JP5114301B2 - 画像計測装置、画像計測方法及びコンピュータプログラム - Google Patents

画像計測装置、画像計測方法及びコンピュータプログラム Download PDF

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JP5114301B2
JP5114301B2 JP2008152317A JP2008152317A JP5114301B2 JP 5114301 B2 JP5114301 B2 JP 5114301B2 JP 2008152317 A JP2008152317 A JP 2008152317A JP 2008152317 A JP2008152317 A JP 2008152317A JP 5114301 B2 JP5114301 B2 JP 5114301B2
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JP2009300125A (ja
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貴司 中務
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Keyence Corp
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JP2008152317A 2008-06-10 2008-06-10 画像計測装置、画像計測方法及びコンピュータプログラム Active JP5114301B2 (ja)

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JP5525953B2 (ja) 2010-07-29 2014-06-18 株式会社キーエンス 寸法測定装置、寸法測定方法及び寸法測定装置用のプログラム
JP5597056B2 (ja) 2010-08-02 2014-10-01 株式会社キーエンス 画像測定装置、画像測定方法及び画像測定装置用のプログラム
JP5547105B2 (ja) 2011-02-01 2014-07-09 株式会社キーエンス 寸法測定装置、寸法測定方法及び寸法測定装置用のプログラム
JP5679560B2 (ja) 2011-02-01 2015-03-04 株式会社キーエンス 寸法測定装置、寸法測定方法及び寸法測定装置用のプログラム
JP5865666B2 (ja) 2011-10-19 2016-02-17 株式会社キーエンス 画像処理装置および画像処理プログラム
JP6279435B2 (ja) * 2014-09-02 2018-02-14 東芝機械株式会社 画像処理装置
JP6842329B2 (ja) * 2017-03-24 2021-03-17 株式会社Ｓｃｒｅｅｎホールディングス 画像処理方法および画像処理装置
CN108489426B (zh) * 2018-05-17 2023-11-28 信利半导体有限公司 一种非矩形显示产品组装精度的检测方法及检测系统
CN113643225B (zh) * 2020-04-26 2025-02-14 北京配天技术有限公司 一种圆弧检测方法以及圆弧检测装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
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JPS61130809A (ja) * 1984-11-30 1986-06-18 Mitsubishi Electric Corp 視覚センサ
JPH04198741A (ja) * 1990-11-28 1992-07-20 Hitachi Ltd 形状欠陥検出装置
JPH10339615A (ja) * 1997-06-09 1998-12-22 Hoya Corp パターン形状計測方法及びパターン形状計測装置
JP4139664B2 (ja) * 2002-10-04 2008-08-27 大日本印刷株式会社 丸み自動計測方法、マスクパターン品質測定装置
JP4401126B2 (ja) * 2003-08-22 2010-01-20 株式会社日立国際電気 寸法測定装置の所定部位登録方法
JP4683324B2 (ja) * 2005-02-03 2011-05-18 日立金属株式会社 形状測定システム、形状測定方法及び形状測定プログラム

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