JP5170622B2 - 形状測定方法、プログラム、および形状測定装置 - Google Patents

形状測定方法、プログラム、および形状測定装置 Download PDF

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JP5170622B2
JP5170622B2 JP2007181720A JP2007181720A JP5170622B2 JP 5170622 B2 JP5170622 B2 JP 5170622B2 JP 2007181720 A JP2007181720 A JP 2007181720A JP 2007181720 A JP2007181720 A JP 2007181720A JP 5170622 B2 JP5170622 B2 JP 5170622B2
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sheet light
test object
light
shape
sheet
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JP2009019942A5 (fr
JP2009019942A (ja
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智明 山田
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Nikon Corp
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Nikon Corp
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JP2007181720A 2007-07-11 2007-07-11 形状測定方法、プログラム、および形状測定装置 Active JP5170622B2 (ja)

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JP2007181720A JP5170622B2 (ja) 2007-07-11 2007-07-11 形状測定方法、プログラム、および形状測定装置

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JP2007181720A JP5170622B2 (ja) 2007-07-11 2007-07-11 形状測定方法、プログラム、および形状測定装置

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JP2009019942A JP2009019942A (ja) 2009-01-29
JP2009019942A5 JP2009019942A5 (fr) 2010-11-18
JP5170622B2 true JP5170622B2 (ja) 2013-03-27

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8938099B2 (en) * 2010-12-15 2015-01-20 Canon Kabushiki Kaisha Image processing apparatus, method of controlling the same, distance measurement apparatus, and storage medium
US9857166B2 (en) 2012-09-19 2018-01-02 Canon Kabushiki Kaisha Information processing apparatus and method for measuring a target object
JP6351201B2 (ja) * 2012-12-06 2018-07-04 キヤノン株式会社 距離計測装置および方法
JP2014115109A (ja) * 2012-12-06 2014-06-26 Canon Inc 距離計測装置及び方法
FR3056778B1 (fr) * 2016-09-29 2018-10-26 Airbus Operations Procede et dispositif de generation d'une trajectoire de vol optimale destinee a etre suivie par un aeronef.
US10529082B2 (en) * 2017-06-20 2020-01-07 Mitutoyo Corporation Three-dimensional geometry measurement apparatus and three-dimensional geometry measurement method
JP7219034B2 (ja) * 2018-09-14 2023-02-07 株式会社ミツトヨ 三次元形状測定装置及び三次元形状測定方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6410109A (en) * 1987-07-03 1989-01-13 Toshiba Corp Position detecting device
JPH03257307A (ja) * 1990-03-08 1991-11-15 Mitsubishi Heavy Ind Ltd 三次元形状認識方法及び装置
JPH04238205A (ja) * 1991-01-21 1992-08-26 Toshiba Corp 溶接位置検出装置
JP3800842B2 (ja) * 1998-12-28 2006-07-26 スズキ株式会社 三次元形状を計測する方法および装置並びに三次元形状計測用プログラムを記憶した記憶媒体
JP2004219154A (ja) * 2003-01-10 2004-08-05 Hitachi Ltd 物体の表面形状計測方法及び自動溶接装置

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