JP5367036B2 - 有機またはポリマー固体試料の放電発光分光分析による測定方法 - Google Patents

有機またはポリマー固体試料の放電発光分光分析による測定方法 Download PDF

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JP5367036B2
JP5367036B2 JP2011206800A JP2011206800A JP5367036B2 JP 5367036 B2 JP5367036 B2 JP 5367036B2 JP 2011206800 A JP2011206800 A JP 2011206800A JP 2011206800 A JP2011206800 A JP 2011206800A JP 5367036 B2 JP5367036 B2 JP 5367036B2
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discharge
plasma
emission
sample
measurement
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JP2012068247A (ja
JP2012068247A5 (enExample
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パトリック シャポン
アニエス タンペ
セリア オリヴロ
タツヒト ナカムラ
ヒロコ ナカムラ
アキラ フジモト
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Horiba Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/68—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using high frequency electric fields

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  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2011206800A 2010-09-24 2011-09-22 有機またはポリマー固体試料の放電発光分光分析による測定方法 Active JP5367036B2 (ja)

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Application Number Priority Date Filing Date Title
FR1057722A FR2965355B1 (fr) 2010-09-24 2010-09-24 Procede de mesure par spectrometrie de decharge luminescente d'un echantillon solide organique ou polymere
FR1057722 2010-09-24

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JP2013187504A Division JP5427313B2 (ja) 2010-09-24 2013-09-10 固体試料の放電発光分光分析による測定方法

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JP2012068247A JP2012068247A (ja) 2012-04-05
JP2012068247A5 JP2012068247A5 (enExample) 2013-08-01
JP5367036B2 true JP5367036B2 (ja) 2013-12-11

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JP2011206800A Active JP5367036B2 (ja) 2010-09-24 2011-09-22 有機またはポリマー固体試料の放電発光分光分析による測定方法
JP2013187504A Active JP5427313B2 (ja) 2010-09-24 2013-09-10 固体試料の放電発光分光分析による測定方法
JP2013248023A Active JP5643892B2 (ja) 2010-09-24 2013-11-29 固体試料の放電発光分光分析による測定装置

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JP2013248023A Active JP5643892B2 (ja) 2010-09-24 2013-11-29 固体試料の放電発光分光分析による測定装置

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EP (1) EP2434275B1 (enExample)
JP (3) JP5367036B2 (enExample)
FR (1) FR2965355B1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016083717A1 (fr) 2014-11-26 2016-06-02 Horiba Jobin Yvon Sas Procédé d'analyse d'un échantillon solide par spectrométrie de masse à temps de vol

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0657876B2 (ja) 1984-10-15 1994-08-03 日本カ−ボン株式会社 電気炉用黒鉛電極の製造方法
JP6042772B2 (ja) * 2013-05-20 2016-12-14 日本電信電話株式会社 金属部材に対する水素侵入特性評価方法
FR3019298B1 (fr) * 2014-03-31 2016-04-15 Horiba Jobin Yvon Sas Procede et appareil de mesure d'un echantillon solide organique par spectrometrie de decharge luminescente
TWI636253B (zh) * 2017-01-05 2018-09-21 富蘭登科技股份有限公司 一種應用光譜儀來量測氣體解離狀態的量測裝置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2038518C (en) * 1990-03-19 1998-06-23 Tetsuya Mega Glow discharge atomic emission spectroscopy and apparatus thereof
JP3170170B2 (ja) * 1995-02-02 2001-05-28 理学電機工業株式会社 グロー放電発光分光分析方法およびそれに用いる装置
US6040248A (en) * 1998-06-24 2000-03-21 Taiwan Semiconductor Manufacturing Company Chemistry for etching organic low-k materials
US6174800B1 (en) * 1998-09-08 2001-01-16 Taiwan Semiconductor Manufacturing Company Via formation in a poly(arylene ether) inter metal dielectric layer
JP2001004547A (ja) * 1999-06-21 2001-01-12 Horiba Ltd グロー放電分析装置
US6900139B1 (en) * 2002-04-30 2005-05-31 Advanced Micro Devices, Inc. Method for photoresist trim endpoint detection
JP3996817B2 (ja) * 2002-08-27 2007-10-24 株式会社堀場製作所 グロー放電分析装置およびグロー放電分析装置の分析結果表示方法
US7129159B2 (en) * 2004-08-17 2006-10-31 International Business Machines Corporation Integrated dual damascene RIE process with organic patterning layer
FR2926161B1 (fr) * 2008-01-04 2012-02-10 Horiba Jobin Yvon Sas Source magnetron pour spectrometre a decharge luminescente.
FR2942071B1 (fr) * 2009-02-11 2011-04-08 Horiba Jobin Yvon Sas Lampe a decharge pour gds a champ magnetique axial

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016083717A1 (fr) 2014-11-26 2016-06-02 Horiba Jobin Yvon Sas Procédé d'analyse d'un échantillon solide par spectrométrie de masse à temps de vol

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Publication number Publication date
JP2012068247A (ja) 2012-04-05
FR2965355A1 (fr) 2012-03-30
FR2965355B1 (fr) 2013-05-10
JP2014013251A (ja) 2014-01-23
JP5427313B2 (ja) 2014-02-26
EP2434275A1 (fr) 2012-03-28
JP2014066722A (ja) 2014-04-17
EP2434275B1 (fr) 2016-12-28
JP5643892B2 (ja) 2014-12-17

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