JP5195176B2 - 成膜装置 - Google Patents
成膜装置 Download PDFInfo
- Publication number
- JP5195176B2 JP5195176B2 JP2008222738A JP2008222738A JP5195176B2 JP 5195176 B2 JP5195176 B2 JP 5195176B2 JP 2008222738 A JP2008222738 A JP 2008222738A JP 2008222738 A JP2008222738 A JP 2008222738A JP 5195176 B2 JP5195176 B2 JP 5195176B2
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- JP
- Japan
- Prior art keywords
- gas
- separation
- region
- rotary table
- forming apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000008021 deposition Effects 0.000 title description 4
- 239000007789 gas Substances 0.000 claims description 231
- 238000000926 separation method Methods 0.000 claims description 128
- 238000012545 processing Methods 0.000 claims description 72
- 239000012495 reaction gas Substances 0.000 claims description 72
- 239000010408 film Substances 0.000 claims description 65
- 230000002093 peripheral effect Effects 0.000 claims description 52
- 238000000034 method Methods 0.000 claims description 31
- 239000000758 substrate Substances 0.000 claims description 28
- 230000008569 process Effects 0.000 claims description 23
- 238000011144 upstream manufacturing Methods 0.000 claims description 15
- 239000007795 chemical reaction product Substances 0.000 claims description 5
- 238000007599 discharging Methods 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 5
- 239000010409 thin film Substances 0.000 claims description 4
- 238000010030 laminating Methods 0.000 claims description 3
- 230000002452 interceptive effect Effects 0.000 claims description 2
- 239000012528 membrane Substances 0.000 claims 2
- 235000012431 wafers Nutrition 0.000 description 61
- 238000012546 transfer Methods 0.000 description 22
- 238000010926 purge Methods 0.000 description 16
- 230000000694 effects Effects 0.000 description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- 230000008859 change Effects 0.000 description 7
- 239000002994 raw material Substances 0.000 description 6
- 238000000231 atomic layer deposition Methods 0.000 description 5
- 238000002955 isolation Methods 0.000 description 5
- 230000007246 mechanism Effects 0.000 description 5
- 230000009471 action Effects 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 238000012986 modification Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 4
- 239000010453 quartz Substances 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 239000011261 inert gas Substances 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- CGRVKSPUKAFTBN-UHFFFAOYSA-N N-silylbutan-1-amine Chemical compound CCCCN[SiH3] CGRVKSPUKAFTBN-UHFFFAOYSA-N 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- SEQDDYPDSLOBDC-UHFFFAOYSA-N Temazepam Chemical compound N=1C(O)C(=O)N(C)C2=CC=C(Cl)C=C2C=1C1=CC=CC=C1 SEQDDYPDSLOBDC-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- OYACROKNLOSFPA-UHFFFAOYSA-N calcium;dioxido(oxo)silane Chemical compound [Ca+2].[O-][Si]([O-])=O OYACROKNLOSFPA-UHFFFAOYSA-N 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- MROCJMGDEKINLD-UHFFFAOYSA-N dichlorosilane Chemical compound Cl[SiH2]Cl MROCJMGDEKINLD-UHFFFAOYSA-N 0.000 description 1
- 229910001873 dinitrogen Inorganic materials 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002052 molecular layer Substances 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- FZHAPNGMFPVSLP-UHFFFAOYSA-N silanamine Chemical compound [SiH3]N FZHAPNGMFPVSLP-UHFFFAOYSA-N 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 1
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- Chemical Vapour Deposition (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008222738A JP5195176B2 (ja) | 2008-08-29 | 2008-08-29 | 成膜装置 |
US12/539,642 US8808456B2 (en) | 2008-08-29 | 2009-08-12 | Film deposition apparatus and substrate process apparatus |
TW098128931A TWI423367B (zh) | 2008-08-29 | 2009-08-28 | 成膜裝置及基板處理裝置 |
KR1020090080144A KR101562396B1 (ko) | 2008-08-29 | 2009-08-28 | 성막 장치 및 기판 처리 장치 |
CN200910169416.5A CN101660141B (zh) | 2008-08-29 | 2009-08-31 | 成膜装置及基板处理装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008222738A JP5195176B2 (ja) | 2008-08-29 | 2008-08-29 | 成膜装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2010056472A JP2010056472A (ja) | 2010-03-11 |
JP2010056472A5 JP2010056472A5 (enrdf_load_stackoverflow) | 2011-07-14 |
JP5195176B2 true JP5195176B2 (ja) | 2013-05-08 |
Family
ID=41788390
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008222738A Active JP5195176B2 (ja) | 2008-08-29 | 2008-08-29 | 成膜装置 |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP5195176B2 (enrdf_load_stackoverflow) |
CN (1) | CN101660141B (enrdf_load_stackoverflow) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5195175B2 (ja) * | 2008-08-29 | 2013-05-08 | 東京エレクトロン株式会社 | 成膜装置、成膜方法及び記憶媒体 |
JP5195174B2 (ja) * | 2008-08-29 | 2013-05-08 | 東京エレクトロン株式会社 | 成膜装置及び成膜方法 |
CN102269310A (zh) * | 2010-06-03 | 2011-12-07 | 北京中电科电子装备有限公司 | 旋转接头 |
JP5579009B2 (ja) * | 2010-09-29 | 2014-08-27 | 東京エレクトロン株式会社 | 成膜装置および成膜方法 |
JP5884500B2 (ja) * | 2012-01-18 | 2016-03-15 | 東京エレクトロン株式会社 | 成膜装置 |
JP6383674B2 (ja) * | 2014-02-19 | 2018-08-29 | 東京エレクトロン株式会社 | 基板処理装置 |
CN106282969B (zh) * | 2015-06-02 | 2019-02-15 | 中微半导体设备(上海)有限公司 | 化学气相沉积装置及其沉积方法 |
JP6330941B1 (ja) * | 2017-03-07 | 2018-05-30 | 株式会社Sumco | エピタキシャル成長装置およびプリヒートリングならびにそれらを用いたエピタキシャルウェーハの製造方法 |
WO2021225091A1 (ja) * | 2020-05-08 | 2021-11-11 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
CN120035881A (zh) * | 2022-10-27 | 2025-05-23 | 应用材料公司 | 对处理腔室的区域进行关联的方法,及相关系统及方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW200508413A (en) * | 2003-08-06 | 2005-03-01 | Ulvac Inc | Device and method for manufacturing thin films |
DE102004056170A1 (de) * | 2004-08-06 | 2006-03-16 | Aixtron Ag | Vorrichtung und Verfahren zur chemischen Gasphasenabscheidung mit hohem Durchsatz |
US20060073276A1 (en) * | 2004-10-04 | 2006-04-06 | Eric Antonissen | Multi-zone atomic layer deposition apparatus and method |
JP4564498B2 (ja) * | 2004-10-15 | 2010-10-20 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法及び基板処理方法 |
-
2008
- 2008-08-29 JP JP2008222738A patent/JP5195176B2/ja active Active
-
2009
- 2009-08-31 CN CN200910169416.5A patent/CN101660141B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN101660141B (zh) | 2014-04-16 |
CN101660141A (zh) | 2010-03-03 |
JP2010056472A (ja) | 2010-03-11 |
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