JP5216517B2 - 画像検査システム - Google Patents
画像検査システム Download PDFInfo
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- JP5216517B2 JP5216517B2 JP2008257157A JP2008257157A JP5216517B2 JP 5216517 B2 JP5216517 B2 JP 5216517B2 JP 2008257157 A JP2008257157 A JP 2008257157A JP 2008257157 A JP2008257157 A JP 2008257157A JP 5216517 B2 JP5216517 B2 JP 5216517B2
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- 238000007689 inspection Methods 0.000 title claims description 198
- 230000005856 abnormality Effects 0.000 claims description 22
- 238000003384 imaging method Methods 0.000 claims description 15
- 230000007613 environmental effect Effects 0.000 claims description 7
- 238000013523 data management Methods 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 description 11
- 238000010586 diagram Methods 0.000 description 8
- 238000005286 illumination Methods 0.000 description 5
- 238000007726 management method Methods 0.000 description 4
- 230000002950 deficient Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000006870 function Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008257157A JP5216517B2 (ja) | 2008-10-02 | 2008-10-02 | 画像検査システム |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2008257157A JP5216517B2 (ja) | 2008-10-02 | 2008-10-02 | 画像検査システム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010085347A JP2010085347A (ja) | 2010-04-15 |
| JP2010085347A5 JP2010085347A5 (enExample) | 2011-10-20 |
| JP5216517B2 true JP5216517B2 (ja) | 2013-06-19 |
Family
ID=42249437
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2008257157A Active JP5216517B2 (ja) | 2008-10-02 | 2008-10-02 | 画像検査システム |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP5216517B2 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5786406B2 (ja) | 2010-04-01 | 2015-09-30 | 旭硝子株式会社 | 合成石英ガラスの製造方法 |
| EP3477248B1 (de) | 2017-10-26 | 2023-06-07 | Heinrich Georg GmbH Maschinenfabrik | Inspektionssystem und verfahren zur fehleranalyse |
| JP7386724B2 (ja) * | 2020-02-19 | 2023-11-27 | シーシーエス株式会社 | 検査システム及びそれに用いられる発光コントローラ |
| JP2023004324A (ja) * | 2021-06-25 | 2023-01-17 | キヤノン株式会社 | 画像形成装置、画像形成装置の制御方法、及びプログラム |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0344656U (enExample) * | 1989-09-08 | 1991-04-25 | ||
| JP2972666B2 (ja) * | 1997-08-04 | 1999-11-08 | 株式会社日立製作所 | 電子デバイスの製造方法 |
| CN100428277C (zh) * | 1999-11-29 | 2008-10-22 | 奥林巴斯光学工业株式会社 | 缺陷检查系统 |
| JP2001153813A (ja) * | 1999-11-30 | 2001-06-08 | Matsushita Electric Works Ltd | 壜外観検査システムおよびその方法 |
| JP3721147B2 (ja) * | 2002-07-29 | 2005-11-30 | 株式会社東芝 | パターン検査装置 |
| JP2007178127A (ja) * | 2005-12-26 | 2007-07-12 | Toshiba Corp | 外観検査システム、及び外観検査システムの制御方法 |
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2008
- 2008-10-02 JP JP2008257157A patent/JP5216517B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2010085347A (ja) | 2010-04-15 |
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