JP5342474B2 - 精密機器 - Google Patents
精密機器 Download PDFInfo
- Publication number
- JP5342474B2 JP5342474B2 JP2010040053A JP2010040053A JP5342474B2 JP 5342474 B2 JP5342474 B2 JP 5342474B2 JP 2010040053 A JP2010040053 A JP 2010040053A JP 2010040053 A JP2010040053 A JP 2010040053A JP 5342474 B2 JP5342474 B2 JP 5342474B2
- Authority
- JP
- Japan
- Prior art keywords
- low
- history display
- martensitic transformation
- temperature history
- thermal expansion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/12—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance
- G01K11/125—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance using changes in reflectance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/06—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using melting, freezing, or softening
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/13—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by measuring the force required to restore a proofmass subjected to inertial forces to a null position
- G01P15/132—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by measuring the force required to restore a proofmass subjected to inertial forces to a null position with electromagnetic counterbalancing means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K2203/00—Application of thermometers in cryogenics
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Gyroscopes (AREA)
Description
Tm3≒Tm2−30 (℃)
図9は予め低温に晒し、マルテンサイト変態が発生したものを比較サンプル51として、マルテンサイト変態が発生していない材料52と共に配列した低温履歴表示板50を示したものであり、このように比較サンプル51を取り付けておけば、どのような針状の組織が出現するかの比較対象となり、判定を容易に行うことができる。
Claims (4)
- 低温においてマルテンサイト変態を生じる低熱膨張材料を機器内部に使用している精密機器であって、
前記低熱膨張材料と同一の材料によって形成され、表面が鏡面研磨された低温履歴表示板を前記機器の外面に備えていることを特徴とする精密機器。 - 低温においてマルテンサイト変態を生じる低熱膨張材料を機器内部に使用している精密機器であって、
マルテンサイト変態温度が異なる複数の材料によって形成され、表面が鏡面研磨された低温履歴表示板を前記機器の外面に備えていることを特徴とする精密機器。 - 請求項1又は2記載の精密機器において、
前記鏡面研磨された表面に透明樹脂コーティングが施されていることを特徴とする精密機器。 - 請求項1又は2記載の精密機器において、
前記低温履歴表示板は前記鏡面研磨された表面が前記機器の外面に向く内向きとされて前記機器の外面に取り付けられていることを特徴とする精密機器。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010040053A JP5342474B2 (ja) | 2010-02-25 | 2010-02-25 | 精密機器 |
US13/013,362 US8490570B2 (en) | 2010-02-25 | 2011-01-25 | Precision apparatus using low thermal expansion component |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010040053A JP5342474B2 (ja) | 2010-02-25 | 2010-02-25 | 精密機器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011174854A JP2011174854A (ja) | 2011-09-08 |
JP5342474B2 true JP5342474B2 (ja) | 2013-11-13 |
Family
ID=44475396
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010040053A Expired - Fee Related JP5342474B2 (ja) | 2010-02-25 | 2010-02-25 | 精密機器 |
Country Status (2)
Country | Link |
---|---|
US (1) | US8490570B2 (ja) |
JP (1) | JP5342474B2 (ja) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8905635B2 (en) * | 2011-09-30 | 2014-12-09 | Honeywell International Inc. | Temperature sensor attachment facilitating thermal conductivity to a measurement point and insulation from a surrounding environment |
ITMI20120273A1 (it) * | 2012-02-24 | 2013-08-25 | Getters Spa | Etichetta termosensibile |
GB201318872D0 (en) * | 2013-10-25 | 2013-12-11 | Rolls Royce Plc | Temperature indicator |
JP6483292B2 (ja) * | 2016-02-15 | 2019-03-13 | 株式会社日立製作所 | 探査システムおよびその診断方法 |
WO2018034016A1 (ja) * | 2016-08-16 | 2018-02-22 | アルプス電気株式会社 | 発音装置 |
CN106443064B (zh) * | 2016-11-28 | 2019-03-29 | 上海航天精密机械研究所 | 低温加速度测量与校准方法 |
WO2020195405A1 (ja) | 2019-03-26 | 2020-10-01 | 日本鋳造株式会社 | 低温安定性に優れる低熱膨張合金およびその製造方法 |
KR102345951B1 (ko) | 2019-03-26 | 2021-12-30 | 니폰추조 가부시키가이샤 | 저온 안정성이 우수한 저열팽창 합금 및 그의 제조 방법 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3182507A (en) * | 1960-11-30 | 1965-05-11 | Ilikon Corp | Thermal history gage |
SU409124A1 (ru) * | 1972-06-09 | 1973-11-30 | Институт металлофизики Украинской ССР | Способ определения температурных точгк превра1!1,ений мартпнситиого типа |
SE428400B (sv) * | 1977-06-28 | 1983-06-27 | Inst Kib Akademii Nauk Uk Ssr | Sett att fran psendoeffekter serskilja ekta termiska fasomvandlingseffekter vid avkylning av en metall eller en metallegering, samt anordning for genomforande av settet |
SU1224615A1 (ru) * | 1984-06-21 | 1986-04-15 | Предприятие П/Я А-3697 | Способ измерени температуры |
SE460155B (sv) * | 1987-03-02 | 1989-09-11 | Alfa Laval Licens Ab | Saett foer bestaemning av temperatur-tid-foerloppet under fasomvandling |
US5088825A (en) * | 1989-12-27 | 1992-02-18 | Honeywell Inc. | Housing and support assembly for ring laser gyroscope |
JP3331995B2 (ja) | 1998-11-27 | 2002-10-07 | 株式会社村田製作所 | 貫通孔を有する金属物品およびその製造方法 |
JP2001011580A (ja) | 1999-07-02 | 2001-01-16 | Shin-Hokoku Steel Corp | 低温安定型Ni−Co−Fe系低熱膨張合金 |
JP2001192777A (ja) * | 1999-10-21 | 2001-07-17 | Hitachi Metals Ltd | 低熱膨張鋳造材 |
JP2001124715A (ja) | 1999-10-27 | 2001-05-11 | Sekisui Chem Co Ltd | 金属の変態観測装置及び方法 |
JP2003221650A (ja) * | 2001-11-22 | 2003-08-08 | Shin-Hokoku Steel Corp | 快削性に富む低温安定型低熱膨張合金 |
JP3740155B2 (ja) * | 2004-06-25 | 2006-02-01 | 株式会社神戸製鋼所 | 溶接金属部のアシキュラーフェライト変態率を予測する方法、及び該アシキュラーフェライトの形態予測方法 |
US7100447B2 (en) * | 2004-12-07 | 2006-09-05 | Honeywell International Inc. | Super Invar magnetic return path for high performance accelerometers |
JP4494425B2 (ja) | 2007-02-15 | 2010-06-30 | 日本航空電子工業株式会社 | リングレーザージャイロ |
US20090120106A1 (en) * | 2007-11-12 | 2009-05-14 | Milton Chin | Temperature Alert Device for Cryopreservation |
JP5906005B2 (ja) * | 2010-03-25 | 2016-04-20 | 株式会社Ihi | 熱処理方法 |
US8920023B2 (en) * | 2010-08-06 | 2014-12-30 | Victor Sloan | Cryogenic non destructive testing (NDT) and material treatment |
-
2010
- 2010-02-25 JP JP2010040053A patent/JP5342474B2/ja not_active Expired - Fee Related
-
2011
- 2011-01-25 US US13/013,362 patent/US8490570B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2011174854A (ja) | 2011-09-08 |
US20110203511A1 (en) | 2011-08-25 |
US8490570B2 (en) | 2013-07-23 |
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