JP5536501B2 - Silicon carbide single crystal manufacturing equipment - Google Patents

Silicon carbide single crystal manufacturing equipment Download PDF

Info

Publication number
JP5536501B2
JP5536501B2 JP2010059700A JP2010059700A JP5536501B2 JP 5536501 B2 JP5536501 B2 JP 5536501B2 JP 2010059700 A JP2010059700 A JP 2010059700A JP 2010059700 A JP2010059700 A JP 2010059700A JP 5536501 B2 JP5536501 B2 JP 5536501B2
Authority
JP
Japan
Prior art keywords
single crystal
guide member
height
heating coil
induction heating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2010059700A
Other languages
Japanese (ja)
Other versions
JP2011190157A (en
Inventor
拓也 門原
隆之 丸山
憲一郎 奥野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Showa Denko KK
Original Assignee
Showa Denko KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Denko KK filed Critical Showa Denko KK
Priority to JP2010059700A priority Critical patent/JP5536501B2/en
Publication of JP2011190157A publication Critical patent/JP2011190157A/en
Application granted granted Critical
Publication of JP5536501B2 publication Critical patent/JP5536501B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Description

本発明は、炭化ケイ素単結晶の製造装置に関する。 The present invention relates to an apparatus for producing a silicon carbide single crystal.

従来から、次世代のLEDデバイス、パワーデバイス、高周波デバイス等の半導体デバイス用基板として、単結晶からなる単結晶ウエハが広く用いられている。この単結晶を作製する方法として昇華法が知られており、該昇華法では、例えば蓋体と坩堝本体とガイド部材(封止部)とを備えた坩堝が用いられる(例えば、特許文献1参照)。   Conventionally, single-crystal wafers made of single crystals have been widely used as substrates for semiconductor devices such as next-generation LED devices, power devices, and high-frequency devices. As a method for producing this single crystal, a sublimation method is known. In this sublimation method, for example, a crucible provided with a lid, a crucible body, and a guide member (sealing part) is used (for example, see Patent Document 1). ).

特開2004−352590号公報JP 2004-352590 A

しかしながら、特許文献1に記載された坩堝では、以下のような問題点があった。すなわち、ガイド部材の中央部および下部の周囲には誘導加熱コイルが巻回されていないため、ガイド部材の中央部および下部が低温になりやすい。この場合、昇華用原料から発生する昇華ガスが、坩堝の他の部分よりも低温になったガイド部材の中央部および下部の内面に堆積して多結晶を形成するため、単結晶の成長が妨げられるという問題があった。   However, the crucible described in Patent Document 1 has the following problems. That is, since the induction heating coil is not wound around the central portion and the lower portion of the guide member, the central portion and the lower portion of the guide member are likely to become low temperature. In this case, the sublimation gas generated from the sublimation raw material is deposited on the inner surface of the central part and the lower part of the guide member, which is lower in temperature than the other parts of the crucible, to form a polycrystal, thus preventing the growth of the single crystal There was a problem of being.

そこで、本発明の目的は、ガイド部材において低温となる部位を低減することにより、種結晶からの単結晶を効率的に成長させることができる炭化ケイ素単結晶の製造装置を提供することにある。   Accordingly, an object of the present invention is to provide an apparatus for producing a silicon carbide single crystal capable of efficiently growing a single crystal from a seed crystal by reducing a portion of the guide member that has a low temperature.

前述した課題を解決するため、本発明は次のような特徴を有している。本発明の第1の特徴は、昇華用原料(昇華用原料15)を収容する坩堝本体(坩堝本体5)、および、前記昇華用原料に対向した位置に種結晶(種結晶23)を取り付ける蓋体(蓋体3)を有する坩堝(坩堝9)と、前記蓋体から昇華用原料に向けて筒状に延びるガイド部材(ガイド部材7)と、前記坩堝本体の外周側に配設した加熱手段(加熱部13)と、を備えた炭化ケイ素単結晶の製造装置(炭化ケイ素単結晶の製造装置1)であって、前記ガイド部材の高さをH1、前記加熱手段と前記ガイド部材との高さ方向で重複する高さ寸法をH2とした場合に、H2=(0.5〜1.0)×H1である。   In order to solve the above-described problems, the present invention has the following features. The first feature of the present invention is that a crucible body (crucible body 5) containing a sublimation raw material (sublimation raw material 15) and a lid for attaching a seed crystal (seed crystal 23) at a position facing the sublimation raw material. A crucible (crucible 9) having a body (lid 3), a guide member (guide member 7) extending in a cylindrical shape from the lid toward the sublimation raw material, and heating means disposed on the outer peripheral side of the crucible body (Heating unit 13), a silicon carbide single crystal manufacturing apparatus (silicon carbide single crystal manufacturing apparatus 1), wherein the height of the guide member is H1, and the height of the heating means and the guide member When the height dimension overlapping in the vertical direction is H2, H2 = (0.5 to 1.0) × H1.

まず、H2=(0.5〜1.0)×H1は、ガイド部材の半分以上の部位の外周に加熱手段が配置されることを意味する。これによって、ガイド部材の大部分は高温となり、ガイド部材の内壁面から多結晶が成長することを抑制することができる。従って、良質な単結晶を確実に成長させることができる。   First, H2 = (0.5 to 1.0) × H1 means that the heating means is disposed on the outer periphery of more than half of the guide member. As a result, most of the guide member becomes high temperature, and it is possible to suppress the growth of polycrystals from the inner wall surface of the guide member. Therefore, a good quality single crystal can be reliably grown.

本発明の第2の特徴は、前記種結晶(種結晶23)から成長する単結晶(単結晶39)について所望する成長高さをH3とする場合に、H2>H3であることを要旨とする。ここで、所望する成長高さとは、成長完了後の種結晶の高さである。   The second feature of the present invention is summarized as H2> H3, where H3 is a desired growth height for the single crystal (single crystal 39) grown from the seed crystal (seed crystal 23). . Here, the desired growth height is the height of the seed crystal after the growth is completed.

本発明に係る炭化ケイ素単結晶の製造装置によれば、ガイド部材において低温となる部位を低減することにより、種結晶からの単結晶を効率的に成長させることができる。   According to the silicon carbide single crystal manufacturing apparatus according to the present invention, it is possible to efficiently grow a single crystal from a seed crystal by reducing a portion of the guide member that has a low temperature.

本発明の実施形態に係る炭化ケイ素単結晶の製造装置を示す断面図である。It is sectional drawing which shows the manufacturing apparatus of the silicon carbide single crystal which concerns on embodiment of this invention. 比較例に係る炭化ケイ素単結晶の製造装置を示す断面図である。It is sectional drawing which shows the manufacturing apparatus of the silicon carbide single crystal which concerns on a comparative example.

以下、本発明の実施の形態に係る炭化ケイ素単結晶の製造装置の詳細を図面に基づいて説明する。具体的には、(1)炭化ケイ素単結晶の製造装置の全体構成、(2)比較例に係る炭化ケイ素単結晶の製造装置の全体構成、(3)作用効果、(4)その他の実施形態について説明する。図面は模式的なものであり、各材料層の厚みやその比率などは現実のものとは異なることに留意すべきである。したがって、具体的な厚みや寸法は以下の説明を参酌して判断すべきものである。図面相互間においても互いの寸法の関係や比率が異なる部分が含まれている。   Hereinafter, details of an apparatus for producing a silicon carbide single crystal according to an embodiment of the present invention will be described with reference to the drawings. Specifically, (1) the entire configuration of the silicon carbide single crystal manufacturing apparatus, (2) the entire configuration of the silicon carbide single crystal manufacturing apparatus according to the comparative example, (3) operational effects, (4) other embodiments Will be described. It should be noted that the drawings are schematic, and the thicknesses and ratios of the material layers are different from actual ones. Therefore, specific thicknesses and dimensions should be determined in consideration of the following description. Also included in the drawings are portions having different dimensional relationships and ratios.

(1)炭化ケイ素単結晶の製造装置の全体構成
まず、第1の実施形態に係る炭化ケイ素単結晶の製造装置1の全体構成について図1を用いて説明する。図1は、本発明の第1の実施形態に係る炭化ケイ素単結晶の製造装置1を示す断面図である。
(1) Overall Configuration of Silicon Carbide Single Crystal Manufacturing Device First, the overall configuration of the silicon carbide single crystal manufacturing device 1 according to the first embodiment will be described with reference to FIG. FIG. 1 is a cross-sectional view showing a silicon carbide single crystal manufacturing apparatus 1 according to a first embodiment of the present invention.

この製造装置1は、蓋体3、坩堝本体5、およびガイド部材7を有する坩堝9と、該坩堝9の外周を覆う石英管11と、該石英管11の外周側に巻回された加熱部13と、を備えている。   The manufacturing apparatus 1 includes a crucible 9 having a lid 3, a crucible body 5, and a guide member 7, a quartz tube 11 covering the outer periphery of the crucible 9, and a heating unit wound around the outer periphery of the quartz tube 11. 13.

坩堝本体5は、上端部が開口されて、この開口が蓋体3によって塞がれており、材質は黒鉛から形成されている。底部には、炭化ケイ素の粉体からなる昇華用原料15が収容されており、下部に取り付けられた支持棒17によって支持されている。なお、昇華用原料15が加熱されると、昇華ガスGが発生し、ガイド部材7によって種結晶23に導かれる。   The crucible body 5 is opened at the upper end, and the opening is closed by the lid 3 and is made of graphite. A sublimation raw material 15 made of silicon carbide powder is accommodated at the bottom and supported by a support rod 17 attached to the lower part. When the sublimation raw material 15 is heated, a sublimation gas G is generated and guided to the seed crystal 23 by the guide member 7.

蓋体3は、坩堝本体5の上端部の開口を封鎖するように、坩堝本体5の上端部のねじ部に螺合されており、材質は黒鉛から形成されている。蓋体3の下面19の中央部には、下方に突出する円盤状の台座21(種結晶取付部)が形成されている。この台座21の下面に、炭化ケイ素からなる円盤状の種結晶23が取り付けられる。   The lid 3 is screwed into a threaded portion at the upper end of the crucible body 5 so as to seal the opening at the upper end of the crucible body 5, and is made of graphite. A disc-shaped pedestal 21 (seed crystal attachment portion) that protrudes downward is formed at the center of the lower surface 19 of the lid 3. A disk-shaped seed crystal 23 made of silicon carbide is attached to the lower surface of the pedestal 21.

加熱部13は、石英管11および該石英管11に覆われた坩堝9の全体の外周側に螺旋状に巻回されている。加熱部13は、上側に配置された上側誘導加熱コイル25と、下側に配置された下側誘導加熱コイル27と、これらの上側誘導加熱コイル25および下側誘導加熱コイル27の間に配置された干渉防止コイル29とからなる。   The heating unit 13 is spirally wound around the outer peripheral side of the quartz tube 11 and the entire crucible 9 covered with the quartz tube 11. The heating unit 13 is disposed between the upper induction heating coil 25 disposed on the upper side, the lower induction heating coil 27 disposed on the lower side, and the upper induction heating coil 25 and the lower induction heating coil 27. And an interference preventing coil 29.

上側誘導加熱コイル25は、蓋体3、台座21、およびガイド部材7の高さ位置に対応して配置されており、下側誘導加熱コイル27は、昇華用原料15の高さ位置に対応して配置されている。また、上側誘導加熱コイル25は本実施形態では4回巻回されており、上側から第1コイル31、第2コイル33、第3コイル35、第4コイル37とする。図1に示すように、第1コイル31は蓋体3の高さ位置に配置され、第2コイル33はガイド部材7の上端部の高さ位置に対応し、第3コイル35は単結晶39の下端部の高さ位置に対応し、第4コイル37はガイド部材7の下部の高さ位置に対応している。 The upper induction heating coil 25 is arranged corresponding to the height positions of the lid 3, the base 21 and the guide member 7, and the lower induction heating coil 27 corresponds to the height position of the sublimation raw material 15. Are arranged. In addition, the upper induction heating coil 25 is wound four times in the present embodiment, and is referred to as a first coil 31, a second coil 33, a third coil 35, and a fourth coil 37 from the upper side. As shown in FIG. 1, the first coil 31 is disposed at the height position of the lid 3, the second coil 33 corresponds to the height position of the upper end portion of the guide member 7, and the third coil 35 is a single crystal 39. The fourth coil 37 corresponds to the height position of the lower portion of the guide member 7.

ここで、ガイド部材7は、蓋体3の下面19に位置する上端41から下方に延びる円筒状の上端部43と、該上端部43の下端から斜め下方に拡径する筒状の本体部45とから構成されている。そして、上端部43の上端41から本体部45の下端47までの高さH1がガイド部材7の高さH1となっている。なお、坩堝本体5の上側内壁面51と下側内壁面53との境界部に形成された段差にガイド部材7の下端47が係止されている。   Here, the guide member 7 includes a cylindrical upper end portion 43 extending downward from the upper end 41 located on the lower surface 19 of the lid 3, and a cylindrical main body portion 45 whose diameter is increased obliquely downward from the lower end of the upper end portion 43. It consists of and. The height H1 from the upper end 41 of the upper end portion 43 to the lower end 47 of the main body portion 45 is the height H1 of the guide member 7. The lower end 47 of the guide member 7 is locked to a step formed at the boundary between the upper inner wall surface 51 and the lower inner wall surface 53 of the crucible body 5.

一方、ガイド部材7と上側誘導加熱コイル25との高さ方向で重複する高さ寸法はH2である。このH2は、第2コイル33の上端から第4コイル37の下端までの上下距離と一致する。さらに、単結晶39の所望する成長高さをH3とすると、これらのH1,H2,H3の間には、H2=(0.5〜1.0)×H1およびH2>H3の大小関係が成立する。ここで、所望する成長高さとは、成長完了後の種結晶の高さを示し、製品のサイズによって決まる。   On the other hand, the height dimension overlapping in the height direction between the guide member 7 and the upper induction heating coil 25 is H2. This H2 coincides with the vertical distance from the upper end of the second coil 33 to the lower end of the fourth coil 37. Further, assuming that the desired growth height of the single crystal 39 is H3, a magnitude relationship of H2 = (0.5 to 1.0) × H1 and H2> H3 is established between these H1, H2, and H3. To do. Here, the desired growth height indicates the height of the seed crystal after completion of the growth, and is determined by the size of the product.

H2=(0.5〜1.0)×H1は、ガイド部材7の半分以上の部位の外周に上側誘導加熱コイル25が配置されることを意味する。なお、H2=(0.8〜1.0)×H1が好ましい。また、H2>H3は、成長した単結晶39の高さ方向の全部位の外周に上側誘導加熱コイル25が配置されることを意味する。   H2 = (0.5 to 1.0) × H1 means that the upper induction heating coil 25 is arranged on the outer periphery of a half or more portion of the guide member 7. Note that H2 = (0.8 to 1.0) × H1 is preferable. Further, H2> H3 means that the upper induction heating coil 25 is arranged on the outer periphery of all the height-wise portions of the grown single crystal 39.

(2)比較例に係る炭化ケイ素単結晶の製造装置101の全体構成
次いで、比較例に係る炭化ケイ素単結晶の製造装置101の全体構成を図2を用いて説明する。図2は、比較例に係る炭化ケイ素単結晶の製造装置101を示す断面図であり、図1と同一構成の部位には同一符号を付してその説明を省略する。
(2) Overall Configuration of Silicon Carbide Single Crystal Manufacturing Apparatus 101 According to Comparative Example Next, the overall configuration of the silicon carbide single crystal manufacturing apparatus 101 according to the comparative example will be described with reference to FIG. FIG. 2 is a cross-sectional view showing a silicon carbide single crystal manufacturing apparatus 101 according to a comparative example. Parts having the same configurations as those in FIG.

この比較例では、ガイド部材107の高さ(上端141から下端147までの上下距離)がh1であり、ガイド部材107と上側誘導加熱コイル125(加熱手段113)との高さ方向で重複する高さ寸法はh2である。また、単結晶39の所望する成長高さをh3とすると、h2はh1の0.5倍未満であり、h3はh2よりも小さくなっている。   In this comparative example, the height of the guide member 107 (vertical distance from the upper end 141 to the lower end 147) is h1, and overlaps in the height direction between the guide member 107 and the upper induction heating coil 125 (heating means 113). The size is h2. If the desired growth height of the single crystal 39 is h3, h2 is less than 0.5 times h1, and h3 is smaller than h2.

従って、ガイド部材107の上端部以外の大部分の外周には、上側誘導加熱コイル125が巻回されていないため、ガイド部材107の大部分は低温となり、ガイド部材107の内壁面から多結晶130が成長する。また、所望する成長高さh3よりもh2が小さいため、単結晶139の成長途中の時点から上側誘導加熱コイル125による加熱が弱まり、良質な単結晶を得ることができなくなる。   Accordingly, since the upper induction heating coil 125 is not wound around the outer periphery of most of the guide member 107 except for the upper end portion, most of the guide member 107 is cooled to a polycrystalline 130 from the inner wall surface of the guide member 107. Will grow. Further, since h2 is smaller than the desired growth height h3, heating by the upper induction heating coil 125 is weakened from the middle of the growth of the single crystal 139, and a high-quality single crystal cannot be obtained.

(3)作用・効果
実施形態に係る炭化ケイ素単結晶の製造装置1は、昇華用原料15を収容する坩堝本体5、および、前記昇華用原料15に対向した位置に種結晶23を取り付ける蓋体3を有する坩堝9と、前記蓋体3から昇華用原料15に向けて筒状に延びるガイド部材7と、前記坩堝本体5の外周側に配設した加熱部13と、を備えた炭化ケイ素単結晶の製造装置1であって、前記ガイド部材7の高さをH1、前記加熱部13と前記ガイド部材7との高さ方向で重複する高さ寸法をH2とした場合に、H2=(0.5〜1.0)×H1である。
(3) Action / Effect The silicon carbide single crystal manufacturing apparatus 1 according to the embodiment includes a crucible body 5 that houses a sublimation raw material 15, and a lid that attaches a seed crystal 23 to a position facing the sublimation raw material 15. 3, a guide member 7 extending in a cylindrical shape from the lid 3 toward the sublimation raw material 15, and a heating unit 13 disposed on the outer peripheral side of the crucible body 5. In the crystal manufacturing apparatus 1, when the height of the guide member 7 is H1, and the height dimension overlapping in the height direction of the heating unit 13 and the guide member 7 is H2, H2 = (0 0.5-1.0) × H1.

まず、H2=(0.5〜1.0)×H1は、ガイド部材7の半分以上の部位の外周に加熱部13である上側誘導加熱コイル25が配置されることを意味する。これによって、ガイド部材7の大部分は高温となり、ガイド部材7の内壁面から多結晶130が成長することを抑制することができる。従って、良質な単結晶39を確実に成長させることができる。   First, H2 = (0.5 to 1.0) × H1 means that the upper induction heating coil 25 that is the heating unit 13 is disposed on the outer periphery of a portion that is half or more of the guide member 7. Thereby, most of the guide member 7 becomes a high temperature, and it is possible to suppress the growth of the polycrystal 130 from the inner wall surface of the guide member 7. Therefore, the high-quality single crystal 39 can be reliably grown.

また、前記種結晶23から成長する単結晶39について所望する成長高さをH3とする場合に、H2>H3である。H2>H3は、成長した単結晶39の高さ方向の全部位の外周に加熱部13である上側誘導加熱コイル25が配置されることを意味する。従って、単結晶39の成長途中の時点から加熱部13による加熱が弱まることがなく、良質な単結晶39を得ることができる。   Further, when the desired growth height of the single crystal 39 grown from the seed crystal 23 is H3, H2> H3. H2> H3 means that the upper induction heating coil 25 serving as the heating unit 13 is arranged on the outer periphery of all the height-wise portions of the grown single crystal 39. Therefore, the heating by the heating unit 13 is not weakened from the time point during the growth of the single crystal 39, and the high-quality single crystal 39 can be obtained.

(4)その他の実施形態
なお、前述した実施の形態の開示の一部をなす論述および図面はこの発明を限定するものであると理解すべきではない。この開示から当業者には様々な代替実施の形態、実施例および運用技術が明らかとなろう。
(4) Other Embodiments It should not be understood that the descriptions and drawings constituting a part of the disclosure of the above-described embodiments limit the present invention. From this disclosure, various alternative embodiments, examples and operational techniques will be apparent to those skilled in the art.

本実施形態においては、蓋体3の裏面に下方に突出する台座21を設けた場合を説明したが、これに限定されず、蓋体3の裏面自体(下方に突出していない面一状)を台座として使用する場合にも本発明が適用可能である。   In this embodiment, although the case where the base 21 which protrudes below was provided in the back surface of the cover body 3 was demonstrated, it is not limited to this, The back surface itself (surface shape which does not protrude below) of the cover body 3 is used. The present invention is also applicable when used as a pedestal.

このように、本発明は、ここでは記載していない様々な実施の形態などを含むことは勿論である。したがって、本発明の技術的範囲は、上述の説明から妥当な特許請求の範囲に係る発明特定事項によってのみ定められるものである。   As described above, the present invention naturally includes various embodiments that are not described herein. Therefore, the technical scope of the present invention is defined only by the invention specifying matters according to the scope of claims reasonable from the above description.

1…炭化ケイ素単結晶の製造装置、 3…蓋体、 5…坩堝本体、 7…ガイド部材、 9…坩堝、 13…加熱手段、15…昇華用原料、 23…種結晶、 25…上側誘導加熱コイル(加熱手段)、 39…単結晶   DESCRIPTION OF SYMBOLS 1 ... Manufacturing apparatus of a silicon carbide single crystal, 3 ... Cover, 5 ... Crucible body, 7 ... Guide member, 9 ... Crucible, 13 ... Heating means, 15 ... Sublimation raw material, 23 ... Seed crystal, 25 ... Upper induction heating Coil (heating means), 39 ... single crystal

Claims (1)

昇華用原料を収容する坩堝本体、および前記昇華用原料に対向した位置に種結晶を取り付ける台座が形成された蓋体を有する坩堝と、前記蓋体から前記昇華用原料に向けて筒状に延びるガイド部材と、前記坩堝本体の外周側に配設した加熱手段とを備えた炭化ケイ素単結晶の製造装置であって、
前記加熱手段は、上側に配置された上側誘導加熱コイルと、下側に配置された下側誘導加熱コイルと、前記上側誘導加熱コイルと前記下側誘導加熱コイルの間に配置された干渉防止コイルとからなっており、
前記上側誘導加熱コイルは、前記蓋体、前記台座、および前記ガイド部材の高さ位置に対応して配置され、
前記ガイド部材の高さをH1、前記上側誘電加熱コイルと前記ガイド部材との高さ方向で重複する高さ寸法をH2とした場合に、H2=(0.8〜1.0)×H1であり、
前記下側誘導加熱コイルと前記干渉防止コイルは、前記ガイド部材と高さ方向で重複しない位置にあり、
前記種結晶から成長する単結晶について所望する成長高さをH3とする場合に、H2>H3であることを特徴とする炭化ケイ素単結晶の製造装置。
A crucible body containing a sublimation raw material, a crucible having a lid on which a pedestal for attaching a seed crystal is formed at a position facing the sublimation raw material, and a cylinder extending from the lid toward the sublimation raw material An apparatus for producing a silicon carbide single crystal comprising a guide member and heating means disposed on the outer peripheral side of the crucible body,
The heating means includes an upper induction heating coil disposed on the upper side, a lower induction heating coil disposed on the lower side, and an interference preventing coil disposed between the upper induction heating coil and the lower induction heating coil. And consists of
The upper induction heating coil is disposed corresponding to the height position of the lid, the pedestal, and the guide member,
When the height of the guide member is H1 and the height dimension overlapping in the height direction of the upper dielectric heating coil and the guide member is H2, H2 = ( 0.8 to 1.0) × H1 Yes,
The lower induction heating coil and the interference prevention coil are in positions that do not overlap with the guide member in the height direction ,
An apparatus for producing a silicon carbide single crystal , wherein H2> H3, where H3 is a desired growth height of the single crystal grown from the seed crystal .
JP2010059700A 2010-03-16 2010-03-16 Silicon carbide single crystal manufacturing equipment Active JP5536501B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010059700A JP5536501B2 (en) 2010-03-16 2010-03-16 Silicon carbide single crystal manufacturing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010059700A JP5536501B2 (en) 2010-03-16 2010-03-16 Silicon carbide single crystal manufacturing equipment

Publications (2)

Publication Number Publication Date
JP2011190157A JP2011190157A (en) 2011-09-29
JP5536501B2 true JP5536501B2 (en) 2014-07-02

Family

ID=44795465

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010059700A Active JP5536501B2 (en) 2010-03-16 2010-03-16 Silicon carbide single crystal manufacturing equipment

Country Status (1)

Country Link
JP (1) JP5536501B2 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5985024A (en) * 1997-12-11 1999-11-16 Northrop Grumman Corporation Method and apparatus for growing high purity single crystal silicon carbide
JP4708746B2 (en) * 2004-09-02 2011-06-22 株式会社ブリヂストン Method and apparatus for producing silicon carbide single crystal
JP2007204309A (en) * 2006-02-01 2007-08-16 Matsushita Electric Ind Co Ltd Single crystal growth device and single crystal growth method

Also Published As

Publication number Publication date
JP2011190157A (en) 2011-09-29

Similar Documents

Publication Publication Date Title
EP2524978B1 (en) Apparatus for producing silicon carbide single crystal
JP5271601B2 (en) Single crystal manufacturing apparatus and manufacturing method
JP2002060297A (en) Apparatus and method for growing single crystal
WO2010114008A1 (en) Device for producing single crystal of silicon carbide
JP5240100B2 (en) Silicon carbide single crystal manufacturing equipment
JP5012655B2 (en) Single crystal growth equipment
JP2011190129A (en) Apparatus for manufacturing silicon carbide single crystal
JP2011184208A (en) Apparatus and method for producing silicon carbide single crystal
JP4459211B2 (en) Single crystal growth apparatus and growth method
JP2010076991A (en) Manufacturing apparatus for silicon carbide single crystal and manufacturing method of silicon carbide single crystal
JP5397503B2 (en) Single crystal growth equipment
JP2012036035A (en) Method for manufacturing silicon carbide single crystal
JP2010076990A (en) Manufacturing apparatus for silicon carbide single crystal and manufacturing method of silicon carbide single crystal
JP5536501B2 (en) Silicon carbide single crystal manufacturing equipment
JP5516167B2 (en) Silicon carbide single crystal manufacturing equipment
JP2012254892A (en) Manufacturing method and manufacturing device for single crystal
JP2006327879A (en) Method for manufacturing compound semiconductor single crystal
JP2006290685A (en) Method for producing silicon carbide single crystal
JP5831339B2 (en) Method for producing silicon carbide single crystal
JP2010180117A (en) Apparatus for manufacturing silicon carbide single crystal
JP2010248029A (en) Production apparatus for silicon carbide single crystal
WO2022004703A1 (en) METHOD FOR PRODUCING SiC CRYSTALS
JP2011051824A (en) Single crystal producing apparatus
WO2022045291A1 (en) Sic polycrystal manufacturing method
KR100888221B1 (en) Heat shielding member and single crystal pulling equipment using the same

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20130205

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20130829

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20130905

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20131015

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20131210

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140107

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140310

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20140401

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20140424

R150 Certificate of patent or registration of utility model

Ref document number: 5536501

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313111

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350