JP5253533B2 - 走査型電子顕微鏡 - Google Patents
走査型電子顕微鏡 Download PDFInfo
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- JP5253533B2 JP5253533B2 JP2011048756A JP2011048756A JP5253533B2 JP 5253533 B2 JP5253533 B2 JP 5253533B2 JP 2011048756 A JP2011048756 A JP 2011048756A JP 2011048756 A JP2011048756 A JP 2011048756A JP 5253533 B2 JP5253533 B2 JP 5253533B2
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- 一次電子線を発生させる電子源と、上記一次電子線を試料上に集束させる対物レンズと、上記一次電子線の照射により得られる信号電子を衝突させるための横向きに配置された三角柱形状の導体板と、該導体板から発生した二次電子を検出する検出器と、上記対物レンズと上記導体板の間に上記信号電子を加速させるための加速電界を発生させる加速電界発生手段と、上記対物レンズの上側に配置されたシールド板と、を有し、
上記三角柱形状の導体板は、水平な上面と、上記信号電子の衝突面をなす傾斜した2つの下面と、上記一次電子線の通路を形成する上記上面から上記三角柱の頂角にいたる中心孔と、を有し、更に、上記検出器が上記傾斜した下面の側方に配置されていることを特徴とする走査型電子顕微鏡。 - 請求項1記載の走査型電子顕微鏡において、上記導体板の中心孔の下端には円筒状の部材が設けられていることを特徴とする走査型電子顕微鏡。
- 請求項1記載の走査型電子顕微鏡において、上記シールド板に負電圧が印加されていることを特徴とする走査型電子顕微鏡。
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JP2011048756A JP5253533B2 (ja) | 2011-03-07 | 2011-03-07 | 走査型電子顕微鏡 |
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JP2006037660A Division JP4732917B2 (ja) | 2006-02-15 | 2006-02-15 | 走査型電子顕微鏡及び欠陥検出装置 |
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JP2011108667A JP2011108667A (ja) | 2011-06-02 |
JP5253533B2 true JP5253533B2 (ja) | 2013-07-31 |
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GB8607222D0 (en) * | 1986-03-24 | 1986-04-30 | Welding Inst | Charged particle collection |
JP2001110351A (ja) * | 1999-10-05 | 2001-04-20 | Hitachi Ltd | 走査電子顕微鏡 |
JP4006946B2 (ja) * | 2000-01-25 | 2007-11-14 | 株式会社日立製作所 | 走査電子顕微鏡 |
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