JP5096543B2 - テラヘルツ波装置 - Google Patents
テラヘルツ波装置 Download PDFInfo
- Publication number
- JP5096543B2 JP5096543B2 JP2010235414A JP2010235414A JP5096543B2 JP 5096543 B2 JP5096543 B2 JP 5096543B2 JP 2010235414 A JP2010235414 A JP 2010235414A JP 2010235414 A JP2010235414 A JP 2010235414A JP 5096543 B2 JP5096543 B2 JP 5096543B2
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- JP
- Japan
- Prior art keywords
- wavelength
- terahertz wave
- laser
- wave device
- frequency
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/062—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying the potential of the electrodes
- H01S5/06226—Modulation at ultra-high frequencies
- H01S5/0623—Modulation at ultra-high frequencies using the beating between two closely spaced optical frequencies, i.e. heterodyne mixing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2/00—Demodulating light; Transferring the modulation of modulated light; Frequency-changing of light
- G02F2/002—Demodulating light; Transferring the modulation of modulated light; Frequency-changing of light using optical mixing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/14—External cavity lasers
- H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4012—Beam combining, e.g. by the use of fibres, gratings, polarisers, prisms
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S1/00—Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range
- H01S1/02—Masers, i.e. devices using stimulated emission of electromagnetic radiation in the microwave range solid
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Nonlinear Science (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Lasers (AREA)
- Semiconductor Lasers (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
Description
320 波長スイープレーザー
330 カプラー
340 フォトミキサー
321 利得媒質
322 波長可変フィルター
327 光繊維
323 第1光アイソレータ
324 第2光アイソレータ
326 光繊維結合器
Claims (13)
- 固定された第1波長を有する第1レーザー光を発振する波長固定レーザーと、
可変する第2波長を有する第2レーザー光を発振する波長スイープレーザーと、
前記第1レーザー光と前記第2レーザー光を結合させるカプラーと、
前記カプラーで放出された混合光をテラヘルツ波に変換する発生器と、を含み、
前記テラヘルツ波の周波数が連続的に可変になるように構成され、
前記波長スイープレーザーは利得媒質及び前記利得媒質から放出された光を前記第2波長にフィルターリングする波長可変フィルターを含み、前記波長可変フィルターは印加される電圧の増加に応じてフィルターリングする前記第2波長を短波長から長波長に可変し、前記波長可変フィルターに一定の変調周波数を有するサイン関数による電圧を印加し、短波長から長波長への走査及び長波長から短波長への2方向への走査を全て使用することにより有効走査周波数を前記変調周波数の2倍にすることを特徴とするテラヘルツ波装置。 - 前記発生器は、前記第1波長と前記第2波長との差異値に対応する周波数を有するテラヘルツ波を発生させることを特徴とする請求項1に記載のテラヘルツ波装置。
- 前記利得媒質及び前記波長可変フィルターは、光繊維に結合されることを特徴とする請求項1に記載のテラヘルツ波装置。
- 前記利得媒質は、半導体光増幅器(semiconductor optical amplifier)を含むことを特徴とする請求項1に記載のテラヘルツ波装置。
- 前記利得媒質は、希土類元素添加の光繊維を含むことを特徴とする請求項1に記載のテ
ラヘルツ波装置。 - 前記希土類元素は、エルビウム(Er)、またはイッテルビウム(Yb)の中で、少なくとも何れか1つを含むことを特徴とする請求項5に記載のテラヘルツ波装置。
- 前記波長可変フィルターは、光繊維のファブリ・ペロー可変フィルターを含むことを特徴とする請求項1記載のテラヘルツ波装置。
- 前記波長スイープレーザーは、前記ファブリ・ペロー可変フィルターにパルス形態で電圧を印加する高周波ドライバーをさらに含むことを特徴とする請求項7記載のテラヘルツ波装置。
- 前記ファブリ・ペロー可変フィルターは、前記印加される電圧によって連続的に前記第2波長を可変してフィルターリングすることを特徴とする請求項8に記載のテラヘルツ波装置。
- 前記波長スイープレーザーは、前記第2レーザー光を1方向に進行させる光アイソレータ(optical isolator)をさらに含むことを特徴とする請求項1に記載のテラヘルツ波装置。
- 前記波長スイープレーザーは、一部を出力し、他の一部を前記利得媒質にフィードバックする出力光繊維結合器をさらに含むことを特徴とする請求項1に記載のテラヘルツ波装置。
- 前記発生器から放出され、サンプルを透過したテラヘルツ波を検出する検出器をさらに含むことを特徴とする請求項8に記載のテラヘルツ波装置。
- 前記高周波ドライバーで提供される同期信号を利用してトリガーしながら前記検出器から検出信号を連続的に獲得するデータ獲得装置をさらに含むことを特徴とする請求項12に記載のテラヘルツ波装置。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2010-0012893 | 2010-02-11 | ||
KR20100012893 | 2010-02-11 | ||
KR10-2010-0055614 | 2010-06-11 | ||
KR1020100055614A KR101453472B1 (ko) | 2010-02-11 | 2010-06-11 | 테라헤르츠파 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2011164578A JP2011164578A (ja) | 2011-08-25 |
JP5096543B2 true JP5096543B2 (ja) | 2012-12-12 |
Family
ID=44316769
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010235414A Expired - Fee Related JP5096543B2 (ja) | 2010-02-11 | 2010-10-20 | テラヘルツ波装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US8476592B2 (ja) |
JP (1) | JP5096543B2 (ja) |
DE (1) | DE102010042469A1 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20130073450A (ko) * | 2011-12-23 | 2013-07-03 | 한국전자통신연구원 | 테라헤르츠파 생성기 및 테라헤르츠파 생성 방법 |
CA2879528C (en) * | 2012-07-27 | 2021-01-05 | Thorlabs, Inc. | Mems-tunable short cavity laser |
JP2014060384A (ja) * | 2012-08-23 | 2014-04-03 | Canon Inc | 面発光レーザー、光源装置、光源装置の駆動方法及び光干渉断層撮像装置 |
CN104457991B (zh) * | 2014-12-10 | 2016-06-08 | 上海理工大学 | 通过太赫兹波检测气体里德伯态精细谱线的装置 |
FR3030954A1 (fr) * | 2014-12-17 | 2016-06-24 | Thales Sa | Composant optoelectronique pour generer et rayonner un signal hyperfrequence |
KR101699273B1 (ko) * | 2015-06-30 | 2017-01-24 | 한국표준과학연구원 | 테라헤르츠파를 이용한 실시간 비접촉 비파괴 두께 측정장치 |
KR101712890B1 (ko) | 2015-10-13 | 2017-03-08 | 한국표준과학연구원 | 연속파 THz 빔 스캔을 이용한 고속 3차원 영상 탐지 장치 |
CN106159641B (zh) * | 2016-09-05 | 2017-07-18 | 华讯方舟科技有限公司 | 携带轨道角动量的太赫兹波的发生装置及产生方法 |
JP6966872B2 (ja) * | 2017-05-22 | 2021-11-17 | 株式会社リコー | テラヘルツ波発生装置、検査装置 |
CN116793963A (zh) * | 2023-03-28 | 2023-09-22 | 生态环境部南京环境科学研究所 | 加强废水处理系统中MPs与ARGs复合污染监管的装置及方法 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0524382B1 (en) | 1991-07-22 | 1996-08-21 | Hewlett-Packard Company | Optical oscillator sweeper |
JP3191062B2 (ja) | 1992-03-03 | 2001-07-23 | 株式会社アドバンテスト | 周波数変換装置 |
US5832009A (en) * | 1995-08-18 | 1998-11-03 | Sony Corporation | Laser light emitting device, laser beacon device and laser imager display device |
US6144679A (en) * | 1999-01-15 | 2000-11-07 | Science Applications International Corporation | Method and apparatus for providing a coherent terahertz source |
EP1715377A4 (en) * | 2004-01-29 | 2011-04-27 | Nishizawa Junichi | ELECTROMAGNETIC WAVE GENERATING DEVICE |
US7054339B1 (en) | 2004-07-13 | 2006-05-30 | Np Photonics, Inc | Fiber-laser-based Terahertz sources through difference frequency generation (DFG) by nonlinear optical (NLO) crystals |
JP2006091802A (ja) * | 2004-09-21 | 2006-04-06 | Semiconductor Res Found | テラヘルツ電磁波発生装置及び方法 |
US8315282B2 (en) * | 2005-01-20 | 2012-11-20 | Massachusetts Institute Of Technology | Fourier domain mode locking: method and apparatus for control and improved performance |
JP2006215222A (ja) | 2005-02-03 | 2006-08-17 | Tohoku Univ | テラヘルツ波発生装置及び分光測定装置 |
US7539221B1 (en) * | 2006-10-19 | 2009-05-26 | Np Photonics, Inc | Fiber-laser-based gigahertz sources through difference frequency generation (DFG) by nonlinear optical (NLO) materials |
JP2009033078A (ja) * | 2007-01-29 | 2009-02-12 | Optical Comb Inc | 波長走査型光源 |
KR100926039B1 (ko) | 2007-11-13 | 2009-11-11 | 한국표준과학연구원 | 초정밀 및 고분해능의 테라헤르츠 분광기 및 그 측정방법 |
JP2010010172A (ja) * | 2008-06-24 | 2010-01-14 | Fujifilm Corp | 波長掃引光源 |
KR101020949B1 (ko) | 2008-11-18 | 2011-03-09 | 주식회사 데이타웨이브 시스템 | 키워드 광고의 부정 클릭 검출 방법 및 서버 |
US8670129B2 (en) * | 2009-09-03 | 2014-03-11 | Axsun Technologies, Inc. | Filtered ASE swept source for OCT medical imaging |
US8946632B2 (en) * | 2009-11-10 | 2015-02-03 | New Jersey Institute Of Technology | System and method for terahertz 2D interferometric and synthetic aperture imaging with an incoherent source |
KR101385108B1 (ko) * | 2009-12-17 | 2014-04-29 | 한국전자통신연구원 | 포토믹서 모듈 및 그것의 테라헤르츠파 발생 방법 |
KR101231544B1 (ko) | 2010-01-22 | 2013-02-07 | (주)아모레퍼시픽 | 각화 이상 피부질환의 진단키트 및 그를 이용하는 진단방법 |
-
2010
- 2010-10-14 DE DE102010042469A patent/DE102010042469A1/de not_active Withdrawn
- 2010-10-20 JP JP2010235414A patent/JP5096543B2/ja not_active Expired - Fee Related
- 2010-10-20 US US12/908,628 patent/US8476592B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US8476592B2 (en) | 2013-07-02 |
JP2011164578A (ja) | 2011-08-25 |
DE102010042469A1 (de) | 2011-08-11 |
US20110192978A1 (en) | 2011-08-11 |
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