JP5307117B2 - Copper surface treatment agent and surface treatment method - Google Patents

Copper surface treatment agent and surface treatment method Download PDF

Info

Publication number
JP5307117B2
JP5307117B2 JP2010501865A JP2010501865A JP5307117B2 JP 5307117 B2 JP5307117 B2 JP 5307117B2 JP 2010501865 A JP2010501865 A JP 2010501865A JP 2010501865 A JP2010501865 A JP 2010501865A JP 5307117 B2 JP5307117 B2 JP 5307117B2
Authority
JP
Japan
Prior art keywords
surface treatment
copper
agent
treatment agent
copper foil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2010501865A
Other languages
Japanese (ja)
Other versions
JPWO2009110364A1 (en
Inventor
俊雄 印部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Paint Co Ltd
Nippon Paint Holdings Co Ltd
Original Assignee
Nippon Paint Co Ltd
Nippon Paint Holdings Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Paint Co Ltd, Nippon Paint Holdings Co Ltd filed Critical Nippon Paint Co Ltd
Priority to JP2010501865A priority Critical patent/JP5307117B2/en
Publication of JPWO2009110364A1 publication Critical patent/JPWO2009110364A1/en
Application granted granted Critical
Publication of JP5307117B2 publication Critical patent/JP5307117B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/38Improvement of the adhesion between the insulating substrate and the metal
    • H05K3/389Improvement of the adhesion between the insulating substrate and the metal by the use of a coupling agent, e.g. silane
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C22/00Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
    • C23C22/05Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using aqueous solutions
    • C23C22/06Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using aqueous solutions using aqueous acidic solutions with pH less than 6
    • C23C22/48Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using aqueous solutions using aqueous acidic solutions with pH less than 6 not containing phosphates, hexavalent chromium compounds, fluorides or complex fluorides, molybdates, tungstates, vanadates or oxalates
    • C23C22/52Treatment of copper or alloys based thereon
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C2222/00Aspects relating to chemical surface treatment of metallic material by reaction of the surface with a reactive medium
    • C23C2222/20Use of solutions containing silanes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical Treatment Of Metals (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Preventing Corrosion Or Incrustation Of Metals (AREA)

Abstract

Provided is a copper surface treatment agent comprising a tin compound, a complexing agent, and a silane coupling agent, and a surface treatment method whereby a copper surface can be treated so as to achieve a smooth state without performing a roughing process such as etching and close adhesion between the copper and an insulating material such as a resin can be maintained, without increasing the number of processing steps.

Description

本発明は、銅の表面処理剤および表面処理方法、並びに、銅張り材料、多層配線基板および配線基板に関するものである。さらに詳しくは、銅の表面をエッチング等の粗化処理することなく平滑(フラット)な状態に処理することができる銅の表面処理剤および表面処理方法、並びに、上記表面処理方法により表面処理されてなる銅張り材料、多層配線基板および配線基板に関するものである。   The present invention relates to a copper surface treatment agent and a surface treatment method, a copper-clad material, a multilayer wiring board, and a wiring board. More specifically, the copper surface treatment agent and surface treatment method capable of treating the copper surface in a smooth (flat) state without roughening such as etching, and the surface treatment method are used. The present invention relates to a copper-clad material, a multilayer wiring board, and a wiring board.

従来、一般的な多層配線基板(ビルドアップ配線基板)は、表面部に銅からなる導電層を有する内層基板が樹脂等の絶縁材を挟んで他の内層基板と積層プレスされることにより製造されている。上記導電層間は、孔壁が銅メッキされたスルーホールと呼ばれる貫通孔により、電気的に接続されている。   Conventionally, a general multilayer wiring board (build-up wiring board) is manufactured by laminating and pressing an inner layer substrate having a conductive layer made of copper on the surface portion with another inner layer substrate with an insulating material such as resin interposed therebetween. ing. The conductive layers are electrically connected by a through hole called a through hole whose hole wall is plated with copper.

ここで、上記多層配線基板の配線として上記内層基板の表面部に用いられている銅には、樹脂等の絶縁材との密着性が要求されている。それゆえ、上記内層基板の表面部に用いられている銅の表面と、樹脂等の絶縁材との密着性を向上させるために、銅の表面処理が行われるのが一般的である。   Here, the copper used for the surface portion of the inner layer substrate as the wiring of the multilayer wiring substrate is required to have adhesiveness with an insulating material such as a resin. Therefore, in order to improve the adhesion between the copper surface used for the surface portion of the inner layer substrate and an insulating material such as a resin, a copper surface treatment is generally performed.

銅の表面処理方法としては、例えば、銅の表面を塩化銅、硫酸・過酸化水素等でエッチングして銅の表面を粗化させ、銅の表面に凹凸形状の酸化皮膜を付ける方法等が挙げられる。この方法によれば、凹凸形状の酸化皮膜が樹脂等の絶縁材にくい込み、アンカー効果を生じて、銅と樹脂等の絶縁材との密着性が向上する。銅と樹脂等の絶縁材との密着性を向上させるための他の方法として、粗化させた銅の表面を、スズ、シランカップリング剤等で処理する方法も開発されている(例えば、特許文献1〜3参照)。   Examples of the copper surface treatment method include a method of roughening the copper surface by etching the copper surface with copper chloride, sulfuric acid / hydrogen peroxide, etc., and attaching an uneven oxide film to the copper surface. It is done. According to this method, the concavo-convex-shaped oxide film is difficult to insulate with an insulating material such as a resin, and an anchor effect is produced, thereby improving the adhesion between copper and an insulating material such as a resin. As another method for improving the adhesion between copper and an insulating material such as a resin, a method of treating the roughened copper surface with tin, a silane coupling agent or the like has been developed (for example, a patent). References 1-3).

近年の電子機器・電子部品の小型化、薄型化等に対応するために、多層配線基板を薄くすることが要求されている。さらに、近年の電子機器・電子部品の高周波化、高密度化等に対応するために、多層配線基板の配線の微細化(ファイン化)が要求されている。   In order to cope with recent downsizing and thinning of electronic devices and electronic parts, it is required to make the multilayer wiring board thinner. Furthermore, in order to cope with the recent increase in frequency and density of electronic devices and electronic parts, it is required to make the wiring of the multilayer wiring board finer (finer).

また、上記多層配線基板の表面部に用いられている銅の表面が粗い場合には、該多層配線基板に表面電流が流れ、電気的損失や信号の遅延が生じるという問題がある。   Further, when the surface of copper used for the surface portion of the multilayer wiring board is rough, there is a problem that a surface current flows through the multilayer wiring board, resulting in electrical loss and signal delay.

そこで、上記のエッチング等の粗化処理を用いる方法に代わる方法として、内層基板の表面部に用いられている銅の表面に、スズメッキ等によりスズ皮膜を形成する方法が示されている(例えば、特許文献4参照)。さらに、銅と樹脂等の絶縁材との密着性を向上させるために、内層基板の表面部に用いられている銅の表面にスズメッキした後、硝酸、シランカップリング剤等で処理する方法が示されている(例えば、特許文献5〜9参照)。
日本国公開特許公報「特開平10−289838号公報(公開日:1998年10月27日)」 日本国公開特許公報「特開2000−340948号公報(公開日:2000年12月8日)」 日本国公開特許公報「特開平10−256736号公報(公開日:1998年9月25日)」 日本国公開特許公報「特開平4−233793号公報(公開日:1992年8月21日)」 日本国公開特許公報「特開2005−23301号公報(公開日:2005年1月27日)」 日本国公開特許公報「特開平1−109796号公報(公開日:1989年4月26日)」 日本国公開特許公報「特開平7−170064号公報(公開日:1995年7月4日)」 日本国公開特許公報「特許第3135516号公報(公開日:特開平10−46359号公報、1998年2月17日)」 日本国公開特許公報「特開2003−201585号公報(公開日:2003年7月18日)」
Therefore, as a method of replacing the method using the roughening treatment such as etching, a method of forming a tin film by tin plating or the like on the surface of copper used for the surface portion of the inner layer substrate is shown (for example, (See Patent Document 4). Furthermore, in order to improve the adhesion between copper and an insulating material such as resin, a method of treating with nitric acid, silane coupling agent, etc. after tin plating on the copper surface used for the surface part of the inner layer substrate is shown. (For example, see Patent Documents 5 to 9).
Japanese Patent Publication “Japanese Patent Laid-Open No. 10-289838 (Publication Date: October 27, 1998)” Japanese Patent Publication “JP 2000-340948 A (publication date: December 8, 2000)” Japanese Patent Publication “Japanese Patent Laid-Open No. 10-256736 (Publication Date: September 25, 1998)” Japanese Patent Publication “JP-A-4-233793 (Publication Date: August 21, 1992)” Japanese Patent Publication “Japanese Unexamined Patent Application Publication No. 2005-23301 (Publication Date: January 27, 2005)” Japanese Patent Publication “JP-A-1-109796 (Publication Date: April 26, 1989)” Japanese Patent Publication “Japanese Laid-Open Patent Publication No. 7-170064 (Publication Date: July 4, 1995)” Japanese Patent Publication “Japanese Patent No. 3135516 (Publication Date: JP 10-46359 A, Feb. 17, 1998)” Japanese Patent Publication “Japanese Patent Laid-Open No. 2003-201585 (Publication Date: July 18, 2003)”

しかしながら、上記特許文献1〜3に示される銅の表面処理方法では、いずれも性能、特に銅と樹脂等の絶縁材との密着性が不十分であるため、ほとんど実用化されていない。さらに、これらの方法では、粗化処理が銅を溶解するため銅幅が目減りし、これらの方法により表面処理された銅張り材料のファイン化が困難となり、かつ電気損失が大きくなる。さらに、これらの方法では、粗化処理後の経時変化に伴い酸化膜が成長するため不動態化が不十分となり、いずれも性能が劣化する。そのため、後処理としての防錆処理が一般的に行われている。   However, the copper surface treatment methods disclosed in Patent Documents 1 to 3 have hardly been put into practical use because the performance, particularly the adhesion between copper and an insulating material such as a resin, is insufficient. Furthermore, in these methods, since the roughening treatment dissolves copper, the copper width is reduced, and it becomes difficult to refine the copper-clad material surface-treated by these methods, and the electrical loss increases. Furthermore, in these methods, since an oxide film grows with a change with time after the roughening treatment, passivation becomes insufficient, and the performance deteriorates in all cases. Therefore, a rust prevention treatment as a post treatment is generally performed.

また、上記特許文献4に示される銅の表面処理方法では、銅の表面をエッチング等の粗化処理する方法と比較して、銅と樹脂等の絶縁材との密着性が十分ではないという問題点を有している。   In addition, the copper surface treatment method disclosed in Patent Document 4 has a problem that the adhesion between copper and an insulating material such as a resin is not sufficient as compared with a method of roughening the surface of copper such as etching. Has a point.

また、上記特許文献5〜9に示される銅の表面処理方法では、銅の表面にスズメッキした後、硝酸、シランカップリング剤等で処理するので、処理工程が増加する。さらに、これらの方法でも、銅の表面をエッチング等の粗化処理する方法と比較して、銅と樹脂等の絶縁材との十分な密着性を維持できないという問題点がある。   Moreover, in the copper surface treatment methods disclosed in Patent Documents 5 to 9, since the surface of the copper is tin-plated and then treated with nitric acid, a silane coupling agent, or the like, the number of treatment steps increases. Furthermore, these methods also have a problem that sufficient adhesion between copper and an insulating material such as a resin cannot be maintained as compared with a method of roughening the surface of copper such as etching.

本発明は、上記従来の問題点に鑑みなされたものであって、その目的は、処理工程を増加させることなく、銅の表面をエッチング等の粗化処理することなく平滑な状態に処理することができ、かつ銅と樹脂等の絶縁材との間の密着性を維持することができる銅の表面処理剤および表面処理方法を提供することにある。   The present invention has been made in view of the above-described conventional problems, and its purpose is to process the surface of copper in a smooth state without increasing the number of processing steps and without performing roughening treatment such as etching. An object of the present invention is to provide a copper surface treatment agent and a surface treatment method capable of maintaining adhesion between copper and an insulating material such as a resin.

本発明者は、上記課題に鑑み鋭意検討した結果、銅の表面処理に用いられる表面処理剤において、上記表面処理剤にスズ化合物と、錯化剤(キレート剤)と、シランカップリング剤とを含めることで、銅の表面にスズとシラン化合物とを化成一体化して共析出させ、銅と樹脂等の絶縁材との十分な密着性を維持することができることを独自に見出し、本発明を完成させるに至った。   As a result of intensive studies in view of the above problems, the present inventor, as a surface treatment agent used for copper surface treatment, contains a tin compound, a complexing agent (chelating agent), and a silane coupling agent in the surface treatment agent. Including the tin and the silane compound on the surface of copper and co-depositing them, it was found uniquely that it can maintain sufficient adhesion between copper and insulating materials such as resin, and the present invention was completed. I came to let you.

即ち、本発明の銅の表面処理剤は、上記課題を解決するために、スズ化合物と、錯化剤と、シランカップリング剤とを含有することを特徴としている。   That is, the copper surface treating agent of the present invention is characterized by containing a tin compound, a complexing agent, and a silane coupling agent in order to solve the above-mentioned problems.

上記の発明によれば、スズ化合物と、シランカップリング剤とが表面処理を行う際に共存しているので、銅の表面にスズ皮膜を形成しながらシラン化合物を析出(付着)させることができる。つまり、本発明の銅の表面処理剤は、銅の表面にスズ、および、シランカップリング剤単量体またはシランカップリング剤縮合体を共析出させることができる。それゆえ、樹脂等の絶縁材との密着性が良好なスズ皮膜、および、樹脂等の絶縁材との密着官能基を有するシラン化合物の双方の作用により、本発明の銅の表面処理剤は、銅と樹脂等の絶縁材との十分な密着性を付与することができる。さらに、本発明の銅の表面処理剤は、錯化剤を含有しているので、上記表面処理剤を溶液で用いた場合に、上記錯化剤が銅と錯体を形成して銅の表面の電位が低くなるため還元されやすく、スズが析出しやすくなる。さらに、上記表面処理剤の溶液は、上記錯化剤が溶解した銅のキレートをすることにより、スズ皮膜の均一性を向上させる可能性がある。さらに、上記表面処理剤にフッ素化合物を含めた場合には、上記表面処理剤の溶液ではスズイオンが遊離フッ素により安定化されると考えられ、上記表面処理剤の溶液をより一層濁りの少ない安定な溶液とすることができる。   According to the above invention, since the tin compound and the silane coupling agent coexist when the surface treatment is performed, the silane compound can be deposited (attached) while forming a tin film on the copper surface. . That is, the copper surface treating agent of the present invention can co-precipitate tin and a silane coupling agent monomer or a silane coupling agent condensate on the surface of copper. Therefore, due to the action of both the tin film having good adhesion with an insulating material such as a resin and the silane compound having an adhesive functional group with an insulating material such as a resin, the copper surface treatment agent of the present invention is Sufficient adhesion between copper and an insulating material such as resin can be imparted. Furthermore, since the copper surface treating agent of the present invention contains a complexing agent, when the surface treating agent is used in a solution, the complexing agent forms a complex with copper, so that the surface of the copper is treated. Since the potential is low, it is easily reduced and tin is likely to precipitate. Furthermore, the solution of the surface treatment agent may improve the uniformity of the tin film by chelating copper in which the complexing agent is dissolved. Further, when a fluorine compound is included in the surface treatment agent, it is considered that tin ions are stabilized by free fluorine in the solution of the surface treatment agent, and the solution of the surface treatment agent is further stabilized with less turbidity. It can be a solution.

また、本発明の銅の表面処理剤は、上記錯化剤として、少なくともチオ尿素もしくはその誘導体を含有することが好ましい。   The copper surface treatment agent of the present invention preferably contains at least thiourea or a derivative thereof as the complexing agent.

これにより、本発明の銅の表面処理剤は、チオ尿素もしくはその誘導体を含有しているので、チオ尿素もしくはその誘導体が主に錯化剤として働き、銅との錯体を形成して銅表面の電位を下げて還元性を向上させる。さらに、チオ尿素もしくはその誘導体は副次的に還元剤としても働き、銅の表面にスズ皮膜を形成しながらシラン化合物を析出させる反応を促進させることができる。   Thereby, since the copper surface treating agent of the present invention contains thiourea or a derivative thereof, the thiourea or the derivative mainly functions as a complexing agent, and forms a complex with copper to form a copper surface. Reduce the potential to improve the reduction. Furthermore, thiourea or a derivative thereof also acts as a secondary reducing agent, and can promote a reaction for depositing a silane compound while forming a tin film on the surface of copper.

また、本発明の銅の表面処理剤は、さらにフッ素化合物または有機酸を含有することが好ましい。   The copper surface treating agent of the present invention preferably further contains a fluorine compound or an organic acid.

これにより、本発明の銅の表面処理剤を溶液で用いた場合に、フッ素化合物から遊離したフッ素や有機酸でスズイオンを安定化する。その安定化のメカニズムは明らかではないが、可能性としては、スズイオンと、遊離フッ素もしくは有機酸とが錯体を形成することにより、濁りの少ない安定な溶液になると考えられる。さらに、本発明の銅の表面処理剤の溶液は濁りの少ない安定な溶液となるので、銅の表面に均一なスズ皮膜を形成することができ、銅と樹脂等の絶縁材との密着性を向上させることができる。   Thereby, when the copper surface treating agent of the present invention is used in a solution, tin ions are stabilized by fluorine or organic acid liberated from the fluorine compound. Although the mechanism of stabilization is not clear, it is considered that a stable solution with less turbidity may be obtained by forming a complex between tin ions and free fluorine or an organic acid. Furthermore, since the solution of the copper surface treatment agent of the present invention becomes a stable solution with little turbidity, a uniform tin film can be formed on the surface of copper, and adhesion between copper and an insulating material such as a resin can be improved. Can be improved.

また、本発明の銅の表面処理剤は、pHが5以下であることが好ましい。   The copper surface treatment agent of the present invention preferably has a pH of 5 or less.

これにより、本発明の銅の表面処理剤は、安定化しやすくなる。   Thereby, the copper surface treating agent of the present invention is easily stabilized.

また、本発明の銅の表面処理剤は、上記シランカップリング剤がメルカプト基、エポキシ基またはアミノ基を有することが好ましい。   In the copper surface treating agent of the present invention, the silane coupling agent preferably has a mercapto group, an epoxy group or an amino group.

これにより、本発明の銅の表面処理剤は、メルカプト基が銅に吸着しやすいので、シランカップリング剤がスズとともに共析出しやすくなる。さらに、メルカプト基はエポキシ樹脂等の絶縁材と反応(架橋)するので、メルカプト基を有するシランカップリング剤が銅の表面に存在していれば、エポキシ樹脂等の絶縁材との密着性が向上する。メルカプト基以外でも、エポキシ基、アミノ基等は絶縁材と反応(架橋)するのでエポキシ樹脂等の絶縁材との密着性が向上する。また、他の官能基として、シランカップリング剤のシラノール基やアルコキシル基がスズ酸化物に吸着する。   Thereby, since the mercapto group tends to adsorb | suck to copper, the silane coupling agent becomes easy to co-precipitate with tin with the copper surface treating agent of this invention. Furthermore, since the mercapto group reacts (crosslinks) with an insulating material such as an epoxy resin, adhesion to an insulating material such as an epoxy resin is improved if a silane coupling agent having a mercapto group is present on the copper surface. To do. In addition to mercapto groups, epoxy groups, amino groups, and the like react (crosslink) with insulating materials, so that adhesion to insulating materials such as epoxy resins is improved. Further, as other functional groups, silanol groups and alkoxyl groups of the silane coupling agent are adsorbed on the tin oxide.

また、本発明の銅の表面処理剤は、上記シランカップリング剤が3量体以上のシランカップリング剤縮合体を含んでいることが好ましい。   In the copper surface treatment agent of the present invention, the silane coupling agent preferably contains a silane coupling agent condensate of a trimer or more.

これにより、3量体以上のシランカップリング剤縮合体は、シランカップリング剤の単量体と比較して、シランカップリング剤が析出しやすいという優位性がある。それゆえ、本発明の銅の表面処理剤は、銅と樹脂等の絶縁材との密着性をより一層向上させることができる。   Thereby, the silane coupling agent condensate of a trimer or more has an advantage that the silane coupling agent is easily precipitated as compared with the monomer of the silane coupling agent. Therefore, the copper surface treatment agent of the present invention can further improve the adhesion between copper and an insulating material such as a resin.

また、本発明の銅の表面処理剤は、上記スズ化合物の重量に対する上記シランカップリング剤の重量の比が0.001以上、100以下の範囲内であることが好ましい。また、本発明の銅の表面処理剤は、上記表面処理剤全体(表面処理剤の溶液全体)に対する上記スズ化合物の濃度が10ppm以上、200,000ppm以下の範囲内であることが好ましい。また、本発明の銅の表面処理剤は、上記表面処理剤全体に対する上記シランカップリング剤の濃度が10ppm以上、100,000ppm以下の範囲内であることが好ましい。   In the copper surface treatment agent of the present invention, the ratio of the weight of the silane coupling agent to the weight of the tin compound is preferably in the range of 0.001 to 100. In the copper surface treatment agent of the present invention, the concentration of the tin compound with respect to the entire surface treatment agent (the entire solution of the surface treatment agent) is preferably in the range of 10 ppm to 200,000 ppm. In the copper surface treatment agent of the present invention, the concentration of the silane coupling agent with respect to the entire surface treatment agent is preferably in the range of 10 ppm to 100,000 ppm.

本発明の銅の表面処理剤は、上記スズ化合物の重量に対する上記シランカップリング剤の重量の比、上記表面処理剤全体(表面処理剤の溶液全体)に対する上記スズ化合物の濃度、上記表面処理剤全体に対する上記シランカップリング剤の濃度が上記の範囲内にあることで、銅の表面にスズおよびシラン化合物をより確実に共析出させることができる。それゆえ、本発明の銅の表面処理剤は、銅と樹脂等の絶縁材との密着性をより確実に実現することができる。   The copper surface treatment agent of the present invention comprises a ratio of the weight of the silane coupling agent to a weight of the tin compound, a concentration of the tin compound with respect to the whole surface treatment agent (a whole solution of the surface treatment agent), and the surface treatment agent. When the concentration of the silane coupling agent relative to the whole is within the above range, tin and a silane compound can be more reliably co-deposited on the surface of copper. Therefore, the copper surface treatment agent of the present invention can more reliably realize the adhesion between copper and an insulating material such as a resin.

また、本発明の銅の表面処理剤は、さらに還元剤を含有することが好ましい。   The copper surface treatment agent of the present invention preferably further contains a reducing agent.

これにより、本発明の銅の表面処理剤は、銅の表面にスズ皮膜を形成しながらシラン化合物を析出させる反応を促進させることができる。   Thereby, the copper surface treating agent of this invention can accelerate | stimulate the reaction which precipitates a silane compound, forming a tin membrane | film | coat on the surface of copper.

また、本発明の銅の表面処理剤は、さらに防錆剤を含有することが好ましい。また、本発明の銅の表面処理剤は、上記防錆剤がテトラゾール、トリアゾール、イミダゾール、チオールから選ばれる少なくとも一種の化合物であることが好ましい。   The copper surface treatment agent of the present invention preferably further contains a rust inhibitor. In the copper surface treatment agent of the present invention, the rust inhibitor is preferably at least one compound selected from tetrazole, triazole, imidazole, and thiol.

これにより、本発明の銅の表面処理剤は、銅と樹脂等の絶縁材との密着性を向上させるとともに、表面処理後に長期間保存しても銅の性能が変化し難くなる。   Thereby, the copper surface treating agent of the present invention improves the adhesion between copper and an insulating material such as a resin, and the copper performance hardly changes even if it is stored for a long time after the surface treatment.

また、本発明の銅の表面処理剤は、さらに金属化合物を含有することが好ましい。さらに、上記金属化合物が銀、パラジウム、金、白金、銅から選ばれる少なくとも一種の金属を含有する化合物であることが好ましい。   The copper surface treatment agent of the present invention preferably further contains a metal compound. Furthermore, the metal compound is preferably a compound containing at least one metal selected from silver, palladium, gold, platinum, and copper.

これにより、本発明の銅の表面処理剤は、金属イオンの緩衝作用により銅の表面にスズ皮膜を均一・安定に形成することができると考えられる。   Thereby, it is considered that the copper surface treatment agent of the present invention can form a tin film uniformly and stably on the surface of copper by the buffering action of metal ions.

また、本発明の銅の表面処理方法は、銅の表面に上記銅の表面処理剤を接触させることが好ましい。さらに、本発明の銅の表面処理方法は、銅の表面を粗化処理することなく、銅の表面に上記銅の表面処理剤を接触させることが好ましい。   In the copper surface treatment method of the present invention, the copper surface treatment agent is preferably brought into contact with the copper surface. Furthermore, in the copper surface treatment method of the present invention, the copper surface treatment agent is preferably brought into contact with the copper surface without roughening the copper surface.

これにより、本発明の銅の表面処理方法は、銅の表面にスズメッキした後に硝酸、シランカップリング剤等で処理する表面処理方法と比較して、処理工程を一工程減らすことができる。工程削減は単にプロセスコストのみならず、廃水処理低減、後工程の管理リスク低減、さらには次工程のメッキ工程への信頼性低下のリスク低減にもなる。また、本発明の銅の表面処理方法は、銅の表面をエッチング等の粗化処理しなくとも十分な密着性を担保できるため、銅の表面を平滑な状態に処理することができる。その結果、本発明の銅の表面処理方法は、多層配線基板の小型化、薄型化、高周波化、高密度化等に対応するのに適している。   As a result, the copper surface treatment method of the present invention can reduce the number of treatment steps by one step compared to the surface treatment method in which the surface of copper is tin-plated and then treated with nitric acid, a silane coupling agent, or the like. The process reduction not only reduces the process cost, but also reduces the wastewater treatment, the management risk of the subsequent process, and the risk of lowering the reliability of the plating process of the next process. In addition, since the copper surface treatment method of the present invention can ensure sufficient adhesion without roughening the surface of the copper, such as etching, the surface of the copper can be treated in a smooth state. As a result, the copper surface treatment method of the present invention is suitable for dealing with downsizing, thinning, high frequency, high density and the like of a multilayer wiring board.

また、本発明の銅の表面処理方法は、銅の表面に酸洗処理、粗化処理(凹凸処理)、防錆処理、酸化処理、表面調整処理、脱脂処理から選ばれる少なくとも一種の前処理をした後に、上記表面処理剤を接触させてもよい。   Moreover, the copper surface treatment method of the present invention comprises at least one pretreatment selected from pickling treatment, roughening treatment (unevenness treatment), rust prevention treatment, oxidation treatment, surface conditioning treatment, and degreasing treatment on the copper surface. Then, the surface treatment agent may be contacted.

これにより、本発明の銅の表面処理方法は、酸洗処理、脱脂処理により銅表面の汚れ、酸化物等を除去することができ、粗化処理、防錆処理、酸化処理、表面調整処理により銅表面での化成性向上、銅の性能向上をより一層図ることができる。   Thereby, the copper surface treatment method of the present invention can remove stains, oxides, etc. on the copper surface by pickling treatment and degreasing treatment, and by roughening treatment, rust prevention treatment, oxidation treatment, surface conditioning treatment. It is possible to further improve the chemical conversion on the copper surface and the performance of copper.

また、本発明の銅の表面処理方法は、銅の表面に上記表面処理剤を接触させた後に、防錆剤や樹脂、シランカップリング剤、およびチタンアルコキシドのうちの少なくとも1つを接触させることが好ましい。   In the copper surface treatment method of the present invention, after the surface treatment agent is brought into contact with the copper surface, at least one of a rust inhibitor, a resin, a silane coupling agent, and a titanium alkoxide is brought into contact. Is preferred.

これにより、本発明の銅の表面処理方法は、銅の表面に防錆剤や樹脂、シラン化合物またはチタンアルコキシドが析出するため、銅と樹脂等の絶縁材との密着性をより一層向上させることができる。   As a result, the copper surface treatment method of the present invention further improves the adhesion between copper and an insulating material such as a resin because a rust inhibitor, resin, silane compound or titanium alkoxide is deposited on the surface of copper. Can do.

また、本発明の銅張り材料は、上記銅の表面処理方法により表面処理されてなることが好ましい。さらに、本発明の多層配線基板は、上記銅張り材料を備えていることが好ましい。さらに、本発明の配線基板は、最外層に上記銅張り材料を備えていることが好ましい。   Moreover, it is preferable that the copper clad material of this invention is surface-treated by the said copper surface treatment method. Furthermore, the multilayer wiring board of the present invention preferably includes the copper-clad material. Furthermore, the wiring board of the present invention preferably includes the copper-clad material in the outermost layer.

これにより、本発明の銅張り材料、多層配線基板および配線基板は、従来の銅の表面処理方法により表面処理された銅張り材料、多層配線基板および配線基板と比較して、銅と樹脂等の絶縁材との十分な密着性を維持することが可能となる。   As a result, the copper-clad material, multilayer wiring board, and wiring board of the present invention are made of copper and resin, etc., compared with the copper-clad material, multilayer wiring board, and wiring board surface-treated by the conventional copper surface treatment method. It becomes possible to maintain sufficient adhesion with the insulating material.

本発明の他の目的、特徴、および優れた点は、以下に示す記載によって十分分かるであろう。また、本発明の利点は、添付図面を参照した次の説明によって明白になるであろう。   Other objects, features, and advantages of the present invention will be fully understood from the following description. The advantages of the present invention will become apparent from the following description with reference to the accompanying drawings.

本発明における銅の表面処理方法により表面処理された銅のSEM外観を示す図である。It is a figure which shows the SEM external appearance of the copper surface-treated by the copper surface treatment method in this invention. 従来の銅の表面処理方法により表面処理された銅SEM外観を示す図である。It is a figure which shows the copper SEM appearance surface-treated by the conventional copper surface treatment method. 従来の銅の表面処理方法により表面処理された銅SEM外観を示す図である。It is a figure which shows the copper SEM appearance surface-treated by the conventional copper surface treatment method.

以下、本発明について詳しく説明するが、本発明の範囲はこれらの説明に拘束されることはなく、以下の例示以外についても、本発明の趣旨を損なわない範囲で適宜変更して実施し得るものである。具体的には、本発明は下記の実施形態に限定されるものではなく、請求項に示した範囲で種々の変更が可能である。すなわち、請求項に示した範囲で適宜変更した技術的手段を組み合わせて得られる実施形態についても本発明の技術的範囲に含まれる。なお、本明細書等において、便宜上、「重量ppm」を単に「ppm」,「重量%」を単に「%」と記載する。   Hereinafter, the present invention will be described in detail. However, the scope of the present invention is not limited to these descriptions, and other than the following examples, the present invention can be appropriately modified and implemented without departing from the spirit of the present invention. It is. Specifically, the present invention is not limited to the following embodiments, and various modifications are possible within the scope of the claims. That is, embodiments obtained by combining technical means appropriately modified within the scope of the claims are also included in the technical scope of the present invention. In this specification and the like, for convenience, “weight ppm” is simply referred to as “ppm”, and “weight%” is simply referred to as “%”.

(I)本発明における銅の表面処理剤で表面処理される物質等
本発明における銅の表面処理剤で表面処理される物質は、銅を50%以上含有するものであれば特に限定されない。つまり、銅を50%以上含有していれば、銅以外の物質が含まれていても本発明に含まれる。例えば、銅単体、銅を含む銅合金材、クロメート等の表面処理された銅、メッキされた銅などが挙げられる。
(I) Substances Surface-treated with Copper Surface Treatment Agent in the Present Invention The substance surface-treated with the copper surface treatment agent in the present invention is not particularly limited as long as it contains 50% or more of copper. That is, as long as it contains 50% or more of copper, it is included in the present invention even if a substance other than copper is included. Examples thereof include copper alone, copper alloy material containing copper, surface-treated copper such as chromate, and plated copper.

本発明における銅として、具体的には電子基板、リードフレーム等の電子部品、装飾品、建材等に使用される箔(電解銅箔、圧延銅箔)、めっき膜(無電解銅めっき膜、電解銅めっき膜)、線、棒、管、板など、種々の用途の銅を挙げることができる。上記銅は、黄銅、青銅、白銅、ヒ素銅、ケイ素銅、チタン銅、クロム銅等、その目的に応じて他の元素を含有したものであってもよい。また、近年の高周波の電気信号が流れる銅配線の場合には、銅の表面は平均粗さが0.1μm以下の平滑面であることが好ましい。   As copper in the present invention, specifically, foil (electrolytic copper foil, rolled copper foil), plating film (electroless copper plating film, electrolysis) used for electronic parts such as electronic boards and lead frames, ornaments, building materials, etc. Copper plating film), wires, rods, tubes, plates, and the like can be used for various purposes. The said copper may contain other elements according to the objective, such as brass, bronze, white copper, arsenic copper, silicon copper, titanium copper, chromium copper. In the case of a copper wiring through which a high-frequency electrical signal flows in recent years, the copper surface is preferably a smooth surface having an average roughness of 0.1 μm or less.

本発明において、銅と密着する樹脂等の絶縁材は、エポキシ樹脂、フェノール樹脂、ポリイミド、ポリウレタン、ビスマレイミド・トリアジン樹脂、変性ポリフェニレンエーテル、シアネートエステル等の熱硬化性樹脂などを挙げることができる。これらの樹脂は官能基によって変性されていてもよく、ガラス繊維、アラミド繊維、その他の繊維等で強化されていてもよい。例えば、ビルドアップ工程でのプリント基板用途では、内層絶縁材、プリプレグ、外層ソルダーレジスト、両絶縁材に対しても優れた密着性を確保できる。   In the present invention, examples of the insulating material such as a resin that adheres to copper include thermosetting resins such as epoxy resin, phenol resin, polyimide, polyurethane, bismaleimide / triazine resin, modified polyphenylene ether, and cyanate ester. These resins may be modified with functional groups, and may be reinforced with glass fibers, aramid fibers, other fibers, and the like. For example, in printed circuit board applications in the build-up process, excellent adhesion can be secured even for inner layer insulating materials, prepregs, outer layer solder resists, and both insulating materials.

(II)本発明における銅の表面処理剤に用いられる材料等
本発明の銅の表面処理剤は、スズ化合物と、錯化剤と、シランカップリング剤とを含有するものである。さらに、本発明の銅の表面処理剤は、フッ素化合物を含有することが好ましい。さらに、本発明の銅の表面処理剤は、還元剤を含有することが好ましい。さらに、本発明の銅の表面処理剤は、金属化合物を含有することが好ましい。また、本発明の銅の表面処理剤は、必要に応じて、酸・アルカリのpH調整剤を含有していてもよい。
(II) Materials Used for Copper Surface Treatment Agent in the Present Invention The copper surface treatment agent of the present invention contains a tin compound, a complexing agent, and a silane coupling agent. Further, the copper surface treatment agent of the present invention preferably contains a fluorine compound. Furthermore, the copper surface treating agent of the present invention preferably contains a reducing agent. Furthermore, the copper surface treating agent of the present invention preferably contains a metal compound. Moreover, the copper surface treating agent of the present invention may contain an acid / alkali pH adjuster, if necessary.

また、本発明の銅の表面処理剤は、該表面処理剤の特性を阻害しない限り、上記物質以外の物質(以下、「他の物質」という)を含んでいてもよい。他の物質を含める方法としては、特に限定されるものではない。   The copper surface treating agent of the present invention may contain a substance other than the above substances (hereinafter referred to as “other substances”) as long as the properties of the surface treating agent are not impaired. It does not specifically limit as a method of including another substance.

<スズ化合物>
本発明の銅の表面処理剤は、スズ化合物を含有するものである。スズ化合物としては、後述する溶媒に対して可溶性のものであれば特に限定されないが、その溶解性から酸との塩類が好ましい。例えば、硫酸第一スズ、硫酸第二スズ、ホウフッ化第一スズ、フッ化第一スズ、フッ化第二スズ、硝酸第一スズ、硝酸第二スズ、塩化第一スズ、塩化第二スズ、ギ酸第一スズ、ギ酸第二スズ、酢酸第一スズ、酢酸第二スズ等の第一スズ塩や第二スズ塩などが挙げられる。その中でも、スズ皮膜の形成速度が速いという理由から第一スズ塩が好ましく、後述する溶媒との溶液中での安定性が高く、均一なスズ皮膜を形成することができるという理由から、第二スズ塩が好ましい。さらに、銅のエッチングに悪影響を及ぼさないという理由から硫酸第二スズが特に好ましい。
<Tin compounds>
The copper surface treating agent of the present invention contains a tin compound. Although it will not specifically limit as a tin compound if it is soluble with respect to the solvent mentioned later, Salts with an acid are preferable from the solubility. For example, stannous sulfate, stannic sulfate, stannous borofluoride, stannous fluoride, stannic fluoride, stannous nitrate, stannic nitrate, stannous chloride, stannic chloride, Examples thereof include stannous salts such as stannous formate, stannic formate, stannous acetate, and stannic acetate, and stannic salts. Among them, stannous salt is preferable because of the high formation rate of tin film, and it is highly stable in a solution with a solvent to be described later, so that a uniform tin film can be formed. Tin salts are preferred. Furthermore, stannic sulfate is particularly preferred because it does not adversely affect copper etching.

上記表面処理剤全体(表面処理剤の溶液全体)に対する上記スズ化合物の濃度は、好ましくは10ppm以上200,000ppm以下、より好ましくは25ppm以上10,000ppm以下、特に好ましくは100ppm以上2,000ppm以下の範囲内である。上記表面処理剤全体に対する上記スズ化合物の濃度が10ppm未満であると、銅および樹脂等の絶縁材との密着性が低下するおそれがあり、好ましくない。一方、200,000ppmを超えると、銅の表面に多量のスズが析出し、スズ皮膜が凝集破壊するおそれがあり、かつ溶液安定性が劣るとの理由から銅の表面にスズ皮膜を形成し難くなるおそれがあり、好ましくない。   The concentration of the tin compound with respect to the entire surface treatment agent (the entire solution of the surface treatment agent) is preferably 10 ppm to 200,000 ppm, more preferably 25 ppm to 10,000 ppm, and particularly preferably 100 ppm to 2,000 ppm. Within range. If the concentration of the tin compound relative to the entire surface treatment agent is less than 10 ppm, the adhesion with an insulating material such as copper and resin may be lowered, which is not preferable. On the other hand, if it exceeds 200,000 ppm, a large amount of tin is deposited on the copper surface, the tin coating may cohesively break, and it is difficult to form a tin coating on the copper surface because of poor solution stability. This is not preferable.

<シランカップリング剤>
本発明の銅の表面処理剤は、シランカップリング剤を含有するものである。シランカップリング剤としては、後述する溶媒に対して可溶性のものであれば特に限定されない。シランカップリング剤としては、例えば、3−メルカプトプロピルトリメトキシシラン、3−メルカプトプロピルメチルジメトキシシラン等のメルカプトシラン、ビニルトリクロルシラン、ビニルトリメトキシシラン、ビニルトリエトキシシラン等のビニルシラン、2−(3,4−エポキシシクロヘキシル)エチルトリメトキシシラン、3−グリシドキシプロピルトリメトキシシラン、3−グリシドキシプロピルメチルジエトキシシラン、3−グリシドキシプロピルトリエトキシシラン等のエポキシシラン、p−スチリルトリメトキシシラン等のスチリルシラン、メタクリロキシプロピルメチルジメトキシシラン、メタクリロキシプロピルトリメトキシシラン、メタクリロキシプロピルメチルジエトキシシラン、メタクリロキシプロピルトリエトキシシラン等のメタクリロキシシラン、3−アクリロキシプロピルトリメトキシシラン等のアクリロキシシラン、N−2−(アミノエチル)−3−アミノプロピルメチルジメトキシシラン、N−2−(アミノエチル)−3−アミノプロピルトリメトキシシラン、N−2−(アミノエチル)−3−アミノプロピルトリエトキシシラン、3−アミノプロピルトリメトキシシラン、3−アミノプロピルトリエトキシシラン、3−トリエトキシシリル−N−(1,3−ジメチル−ブチリデン)プロピルアミン、N−フェニル−3−アミノプロピルトリメトキシシラン、N−(ビニルベンジル)−2−アミノエチル−3−アミノプロピルトリメトキシシラン等のアミノシラン、3−ウレイドプロピルトリエトキシシラン等のウレイドシラン、3−クロロプロピルトリメトキシシラン等のクロロプロピルシラン、ビス(トリエトキシシリルプロピル)テトラスルフィド等のスルフィドシラン、3−イソシアネートプロピルトリエトキシシラン等のイソシアネートシラン、それらの混合物などが挙げられる。
<Silane coupling agent>
The copper surface treating agent of the present invention contains a silane coupling agent. The silane coupling agent is not particularly limited as long as it is soluble in the solvent described later. Examples of the silane coupling agent include mercaptosilanes such as 3-mercaptopropyltrimethoxysilane and 3-mercaptopropylmethyldimethoxysilane, vinylsilanes such as vinyltrichlorosilane, vinyltrimethoxysilane and vinyltriethoxysilane, 2- (3 , 4-epoxycyclohexyl) ethyltrimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3-glycidoxypropylmethyldiethoxysilane, epoxyglycan such as 3-glycidoxypropyltriethoxysilane, p-styryltri Stylylsilane such as methoxysilane, methacryloxypropylmethyldimethoxysilane, methacryloxypropyltrimethoxysilane, methacryloxypropylmethyldiethoxysilane, methacryloxypropyltri Methacryloxysilane such as toxisilane, Acryloxysilane such as 3-acryloxypropyltrimethoxysilane, N-2- (aminoethyl) -3-aminopropylmethyldimethoxysilane, N-2- (aminoethyl) -3-amino Propyltrimethoxysilane, N-2- (aminoethyl) -3-aminopropyltriethoxysilane, 3-aminopropyltrimethoxysilane, 3-aminopropyltriethoxysilane, 3-triethoxysilyl-N- (1,3 -Dimethyl-butylidene) propylamine, N-phenyl-3-aminopropyltrimethoxysilane, N- (vinylbenzyl) -2-aminoethyl-3-aminopropyltrimethoxysilane, and other aminosilanes, 3-ureidopropyltriethoxysilane Such as ureidosilane, Chloropropyl silanes such as Russia trimethoxysilane, bis (triethoxysilylpropyl) tetrasulfide, etc. Surufidoshiran, isocyanate silanes such as 3-isocyanate propyl triethoxysilane, mixtures thereof and the like.

また、銅に吸着しやすいのでスズとともに共析出しやすくなり、エポキシ樹脂等の絶縁材との密着性に優れているという理由からメルカプト基を有するシランカップリング剤、例えばメルカプトシランが好ましく、絶縁材と架橋しやすいという理由から、例えばアミノシラン、エポキシシラン、イソシアネートシランが好ましく、多種の絶縁材との適合性に優れているという理由から、例えばアミノ基を有するシランカップリング剤とエポキシ基を有するシランカップリング剤との混合物、共縮合物(例えばアミノシランとエポキシシランとの共縮合物)が好ましい。また、絶縁材との密着性に優れているという理由からアルコキシル基を有するシランカップリング剤、例えばシラノール、トリシラノール等も好ましい。その中でも、銅とエポキシ樹脂等の絶縁材との密着性を極めて向上させるという理由からメルカプト基を有するシランカップリング剤が特に好ましい。   In addition, since it easily adsorbs to copper, it easily co-precipitates with tin, and a silane coupling agent having a mercapto group, such as mercaptosilane, is preferable because it has excellent adhesion to an insulating material such as an epoxy resin. For example, aminosilane, epoxy silane, and isocyanate silane are preferable because they are easily cross-linked with each other. For example, silane coupling agents having amino groups and silanes having epoxy groups are preferable because of excellent compatibility with various insulating materials. A mixture with a coupling agent or a cocondensate (for example, a cocondensate of aminosilane and epoxysilane) is preferred. Also, a silane coupling agent having an alkoxyl group, such as silanol and trisilanol, is preferable because of its excellent adhesion to the insulating material. Among them, a silane coupling agent having a mercapto group is particularly preferable because the adhesion between copper and an insulating material such as an epoxy resin is extremely improved.

また、本発明の銅の表面処理剤は、シランカップリング剤単量体と比較して析出しやすいという優位性があるという理由から、3量体以上のシランカップリング剤縮合体を含んでいることが好ましい。   Further, the copper surface treatment agent of the present invention contains a silane coupling agent condensate of a trimer or more because it has an advantage of being easily precipitated as compared with a silane coupling agent monomer. It is preferable.

ここで、シランカップリング剤縮合体を形成する際のシランカップリング剤の縮合率は、次に示す式(1)
z=x/(x+y)×100・・・(1)
[式(1)中、xはシランカップリング剤縮合体(2量体以上のシランカップリング剤)のモル比を表し、yはシランカップリング剤単量体のモル比を表し、zはシランカップリング剤の縮合率(%)を表す]で規定される。
Here, the condensation rate of the silane coupling agent when forming the silane coupling agent condensate is expressed by the following formula (1).
z = x / (x + y) × 100 (1)
[In formula (1), x represents the molar ratio of the silane coupling agent condensate (a dimer or higher silane coupling agent), y represents the molar ratio of the silane coupling agent monomer, and z represents silane. Represents the condensation rate (%) of the coupling agent].

なお、シランカップリング剤縮合体またはシランカップリング剤単量体のモル比については、29Si−NMRを用いて導き出すことができる。具体的には、シランカップリング剤中のケイ素原子が酸素原子を介して他のケイ素原子と結合しているものをシランカップリング剤縮合体とし、上記ケイ素原子が酸素原子を介して他のケイ素原子と結合していないものをシランカップリング剤単量体として、シランカップリング剤縮合体またはシランカップリング剤単量体のモル比を導き出すことができる。Note that the molar ratio of the silane coupling agent condensate or a silane coupling Zaitan monomers can be derived using the 29 Si-NMR. Specifically, a silane coupling agent condensate is one in which a silicon atom in a silane coupling agent is bonded to another silicon atom through an oxygen atom, and the silicon atom is bonded to another silicon through an oxygen atom. The mole ratio of the silane coupling agent condensate or the silane coupling agent monomer can be derived by using a silane coupling agent monomer that is not bonded to an atom.

上記表面処理剤全体(表面処理剤の溶液全体)に対する上記シランカップリング剤の濃度は、好ましくは10ppm以上100,000ppm以下、より好ましくは100ppm以上5,000ppm以下、特に好ましくは200ppm以上2,000ppm以下の範囲内である。上記表面処理剤全体に対する上記シランカップリング剤の濃度が10ppm未満であると、上記スズ皮膜および樹脂等の絶縁材との密着性が低下するおそれがあり、好ましくない。一方、100,000ppmを超えると、銅の表面にシラン化合物が吸着してスズを析出させ難くなるおそれがあり、好ましくない。   The concentration of the silane coupling agent with respect to the whole surface treatment agent (the whole solution of the surface treatment agent) is preferably 10 ppm to 100,000 ppm, more preferably 100 ppm to 5,000 ppm, and particularly preferably 200 ppm to 2,000 ppm. Within the following range. If the concentration of the silane coupling agent with respect to the entire surface treatment agent is less than 10 ppm, the adhesion with the insulating material such as the tin film and the resin may decrease, which is not preferable. On the other hand, if it exceeds 100,000 ppm, the silane compound may be adsorbed on the copper surface and it may be difficult to precipitate tin, which is not preferable.

上記スズ化合物の重量に対する上記シランカップリング剤の重量の比は、スズ皮膜の形成とシラン化合物の析出とのバランスがよいとの理由から、好ましくは0.001以上100以下、より好ましくは0.01以上10以下、特に好ましくは0.02以上1以下の範囲内である。   The ratio of the weight of the silane coupling agent to the weight of the tin compound is preferably 0.001 or more and 100 or less, more preferably 0.00 because the balance between the formation of the tin film and the precipitation of the silane compound is good. The range is from 01 to 10, particularly preferably from 0.02 to 1.

<錯化剤>
本発明の銅の表面処理剤は、錯化剤を含有するものである。ここで、本明細書でいう錯化剤とは、銅に配位してキレートを形成し、銅表面の電位を下げ還元しやすいような状態にし、スズ表面に樹脂等の絶縁材密着層を形成しやすくするものを意味する。錯化剤としては、例えば、チオ尿素、エチレンチオウレア、ジエチルチオ尿素、ジブチルチオ尿素などのチオ尿素誘導体、チオ硫酸、シアン類等が挙げられる。その中でも、上記表面処理剤を溶液で用いた場合に、より一層濁りの少ない安定な溶液とすることができ、かつ銅との錯体を形成しやすく、銅の表面の電位を低くするためより一層スズ皮膜を形成しやすくすることができるという理由からチオ尿素が好ましい。なお、錯化剤には、副次的に後述する還元剤としても働くものもある。その中で、チオ尿素は、副次的に後述する還元剤としても働くものである。
<Complexing agent>
The copper surface treating agent of the present invention contains a complexing agent. Here, the complexing agent as used in the present specification means coordination with copper to form a chelate, lowering the potential of the copper surface, making it easy to reduce, and providing an insulating material adhesion layer such as a resin on the tin surface. It means something that is easy to form. Examples of the complexing agent include thiourea derivatives such as thiourea, ethylenethiourea, diethylthiourea, and dibutylthiourea, thiosulfuric acid, and cyanides. Among them, when the surface treatment agent is used in a solution, it can be made a stable solution with less turbidity, and more easily forms a complex with copper, and further lowers the potential on the surface of copper. Thiourea is preferred because it can easily form a tin film. Some complexing agents also work as a reducing agent, which will be described later. Among them, thiourea also functions as a reducing agent which will be described later.

上記表面処理剤全体(表面処理剤の溶液全体)に対する上記錯化剤の濃度は、好ましくは0.01%以上50%以下、より好ましくは0.1%以上30%以下、特に好ましくは1%以上15%以下の範囲内である。上記表面処理剤全体に対する上記錯化剤の濃度が0.01%未満であると、銅表面に錯体を形成し難くなるおそれがあり、好ましくない。一方、50%を超えると、銅の溶解性が悪くなり、銅の表面にスズ皮膜を形成しながらシラン化合物を析出させる反応を阻害するおそれがあり、好ましくない。   The concentration of the complexing agent with respect to the entire surface treatment agent (the whole solution of the surface treatment agent) is preferably 0.01% to 50%, more preferably 0.1% to 30%, and particularly preferably 1%. It is in the range of 15% or less. If the concentration of the complexing agent relative to the entire surface treatment agent is less than 0.01%, it is difficult to form a complex on the copper surface, which is not preferable. On the other hand, if it exceeds 50%, the solubility of copper is deteriorated, and there is a possibility that the reaction of depositing the silane compound while forming a tin film on the surface of copper may be hindered.

<還元剤>
本発明の銅の表面処理剤は、還元剤を含有していることが好ましい。還元剤としては、例えば、チオ尿素、ジエチルチオ尿素、水素化ホウ素カリウム、ジメチルアミノボラン、次亜リン酸ナトリウム、ヒドラジン、ホルムアルデヒド等が挙げられる。その中でも、スズ化合物に電子を付加して、スズ単体、酸化スズ等からなるスズ皮膜を形成しやすいという理由から少なくともチオ尿素を含有することが好ましい。
<Reducing agent>
The copper surface treating agent of the present invention preferably contains a reducing agent. Examples of the reducing agent include thiourea, diethylthiourea, potassium borohydride, dimethylaminoborane, sodium hypophosphite, hydrazine, formaldehyde and the like. Among them, it is preferable to contain at least thiourea because it is easy to add a tin compound and to form a tin film made of tin alone, tin oxide, or the like.

上記表面処理剤全体(表面処理剤の溶液全体)に対する上記還元剤の濃度は、好ましくは0.01%以上50%以下、より好ましくは0.1%以上30%以下、特に好ましくは1%以上15%以下の範囲内である。上記表面処理剤全体に対する上記還元剤の濃度が0.01%未満であると、上記スズ皮膜を形成しないおそれがあり、好ましくない。一方、50%を超えると、スズが溶解し難くなるとの理由から銅の表面にスズ皮膜を形成し難くなるおそれがあり、好ましくない。   The concentration of the reducing agent with respect to the whole surface treatment agent (the whole solution of the surface treatment agent) is preferably 0.01% or more and 50% or less, more preferably 0.1% or more and 30% or less, and particularly preferably 1% or more. It is in the range of 15% or less. If the concentration of the reducing agent relative to the entire surface treatment agent is less than 0.01%, the tin film may not be formed, which is not preferable. On the other hand, if it exceeds 50%, it is difficult to form a tin film on the surface of copper because it is difficult to dissolve tin, which is not preferable.

<フッ素化合物、有機酸>
本発明の銅の表面処理剤は、フッ素化合物または有機酸を含有していることが好ましい。フッ素化合物としては、例えば、フッ化水素、ホウフッ化水素酸、酸性フッ化ナトリウム、酸性フッ化アンモニウム、フッ化ナトリウム、フッ化アンモニウム、ケイフッ化水素等が挙げられる。その中でも、上記表面処理剤を溶液で用い、pHが5以下である場合に、スズイオンが安定的に存在し、より一層濁りの少ない安定な溶液とすることができるという理由からフッ化水素、酸性フッ化ナトリウムが好ましい。有機酸は、イセチオン酸、メタンスルホン酸、スチレンスルホン酸、ホスホン酸が望ましい。
<Fluorine compounds, organic acids>
The copper surface treating agent of the present invention preferably contains a fluorine compound or an organic acid. Examples of the fluorine compound include hydrogen fluoride, borohydrofluoric acid, acidic sodium fluoride, acidic ammonium fluoride, sodium fluoride, ammonium fluoride, and hydrogen silicofluoride. Among these, when the surface treatment agent is used in a solution and the pH is 5 or less, tin ions are stably present, and it is possible to obtain a stable solution with less turbidity. Sodium fluoride is preferred. The organic acid is preferably isethionic acid, methanesulfonic acid, styrenesulfonic acid, or phosphonic acid.

上記表面処理剤全体(表面処理剤の溶液全体)に対する上記フッ素化合物および有機酸の合計の濃度は、好ましくは10ppm以上200,000ppm以下、より好ましくは25ppm以上5000ppm以下、特に好ましくは100ppm以上2000ppm以下の範囲内である。上記表面処理剤全体に対する上記フッ素化合物および有機酸の合計の濃度が10ppm未満であると、スズイオンが安定化し難いおそれがあり、好ましくない。一方、200,000ppmを超えると、銅の表面にスズ皮膜を形成する反応を阻害するおそれがあり、好ましくない。上記表面処理剤全体に対する上記フッ素化合物および有機酸の合計の濃度が5,000ppm以下であると、銅の表面に形成されるスズ皮膜が厚くなること、多孔質(ポーラス)になること等で不均一になるおそれがないため、より好ましい。   The total concentration of the fluorine compound and the organic acid with respect to the entire surface treatment agent (the entire solution of the surface treatment agent) is preferably 10 ppm to 200,000 ppm, more preferably 25 ppm to 5000 ppm, and particularly preferably 100 ppm to 2000 ppm. Is within the range. If the total concentration of the fluorine compound and the organic acid relative to the entire surface treatment agent is less than 10 ppm, tin ions may be difficult to stabilize, which is not preferable. On the other hand, if it exceeds 200,000 ppm, the reaction of forming a tin film on the surface of copper may be inhibited, which is not preferable. If the total concentration of the fluorine compound and the organic acid with respect to the entire surface treatment agent is 5,000 ppm or less, the tin film formed on the surface of the copper becomes thick and becomes porous (porous). Since there is no possibility of becoming uniform, it is more preferable.

上記表面処理剤全体(表面処理剤の溶液全体)に対する上記フッ素化合物に由来する遊離フッ素の濃度は、好ましくは0.1ppm以上100ppm以下、より好ましくは1ppm以上50ppm以下、特に好ましくは2ppm以上20ppm以下の範囲内である。上記表面処理剤全体に対する上記フッ素化合物中の遊離フッ素の濃度が0.1ppm未満であると、スズイオンが安定的に存在し難くなるおそれがあり、好ましくない。一方、100ppmを超えると、銅の表面にスズ皮膜を形成しながらシラン化合物を析出させる反応を阻害するおそれがあり、好ましくない。遊離のフッ素の濃度は、フッ素イオン量として通常のイオンメーターにより測定することができる。   The concentration of free fluorine derived from the fluorine compound with respect to the whole surface treatment agent (the whole solution of the surface treatment agent) is preferably 0.1 ppm to 100 ppm, more preferably 1 ppm to 50 ppm, and particularly preferably 2 ppm to 20 ppm. Is within the range. If the concentration of free fluorine in the fluorine compound relative to the entire surface treatment agent is less than 0.1 ppm, tin ions may not be stably present, which is not preferable. On the other hand, when it exceeds 100 ppm, there is a possibility of inhibiting the reaction of depositing the silane compound while forming a tin film on the surface of copper, which is not preferable. The concentration of free fluorine can be measured with an ordinary ion meter as the amount of fluorine ions.

ここで、遊離フッ素(フッ素イオン)について以下に説明する。本発明の銅の表面処理剤の溶液には、遊離フッ素が存在していることが好ましい。上記遊離フッ素を存在させるには、上記表面処理剤にフッ素化合物を含めておく。上記遊離フッ素は、上記表面処理剤の溶液中におけるスズ化合物の安定性を向上させる作用を有している。さらに、上記遊離フッ素は、上記表面処理剤の溶液による表面処理の対象である銅に対しての上記スズ化合物の反応を促進する作用も有している。   Here, free fluorine (fluorine ion) will be described below. It is preferable that free fluorine exists in the solution of the copper surface treating agent of the present invention. In order to allow the free fluorine to exist, a fluorine compound is included in the surface treatment agent. The said free fluorine has the effect | action which improves the stability of the tin compound in the solution of the said surface treating agent. Furthermore, the free fluorine also has an action of promoting the reaction of the tin compound with respect to copper which is a target of the surface treatment with the solution of the surface treatment agent.

<防錆剤>
本発明の銅の表面処理剤は、防錆剤を含有していることが好ましい。防錆剤としては、例えば、アミノテトラゾール、メチルメルカプトテトラゾール、ベンゾトリアゾール、カルボキシベンゾトリアゾール、アミノメルカプトトリアゾール、イミダゾール、メチルイミダゾール、トリアジンチオール、トリメルカプトトリアジン若しくはこれらの塩、またはこれらの類似化合物;メルカプトシラン;チオグリコール酸;チオグリセロール;グアニルチオ尿素;チオ尿素類;等が挙げられる。その中でも、銅表面での防錆機能と化成性との両立という理由から、テトラゾール、トリアゾール、イミダゾール、チオール類の防錆剤が好ましい。
<Rust preventive>
The copper surface treatment agent of the present invention preferably contains a rust inhibitor. Examples of the rust preventive include aminotetrazole, methyl mercaptotetrazole, benzotriazole, carboxybenzotriazole, aminomercaptotriazole, imidazole, methylimidazole, triazine thiol, trimercaptotriazine or a salt thereof, or a similar compound thereof; mercaptosilane Thioglycolic acid; thioglycerol; guanylthiourea; thioureas; Among them, tetrazole, triazole, imidazole, and thiol rust preventives are preferred because they have both a rust preventive function on the copper surface and chemical conversion.

<金属化合物>
本発明の銅の表面処理剤は、金属化合物を含有していることが好ましい。金属化合物としては、金属塩等が挙げられる。また、金属化合物としては、例えば、アルミニウム化合物、ジルコニル化合物、チタニウム化合物、カルシウム化合物、ナトリウム化合物、マグネシウム化合物、ストロンチウム化合物、マンガン化合物、バナジウム化合物、イットリウム化合物、ニオブ化合物、亜鉛化合物、インジウム化合物、銀化合物、鉄化合物、パラジウム化合物、コバルト化合物、銅化合物、ニッケル化合物等が挙げられる。その中でも、スズと共析出しやすいと考えられ、より緻密なスズ膜を与えるという理由から銀化合物、パラジウム化合物、金化合物、白金化合物、銅化合物が好ましい。中でも、ファイン配線間吸着等の電気信頼性における抵抗値の低下、メッキ前処理として必要な皮膜除去性、基材である銅の防錆性、コストの面から銀化合物がより好ましい。
<Metal compound>
The copper surface treating agent of the present invention preferably contains a metal compound. Examples of the metal compound include metal salts. Examples of metal compounds include aluminum compounds, zirconyl compounds, titanium compounds, calcium compounds, sodium compounds, magnesium compounds, strontium compounds, manganese compounds, vanadium compounds, yttrium compounds, niobium compounds, zinc compounds, indium compounds, silver compounds. , Iron compounds, palladium compounds, cobalt compounds, copper compounds, nickel compounds and the like. Among these, silver compounds, palladium compounds, gold compounds, platinum compounds, and copper compounds are preferred because they are considered to easily co-precipitate with tin and give a denser tin film. Among these, silver compounds are more preferable from the viewpoints of reduction in resistance value in electrical reliability such as adsorption between fine wires, removal of a film necessary for plating pretreatment, rust prevention of copper as a base material, and cost.

上記表面処理剤全体(表面処理剤の溶液全体)に対する上記金属化合物の濃度は、好ましくは1ppm以上10,000ppm以下、より好ましくは10ppm以上2,000ppm以下、特に好ましくは100ppm以上1,000ppm以下の範囲内である。上記表面処理剤全体に対する上記金属化合物の濃度が1ppm未満であると、フッ素と錯体を形成し難くなるおそれがあり、好ましくない。一方、10,000ppmを超えると、銅の表面にスズ皮膜を形成しながらシラン化合物を析出させる反応を阻害するおそれがあり、好ましくない。   The concentration of the metal compound relative to the whole surface treatment agent (the whole solution of the surface treatment agent) is preferably 1 ppm to 10,000 ppm, more preferably 10 ppm to 2,000 ppm, and particularly preferably 100 ppm to 1,000 ppm. Within range. If the concentration of the metal compound relative to the entire surface treatment agent is less than 1 ppm, it may be difficult to form a complex with fluorine, which is not preferable. On the other hand, if it exceeds 10,000 ppm, there is a possibility of inhibiting the reaction of depositing the silane compound while forming a tin film on the surface of copper, which is not preferable.

<pH調整剤>
本発明の銅の表面処理剤は、必要に応じて、酸・アルカリのpH調整剤を含有していてもよい。ここで、本発明の銅の表面処理剤は、pHが5以下であることが好ましい。酸のpH調整剤としては、無機酸および有機酸から選択される少なくとも1種の酸を使用することができる。本発明で使用することができる酸としては、例えば、塩酸、硫酸、硝酸、ホウフッ化水素酸、リン酸などの無機酸;ギ酸、酢酸、プロピオン酸、酪酸等のカルボン酸、メタンスルホン酸、エタンスルホン酸等のアルカンスルホン酸、ベンゼンスルホン酸、フェノールスルホン酸、クレゾールスルホン酸等の芳香族スルホン酸などの有機酸;が挙げられる。その中でも、樹脂等の絶縁材との密着層を形成する速度、スズ化合物の溶解性等という理由から硫酸が好ましい。
<PH adjuster>
The copper surface treatment agent of the present invention may contain an acid / alkali pH adjuster, if necessary. Here, the copper surface treatment agent of the present invention preferably has a pH of 5 or less. As the acid pH adjuster, at least one acid selected from inorganic acids and organic acids can be used. Examples of the acid that can be used in the present invention include inorganic acids such as hydrochloric acid, sulfuric acid, nitric acid, borofluoric acid, and phosphoric acid; carboxylic acids such as formic acid, acetic acid, propionic acid, and butyric acid, methanesulfonic acid, and ethane. And organic acids such as alkane sulfonic acids such as sulfonic acid, aromatic sulfonic acids such as benzene sulfonic acid, phenol sulfonic acid, and cresol sulfonic acid. Among them, sulfuric acid is preferable because of the speed of forming an adhesion layer with an insulating material such as a resin and the solubility of a tin compound.

上記表面処理剤全体(表面処理剤の溶液全体)に対する上記pH調整剤の濃度は、好ましくは10ppm以上10,000ppm以下、より好ましくは50ppm以上2,000ppm以下、特に好ましくは100ppm以上1,000ppm以下の範囲内である。上記表面処理剤全体に対する上記pH調整剤の濃度が10ppm未満であると、スズ化合物が溶解し難くなり、フッ素がスズとの錯体を形成し難くなるおそれがあり、好ましくない。一方、10,000ppmを超えると、銅の表面にスズ皮膜を形成しながらシラン化合物を析出させる反応を阻害するおそれがあり、好ましくない。   The concentration of the pH adjusting agent with respect to the whole surface treatment agent (the whole solution of the surface treatment agent) is preferably 10 ppm to 10,000 ppm, more preferably 50 ppm to 2,000 ppm, and particularly preferably 100 ppm to 1,000 ppm. Is within the range. If the concentration of the pH adjuster relative to the entire surface treatment agent is less than 10 ppm, the tin compound is difficult to dissolve, and it is difficult to form a complex with tin, which is not preferable. On the other hand, if it exceeds 10,000 ppm, there is a possibility of inhibiting the reaction of depositing the silane compound while forming a tin film on the surface of copper, which is not preferable.

<他の物質>
本発明の銅の表面処理剤は、樹脂等の絶縁材との均一な密着層を形成するための界面活性剤、樹脂等の絶縁材との密着層の形成を促進するための重合開始剤等、必要に応じて、銅の表面にスズ皮膜を形成しながらシラン化合物を析出させる反応を阻害しないような種々の添加剤を含有してもよい。
<Other substances>
The copper surface treatment agent of the present invention is a surfactant for forming a uniform adhesion layer with an insulating material such as a resin, a polymerization initiator for promoting the formation of an adhesion layer with an insulating material such as a resin, etc. If necessary, various additives that do not inhibit the reaction of depositing the silane compound while forming a tin film on the surface of copper may be contained.

<後処理剤>
後処理剤として、シランカップリング剤、チタンアルコキシド、樹脂、防錆剤等があげられるが、絶縁材と密着する官能基を有するものであれば任意の化合物を使用できる。また、これらを組み合わせて用いることもできる。絶縁材と密着する官能基としてはエポキシ基、シラノール基、イミド基、イソシアネート基、カルボキシル基、ホスホン基、カルボニル基、メルカプト基等があげられる。上記樹脂としては、上記官能基を有するものであればよく、例えばポリアクリル酸、その誘導体等のアルクル樹脂、エポキシ樹脂、ポリアリルアミン等があげられる。これら後処理剤を用いる際の濃度としては、10ppm以上20,000ppm以下の範囲内が好ましい。
<Post-treatment agent>
Examples of the post-treatment agent include silane coupling agents, titanium alkoxides, resins, and rust inhibitors, and any compound can be used as long as it has a functional group that is in close contact with the insulating material. Moreover, these can also be used in combination. Examples of the functional group in close contact with the insulating material include an epoxy group, a silanol group, an imide group, an isocyanate group, a carboxyl group, a phosphone group, a carbonyl group, and a mercapto group. The resin has only to have the above functional group, and examples thereof include polyacrylic acid, alklu resins such as derivatives thereof, epoxy resins, polyallylamine and the like. The concentration when these post-treatment agents are used is preferably within the range of 10 ppm or more and 20,000 ppm or less.

(III)本発明における銅の表面処理剤の製造方法
本発明の銅の表面処理剤は、従来公知の混合方法・混合装置により混合される。本発明の銅の表面処理剤に含有される物質を混合する順番は、特に限定されない。また、上記物質は、一度に混合してもよく、分割して混合してもよい。
(III) Manufacturing Method of Copper Surface Treatment Agent in the Present Invention The copper surface treatment agent of the present invention is mixed by a conventionally known mixing method / mixing apparatus. The order of mixing the substances contained in the copper surface treating agent of the present invention is not particularly limited. Moreover, the said substance may be mixed at once, and may be divided and mixed.

(IV)本発明における銅の表面処理剤を含む溶液
本発明における銅の表面処理方法は、銅の表面に、上記表面処理剤を溶液として接触させることが好ましい。上記溶液は、溶質である上記表面処理剤と溶媒とから構成される。本発明に用いられる溶媒は、上記表面処理剤を溶解することができれば特に限定されない。例えば、水、および有機溶媒、例えばベンゼン、トルエン、キシレン、n−へプタン、n−ヘキサン、シクロヘキサン、n−オクタン等の炭化水素;ジクロロメタン、ジクロロエタン、四塩化炭素、クロロホルム、クロロベンゼン、ジクロロベンゼンおよびトリクロロベンゼン等のハロゲン化炭化水素;メチルエチルケトン、メチルイソブチルケトン等のケトン類;テトラヒドロフラン、ジエチルエーテル、ジオキサン、メチルセルソルブ等のエーテル類;メタノール、エタノール、メトキシプロパノール等のアルコール類;などが挙げられる。上記溶媒は、単独で用いてもよく、適宜2種類以上を混合して用いてもよい。また、上記水としては、イオン交換水、純水、超純水等のイオン性物質や不純物を除去した水が好ましい。
(IV) Solution containing copper surface treatment agent in the present invention In the copper surface treatment method in the present invention, the surface treatment agent is preferably brought into contact with the surface of copper as a solution. The solution is composed of the surface treatment agent as a solute and a solvent. The solvent used in the present invention is not particularly limited as long as it can dissolve the surface treatment agent. For example, water, and organic solvents such as benzene, toluene, xylene, n-heptane, n-hexane, cyclohexane, n-octane and other hydrocarbons; dichloromethane, dichloroethane, carbon tetrachloride, chloroform, chlorobenzene, dichlorobenzene and tri And halogenated hydrocarbons such as chlorobenzene; ketones such as methyl ethyl ketone and methyl isobutyl ketone; ethers such as tetrahydrofuran, diethyl ether, dioxane and methyl cellosolve; alcohols such as methanol, ethanol and methoxypropanol; The said solvent may be used independently and may mix and use 2 or more types suitably. The water is preferably water from which ionic substances and impurities such as ion-exchanged water, pure water, and ultrapure water have been removed.

上記溶液中の上記有機溶媒の濃度は、溶液の温度、上記表面処理剤の成分等によって決まり特に限定されるものではないが、環境配慮の理由から、好ましくは0%以上10%以下、より好ましくは0%以上1%以下、特に好ましくは0%以上0.1%以下の範囲内である。   The concentration of the organic solvent in the solution is determined depending on the temperature of the solution, the components of the surface treatment agent, etc., and is not particularly limited. However, for environmental reasons, it is preferably 0% or more and 10% or less, more preferably Is in the range of 0% to 1%, particularly preferably 0% to 0.1%.

ここで、本発明は、銅の安定した表面処理を行うことも目的の1つとしているため、上記溶液中における上記表面処理剤の濃度が低濃度であってもよい。それゆえ、本発明における銅の表面処理剤は、従来の銅の表面処理剤と比較して、銅の表面をエッチング等の粗化処理しないという点で優れている。   Here, since the present invention is also intended to perform a stable surface treatment of copper, the concentration of the surface treatment agent in the solution may be low. Therefore, the copper surface treating agent in the present invention is superior to the conventional copper surface treating agent in that the surface of the copper is not roughened by etching or the like.

(V)本発明における銅の表面処理方法
本発明の銅の表面処理方法は、銅の表面に上記表面処理剤を接触させる方法である。さらに、本発明の銅の表面処理方法は、銅の表面を粗化処理することなく、銅の表面に上記表面処理剤を接触させてもよい。
(V) The surface treatment method of copper in this invention The surface treatment method of copper of this invention is a method of making the said surface treating agent contact the surface of copper. Furthermore, in the copper surface treatment method of the present invention, the surface treatment agent may be brought into contact with the copper surface without roughening the copper surface.

銅の表面に上記表面処理剤を接触させる方法としては特に限定されない。例えば、上記表面処理剤を含む溶液に銅を浸漬させる方法、銅の表面に上記表面処理剤を含む溶液をスプレーによって噴射する方法、銅の表面に上記表面処理剤を含む溶液を塗布する方法等が挙げられる。また、上記表面処理剤は、一度に接触させてもよく、分割して接触させてもよい。   The method for bringing the surface treatment agent into contact with the copper surface is not particularly limited. For example, a method of immersing copper in a solution containing the surface treatment agent, a method of spraying a solution containing the surface treatment agent on the surface of copper by spraying, a method of applying a solution containing the surface treatment agent on the surface of copper, etc. Is mentioned. Moreover, the said surface treating agent may be made to contact at once, and may be divided and made to contact.

銅の表面に上記表面処理剤を接触させる際の温度は、上記表面処理剤の成分等によって決まり特に限定されるものではないが、反応性に優れているとの理由から、好ましくは10℃以上60℃以下、より好ましくは20℃以上50℃以下、特に好ましくは30℃以上40℃以下の範囲内である。   The temperature at which the surface treatment agent is brought into contact with the surface of copper is not particularly limited depending on the components of the surface treatment agent, but is preferably 10 ° C. or higher because of excellent reactivity. It is 60 ° C. or less, more preferably 20 ° C. or more and 50 ° C. or less, particularly preferably 30 ° C. or more and 40 ° C. or less.

銅の表面に上記表面処理剤を接触させる時間は、上記表面処理剤の成分等によって決まり特に限定されるものではないが、反応性に優れているとの理由から、好ましくは1秒以上600秒以下、より好ましくは5秒以上300秒以下、特に好ましくは15秒以上120秒以下の範囲内である。   The time for which the surface treatment agent is brought into contact with the surface of copper is not particularly limited depending on the components of the surface treatment agent, but is preferably 1 second or more and 600 seconds because of excellent reactivity. Hereinafter, it is more preferably in the range of 5 seconds to 300 seconds, particularly preferably 15 seconds to 120 seconds.

本発明における銅の表面処理方法は、銅の表面に上記表面処理剤を接触させる前に、酸等により前処理してもよい。また、本発明における銅の表面処理方法は、銅の表面に上記表面処理剤を接触させた後に、さらに上記表面処理剤等により後処理してもよい。上記後処理後には、水洗してから乾燥させても、水洗せずに乾燥させてもよい。また、本発明における銅の表面処理方法は、銅の表面に上記表面処理剤を接触させた後に、熱処理等を行ってもよい。   The copper surface treatment method of the present invention may be pretreated with an acid or the like before bringing the surface treatment agent into contact with the copper surface. In the copper surface treatment method of the present invention, after the surface treatment agent is brought into contact with the copper surface, the copper treatment may be further performed with the surface treatment agent or the like. After the post-treatment, it may be washed with water and dried, or may be dried without washing. In the copper surface treatment method of the present invention, the surface treatment agent may be brought into contact with the copper surface, and then heat treatment or the like may be performed.

(VI)本発明における銅張り材料
本発明の銅張り材料は、上記銅の表面処理方法により表面処理されてなるものである。上記銅の表面処理方法により表面処理される前の銅張り材料としては、一般的な電子基板、リードフレーム等の電子部品、装飾品、建材等を挙げることができる。本発明の銅張り材料は、銅の表面全体が上記表面処理方法により表面処理されているものに限定されず、銅の表面の一部が上記表面処理方法により表面処理されているものも本発明に含まれる。
(VI) Copper-clad material in the present invention The copper-clad material of the present invention is surface-treated by the above-described copper surface treatment method. Examples of the copper-clad material before the surface treatment by the copper surface treatment method include electronic parts such as general electronic substrates and lead frames, ornaments, and building materials. The copper-clad material of the present invention is not limited to those in which the entire surface of copper is surface-treated by the above-mentioned surface treatment method, and those in which a part of the surface of copper is surface-treated by the above-mentioned surface treatment method are also included in the present invention. include.

(VII)本発明における多層配線基板
本発明の多層配線基板(ビルドアップ配線基板)は、上記銅張り材料を備えているものである。本発明の多層配線基板は、従来公知の多層配線基板の製造方法により製造されるものである。具体的には、表面部が銅からなる導電層を有する内層基板が、樹脂等の絶縁材を挟んで他の内層基板と積層プレスされることにより製造される。多層配線基板(ビルドアップ配線基板)には、一括ラミネーション方式のビルドアップ基板と、シーケンシャルビルドアップ方式のビルドアップ基板とがある。
(VII) Multilayer Wiring Board in the Present Invention The multilayer wiring board (build-up wiring board) of the present invention is provided with the above copper-clad material. The multilayer wiring board of the present invention is manufactured by a conventionally known method for manufacturing a multilayer wiring board. Specifically, an inner layer substrate having a conductive layer whose surface is made of copper is manufactured by being laminated and pressed with another inner layer substrate with an insulating material such as resin interposed therebetween. The multilayer wiring board (build-up wiring board) includes a batch lamination type build-up board and a sequential build-up type build-up board.

本発明における多層配線基板には、最外層に上記銅張り材料を備えている外層基板および単層基板を含む。また、上記外層基板には、最外層面に上記銅張り材料を片面または両面に備えている片面または両面の外層基板を含む。   The multilayer wiring board in the present invention includes an outer layer board and a single layer board provided with the copper-clad material in the outermost layer. The outer layer substrate includes a single-sided or double-sided outer layer substrate having the copper-clad material on one or both sides on the outermost layer surface.

以下、実施例および比較例により、本発明をさらに詳細に説明するが、本発明はこれら実施例に限定されるものではない。   Hereinafter, although an example and a comparative example explain the present invention still in detail, the present invention is not limited to these examples.

〔実施例1〕
<銅の表面処理工程>
厚さ35μmの電解銅箔(古河サーキットフォイル株式会社製、商品名:「F−WS箔」)を、水道水で希釈した硫酸および過酸化水素の水溶液(硫酸の濃度3%、過酸化水素の濃度1%)に30℃・60秒の条件で浸漬させた後、水道水で洗浄した。
[Example 1]
<Copper surface treatment process>
A 35 μm thick electrolytic copper foil (Furukawa Circuit Foil, trade name: “F-WS foil”) diluted with tap water in sulfuric acid and hydrogen peroxide (sulfuric acid concentration 3%, hydrogen peroxide The sample was immersed in a concentration of 1%) at 30 ° C. for 60 seconds, and then washed with tap water.

次に、上記処理を行った電解銅箔を、所定の表面処理剤(成分等については後述する)の溶液に40℃・60秒の条件で浸漬させた後、水道水で洗浄し、80℃・5分の条件で乾燥させた。   Next, the electrolytic copper foil subjected to the above treatment was immersed in a solution of a predetermined surface treatment agent (components will be described later) under conditions of 40 ° C. and 60 seconds, then washed with tap water, and 80 ° C. -Dried for 5 minutes.

<所定の表面処理剤の成分等>
上記所定の表面処理剤には、スズ化合物としての硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm、試薬)と、錯化剤としてのチオ尿素(表面処理剤全体に対するチオ尿素の濃度:5%、試薬)と、シランカップリング剤としての5%に希釈した3−メルカプトプロピルトリメトキシシラン(表面処理剤全体に対する3−メルカプトプロピルトリメトキシシランの濃度:1000ppm、信越化学工業株式会社製、商品名:「KBM−803」)とを含めた。その後、水酸化ナトリウムを添加して、上記表面処理剤を含む溶液のpHを3とした。
<Components of predetermined surface treatment agent>
The predetermined surface treatment agent includes tin sulfate as a tin compound (concentration of tin sulfate relative to the entire surface treatment agent: 25 ppm, reagent) and thiourea as a complexing agent (concentration of thiourea relative to the entire surface treatment agent: 5-mercaptopropyltrimethoxysilane diluted to 5% as a silane coupling agent (concentration of 3-mercaptopropyltrimethoxysilane with respect to the entire surface treatment agent: 1000 ppm, manufactured by Shin-Etsu Chemical Co., Ltd., Product name: “KBM-803”). Thereafter, sodium hydroxide was added to adjust the pH of the solution containing the surface treatment agent to 3.

<多層配線基板製造工程>
得られた電解銅箔と樹脂等の絶縁材との密着性を評価するため、上記電解銅箔の両面にビルドアップ配線板用絶縁材(松下電工株式会社製汎用プリプレグ、FR−4)を重ねて、150℃・20kg/m→150℃・30kg/m・0.5時間→180℃・30kg/m・1.5時間の条件で加熱しながら積層プレスし、その後に、80℃・1.5時間の条件で冷却した。その後プレスを終了し、20℃・20分間の条件で冷却した。
<Multilayer wiring board manufacturing process>
In order to evaluate the adhesion between the obtained electrolytic copper foil and an insulating material such as a resin, build-up wiring board insulating materials (general-purpose prepreg, FR-4 manufactured by Matsushita Electric Works, Ltd.) are laminated on both surfaces of the electrolytic copper foil. 150 ° C. · 20 kg / m 2 → 150 ° C. · 30 kg / m 2 · 0.5 hours → 180 ° C. · 30 kg / m 2 · 1.5 hours heating and laminating press, then 80 ° C. -It cooled on the conditions for 1.5 hours. Thereafter, the press was terminated, and cooling was performed at 20 ° C. for 20 minutes.

<銅の表面処理後の物性>
(1)銅の表面処理後における電解銅箔のエッチング量
銅の表面処理後における電解銅箔のエッチング量は、精密天秤により、エッチング前後の重量変化を測定して求めた。その結果、エッチング量が0.1g/m未満である状態を「○」とし、0.1g/m以上1g/m以下である状態を「△」とし、1g/mを超える状態を「×」とした。
<Physical properties after surface treatment of copper>
(1) The etching amount of the electrolytic copper foil after the copper surface treatment The etching amount of the electrolytic copper foil after the copper surface treatment was obtained by measuring the weight change before and after the etching with a precision balance. As a result, the state where the etching amount is less than 0.1 g / m 2 is “◯”, the state where the etching amount is 0.1 g / m 2 or more and 1 g / m 2 or less is “Δ”, and the state exceeds 1 g / m 2. Was marked “x”.

(2)銅の表面処理後における電解銅箔のSEM外観
銅の表面処理後における電解銅箔の外観は、SEM(Scanning Electron Microscope、日本電子株式会社製、商品名:「JSM5310」)により、倍率を1000倍および5000倍にして目視にて評価した。その結果、凹凸がない(平坦な)状態を「○」とし、凹凸がある状態を「×」とした。
(2) SEM appearance of electrolytic copper foil after copper surface treatment The external appearance of the electrolytic copper foil after copper surface treatment is determined by SEM (Scanning Electron Microscope, manufactured by JEOL Ltd., trade name: “JSM5310”). Was 1000 times and 5000 times and evaluated visually. As a result, the state without unevenness (flat) was set as “◯”, and the state with unevenness was set as “x”.

図1,2は、実施例1における銅のSEM外観を示したものである。図1に示すように、本発明の銅の表面処理剤により表面処理を行った銅は、凹凸がない状態であった。なお、図2は、前処理として硫酸・過酸化水素の水溶液(従来の銅の表面処理剤)により表面処理を行った後の銅のSEM外観を示したものである。   1 and 2 show the SEM appearance of copper in Example 1. FIG. As shown in FIG. 1, the copper which surface-treated with the copper surface treating agent of this invention was a state without an unevenness | corrugation. FIG. 2 shows the SEM appearance of copper after surface treatment with a sulfuric acid / hydrogen peroxide aqueous solution (conventional copper surface treatment agent) as a pretreatment.

(3)銅の表面処理後における電解銅箔のスズ・シラン化合物の皮膜量
銅の表面処理後における電解銅箔のスズ・シラン化合物の皮膜量は、蛍光X線(株式会社島津製作所製、商品名:「XRF1700」)による測定により、スズ元素もしくはシラン元素の量として測定した。
(3) The amount of tin / silane compound film on the electrolytic copper foil after copper surface treatment The amount of tin / silane compound film on the electrolytic copper foil after copper surface treatment was measured using fluorescent X-rays (product of Shimadzu Corporation, product) Name: “XRF1700”), and measured as the amount of tin element or silane element.

(4)銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性
多層配線基板の銅箔と樹脂等の絶縁材との密着性、即ち多層配線基板における絶縁材からの銅箔の引き剥がし強さは、万能試験機(株式会社エー・アンド・デイ製、商品名:「テンシロン」)により、JIS C 6481に準拠してロードセル100kg/m、レンジ2%、クロスヘッドスピード50mm/min、チャートスピード20mm/minの条件で測定した。
(4) Adhesiveness between copper foil and insulating material such as resin in multilayer wiring board provided with electrolytic copper foil after surface treatment of copper Adhesion between copper foil of multilayer wiring board and insulating material such as resin, The peel strength of the copper foil from the insulating material in the multilayer wiring board is 100 kg / m in load cell according to JIS C 6481 using a universal testing machine (manufactured by A & D Co., Ltd., trade name: “Tensilon”). 2. Measurement was performed under conditions of a range of 2%, a crosshead speed of 50 mm / min, and a chart speed of 20 mm / min.

(5)上記物性の評価結果
上記物性の評価結果は、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が35mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.3mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.80kN/mであった。
(5) Evaluation results of the above physical properties The evaluation results of the above physical properties are that the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, the copper The amount of tin film on the electrolytic copper foil after the surface treatment of 35 mg / m 2 , the amount of the silane compound film on the electrolytic copper foil after the surface treatment of copper is 0.3 mg / m 2 , and the electrolytic copper after the surface treatment of copper The adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the foil was 0.80 kN / m.

〔実施例2〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更したこと以外は、実施例1と同様の操作を行った。
[Example 2]
Except that the tin compound contained in the specified surface treatment agent was changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). The same operation as in Example 1 was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が137mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.4mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.00kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment The amount of the silane compound of the electrolytic copper foil after the surface treatment of copper is 137 mg / m 2 , the amount of the silane compound is 0.4 mg / m 2 , and the copper foil in the multilayer wiring board provided with the electrolytic copper foil after the copper surface treatment Adhesion with an insulating material such as a resin was 1.00 kN / m.

〔実施例3〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm、試薬)を追加したこと以外は、実施例1と同様の操作を行った。
Example 3
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). The same operation as in Example 1 was performed except that hydrogen fluoride (concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm, reagent) was added to the agent.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が110mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.4mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.10kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 110 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.4 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as resin was 1.10 kN / m.

〔実施例4〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、錯化剤をチオ尿素(表面処理剤全体に対するチオ尿素の濃度:5%)からジエチルチオ尿素(表面処理剤全体に対するジエチルチオ尿素の濃度:5%)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 4
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). Change from thiourea (concentration of thiourea to the entire surface treatment agent: 5%) to diethylthiourea (concentration of diethylthiourea to the entire surface treatment agent: 5%), and use hydrogen fluoride (surface treatment agent) as the prescribed surface treatment agent The same operation as in Example 1 was performed except that the concentration of hydrogen fluoride with respect to the whole: 500 ppm) was added.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が35mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.3mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.70kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 35 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.3 mg / m 2 , and an electrolytic copper foil after copper surface treatment; The adhesion with an insulating material such as resin was 0.70 kN / m.

〔実施例5〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:10,000ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:10,000ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 5
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 10,000 ppm). The same operation as in Example 1 was performed except that hydrogen fluoride (concentration of hydrogen fluoride with respect to the entire surface treatment agent: 10,000 ppm) was added to the surface treatment agent.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が1024mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.6mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.70kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 1024mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil after the surface treatment of the copper with an electrolytic copper foil after the 0.6 mg / m 2, the surface treatment of copper The adhesion with an insulating material such as resin was 0.70 kN / m.

〔実施例6〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシラン(表面処理剤全体に対する3−メルカプトプロピルトリメトキシシランの濃度:1000ppm)から5%に希釈した3−メルカプトプロピルトリメトキシシラン(表面処理剤全体に対する3−メルカプトプロピルトリメトキシシランの濃度:200ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 6
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm), and a silane coupling agent 3-mercaptopropyltrimethoxysilane (concentration of 3-mercaptopropyltrimethoxysilane with respect to the whole surface treatment agent: 1000 ppm) diluted to 5% from 3-mercaptopropyltrimethoxysilane (to the whole surface treatment agent) Example 1 except that the concentration of 3-mercaptopropyltrimethoxysilane was changed to 200 ppm and hydrogen fluoride (the concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm) was added to the predetermined surface treatment agent. The same operation was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が252mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.3mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.80kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment The amount of 252 mg / m 2 , the amount of the silane compound film on the electrolytic copper foil after copper surface treatment is 0.3 mg / m 2 , and the copper foil in the multilayer wiring board provided with the electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as resin was 0.80 kN / m.

〔実施例7〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシラン(表面処理剤全体に対する3−メルカプトプロピルトリメトキシシランの濃度:1000ppm)から5%に希釈した3−メルカプトプロピルトリメトキシシラン(表面処理剤全体に対する3−メルカプトプロピルトリメトキシシランの濃度:5000ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 7
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm), and a silane coupling agent 3-mercaptopropyltrimethoxysilane (concentration of 3-mercaptopropyltrimethoxysilane with respect to the whole surface treatment agent: 1000 ppm) diluted to 5% from 3-mercaptopropyltrimethoxysilane (to the whole surface treatment agent) Example 1 except that the concentration of 3-mercaptopropyltrimethoxysilane was changed to 5000 ppm and hydrogen fluoride (the concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm) was added to the predetermined surface treatment agent. The same operation was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が17mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が2.4mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.20kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment A copper foil in a multilayer wiring board having an amount of 17 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment of 2.4 mg / m 2 , and an electrolytic copper foil after the copper surface treatment; Adhesion with an insulating material such as resin was 1.20 kN / m.

〔実施例8〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加し、上記表面処理剤を含む溶液のpHを1に変更したこと以外は、実施例1と同様の操作を行った。
Example 8
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). The same operation as in Example 1 was performed except that hydrogen fluoride (concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm) was added to the agent, and the pH of the solution containing the surface treatment agent was changed to 1. It was.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が862mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.7mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.80kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 862 mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil after the surface treatment of the copper with an electrolytic copper foil after the 0.7 mg / m 2, the surface treatment of copper Adhesion with an insulating material such as resin was 0.80 kN / m.

〔実施例9〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加し、上記表面処理剤を含む溶液のpHを5に変更したこと以外は、実施例1と同様の操作を行った。
Example 9
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). The same operation as in Example 1 was performed except that hydrogen fluoride (concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm) was added to the agent, and the pH of the solution containing the surface treatment agent was changed to 5. It was.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が19mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.3mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.80kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 19 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.3 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as resin was 0.80 kN / m.

〔実施例10〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシラン(表面処理剤全体に対する3−メルカプトプロピルトリメトキシシランの濃度:1000ppm)から30%に希釈した3−メルカプトプロピルトリメトキシシラン(表面処理剤全体に対する3−メルカプトプロピルトリメトキシシランの濃度:1000ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 10
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm), and a silane coupling agent 3-mercaptopropyltrimethoxysilane (concentration of 3-mercaptopropyltrimethoxysilane with respect to the whole surface treatment agent: 1000 ppm) diluted to 30% to 3-mercaptopropyltrimethoxysilane (with respect to the whole surface treatment agent) Example 1 except that the concentration of 3-mercaptopropyltrimethoxysilane was changed to 1000 ppm and hydrogen fluoride (the concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm) was added to the predetermined surface treatment agent. The same operation was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が89mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.7mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.10kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 89 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.7 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as resin was 1.10 kN / m.

〔実施例11〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランから3−メルカプトプロピルトリメトキシシランとエポキシシラン(信越化学工業株式会社製、商品名:「KBM403」)とを1:1で混合して5%に希釈した混合物(表面処理剤全体に対する上記混合物の濃度:1000ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 11
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm), and a silane coupling agent 3-mercaptopropyltrimethoxysilane diluted with 5% to 3-mercaptopropyltrimethoxysilane and epoxysilane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM403”) mixed 1: 1 to 5% Except that it was changed to a diluted mixture (concentration of the above-mentioned mixture with respect to the whole surface treatment agent: 1000 ppm), and hydrogen fluoride (concentration of hydrogen fluoride with respect to the whole surface treatment agent: 500 ppm) was added to the predetermined surface treatment agent. The same operation as in Example 1 was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が135mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が1.0mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.20kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 135 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 1.0 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as resin was 1.20 kN / m.

〔実施例12〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランから3−メルカプトプロピルトリメトキシシランとアミノシラン(信越化学工業株式会社製、商品名:「KBM903」)とを1:1で混合して5%に希釈した混合物(表面処理剤全体に対する上記混合物の濃度:1000ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 12
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm), and a silane coupling agent 3-mercaptopropyltrimethoxysilane diluted to 5% with 3-mercaptopropyltrimethoxysilane and aminosilane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM903”) in a ratio of 1: 1 to 5% Except for changing to a diluted mixture (concentration of the above mixture with respect to the entire surface treatment agent: 1000 ppm) and adding hydrogen fluoride (concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm) to the predetermined surface treatment agent, The same operation as in Example 1 was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が159mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が1.2mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.20kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment The amount of 159 mg / m 2 , the coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 1.2 mg / m 2 , and the copper foil in the multilayer wiring board provided with the electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as resin was 1.20 kN / m.

〔実施例13〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランから3−メルカプトプロピルトリメトキシシランとイソシアネートシラン(信越化学工業株式会社製、商品名:「KBE9007」)とを1:1で混合して5%に希釈した混合物(表面処理剤全体に対する上記混合物の濃度:1000ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 13
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm), and a silane coupling agent 3-mercaptopropyltrimethoxysilane diluted to 5% with 3-mercaptopropyltrimethoxysilane and isocyanate silane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBE9007”) in a ratio of 1: 1 to 5% Except that it was changed to a diluted mixture (concentration of the above-mentioned mixture with respect to the whole surface treatment agent: 1000 ppm), and hydrogen fluoride (concentration of hydrogen fluoride with respect to the whole surface treatment agent: 500 ppm) was added to the predetermined surface treatment agent. The same operation as in Example 1 was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が120mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.6mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.10kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 120 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.6 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as resin was 1.10 kN / m.

〔実施例14〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランからエポキシシランとアミノシランとを1:1で混合して5%に希釈した混合物(表面処理剤全体に対する上記混合物の濃度:1000ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 14
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm), and a silane coupling agent From 3-mercaptopropyltrimethoxysilane diluted to 5%, the mixture was changed to 5% by mixing epoxysilane and aminosilane 1: 1 (concentration of the above mixture with respect to the whole surface treatment agent: 1000 ppm), The same operation as in Example 1 was performed except that hydrogen fluoride (hydrogen fluoride concentration with respect to the entire surface treatment agent: 500 ppm) was added to the predetermined surface treatment agent.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が163mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が1.2mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.10kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment The amount of 163 mg / m 2 , the coating amount of the silane compound of the electrolytic copper foil after the copper surface treatment is 1.2 mg / m 2 , and the copper foil in the multilayer wiring board provided with the electrolytic copper foil after the copper surface treatment Adhesion with an insulating material such as resin was 1.10 kN / m.

〔実施例15〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤にチオ硫酸ナトリウム(表面処理剤全体に対するチオ硫酸ナトリウムの濃度:1000ppm、試薬)を追加し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 15
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). Sodium thiosulfate (concentration of sodium thiosulfate relative to the entire surface treatment agent: 1000 ppm, reagent) is added to the agent, and hydrogen fluoride (concentration of hydrogen fluoride relative to the entire surface treatment agent: 500 ppm) is added to the specified surface treatment agent Except that, the same operation as in Example 1 was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が87mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.6mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.00kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 87 mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil after the surface treatment of the copper with an electrolytic copper foil after the 0.6 mg / m 2, the surface treatment of copper Adhesion with an insulating material such as a resin was 1.00 kN / m.

〔実施例16〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤に次亜リン酸ナトリウム(表面処理剤全体に対する次亜リン酸ナトリウムの濃度:1000ppm、試薬)を追加し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 16
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). Sodium hypophosphite (concentration of sodium hypophosphite with respect to the whole surface treatment agent: 1000 ppm, reagent) is added to the agent, and hydrogen fluoride (concentration of hydrogen fluoride with respect to the whole surface treatment agent: The same operation as in Example 1 was performed except that 500 ppm) was added.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が113mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.5mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.00kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment The copper foil in the multilayer wiring board provided with the amount of 113 mg / m 2 , the coating amount of the silane compound of the electrolytic copper foil after the copper surface treatment is 0.5 mg / m 2 , and the electrolytic copper foil after the copper surface treatment; Adhesion with an insulating material such as a resin was 1.00 kN / m.

〔実施例17〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤に硝酸アルミニウム(表面処理剤全体に対する硝酸アルミニウムの濃度:1000ppm、試薬)を追加し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 17
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). Aluminum nitrate (concentration of aluminum nitrate relative to the entire surface treatment agent: 1000 ppm, reagent) was added to the agent, and hydrogen fluoride (concentration of hydrogen fluoride relative to the entire surface treatment agent: 500 ppm) was added to the specified surface treatment agent Except for this, the same operation as in Example 1 was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が126mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.4mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.00kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 126 mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil having an electrolytic copper foil after the 0.4 mg / m 2, the surface treatment of the copper after the surface treatment of copper Adhesion with an insulating material such as a resin was 1.00 kN / m.

〔実施例18〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤に防錆剤としてのアミノテトラゾール(表面処理剤全体に対するアミノテトラゾールの濃度:1000ppm、試薬)を追加し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加したこと以外は、実施例1と同様の操作を行った。
Example 18
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). Aminotetrazole (concentration of aminotetrazole with respect to the entire surface treatment agent: 1000 ppm, reagent) as a rust inhibitor is added to the agent, and hydrogen fluoride (concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm) is added to the predetermined surface treatment agent. ) The same operation as in Example 1 was performed except that.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が105mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.4mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.20kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment A copper foil in a multilayer wiring board having an amount of 105 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.4 mg / m 2 , and an electrolytic copper foil after the copper surface treatment; Adhesion with an insulating material such as resin was 1.20 kN / m.

〔実施例19〕
電解銅箔の酸洗を、硫酸および過酸化水素の水溶液から硫酸の水溶液(硫酸の濃度3%)に変更し、所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm、試薬)を追加したこと以外は、実施例1と同様の操作を行った。
Example 19
The pickling of the electrolytic copper foil was changed from an aqueous solution of sulfuric acid and hydrogen peroxide to an aqueous solution of sulfuric acid (sulfuric acid concentration 3%), and the tin compound contained in the specified surface treatment agent was changed to tin sulfate (sulfuric acid for the entire surface treatment agent). Changed from tin concentration: 25 ppm) to tin sulfate (concentration of tin sulfate with respect to the entire surface treatment agent: 500 ppm), and hydrogen fluoride (concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm, reagent) ) The same operation as in Example 1 was performed except that.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が123mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.4mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.00kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 123 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.4 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as a resin was 1.00 kN / m.

〔実施例20〕
電解銅箔の酸洗を、硫酸および過酸化水素の水溶液から、硫酸、過酸化水素および防錆剤としてのチオグリセロールの水溶液(硫酸の濃度3%、過酸化水素の濃度1%、チオグリセロールの濃度1%)に変更し、所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm、試薬)を追加したこと以外は、実施例1と同様の操作を行った。
Example 20
Pickling electrolytic copper foil from sulfuric acid and hydrogen peroxide aqueous solution, sulfuric acid, hydrogen peroxide and aqueous solution of thioglycerol as rust inhibitor (sulfuric acid concentration 3%, hydrogen peroxide concentration 1%, thioglycerol The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). The same operation as in Example 1 was performed, except that hydrogen fluoride (hydrogen fluoride concentration with respect to the entire surface treatment agent: 500 ppm, reagent) was added to the predetermined surface treatment agent.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が98mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.4mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.50kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 98 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.4 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as a resin was 1.50 kN / m.

〔実施例21〕
電解銅箔の酸洗を、硫酸および過酸化水素の水溶液から、二塩化パラジウムおよび塩化第二銅の水溶液(二塩化パラジウムの濃度0.03%、塩化第二銅の濃度1%、pH2)に変更し、所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm、試薬)を追加したこと以外は、実施例1と同様の操作を行った。
Example 21
Pickling of electrolytic copper foil from aqueous solution of sulfuric acid and hydrogen peroxide to aqueous solution of palladium dichloride and cupric chloride (palladium dichloride concentration 0.03%, cupric chloride concentration 1%, pH 2) Change the tin compound contained in the specified surface treatment agent from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) The same operation as in Example 1 was performed except that hydrogen fluoride (concentration of hydrogen fluoride with respect to the entire surface treatment agent: 500 ppm, reagent) was added to the surface treatment agent.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が77mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.4mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.50kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment The amount of the silane compound of the electrolytic copper foil after the surface treatment of copper of 77 mg / m 2 is 0.4 mg / m 2 and the copper foil in the multilayer wiring board provided with the electrolytic copper foil after the copper surface treatment; Adhesion with an insulating material such as a resin was 1.50 kN / m.

〔実施例22〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加し、上記表面処理剤の溶液に浸漬させた電解銅箔を5%に希釈した3−メルカプトプロピルトリメトキシシランを含む後処理剤(後処理剤全体に対する3−メルカプトプロピルトリメトキシシランの濃度:1000ppm)で処理し、その後、水道水で洗浄したこと以外は、実施例1と同様の操作を行った。
[Example 22]
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). Hydrogen fluoride (concentration of hydrogen fluoride with respect to the whole surface treatment agent: 500 ppm) was added to the agent, and 3-mercaptopropyltrimethoxysilane diluted with 5% of the electrolytic copper foil immersed in the solution of the surface treatment agent was added. The same operation as in Example 1 was performed, except that it was treated with a post-treatment agent (concentration of 3-mercaptopropyltrimethoxysilane with respect to the whole post-treatment agent: 1000 ppm) and then washed with tap water.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が137mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.7mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.20kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 137 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.7 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as resin was 1.20 kN / m.

〔実施例23〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、所定の表面処理剤にフッ化水素(表面処理剤全体に対するフッ化水素の濃度:500ppm)を追加し、上記表面処理剤の溶液に浸漬させた電解銅箔を5%に希釈した3−メルカプトプロピルトリメトキシシランを含む後処理剤(後処理剤全体に対する3−メルカプトプロピルトリメトキシシランの濃度:1000ppm)で処理し、その後、水道水で洗浄しなかったこと以外は、実施例1と同様の操作を行った。
Example 23
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm). Hydrogen fluoride (concentration of hydrogen fluoride with respect to the whole surface treatment agent: 500 ppm) was added to the agent, and 3-mercaptopropyltrimethoxysilane diluted with 5% of the electrolytic copper foil immersed in the solution of the surface treatment agent was added. The same operation as Example 1 was performed except that it was treated with the post-treatment agent (concentration of 3-mercaptopropyltrimethoxysilane with respect to the whole post-treatment agent: 1000 ppm) and then not washed with tap water.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が137mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が2.5mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.50kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 137 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 2.5 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as a resin was 1.50 kN / m.

〔実施例24〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランからエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」、表面処理剤全体に対するエポキシシランの濃度:1000ppm)に変更したこと以外は、実施例1と同様の操作を行った。
Example 24
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm), and a silane coupling agent Other than changing 3-mercaptopropyltrimethoxysilane diluted to 5% to epoxy silane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM-403”, concentration of epoxy silane with respect to the entire surface treatment agent: 1000 ppm) The same operation as in Example 1 was performed.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が158mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.2mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.80kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 158 mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil having an electrolytic copper foil after the 0.2 mg / m 2, the surface treatment of the copper after the surface treatment of copper Adhesion with an insulating material such as resin was 0.80 kN / m.

〔実施例25〕
所定の表面処理剤に含まれる所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランからエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」、表面処理剤全体に対するエポキシシランの濃度:1000ppm)に変更し、所定の表面処理剤にメタンスルホン酸(表面処理剤全体に対するメタンスルホン酸の濃度:500ppm、試薬)を追加したこと以外は、実施例1と同様の操作を行った。
Example 25
From tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) contained in the predetermined surface treatment agent contained in the predetermined surface treatment agent From 3-mercaptopropyltrimethoxysilane diluted with 5% silane coupling agent to epoxy silane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM-403”, concentration of epoxy silane with respect to the entire surface treatment agent : 1000 ppm), and the same operation as in Example 1 was performed except that methanesulfonic acid (concentration of methanesulfonic acid with respect to the whole surface treatment agent: 500 ppm, reagent) was added to the predetermined surface treatment agent.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が192mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.2mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.80kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment The amount of 192 mg / m 2 , the coating amount of the silane compound of the electrolytic copper foil after the copper surface treatment is 0.2 mg / m 2 , and the copper foil in the multilayer wiring board provided with the electrolytic copper foil after the copper surface treatment; Adhesion with an insulating material such as resin was 0.80 kN / m.

〔実施例26〕
所定の表面処理剤に含まれる所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランからエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」、表面処理剤全体に対するエポキシシランの濃度:1000ppm)に変更し、所定の表面処理剤に硝酸銀(表面処理剤全体に対する硝酸銀の濃度:50ppm、試薬)を追加したこと以外は、実施例1と同様の操作を行った。
Example 26
From tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) contained in the predetermined surface treatment agent contained in the predetermined surface treatment agent From 3-mercaptopropyltrimethoxysilane diluted with 5% silane coupling agent to epoxy silane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM-403”, concentration of epoxy silane with respect to the entire surface treatment agent : 1000 ppm), and the same operation as in Example 1 was performed except that silver nitrate (silver nitrate concentration with respect to the whole surface treatment agent: 50 ppm, reagent) was added to the predetermined surface treatment agent.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が252mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.2mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.90kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment The amount of 252 mg / m 2 , the amount of the silane compound film on the electrolytic copper foil after copper surface treatment is 0.2 mg / m 2 , and the copper foil in the multilayer wiring board provided with the electrolytic copper foil after copper surface treatment; The adhesion with an insulating material such as resin was 0.90 kN / m.

〔実施例27〕
所定の表面処理剤に含まれる所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランからエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」、表面処理剤全体に対するエポキシシランの濃度:1000ppm)に変更し、所定の表面処理剤に塩化パラジウム(表面処理剤全体に対する塩化パラジウムの濃度:50ppm、試薬)を追加したこと以外は、実施例1と同様の操作を行った。
Example 27
From tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) contained in the predetermined surface treatment agent contained in the predetermined surface treatment agent From 3-mercaptopropyltrimethoxysilane diluted with 5% silane coupling agent to epoxy silane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM-403”, concentration of epoxy silane with respect to the entire surface treatment agent : 1000 ppm), and the same operation as in Example 1 was performed except that palladium chloride (palladium chloride concentration with respect to the whole surface treatment agent: 50 ppm, reagent) was added to the predetermined surface treatment agent.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が213mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.2mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.90kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 213 mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil having an electrolytic copper foil after the 0.2 mg / m 2, the surface treatment of the copper after the surface treatment of copper The adhesion with an insulating material such as resin was 0.90 kN / m.

〔実施例28〕
所定の表面処理剤に含まれる所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランからエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」、表面処理剤全体に対するエポキシシランの濃度:1000ppm)に変更し、上記表面処理剤の溶液に浸漬させた電解銅箔を5%に希釈したエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」)を含む後処理剤(後処理剤全体に対するエポキシシランの濃度:1000ppm)で処理し、その後、水道水で洗浄しなかったこと以外は、実施例1と同様の操作を行った。
Example 28
From tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) contained in the predetermined surface treatment agent contained in the predetermined surface treatment agent From 3-mercaptopropyltrimethoxysilane diluted with 5% silane coupling agent to epoxy silane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM-403”, concentration of epoxy silane with respect to the entire surface treatment agent : 1000 ppm), and a post-treatment agent containing epoxy silane (trade name: “KBM-403” manufactured by Shin-Etsu Chemical Co., Ltd.) in which the electrolytic copper foil immersed in the surface treatment agent solution is diluted to 5%. (Epoxysilane concentration with respect to the entire post-treatment agent: 1000 ppm), and then not washed with tap water The procedure is as in Example 1.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が158mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が2.3mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.20kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 158 mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil after the surface treatment of the copper with an electrolytic copper foil after the 2.3 mg / m 2, the surface treatment of copper Adhesion with an insulating material such as resin was 1.20 kN / m.

〔実施例29〕
所定の表面処理剤に含まれる所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、上記表面処理剤の溶液に浸漬させた電解銅箔を5%に希釈したエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」)を含む後処理剤(後処理剤全体に対するエポキシシランの濃度:1000ppm)で処理し、その後、水道水で洗浄しなかったこと以外は、実施例1と同様の操作を行った。
Example 29
From tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) contained in the predetermined surface treatment agent contained in the predetermined surface treatment agent And a post-treatment agent (post-treatment) containing epoxy silane (trade name: “KBM-403”, manufactured by Shin-Etsu Chemical Co., Ltd.) diluted to 5% of an electrolytic copper foil immersed in the surface treatment agent solution. The same operation as in Example 1 was performed except that the epoxy silane was treated with a concentration of 1000 ppm of the whole agent and then not washed with tap water.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が137mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.7mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.40kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment Copper foil in a multilayer wiring board having an amount of 137 mg / m 2 , a coating amount of the silane compound of the electrolytic copper foil after copper surface treatment is 0.7 mg / m 2 , and an electrolytic copper foil after copper surface treatment; Adhesion with an insulating material such as a resin was 1.40 kN / m.

〔実施例30〕
所定の表面処理剤に含まれる所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランからエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」、表面処理剤全体に対するエポキシシランの濃度:1000ppm)に変更し、上記表面処理剤の溶液に浸漬させた電解銅箔を5%に希釈したポリアクリル酸(日本純薬株式会社製、分子量20,000)を含む後処理剤(後処理剤全体に対するポリアクリル酸の濃度:1000ppm)で処理し、その後、水道水で洗浄しなかったこと以外は、実施例1と同様の操作を行った。
Example 30
From tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) contained in the predetermined surface treatment agent contained in the predetermined surface treatment agent From 3-mercaptopropyltrimethoxysilane diluted with 5% silane coupling agent to epoxy silane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM-403”, concentration of epoxy silane with respect to the entire surface treatment agent : 1000 ppm), and a post-treatment agent (post-treatment) containing polyacrylic acid (manufactured by Nippon Pure Chemical Co., Ltd., molecular weight 20,000) diluted to 5% of the electrolytic copper foil immersed in the above-mentioned surface treatment agent solution Example 1 with the exception that the concentration of polyacrylic acid with respect to the entire agent: 1000 ppm) and then not washed with tap water. It was like operation.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が158mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.2mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.20kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 158 mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil having an electrolytic copper foil after the 0.2 mg / m 2, the surface treatment of the copper after the surface treatment of copper Adhesion with an insulating material such as resin was 1.20 kN / m.

〔実施例31〕
所定の表面処理剤に含まれる所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランからエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」、表面処理剤全体に対するエポキシシランの濃度:1000ppm)に変更し、上記表面処理剤の溶液に浸漬させた電解銅箔を5%に希釈したポリアクリル酸(日本純薬株式会社製、分子量20,000)およびエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」)を含む後処理剤(後処理剤全体に対するポリアクリル酸の濃度:1000ppm、エポキシシランの濃度:1000ppm)で処理し、その後、水道水で洗浄しなかったこと以外は、実施例1と同様の操作を行った。
Example 31
From tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) contained in the predetermined surface treatment agent contained in the predetermined surface treatment agent From 3-mercaptopropyltrimethoxysilane diluted with 5% silane coupling agent to epoxy silane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM-403”, concentration of epoxy silane with respect to the entire surface treatment agent : 1000 ppm), and polyacrylic acid (manufactured by Nippon Pure Chemicals Co., Ltd., molecular weight 20,000) and epoxysilane (Shin-Etsu Chemical Co., Ltd.) diluted to 5% of an electrolytic copper foil immersed in the surface treatment solution. Post-treatment agent (trade name: “KBM-403” manufactured by company) (concentration of polyacrylic acid relative to the whole post-treatment agent: 10 0 ppm, the concentration of the epoxy silane: treated with 1000 ppm), then, except that no washing with tap water, experiment was carried out in the same manner as in Example 1.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が158mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が2.5mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.20kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 158 mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil having an electrolytic copper foil after the 2.5 mg / m 2, the surface treatment of the copper after the surface treatment of copper Adhesion with an insulating material such as resin was 1.20 kN / m.

〔実施例32〕
所定の表面処理剤に含まれる所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤を5%に希釈した3−メルカプトプロピルトリメトキシシランからエポキシシラン(信越化学工業株式会社製、商品名:「KBM−403」、表面処理剤全体に対するエポキシシランの濃度:1000ppm)に変更し、上記表面処理剤の溶液に浸漬させた電解銅箔を5%に希釈したチタンアルコキシド(マツモトファインケミカル株式会社製、商品名:「オルガチックスTC−400」)を含む後処理剤(後処理剤全体に対するチタンアルコキシドの濃度:1000ppm)で処理し、その後、水道水で洗浄しなかったこと以外は、実施例1と同様の操作を行った。
[Example 32]
From tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) contained in the predetermined surface treatment agent contained in the predetermined surface treatment agent From 3-mercaptopropyltrimethoxysilane diluted with 5% silane coupling agent to epoxy silane (manufactured by Shin-Etsu Chemical Co., Ltd., trade name: “KBM-403”, concentration of epoxy silane with respect to the entire surface treatment agent : 1000 ppm), and after-treatment containing titanium alkoxide (trade name: “Orgatechs TC-400” manufactured by Matsumoto Fine Chemical Co., Ltd.) in which the electrolytic copper foil immersed in the surface treatment solution is diluted to 5%. Treatment with an agent (concentration of titanium alkoxide with respect to the whole aftertreatment agent: 1000 ppm) Except that no washing with road water, was subjected to the same procedure as in Example 1.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が158mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0.2mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.20kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 158 mg / m 2, and the copper foil in the multilayer wiring board coating amount of the silane compound of the electrolytic copper foil having an electrolytic copper foil after the 0.2 mg / m 2, the surface treatment of the copper after the surface treatment of copper Adhesion with an insulating material such as resin was 1.20 kN / m.

〔比較例1〕
厚さ35μmの電解銅箔を、硫酸・過酸化水素の水溶液および所定の表面処理剤の溶液に浸漬させる処理を、塩化銅4%、酢酸5%、およびアミノテトラゾール0.3%を含む水溶液に60秒間浸漬するエッチング粗化処理(凹凸処理)に変更したこと以外は、実施例1と同様の操作を行った。
[Comparative Example 1]
A treatment in which an electrolytic copper foil having a thickness of 35 μm is immersed in an aqueous solution of sulfuric acid / hydrogen peroxide and a predetermined surface treatment agent is applied to an aqueous solution containing 4% copper chloride, 5% acetic acid, and 0.3% aminotetrazole. The same operation as Example 1 was performed except having changed into the etching roughening process (concavo-convex process) immersed for 60 seconds.

その結果、銅の表面処理後における電解銅箔のSEM外観が「×」、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が1.00kN/mであった。   As a result, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “x”, and the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil after the copper surface treatment is It was 1.00 kN / m.

図3は、比較例1における銅のSEM外観を示したものである。図3に示すように、従来の銅の表面処理剤により表面処理を行った銅は、凹凸がある状態であった。   FIG. 3 shows the SEM appearance of copper in Comparative Example 1. As shown in FIG. 3, the copper which surface-treated with the surface treating agent of the conventional copper had the unevenness | corrugation.

〔比較例2〕
所定の表面処理剤に含まれるスズ化合物としての硫酸スズと、錯化剤としてのチオ尿素と、シランカップリング剤としての3−メルカプトプロピルトリメトキシシランとを、塩化銅(表面処理剤全体に対する塩化銅の濃度:1%、試薬)と、酢酸(表面処理剤全体に対する酢酸の濃度:10%、試薬)と、アミノテトラゾール(表面処理剤全体に対するアミノテトラゾールの濃度:0.3%、試薬)とに変更したこと以外は、実施例1と同様の操作を行った。
[Comparative Example 2]
Tin sulfate as a tin compound contained in a predetermined surface treatment agent, thiourea as a complexing agent, and 3-mercaptopropyltrimethoxysilane as a silane coupling agent are mixed with copper chloride (chlorination of the entire surface treatment agent). Copper concentration: 1%, reagent), acetic acid (concentration of acetic acid with respect to the whole surface treatment agent: 10%, reagent), and aminotetrazole (concentration of aminotetrazole with respect to the whole surface treatment agent: 0.3%, reagent) The same operation as Example 1 was performed except having changed into.

その結果、銅の表面処理後における電解銅箔のエッチング量が「△」、銅の表面処理後における電解銅箔のSEM外観が「×」、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.40kN/mであった。   As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “Δ”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “x”, and the multilayer including the electrolytic copper foil after the copper surface treatment The adhesion between the copper foil and the insulating material such as resin on the wiring board was 0.40 kN / m.

〔比較例3〕
所定の表面処理剤に含まれるスズ化合物としての硫酸スズと、錯化剤としてのチオ尿素と、シランカップリング剤としての3−メルカプトプロピルトリメトキシシランとを、硫酸(表面処理剤全体に対する硫酸の濃度:10%、試薬)と、過酸化水素(表面処理剤全体に対する過酸化水素の濃度:3%、試薬)と、アミノテトラゾール(表面処理剤全体に対するアミノテトラゾールの濃度:0.3%)とに変更したこと以外は、実施例1と同様の操作を行った。
[Comparative Example 3]
Tin sulfate as a tin compound contained in a predetermined surface treatment agent, thiourea as a complexing agent, and 3-mercaptopropyltrimethoxysilane as a silane coupling agent are mixed with sulfuric acid (sulfuric acid relative to the whole surface treatment agent). Concentration: 10%, reagent), hydrogen peroxide (concentration of hydrogen peroxide with respect to the whole surface treatment agent: 3%, reagent), aminotetrazole (concentration of aminotetrazole with respect to the whole surface treatment agent: 0.3%), The same operation as Example 1 was performed except having changed into.

その結果、銅の表面処理後における電解銅箔のエッチング量が「×」、銅の表面処理後における電解銅箔のSEM外観が「×」、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.20kN/mであった。   As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “×”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “×”, and the multilayer including the electrolytic copper foil after the copper surface treatment The adhesion between the copper foil and the insulating material such as resin on the wiring board was 0.20 kN / m.

〔比較例4〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、錯化剤としてのチオ尿素を含めなかったこと以外は、実施例1と同様の操作を行った。
[Comparative Example 4]
The tin compound contained in the specified surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm) as a complexing agent The same operation as in Example 1 was performed except that the thiourea was not included.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が0mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.00kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment amount 0 mg / m 2, coating weight of 0 mg / m 2 of a silane compound of the electrolytic copper foil after the surface treatment of copper, a copper foil and a resin or the like in the multilayer wiring board with an electrolytic copper foil after the surface treatment of copper The adhesion with the insulating material was 0.00 kN / m.

〔比較例5〕
所定の表面処理剤に含まれるスズ化合物を硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:25ppm)から硫酸スズ(表面処理剤全体に対する硫酸スズの濃度:500ppm)に変更し、シランカップリング剤としての3−メルカプトプロピルトリメトキシシランを含めなかったこと以外は、実施例1と同様の操作を行った。
[Comparative Example 5]
The tin compound contained in the predetermined surface treatment agent is changed from tin sulfate (concentration of tin sulfate to the entire surface treatment agent: 25 ppm) to tin sulfate (concentration of tin sulfate relative to the entire surface treatment agent: 500 ppm), and a silane coupling agent The same operation as in Example 1 was performed except that 3-mercaptopropyltrimethoxysilane was not included.

その結果、銅の表面処理後における電解銅箔のエッチング量が「○」、銅の表面処理後における電解銅箔のSEM外観が「○」、銅の表面処理後における電解銅箔のスズの皮膜量が325mg/m、銅の表面処理後における電解銅箔のシラン化合物の皮膜量が0mg/m、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が0.30kN/mであった。As a result, the etching amount of the electrolytic copper foil after the copper surface treatment is “◯”, the SEM appearance of the electrolytic copper foil after the copper surface treatment is “◯”, and the tin film of the electrolytic copper foil after the copper surface treatment The amount of 325 mg / m 2 , the coating amount of the silane compound of the electrolytic copper foil after the copper surface treatment is 0 mg / m 2 , the copper foil and the resin in the multilayer wiring board provided with the electrolytic copper foil after the copper surface treatment, etc. The adhesion with the insulating material was 0.30 kN / m.

〔実施例のまとめ〕
表1に、銅の表面処理後における上記物性の評価結果をまとめた。
(Summary of Examples)
Table 1 summarizes the evaluation results of the above physical properties after the surface treatment of copper.

実施例1と実施例2とを比較すると、実施例2では実施例1と比べてスズ化合物としての硫酸スズの濃度を増加させることにより、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が向上するという結果になった。   Comparing Example 1 and Example 2, in Example 2, compared with Example 1, the concentration of tin sulfate as a tin compound was increased, thereby providing a multilayer wiring including an electrolytic copper foil after copper surface treatment As a result, the adhesion between the copper foil on the substrate and the insulating material such as resin was improved.

実施例2と実施例3とを比較すると、実施例3では実施例2と比べてフッ素化合物としてのフッ化水素を含めることにより、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が向上するという結果になった。   Comparing Example 2 and Example 3, in Example 3, by including hydrogen fluoride as a fluorine compound as compared with Example 2, a multilayer wiring board provided with an electrolytic copper foil after copper surface treatment was used. As a result, the adhesion between the copper foil and the insulating material such as resin was improved.

実施例3と実施例4とを比較すると、実施例4では実施例3と比べて錯化剤としてのチオ尿素をジエチルチオ尿素に変更することにより、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性は低下するものの、十分な密着性は維持しているという結果になった。   Comparing Example 3 and Example 4, in Example 4, compared with Example 3, thiourea as a complexing agent was changed to diethylthiourea, thereby providing an electrolytic copper foil after the surface treatment of copper. Although the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board was lowered, the result was that sufficient adhesion was maintained.

実施例3と実施例5とを比較すると、実施例5では実施例3と比べてスズ化合物としての硫酸スズの濃度を大幅に増加させることにより、銅の表面処理後における電解銅箔のスズの皮膜量は大幅に増加し、上記電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性は低下するものの、十分な密着性は維持しているという結果になった。   When Example 3 and Example 5 are compared, in Example 5, the concentration of tin sulfate as a tin compound is significantly increased compared to Example 3, so that the tin of the electrolytic copper foil after copper surface treatment is increased. The amount of film is greatly increased, and although the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil is lowered, the result is that sufficient adhesion is maintained. It was.

実施例3と実施例6,7とを比較すると、実施例6では実施例3と比べてシランカップリング剤としての3−メルカプトプロピルトリメトキシシランの濃度を減少させることにより、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性は低下するものの、十分な密着性は維持しているという結果になった。一方、実施例7では実施例3と比べてシランカップリング剤としての3−メルカプトプロピルトリメトキシシランの濃度を増加させることにより、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が向上するという結果になった。   Comparing Example 3 with Examples 6 and 7, in Example 6, the concentration of 3-mercaptopropyltrimethoxysilane as a silane coupling agent was decreased as compared with Example 3, so that after the surface treatment of copper. As a result, the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil was reduced, but sufficient adhesion was maintained. On the other hand, in Example 7, compared with Example 3, the concentration of 3-mercaptopropyltrimethoxysilane as a silane coupling agent was increased, so that the multilayer wiring board provided with the electrolytic copper foil after the copper surface treatment was used. As a result, the adhesion between the copper foil and an insulating material such as resin was improved.

実施例3と実施例8,9とを比較すると、実施例8では実施例3と比べて表面処理剤の溶液のpHを3から1に低下させることにより、銅の表面処理後における電解銅箔のスズの皮膜量は大幅に増加し、上記電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性は低下するものの、十分な密着性は維持しているという結果になった。一方、実施例9では実施例3と比べて表面処理剤の溶液のpHを3から5に上昇させることによっても、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性は同等であるという結果になった。   When Example 3 is compared with Examples 8 and 9, in Example 8, the pH of the solution of the surface treatment agent was lowered from 3 to 1 as compared with Example 3, so that the electrolytic copper foil after the surface treatment of copper was performed. The amount of tin film increases significantly, and although the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil is reduced, sufficient adhesion is maintained. The result was. On the other hand, in Example 9, the copper foil in the multilayer wiring board provided with the electrolytic copper foil after the copper surface treatment was also increased by increasing the pH of the solution of the surface treatment agent from 3 to 5 as compared with Example 3. As a result, the adhesion with an insulating material such as resin was the same.

実施例3と実施例10〜14とを比較すると、実施例10〜14では実施例3と比べてシランカップリング剤としての3−メルカプトプロピルトリメトキシシランを他のシランカップリング剤(2種類のシランカップリング剤の混合物)に変更することにより、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が向上するという結果になった。   When Example 3 and Examples 10-14 are compared, in Examples 10-14, 3-mercaptopropyltrimethoxysilane as a silane coupling agent is compared with Example 3 in comparison with other silane coupling agents (two kinds of silane coupling agents). By changing to a mixture of silane coupling agents, the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil after the copper surface treatment was improved. .

実施例3と実施例15,17とを比較すると、実施例15,17では実施例3と比べて金属化合物を含めることによっても、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性は同等であるという結果になった。   Comparing Example 3 with Examples 15 and 17, in Examples 15 and 17, the multilayer wiring board provided with the electrolytic copper foil after the surface treatment of copper also includes a metal compound as compared with Example 3. As a result, the adhesion between the copper foil and the insulating material such as resin was equal.

実施例3と実施例16とを比較すると、実施例16では実施例3と比べて還元剤を含めることによっても、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性は同等であるという結果になった。   Comparing Example 3 and Example 16, the copper foil in the multilayer wiring board provided with the electrolytic copper foil after the surface treatment of copper in Example 16 also includes a reducing agent as compared with Example 3; As a result, the adhesion with an insulating material such as resin was the same.

実施例3と実施例18とを比較すると、実施例18では実施例3と比べて防錆剤を含めることによって、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が向上するという結果になった。   When Example 3 and Example 18 are compared, in Example 18, by including a rust preventive agent compared to Example 3, the copper foil in the multilayer wiring board provided with the electrolytic copper foil after the surface treatment of copper and As a result, the adhesion with an insulating material such as resin was improved.

実施例3と実施例19とを比較すると、実施例19では実施例3と比べて酸洗に過酸化水素を含めないことによっても、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性は同等であるという結果になった。   Comparing Example 3 and Example 19, in Example 19, the multilayer wiring board provided with the electrolytic copper foil after the surface treatment of copper was obtained by not including hydrogen peroxide in the pickling as compared with Example 3. As a result, the adhesion between the copper foil and the insulating material such as resin was the same.

実施例3と実施例20とを比較すると、実施例20では実施例3と比べて酸洗に防錆剤を含めることによって、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が向上するという結果になった。   When Example 3 and Example 20 are compared, in Example 20, the anti-corrosion agent is included in the pickling as compared with Example 3, so that the multilayered wiring board provided with the electrolytic copper foil after the copper surface treatment is used. As a result, the adhesion between the copper foil and an insulating material such as resin was improved.

実施例3と実施例21とを比較すると、実施例21では実施例3と比べて酸洗の際に貴金属処理を行うことによって、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が向上するという結果になった。   When Example 3 and Example 21 are compared, in Example 21, compared with Example 3, by performing noble metal treatment during pickling, a multilayer wiring board provided with an electrolytic copper foil after copper surface treatment As a result, the adhesion between the copper foil and the insulating material such as resin was improved.

実施例3と実施例22,23とを比較すると、実施例22,23では実施例3と比べてシランカップリング剤としての3−メルカプトプロピルトリメトキシシランで後処理することによって、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が向上するという結果になった。特に、実施例23では、後処理後に水道水で洗浄しないことにより、上記多層配線基板での銅箔と樹脂等の絶縁材との密着性がさらに向上するという結果になった。   When Example 3 is compared with Examples 22 and 23, the surface treatment of copper is performed in Examples 22 and 23 by post-treatment with 3-mercaptopropyltrimethoxysilane as a silane coupling agent as compared with Example 3. As a result, the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil later was improved. In particular, in Example 23, the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board was further improved by not washing with tap water after the post-treatment.

実施例2と実施例24〜27とを比較すると、実施例24〜27では実施例2と比べてシランカップリング剤としての3−メルカプトプロピルトリメトキシシランをエポキシシランに変更することにより、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性は低下するものの、十分な密着性は維持しているという結果になった。実施例24〜27の中で実施例26,27では、AgまたはPdを含有する金属化合物を追加することにより、上記密着性が向上するという結果になった。   Comparing Example 2 and Examples 24-27, in Examples 24-27, by changing 3-mercaptopropyltrimethoxysilane as an silane coupling agent to epoxy silane, compared to Example 2, copper Although the adhesiveness between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil after the surface treatment was lowered, the sufficient adhesiveness was maintained. In Examples 26 and 27 among Examples 24 to 27, the adhesion was improved by adding a metal compound containing Ag or Pd.

実施例2と実施例28〜32とを比較すると、実施例28〜32では実施例2と比べて防錆剤、樹脂またはシランカップリング剤としてのエポキシシラン、ポリアクリル酸またはチタンアルコキシドで後処理することによって、銅の表面処理後における電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が向上するという結果になった。   Comparing Example 2 with Examples 28 to 32, Examples 28 to 32 were post-treated with epoxy silane, polyacrylic acid or titanium alkoxide as a rust inhibitor, resin or silane coupling agent, as compared with Example 2. As a result, the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil after the surface treatment of copper was improved.

実施例1〜32と比較例1〜3とを比較すると、比較例1〜3では実施例1〜32と比べてスズ化合物およびシランカップリング剤を含んだ表面処理剤を用いておらず、エッチング等の粗化処理(凹凸処理)を行っているので、銅の表面処理後における電解銅箔のSEM外観に凹凸が見られるという結果になった。   When Examples 1-32 and Comparative Examples 1-3 are compared, in Comparative Examples 1-3, a surface treatment agent containing a tin compound and a silane coupling agent is not used as compared with Examples 1-32, and etching is performed. Since the roughening process (unevenness | corrugation process), etc. are performed, it became a result that an unevenness | corrugation was seen in the SEM external appearance of the electrolytic copper foil after the surface treatment of copper.

実施例2と比較例4とを比較すると、比較例4では実施例2と比べて錯化剤としてのチオ尿素を含んでいないので、銅の表面処理後における電解銅箔のスズおよびシラン化合物の皮膜は形成されず、上記電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性がなくなるという結果になった。   When Example 2 and Comparative Example 4 are compared, Comparative Example 4 does not contain thiourea as a complexing agent as compared with Example 2, so that the tin and silane compounds of the electrolytic copper foil after copper surface treatment The film was not formed, and the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil was lost.

実施例2と比較例5とを比較すると、比較例5では実施例2と比べてシランカップリング剤としての3−メルカプトプロピルトリメトキシシランを含んでいないので、銅の表面処理後における電解銅箔のシラン化合物の皮膜は形成されず、上記電解銅箔を備えた多層配線基板での銅箔と樹脂等の絶縁材との密着性が低下するという結果になった。   When Example 2 and Comparative Example 5 are compared with each other, Comparative Example 5 does not contain 3-mercaptopropyltrimethoxysilane as a silane coupling agent as compared with Example 2, so that the electrolytic copper foil after copper surface treatment The film of the silane compound was not formed, and the adhesion between the copper foil and the insulating material such as resin in the multilayer wiring board provided with the electrolytic copper foil was reduced.

本発明の銅の表面処理剤は、以上のように、スズ化合物と、錯化剤と、シランカップリング剤とを含有するものである。   As described above, the copper surface treatment agent of the present invention contains a tin compound, a complexing agent, and a silane coupling agent.

それゆえ、本発明の銅の表面処理剤は、処理工程を増加させることなく、銅の表面をエッチング等の粗化処理することなく平滑な状態に処理することができ、かつ銅と樹脂等の絶縁材との間の密着性を維持することができるという効果を奏する。   Therefore, the copper surface treatment agent of the present invention can treat the surface of the copper in a smooth state without increasing the number of treatment steps, without roughening treatment such as etching, and copper and resin. There exists an effect that the adhesiveness between insulating materials can be maintained.

発明の詳細な説明の項においてなされた具体的な実施形態または実施例は、あくまでも、本発明の技術内容を明らかにするものであって、そのような具体例にのみ限定して狭義に解釈されるべきものではなく、本発明の精神と次に記載する請求の範囲内において、いろいろと変更して実施することができるものである。   The specific embodiments or examples made in the detailed description section of the invention are merely to clarify the technical contents of the present invention, and are limited to such specific examples and are interpreted in a narrow sense. It should be understood that the invention can be practiced with various modifications within the spirit of the invention and within the scope of the following claims.

本発明の銅の表面処理剤および表面処理方法は、銅の表面をエッチング等の粗化処理することなく銅と樹脂等の絶縁材との間の密着性を維持することができるため、近年の電子機器・電子部品の高周波化、高密度化等に対応することができる。また、従来の粗化処理(凹凸処理)では、処理後に酸化膜が成長し、電子機器・電子部品としての機能を発揮しないため、多くの場合には後処理として防錆処理を施していた。また、数ミクロン銅エッチングするため、多大な廃水処理コストがかかっていた。本発明の銅の表面処理剤は、密着および防錆(不動態化)を同時に行うため、従来の粗化処理と比較して、電子機器・電子部品の生産工程を削減することができる。さらに、皮膜形成過程において銅の溶解を従来の1/10以下に抑えることができるため、大幅な排水処理負荷低減となる。具体的には、本発明の銅の表面処理剤および表面処理方法は、微細(ファイン)配線を有するプリント配線基板、半導体実装品、液晶デバイス、エレクトロルミネッセンス等の各種電子機器・電子部品に利用することが可能である。   Since the copper surface treatment agent and surface treatment method of the present invention can maintain the adhesion between copper and an insulating material such as a resin without subjecting the copper surface to a roughening treatment such as etching, It is possible to cope with higher frequency and higher density of electronic devices and electronic parts. Moreover, in the conventional roughening process (unevenness | corrugation process), since the oxide film grew after the process and the function as an electronic device / electronic component is not exhibited, in many cases, the rust prevention process was performed as a post-process. In addition, since the copper etching is performed by several microns, a large wastewater treatment cost is required. Since the copper surface treating agent of the present invention performs adhesion and rust prevention (passivation) at the same time, the production process of electronic devices and electronic parts can be reduced as compared with the conventional roughening treatment. Furthermore, since the dissolution of copper can be suppressed to 1/10 or less of the conventional amount in the film formation process, the wastewater treatment load is greatly reduced. Specifically, the copper surface treatment agent and the surface treatment method of the present invention are used for various electronic devices and electronic parts such as printed wiring boards, semiconductor mounting products, liquid crystal devices, and electroluminescence having fine (fine) wiring. It is possible.

Claims (21)

スズ化合物と、錯化剤と、シランカップリング剤とを含有することを特徴とする銅の表面処理剤。   A copper surface treatment agent comprising a tin compound, a complexing agent, and a silane coupling agent. 上記錯化剤として、少なくともチオ尿素もしくはその誘導体を含有することを特徴とする請求の範囲第1項に記載の銅の表面処理剤。   The copper surface treatment agent according to claim 1, wherein the complexing agent contains at least thiourea or a derivative thereof. さらに、フッ素化合物または有機酸を含有することを特徴とする請求の範囲第1項または第2項に記載の銅の表面処理剤。   The copper surface treatment agent according to claim 1 or 2, further comprising a fluorine compound or an organic acid. pHが5以下であることを特徴とする請求の範囲第3項に記載の銅の表面処理剤。   The copper surface treatment agent according to claim 3, wherein the pH is 5 or less. 上記シランカップリング剤がメルカプト基、エポキシ基またはアミノ基を有するものであることを特徴とする請求の範囲第1項〜第4項のいずれか1項に記載の銅の表面処理剤。   The copper surface treatment agent according to any one of claims 1 to 4, wherein the silane coupling agent has a mercapto group, an epoxy group, or an amino group. 上記シランカップリング剤が3量体以上のシランカップリング剤縮合体を含んでいることを特徴とする請求の範囲第1項〜第5項のいずれか1項に記載の銅の表面処理剤。   The copper surface treatment agent according to any one of claims 1 to 5, wherein the silane coupling agent contains a trimer or higher silane coupling agent condensate. 上記スズ化合物の重量に対する上記シランカップリング剤の重量の比が0.001以上、100以下の範囲内であることを特徴とする請求の範囲第1項〜第6項のいずれか1項に記載の銅の表面処理剤。   The ratio of the weight of the silane coupling agent to the weight of the tin compound is in the range of 0.001 or more and 100 or less, 7. The method according to any one of claims 1 to 6, Copper surface treatment agent. 上記表面処理剤全体に対する上記スズ化合物の濃度が10ppm以上、200,000ppm以下の範囲内であることを特徴とする請求の範囲第1項〜第7項のいずれか1項に記載の銅の表面処理剤。   The copper surface according to any one of claims 1 to 7, wherein a concentration of the tin compound with respect to the entire surface treatment agent is within a range of 10 ppm or more and 200,000 ppm or less. Processing agent. 上記表面処理剤全体に対する上記シランカップリング剤の濃度が10ppm以上、100,000ppm以下の範囲内であることを特徴とする請求の範囲第1項〜第8項のいずれか1項に記載の銅の表面処理剤。   The copper according to any one of claims 1 to 8, wherein a concentration of the silane coupling agent with respect to the entire surface treatment agent is within a range of 10 ppm or more and 100,000 ppm or less. Surface treatment agent. さらに、還元剤を含有することを特徴とする請求の範囲第1項〜第9項のいずれか1項に記載の銅の表面処理剤。   Furthermore, the reducing agent is contained, The copper surface treating agent of any one of Claim 1-9 characterized by the above-mentioned. さらに、防錆剤を含有することを特徴とする請求の範囲第1項〜第10項のいずれか1項に記載の銅の表面処理剤。   Furthermore, a rust preventive agent is contained, The surface treating agent of copper of any one of the Claims 1-10 characterized by the above-mentioned. 上記防錆剤がテトラゾール、トリアゾール、イミダゾール、チオールから選ばれる少なくとも一種の化合物であることを特徴とする請求の範囲第11項に記載の銅の表面処理剤。   The copper surface treatment agent according to claim 11, wherein the rust inhibitor is at least one compound selected from tetrazole, triazole, imidazole, and thiol. さらに、金属化合物を含有することを特徴とする請求の範囲第1項〜第12項のいずれか1項に記載の銅の表面処理剤。   The copper surface treatment agent according to any one of claims 1 to 12, further comprising a metal compound. 上記金属化合物がAg、Pd、Au、Pt、Cuから選ばれる少なくとも一種の金属を含有する化合物であることを特徴とする請求の範囲第13項に記載の銅の表面処理剤。   14. The copper surface treatment agent according to claim 13, wherein the metal compound is a compound containing at least one metal selected from Ag, Pd, Au, Pt, and Cu. 銅の表面に請求の範囲第1項〜第14項のいずれか1項に記載の銅の表面処理剤を接触させることを特徴とする銅の表面処理方法。   A copper surface treatment method, wherein the copper surface treatment agent according to any one of claims 1 to 14 is brought into contact with the copper surface. 銅の表面を粗化処理することなく、銅の表面に請求の範囲第1項〜第14項のいずれか1項に記載の銅の表面処理剤を接触させることを特徴とする銅の表面処理方法。   The copper surface treatment, wherein the copper surface treatment agent according to any one of claims 1 to 14 is brought into contact with the surface of the copper without roughening the surface of the copper. Method. 銅の表面に酸洗処理、粗化処理、防錆処理、酸化処理、脱脂処理から選ばれる少なくとも一種の前処理をした後に、上記表面処理剤を接触させることを特徴とする請求の範囲第15項に記載の銅の表面処理方法。   16. The surface treatment agent according to claim 15, wherein the surface treatment agent is contacted after at least one pretreatment selected from pickling treatment, roughening treatment, rust prevention treatment, oxidation treatment, and degreasing treatment on the surface of copper. The surface treatment method of copper as described in the item. 銅の表面に上記表面処理剤を接触させた後に、防錆剤、樹脂またはシランカップリング剤を接触させることを特徴とする請求の範囲第15項〜第17項のいずれか1項に記載の銅の表面処理方法。   The rust preventive agent, the resin or the silane coupling agent is brought into contact with the surface of the copper after the surface treatment agent is brought into contact with the surface of the copper, according to any one of claims 15 to 17. Copper surface treatment method. 請求の範囲第15項〜第18項のいずれか1項に記載の銅の表面処理方法により表面処理されてなることを特徴とする銅張り材料。   A copper-clad material characterized by being surface-treated by the copper surface treatment method according to any one of claims 15 to 18. 請求の範囲第19項に記載の銅張り材料を備えていることを特徴とする多層配線基板。   A multilayer wiring board comprising the copper clad material according to claim 19. 最外層に請求の範囲第19項に記載の銅張り材料を備えていることを特徴とする配線基板。   A wiring board comprising the copper clad material according to claim 19 in an outermost layer.
JP2010501865A 2008-03-04 2009-02-26 Copper surface treatment agent and surface treatment method Active JP5307117B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010501865A JP5307117B2 (en) 2008-03-04 2009-02-26 Copper surface treatment agent and surface treatment method

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2008053816 2008-03-04
JP2008053816 2008-03-04
JP2010501865A JP5307117B2 (en) 2008-03-04 2009-02-26 Copper surface treatment agent and surface treatment method
PCT/JP2009/053487 WO2009110364A1 (en) 2008-03-04 2009-02-26 Copper surface treatment agent and surface treatment method

Publications (2)

Publication Number Publication Date
JPWO2009110364A1 JPWO2009110364A1 (en) 2011-07-14
JP5307117B2 true JP5307117B2 (en) 2013-10-02

Family

ID=41055924

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010501865A Active JP5307117B2 (en) 2008-03-04 2009-02-26 Copper surface treatment agent and surface treatment method

Country Status (3)

Country Link
JP (1) JP5307117B2 (en)
TW (1) TW200938657A (en)
WO (1) WO2009110364A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111655903A (en) * 2018-02-01 2020-09-11 三菱瓦斯化学株式会社 Aqueous solution for surface treatment, method for producing surface-treated alloy, and composite and method for producing same

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5079883B2 (en) * 2010-03-30 2012-11-21 Jx日鉱日石金属株式会社 Copper foil for printed wiring board excellent in heat discoloration resistance and etching property, and laminate using the same
JP5156784B2 (en) * 2010-03-30 2013-03-06 Jx日鉱日石金属株式会社 Copper foil for printed wiring board and laminate using the same
JP6003507B2 (en) * 2012-10-05 2016-10-05 Jfeスチール株式会社 Electrical steel sheet with insulation coating
TW201434366A (en) * 2013-02-27 2014-09-01 Adev Internat Co Ltd Copper foil surface modification method used in manufacturing process of printed circuit board
JP2014240522A (en) * 2013-05-17 2014-12-25 四国化成工業株式会社 Copper surface treatment liquid, surface treatment method and use thereof
JP6427454B2 (en) * 2015-03-31 2018-11-21 日鉄ケミカル&マテリアル株式会社 Copper-clad laminate and printed wiring board
JP6387543B1 (en) * 2017-05-11 2018-09-12 メック株式会社 Film-forming composition, method for producing surface-treated metal member, and method for producing metal-resin composite
WO2019058773A1 (en) 2017-09-22 2019-03-28 四国化成工業株式会社 Tetrazole silane compound, method for synthesizing said compound and use thereof
KR20220057532A (en) 2019-09-06 2022-05-09 시코쿠가세이고교가부시키가이샤 Metal surface treatment liquid and its concentrate, metal surface treatment liquid set and surface treatment method, and method for manufacturing a printed wiring board
JP7263220B2 (en) * 2019-11-29 2023-04-24 新光電気工業株式会社 Method for estimating film thickness of silane coupling coating
CN115700019A (en) * 2020-06-24 2023-02-03 昭和电工材料株式会社 Wiring structure, method for manufacturing same, and semiconductor package
WO2022024226A1 (en) * 2020-07-28 2022-02-03 昭和電工マテリアルズ株式会社 Method for producing circuit board
CN112064003B (en) * 2020-08-20 2022-06-17 华帝股份有限公司 Pretreatment agent and preparation method and application thereof
TW202336276A (en) * 2021-12-28 2023-09-16 日商四國化成工業股份有限公司 Organic coating and method for producing same
WO2023127679A1 (en) * 2021-12-28 2023-07-06 四国化成工業株式会社 Surface treatment liquid for metal

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004349693A (en) * 2003-04-30 2004-12-09 Mec Kk Resin adhesive layer on surface of copper
JP2005023301A (en) * 2003-04-30 2005-01-27 Mec Kk Adhered layer-forming liquid, method for producing bonded layer of copper with resin by using the liquid and laminated material of them
JP2008111188A (en) * 2007-09-25 2008-05-15 Hitachi Chem Co Ltd Copper foil for printed circuit board
JP2008111169A (en) * 2006-10-31 2008-05-15 Mitsui Mining & Smelting Co Ltd Surface-treated copper foil, surface-treated copper foil with extremely thin primer resin layer, and method of manufacturing the surface-treated copper foil and method of manufacturing the surface-treated copper foil with extremely thin primer resin layer

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004349693A (en) * 2003-04-30 2004-12-09 Mec Kk Resin adhesive layer on surface of copper
JP2005023301A (en) * 2003-04-30 2005-01-27 Mec Kk Adhered layer-forming liquid, method for producing bonded layer of copper with resin by using the liquid and laminated material of them
JP2008111169A (en) * 2006-10-31 2008-05-15 Mitsui Mining & Smelting Co Ltd Surface-treated copper foil, surface-treated copper foil with extremely thin primer resin layer, and method of manufacturing the surface-treated copper foil and method of manufacturing the surface-treated copper foil with extremely thin primer resin layer
JP2008111188A (en) * 2007-09-25 2008-05-15 Hitachi Chem Co Ltd Copper foil for printed circuit board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111655903A (en) * 2018-02-01 2020-09-11 三菱瓦斯化学株式会社 Aqueous solution for surface treatment, method for producing surface-treated alloy, and composite and method for producing same

Also Published As

Publication number Publication date
WO2009110364A1 (en) 2009-09-11
JPWO2009110364A1 (en) 2011-07-14
TW200938657A (en) 2009-09-16

Similar Documents

Publication Publication Date Title
JP5307117B2 (en) Copper surface treatment agent and surface treatment method
JP5663739B2 (en) Copper surface conditioning composition and surface treatment method
JP4309602B2 (en) Method for improving adhesion between copper or copper alloy and resin, and laminate
EP2823084B1 (en) Method for promoting adhesion between dielectric substrates and metal layers
WO2006134868A1 (en) Surface treated copper foil, process for producing surface treated copper foil, and surface treated copper foil with very thin primer resin layer
EP1322798A1 (en) Bath and method of electroless plating of silver on metal surfaces
JP2009235565A (en) Solution for and method of treating surface of copper
JP2018016865A (en) Surface treatment agent, resin composition, and utilization of them
JP2014240522A (en) Copper surface treatment liquid, surface treatment method and use thereof
US11230644B1 (en) Coating film-forming composition, method for producing surface-treated metal member, and method for producing metal-resin composite
JP6440440B2 (en) Metal surface treatment liquid, surface treatment method and use thereof
JP2007016105A (en) Metal-surface treating liquid, laminated body, and method for manufacturing laminated body
TW200523108A (en) Chromium-free antitarnish adhesion promoting treatment composition
KR20230007390A (en) composite copper member
JP2008109087A (en) Substrate for mounting semiconductor chip, and preprocessing liquid
JP2018145475A (en) Rust-prevention treatment liquid and its application
JP5688522B2 (en) Copper surface treatment agent
JP4621293B2 (en) Copper surface treatment agent and surface treatment method
JP4941204B2 (en) Copper foil for printed wiring board and surface treatment method thereof
JP2010150613A (en) Surface treatment agent and surface treatment method for copper, and film for copper surface
JP6421073B2 (en) Metal surface treatment liquid and use thereof
JP6440484B2 (en) Metal surface treatment liquid, surface treatment method and use thereof
JPH07832B2 (en) Copper foil for printed circuit and manufacturing method thereof
JP5317099B2 (en) Adhesive layer forming solution
JP4912171B2 (en) Surface-treated copper foil and method for producing the same

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20120206

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130604

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130626

R150 Certificate of patent or registration of utility model

Ref document number: 5307117

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313113

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250