JP5217046B2 - 光学特性測定装置および光学特性測定方法 - Google Patents

光学特性測定装置および光学特性測定方法 Download PDF

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Publication number
JP5217046B2
JP5217046B2 JP2008142625A JP2008142625A JP5217046B2 JP 5217046 B2 JP5217046 B2 JP 5217046B2 JP 2008142625 A JP2008142625 A JP 2008142625A JP 2008142625 A JP2008142625 A JP 2008142625A JP 5217046 B2 JP5217046 B2 JP 5217046B2
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Prior art keywords
measurement
light
optical path
optical
measured
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JP2008142625A
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Japanese (ja)
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JP2009288150A (ja
Inventor
勉 水口
弘幸 佐野
久志 白岩
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Otsuka Electronics Co Ltd
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Otsuka Electronics Co Ltd
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Priority to JP2008142625A priority Critical patent/JP5217046B2/ja
Priority to TW098115658A priority patent/TWI454670B/zh
Priority to KR1020090047212A priority patent/KR101656879B1/ko
Publication of JP2009288150A publication Critical patent/JP2009288150A/ja
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Publication of JP5217046B2 publication Critical patent/JP5217046B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2008142625A 2008-05-30 2008-05-30 光学特性測定装置および光学特性測定方法 Active JP5217046B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2008142625A JP5217046B2 (ja) 2008-05-30 2008-05-30 光学特性測定装置および光学特性測定方法
TW098115658A TWI454670B (zh) 2008-05-30 2009-05-12 Optical property measuring device and method for measuring optical properties
KR1020090047212A KR101656879B1 (ko) 2008-05-30 2009-05-29 광학 특성 측정 장치 및 광학 특성 측정 방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008142625A JP5217046B2 (ja) 2008-05-30 2008-05-30 光学特性測定装置および光学特性測定方法

Publications (2)

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JP2009288150A JP2009288150A (ja) 2009-12-10
JP5217046B2 true JP5217046B2 (ja) 2013-06-19

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JP2008142625A Active JP5217046B2 (ja) 2008-05-30 2008-05-30 光学特性測定装置および光学特性測定方法

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JP (1) JP5217046B2 (ko)
KR (1) KR101656879B1 (ko)
TW (1) TWI454670B (ko)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8040744B2 (en) 2009-01-05 2011-10-18 Sandisk Technologies Inc. Spare block management of non-volatile memories
WO2011144261A1 (fr) 2010-05-19 2011-11-24 Siemens Sas Securisation d'une transmission video a distance destinee au controle a distance d'un vehicule
JP5538194B2 (ja) * 2010-11-30 2014-07-02 ソニー株式会社 光学装置及び電子機器
US11054308B2 (en) 2017-06-01 2021-07-06 Konica Minolta, Inc. Spectrophotometer
KR102047206B1 (ko) * 2018-10-31 2019-11-20 한국과학기술원 체적함수비별 반사율 측정을 위한 함수특성곡선-초분광 캠 테스트 방법 및 장치

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4844617A (en) * 1988-01-20 1989-07-04 Tencor Instruments Confocal measuring microscope with automatic focusing
JPH10148572A (ja) * 1996-11-19 1998-06-02 Nikon Corp 分光反射率測定器
JP3863992B2 (ja) * 1998-03-18 2006-12-27 オリンパス株式会社 走査型光学顕微鏡装置
JP2002181625A (ja) * 2000-12-12 2002-06-26 Mitsui Mining & Smelting Co Ltd 分光測定装置
TWI264611B (en) * 2003-01-28 2006-10-21 Alpha Imaging Technology Corp Detecting method of digital image capturing system and the digital image capturing system
JP2006189291A (ja) * 2005-01-05 2006-07-20 Konica Minolta Sensing Inc 測光装置及び単色光の測光方法
JP4785480B2 (ja) * 2005-09-22 2011-10-05 三鷹光器株式会社 光学計測システム
JP2007328134A (ja) * 2006-06-08 2007-12-20 Nikon Corp 観察装置、および観察プログラム

Also Published As

Publication number Publication date
TW201009307A (en) 2010-03-01
JP2009288150A (ja) 2009-12-10
KR20090124986A (ko) 2009-12-03
KR101656879B1 (ko) 2016-09-12
TWI454670B (zh) 2014-10-01

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