JP5145011B2 - レーザ測量システム - Google Patents

レーザ測量システム Download PDF

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Publication number
JP5145011B2
JP5145011B2 JP2007278668A JP2007278668A JP5145011B2 JP 5145011 B2 JP5145011 B2 JP 5145011B2 JP 2007278668 A JP2007278668 A JP 2007278668A JP 2007278668 A JP2007278668 A JP 2007278668A JP 5145011 B2 JP5145011 B2 JP 5145011B2
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JP
Japan
Prior art keywords
light
unit
signal
light receiving
fan
Prior art date
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Expired - Fee Related
Application number
JP2007278668A
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English (en)
Japanese (ja)
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JP2009109210A (ja
JP2009109210A5 (enExample
Inventor
史彦 上園
邦広 林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon Corp
Original Assignee
Topcon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Topcon Corp filed Critical Topcon Corp
Priority to JP2007278668A priority Critical patent/JP5145011B2/ja
Priority to US12/287,521 priority patent/US7966739B2/en
Priority to EP08018134.0A priority patent/EP2053354B1/en
Publication of JP2009109210A publication Critical patent/JP2009109210A/ja
Publication of JP2009109210A5 publication Critical patent/JP2009109210A5/ja
Application granted granted Critical
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Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00
    • G01C15/002—Active optical surveying means
    • G01C15/004—Reference lines, planes or sectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C1/00—Measuring angles
    • G01C1/02—Theodolites
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/42—Simultaneous measurement of distance and other co-ordinates

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Optical Distance (AREA)
JP2007278668A 2007-10-26 2007-10-26 レーザ測量システム Expired - Fee Related JP5145011B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2007278668A JP5145011B2 (ja) 2007-10-26 2007-10-26 レーザ測量システム
US12/287,521 US7966739B2 (en) 2007-10-26 2008-10-10 Laser surveying system
EP08018134.0A EP2053354B1 (en) 2007-10-26 2008-10-16 Laser surveying system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007278668A JP5145011B2 (ja) 2007-10-26 2007-10-26 レーザ測量システム

Publications (3)

Publication Number Publication Date
JP2009109210A JP2009109210A (ja) 2009-05-21
JP2009109210A5 JP2009109210A5 (enExample) 2010-12-02
JP5145011B2 true JP5145011B2 (ja) 2013-02-13

Family

ID=40021033

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007278668A Expired - Fee Related JP5145011B2 (ja) 2007-10-26 2007-10-26 レーザ測量システム

Country Status (3)

Country Link
US (1) US7966739B2 (enExample)
EP (1) EP2053354B1 (enExample)
JP (1) JP5145011B2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8610263B2 (en) 2010-01-27 2013-12-17 Mitsubishi Electric Corporation Semiconductor device module

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9041915B2 (en) * 2008-05-09 2015-05-26 Ball Aerospace & Technologies Corp. Systems and methods of scene and action capture using imaging system incorporating 3D LIDAR
JP5280258B2 (ja) * 2009-03-16 2013-09-04 株式会社トプコン 測量システム
JP5456549B2 (ja) 2010-04-15 2014-04-02 株式会社トプコン 測量システム及び測量システムに於けるレーザ基準面平滑化方法
US8745884B2 (en) * 2010-06-28 2014-06-10 Trimble Navigation Limited Three dimensional layout and point transfer system
JP5616174B2 (ja) * 2010-09-14 2014-10-29 株式会社トプコン レーザ測量装置
JP5690541B2 (ja) * 2010-09-30 2015-03-25 株式会社トプコン 距離測定装置
US9222771B2 (en) 2011-10-17 2015-12-29 Kla-Tencor Corp. Acquisition of information for a construction site
NO335488B1 (no) 2013-03-22 2014-12-22 Kongsberg Seatex As Posisjonsreferansesystem og fremgangsmåte for posisjonering og sporing av ett eller flere objekter
CN103453886A (zh) * 2013-07-30 2013-12-18 贵州中建建筑科研设计院有限公司 一种测量既有建筑物不可触及测点垂直度的方法
CN104457696B (zh) * 2014-12-09 2017-02-22 江西洪都航空工业集团有限责任公司 一种非调平式水平测量方法
CN105333860B (zh) * 2015-11-27 2017-10-31 盐城工学院 测高测距装置及测量方法
CN109154500A (zh) * 2016-03-08 2019-01-04 斯塔夫控股私人有限公司 激光水准检查
US10006768B2 (en) 2016-03-15 2018-06-26 Stanley Black & Decker Inc. Laser level
CN105629200B (zh) * 2016-03-16 2018-05-15 北京国承万通信息科技有限公司 定位光束发射系统、方法及室内定位系统
US10145671B2 (en) 2016-03-31 2018-12-04 Topcon Positioning Systems, Inc. Three dimensional laser measuring system and method
RU2666224C1 (ru) * 2017-03-15 2018-09-06 Самсунг Электроникс Ко., Лтд. Система сканирования для лидара, основанного на отражателе с магнитной подвеской
CN108196263B (zh) * 2018-01-22 2024-11-29 上海诺司纬光电仪器有限公司 激光定位装置
CA3071935C (en) * 2019-02-19 2026-05-12 Tks Industries Ltd. Apparatus, system and method for detecting objects
CN110764101B (zh) * 2019-11-07 2023-05-05 浙江缔科新技术发展有限公司 一种具备测高功能的光量子激光瞄镜
CN111121656B (zh) * 2019-12-22 2024-09-24 同济大学 一种用于检测预制构件间距的检测设备及方法
EP4006487A1 (en) * 2020-11-30 2022-06-01 Hilti Aktiengesellschaft Target and plumbing system for transferring a point of interest to a jobsite surface
DE102021124012A1 (de) * 2021-09-16 2023-03-16 Neura Robotics GmbH Radarsystem sowie Verfahren zur Bestimmung eines Objektes im Raum

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994005970A1 (en) 1992-09-09 1994-03-17 Spatial Positioning Systems, Inc. Spatial positioning system
JPH07198382A (ja) * 1993-12-28 1995-08-01 Nikon Corp レーザ測量システム
JP3483303B2 (ja) * 1994-06-21 2004-01-06 株式会社トプコン 回転レーザ装置
US5977534A (en) * 1997-04-11 1999-11-02 Spectra-Precision, Inc. Laser transmitter incorporating target dither
US6031601A (en) 1998-07-08 2000-02-29 Trimble Navigation Limited Code-space optical electronic distance meter
JP4601798B2 (ja) * 2000-10-06 2010-12-22 株式会社トプコン 位置測定設定システム
US6710319B2 (en) * 2001-03-08 2004-03-23 Kabushiki Kaisha Topcon System for radiating a reference laser beam and utilizing GPS units for installing an article
JP4731710B2 (ja) * 2001-04-02 2011-07-27 株式会社 ソキア・トプコン レーザ測量機
US6873406B1 (en) 2002-01-11 2005-03-29 Opti-Logic Corporation Tilt-compensated laser rangefinder
TWI220088B (en) 2003-07-01 2004-08-01 Asia Optical Co Inc Optical signal receiving method and optical signal receiving device
JP4697776B2 (ja) * 2005-02-18 2011-06-08 株式会社 ソキア・トプコン 測量機の自動視準装置
JP4819403B2 (ja) * 2005-06-06 2011-11-24 株式会社トプコン 距離測定装置
US7450251B2 (en) 2005-11-09 2008-11-11 The Boeing Company Fanned laser beam metrology system
US7787134B2 (en) 2005-11-09 2010-08-31 The Boeing Company Multiple fanned laser beam metrology system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8610263B2 (en) 2010-01-27 2013-12-17 Mitsubishi Electric Corporation Semiconductor device module

Also Published As

Publication number Publication date
US7966739B2 (en) 2011-06-28
JP2009109210A (ja) 2009-05-21
US20090106989A1 (en) 2009-04-30
EP2053354B1 (en) 2013-09-18
EP2053354A1 (en) 2009-04-29

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