・・・キューブ型ビームスプリッター
72・・・下端部
71・・・ハーフミラー
7b・・・下端面
7´・・・透明部材
8・・・第2光源部
C・・・観察軸線
W・・・ワーク
DESCRIPTION OF SYMBOLS 1 ... Light irradiation apparatus 311 ... Observation hole 5 ... 1st light source part 7 ... Cube-type beam splitter 72 ... Lower end part 71 ... Half mirror 7b ... Lower end surface 7 ' ..Transparent member 8 ... second light source C ... observation axis W ... work

Claims (8)

光の照射対象である製品等のワークと外部観察点との間であって、かつ、それらを結ぶ観察軸線上に設けられた観察孔と、
前記観察孔の周囲に設けられ前記ワークに光を照射する第1光源部と、
前記外部観察点側であって前記観察孔に臨む位置に、前記観察軸線に対して斜めに設けられたハーフミラーと、
射出された光が前記ハーフミラーで反射し、前記観察孔を通って前記ワークに照射される位置に設けられた第2光源部と、
前記観察孔の深さ方向全体に亘って嵌め込まれた透明部材とを備えることを特徴とする光照射装置。
An observation hole provided between a workpiece such as a product to be irradiated with light and an external observation point, and on an observation axis connecting them;
A first light source provided around the observation hole and irradiating the work with light;
A half mirror provided obliquely with respect to the observation axis at a position facing the observation hole on the external observation point side;
A second light source unit provided at a position where the emitted light is reflected by the half mirror and irradiated to the workpiece through the observation hole;
And a transparent member fitted over the entire depth direction of the observation hole.
前記ハーフミラーが、中実透明体からなるビームスプリッターに内包されている請求項1記載の光照射装置。   The light irradiation apparatus according to claim 1, wherein the half mirror is included in a beam splitter made of a solid transparent body. 前記ビームスプリッターを構成する中実透明体の絶対屈折率が前記透明部材の絶対屈折率より大きい請求項2記載の光照射装置。   The light irradiation apparatus according to claim 2, wherein an absolute refractive index of a solid transparent body constituting the beam splitter is larger than an absolute refractive index of the transparent member. 前記第1光源部が、前記観察孔が形成された平板状の透明体と、前記透明体に光を導入する複数の発光体をさらに備え、前記透明の前記ワークに対向する面より光を導出する請求項1、2又は3記載の光照射装置。 The first light source unit further includes a flat transparent body in which the observation hole is formed, and a plurality of light emitters for introducing light into the transparent body, and emits light from a surface of the transparent body facing the workpiece. The light irradiation apparatus according to claim 1, 2 or 3 to be derived. 前記透明部材の側周端面の内面が光反射面である請求項4記載の光照射装置。   The light irradiation device according to claim 4, wherein an inner surface of a side peripheral end surface of the transparent member is a light reflecting surface. 前記透明部材の側周端面の外面が光反射面である請求項4又は5記載の光照射装置。   The light irradiation apparatus according to claim 4 or 5, wherein an outer surface of a side peripheral end surface of the transparent member is a light reflecting surface. 前記透明部材の絶対屈折率が前記平板状の透明体の絶対屈折率より大きい請求項4記載の光照射装置。   The light irradiation apparatus according to claim 4, wherein an absolute refractive index of the transparent member is larger than an absolute refractive index of the flat transparent body. 前記透明部材が、前記ビームスプリッターのワークに対向する側の端部を構成している請求項2、3、4又は5記載の光照射装置。   The light irradiation apparatus according to claim 2, 3, 4, or 5, wherein the transparent member constitutes an end portion of the beam splitter that faces the workpiece.
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