JP5092240B2 - Plating equipment - Google Patents

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JP5092240B2
JP5092240B2 JP2006001881A JP2006001881A JP5092240B2 JP 5092240 B2 JP5092240 B2 JP 5092240B2 JP 2006001881 A JP2006001881 A JP 2006001881A JP 2006001881 A JP2006001881 A JP 2006001881A JP 5092240 B2 JP5092240 B2 JP 5092240B2
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plating
barrel
plating solution
buffer member
plated
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JP2007182613A (en
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猛 大倉
健一 青木
勝 角方
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Murata Manufacturing Co Ltd
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Description

本願発明は、めっき装置に関し、詳しくは、被めっき物を入れたバレルをめっき液に浸漬してバレルを回転させながらめっき処理を行う、いわゆるバレルめっき方法に用いられるめっき装置に関する。   The present invention relates to a plating apparatus, and more particularly to a plating apparatus used in a so-called barrel plating method in which a barrel containing a workpiece is immersed in a plating solution and plating is performed while rotating the barrel.

電子部品などの寸法の小さい被めっき物にめっきを施す際に用いられるめっき方法の一つに、回転可能なバレルに被めっき物を収容し、バレルをめっき液に浸漬した状態で回転させながらめっきを行うバレルめっき方法がある。図7は、従来の、電子部品にめっきを施す場合に用いられる、バレルめっき装置の構成の一例を示す図である。   One of the plating methods used when plating small-sized workpieces such as electronic components is to be plated while rotating the barrel while the barrel is immersed in a plating solution. There is a barrel plating method. FIG. 7 is a diagram showing an example of a configuration of a conventional barrel plating apparatus used when plating an electronic component.

この回転バレルめっき装置は、少なくとも一部がめっき液54を通過させる網状部材から構成され、内部に陰極電極(給電端子)52が配設されたバレル51内に、例えば積層セラミックコンデンサなどの多数の被めっき物(図示せず)と、被めっき物と陰極電極52とを導通させる、例えば、スチールボールなどの接触媒体(図示せず)を投入した後、バレル51をめっき槽53内のめっき液54中に浸漬し、めっき槽53内に配設された陽極電極55と陰極電極52との間に通電しつつ、めっき液54中でバレル51を回転させ、被めっき物を、接触媒体を介して陰極電極52およびめっき液54に接触させることにより、被めっき物にめっきを行い、例えば、積層セラミックコンデンサの外部電極にNiめっきやSnめっきを行うように構成されている。   This rotary barrel plating apparatus is composed of a net-like member at least partially passing a plating solution 54, and in a barrel 51 in which a cathode electrode (feeding terminal) 52 is disposed, a large number of, for example, multilayer ceramic capacitors are provided. After introducing an object to be plated (not shown) and a contact medium (not shown) such as a steel ball for conducting the object to be plated and the cathode electrode 52, the barrel 51 is placed in the plating bath 53. 54, the barrel 51 is rotated in the plating solution 54 while energizing between the anode electrode 55 and the cathode electrode 52 disposed in the plating tank 53, and the object to be plated is passed through the contact medium. Then, the object to be plated is plated by bringing it into contact with the cathode electrode 52 and the plating solution 54, for example, Ni plating or Sn plating is performed on the external electrode of the multilayer ceramic capacitor. It is configured.

しかしながら、このようなバレルめっき方法においては、他のめっき方法の場合と同様に、めっき槽の底部に異物が堆積し、これがめっき液の撹拌、流動により浮遊し、被めっき物の表面に付着して、めっき不良を発生したり、めっき膜の均一性が損なわれたりするという問題点がある。   However, in such a barrel plating method, as in the case of other plating methods, foreign matter accumulates at the bottom of the plating tank, which floats by stirring and flowing of the plating solution and adheres to the surface of the object to be plated. As a result, there is a problem that defective plating occurs or the uniformity of the plating film is impaired.

そこで、例えば、図8に示すように、めっき液54を入れるめっき槽61を仕切り板62で仕切ることにより、めっき槽61を被めっき物60がめっき液54に浸漬される領域となる上槽部63と、その下側の下槽部64とに分割し、上槽部63と下槽部64の一方側の側壁63a,64aに、それぞれめっき液流入口73a,74aを設け、下槽部64の、上記一方側の側壁64aとは逆側の他方側の側壁64bにめっき液排出口74bを設け、循環ライン75に液流ポンプ76を設けて、めっき液を循環するとともに、循環ライン75に濾過手段77を設けて堆積物を濾過するようにしためっき装置が提案されている(特許文献1参照)。   Therefore, for example, as shown in FIG. 8, by dividing a plating tank 61 into which the plating solution 54 is placed by a partition plate 62, the upper tank portion that becomes a region in which the plating object 60 is immersed in the plating solution 54. 63 and the lower tank part 64 below the upper tank part 63 and the side walls 63a and 64a on one side of the lower tank part 64 are provided with plating solution inlets 73a and 74a, respectively. The plating solution discharge port 74b is provided in the other side wall 64b opposite to the one side wall 64a, the liquid flow pump 76 is provided in the circulation line 75, and the plating solution is circulated. There has been proposed a plating apparatus provided with a filtering means 77 to filter deposits (see Patent Document 1).

しかしながら、この特許文献1のめっき装置(図8)の構成を、上述のようなバレルめっき方法に適用した場合、図9に示すように、上槽部63のめっき液流入口73aからめっき槽61内に流入するめっき液54の流れにより、バレル51内で被めっき物71が舞い上り、接触媒体(図示せず)を介しての、陰極電極52から被めっき物71へのめっき電流の供給が不十分になり、めっき不足不良、すなわち、めっき膜厚が薄くなりすぎたり、全くめっき膜が形成されなかったりする不良の原因になるという問題点がある。
特に、めっき液54の流動が、下方からバレル51に向かうことになると、バレル51内での被めっき物の舞い上がりの度合いが大きくなりやすい。
However, when the configuration of the plating apparatus (FIG. 8) of Patent Document 1 is applied to the barrel plating method as described above, as shown in FIG. 9, the plating tank 61 is supplied from the plating solution inlet 73 a of the upper tank portion 63. Due to the flow of the plating solution 54 flowing in, the workpiece 71 rises in the barrel 51, and the plating current is supplied from the cathode electrode 52 to the workpiece 71 via the contact medium (not shown). There is a problem that it becomes insufficient and causes insufficient plating, that is, a defect that the plating film thickness becomes too thin or no plating film is formed at all.
In particular, when the flow of the plating solution 54 is directed from below to the barrel 51, the degree of the so-called plating object in the barrel 51 tends to increase.

すなわち、バレルめっき方法によれば、バレルの回転によっても、被めっき物は転動し、陰極電極や接触媒体との接触の度合いが減少するが、めっき液流入口から流出するめっき液の流れにより、被めっき物の舞い上がりの度合いがさらに大きくなり、被めっき物へのめっき電流の供給がさらに少なくなり、めっき不足不良を引き起こすという問題点がある。
特開2003−221698号公報
That is, according to the barrel plating method, the object to be plated rolls by the rotation of the barrel, and the degree of contact with the cathode electrode and the contact medium decreases, but due to the flow of the plating solution flowing out from the plating solution inlet. There is a problem in that the degree of soaring of the object to be plated is further increased, the supply of the plating current to the object to be plated is further reduced, and insufficient plating is caused.
JP 2003-221698 A

本願発明は上記課題を解決するものであり、バレル内の被めっき物が舞い上がってめっき不良が発生することを防止しつつ、めっき槽内のめっき液を十分に撹拌して異物の堆積をなくし、良好なバレルめっきを行うことが可能なめっき装置を提供することを目的とする。   The invention of the present application solves the above-mentioned problem, while preventing the occurrence of poor plating due to the plating object in the barrel rising, sufficiently agitating the plating solution in the plating tank to eliminate the accumulation of foreign matters, It aims at providing the plating apparatus which can perform favorable barrel plating.

上記課題を解決するために、請求項のめっき装置は、
筒状で回転可能に構成され、被めっき物に給電するための陰極電極を備え、かつ、周壁部の少なくとも一部が、被めっき物を通過させることなくめっき液を通過させる材料から形成されたバレルと、
前記バレル内に収容された被めっき物をめっきする際に、前記バレルが浸漬されるめっき液を収容するめっき槽と、
前記バレルの外側に位置し、前記めっき槽内のめっき液を吸い込む吸込口と、前記バレルの外側に位置し、前記吸込口から吸い込んだめっき液を、循環ラインを経て、前記めっき槽に噴出する噴出口とを備えた、前記めっき槽内のめっき液を循環するための循環手段と、
めっき液を通過させない板状材料を用いて形成され、前記めっき槽内の、噴出口とバレルとの間の領域に、少なくとも一部が前記噴出口と対向するように配設され、前記噴出口から噴出されるめっき液の流動が、前記バレル内の被めっき物の動きに影響を与えることを防止するための緩衝部材と
を具備することを特徴としている。
In order to solve the above problems, the plating apparatus according to claim 1 comprises:
The tube is configured to be rotatable and includes a cathode electrode for supplying power to the object to be plated, and at least a part of the peripheral wall portion is made of a material that allows the plating solution to pass through without passing the object to be plated. Barrel,
When plating an object to be plated accommodated in the barrel, a plating tank for accommodating a plating solution in which the barrel is immersed,
A suction port that is located outside the barrel and sucks the plating solution in the plating tank, and a plating solution that is located outside the barrel and sucked from the suction port is jetted to the plating tank through a circulation line. A circulation means for circulating the plating solution in the plating tank,
It is formed using a plate-like material that does not allow the plating solution to pass, and is disposed in a region between the jet port and the barrel in the plating tank so that at least a part thereof faces the jet port. And a buffer member for preventing the flow of the plating solution ejected from the above from affecting the movement of the object to be plated in the barrel.

また、請求項2のめっき装置は、前記緩衝部材が、平面視した場合に前記バレルを取り囲むような態様で配設されていることを特徴としている。 Moreover, the plating apparatus of Claim 2 is arrange | positioned in the aspect which surrounds the said barrel when the said buffer member planarly views .

請求項1のめっき装置は、筒状で回転可能に構成され、被めっき物に給電するための陰極電極を備え、かつ、周壁部の少なくとも一部が、被めっき物を通過させることなくめっき液を通過させる材料から形成されたバレルと、バレル内に収容された被めっき物をめっきする際に、バレルが浸漬されるめっき液を収容するめっき槽と、バレルの外側に位置し、めっき槽内のめっき液を吸い込む吸込口と、バレルの外側に位置し、吸込口から吸い込んだめっき液を、循環ラインを経て、めっき槽に噴出する噴出口とを備えた、めっき槽内のめっき液を循環するための循環手段と、めっき液を通過させない板状材料を用いて形成され、めっき槽内の、噴出口とバレルとの間の領域に、少なくとも一部が噴出口と対向するように配設され、噴出口から噴出されるめっき液の流動が、バレル内の被めっき物の動きに影響を与えることを防止するための緩衝部材とを具備しているので、緩衝部材の機能により、バレル内の被めっき物が、噴出口から噴出されるめっき液の流動の影響により舞い上がることを抑制することが可能になり、接触媒体を介しての陰極電極から被めっき物に供給される電流が少なくなることを防止しつつ、めっき槽内のめっき液を十分に撹拌して異物の堆積をなくし、良好なバレルめっきを行うことが可能になる。
また、緩衝部材を、めっき槽内の、噴出口とバレルとの間の領域に配設するようにしているので、設備の大型化を抑制することが可能である。
The plating apparatus according to claim 1 is configured to be cylindrical and rotatable, includes a cathode electrode for supplying power to the object to be plated, and at least a part of the peripheral wall portion does not allow the object to be plated to pass therethrough. A barrel formed of a material that passes through, a plating tank that contains a plating solution in which the barrel is immersed when plating an object to be plated accommodated in the barrel, and located outside the barrel and in the plating tank The plating solution in the plating tank is circulated with a suction port that sucks in the plating solution and a jet port that is located outside the barrel and jets the plating solution sucked from the suction port through the circulation line to the plating tank. Is formed using a plate-like material that does not allow the plating solution to pass therethrough, and is disposed in a region between the jet port and the barrel in the plating tank so that at least a part faces the jet port. And from the spout Since the flow of the plating solution is provided with a buffer member for preventing the movement of the object to be plated in the barrel, the function of the buffer member allows the object to be plated in the barrel to It is possible to suppress soaring due to the influence of the flow of the plating solution ejected from the ejection port, while preventing the current supplied to the object to be plated from the cathode electrode via the contact medium from being reduced, It is possible to sufficiently stir the plating solution in the plating tank to eliminate the accumulation of foreign matters and perform good barrel plating.
Moreover, since the buffer member is arranged in the region between the jet port and the barrel in the plating tank, it is possible to suppress the increase in size of the equipment.

また、緩衝部材を、めっき液を通過させない板状材料を用いて形成しているので、噴出口から噴出するめっき液の流動を妨げて、バレル内の被めっき物が舞い上がったりすることを確実に防止することが可能になる。 Further, a cushioning member, because formed using a plate material that does not pass through the plating solution, preventing the flow of the plating solution jetted from the jetting port, reliably to or soaring is the object to be plated in the barrel It becomes possible to prevent.

また、請求項2のめっき装置のように、緩衝部材を、平面視した場合にバレルを取り囲むような態様で配設するようにした場合、噴出口から噴出するめっき液の流動が、バレル内の被めっき物の動きに悪影響を与えることをより確実に防止することが可能になり、本願発明をさらに実効あらしめることができる。 Further, when the buffer member is arranged in such a manner as to surround the barrel when viewed in plan as in the plating apparatus of claim 2, the flow of the plating solution ejected from the ejection port It is possible to more reliably prevent adverse effects on the movement of the object to be plated, and the present invention can be more effectively realized.

以下に本願発明の実施例を示して、本願発明の特徴とするところをさらに詳しく説明する。   The features of the present invention will be described in more detail below with reference to examples of the present invention.

図1は本願発明の一実施例(実施例1)にかかるめっき装置の構成を示す図であり、(a)は正面断面図、(b)は側面断面図である。
この実施例1のめっき装置は、(a)筒状で回転可能に構成され、被めっき物1に給電するための陰極電極11を備え、かつ、周壁部2aの少なくとも一部が、被めっき物1を通過させることなくめっき液3を通過させる材料から形成されたバレル2と、(b)被めっき物1、被めっき物1と陰極電極11とを導通させる、例えば、スチールボールなどの接触媒体13とが収容されるバレル2と、バレル2が浸漬されるめっき液3を収容するめっき槽4と、めっき槽4内のめっき液3を吸い込む吸込口5と、吸込口5から吸い込んだめっき液3を、循環ライン6を経て、めっき槽4に噴出する噴出口7とを備えた、めっき槽4内のめっき液3を循環するための循環手段8と、(c)めっき槽4内に配設され、噴出口7から噴出されるめっき液3の流動が、バレル2内の被めっき物1の動きに影響を与えることを防止するための緩衝部材9とを備えている。
FIG. 1 is a view showing a configuration of a plating apparatus according to an embodiment (Example 1) of the present invention, in which (a) is a front sectional view and (b) is a side sectional view.
The plating apparatus of Example 1 is (a) configured to be cylindrical and rotatable, includes a cathode electrode 11 for supplying power to the object to be plated 1, and at least a part of the peripheral wall portion 2 a is to be plated. A barrel 2 made of a material that allows the plating solution 3 to pass through without passing through 1; and (b) the object to be plated 1, the object to be plated 1 and the cathode electrode 11 are electrically connected, for example, a contact medium such as a steel ball 13, a plating tank 4 containing a plating solution 3 in which the barrel 2 is immersed, a suction port 5 for sucking the plating solution 3 in the plating bath 4, and a plating solution sucked from the suction port 5. 3, a circulation means 8 for circulating the plating solution 3 in the plating tank 4, provided with a spout 7 for jetting into the plating tank 4 through the circulation line 6, and (c) disposed in the plating tank 4. Flow of plating solution 3 installed and ejected from ejection port 7 And a buffer member 9 for preventing the influence on the movement of the object to be plated 1 in the barrel 2.

また、このめっき装置においては、陰極線10が、バレル2の両端面2bからバレル2内に挿入されており、陰極線10の先端には陰極電極11が配設されている。また、めっき槽4内には、バレル2を挟むように一対の陽極電極12が配設されている。   Further, in this plating apparatus, the cathode line 10 is inserted into the barrel 2 from both end faces 2 b of the barrel 2, and the cathode electrode 11 is disposed at the tip of the cathode line 10. A pair of anode electrodes 12 is disposed in the plating tank 4 so as to sandwich the barrel 2.

この実施例1のめっき装置において、吸込口5がめっき槽4の一方の側面4aの下部に配設され、噴出口7は吸込口5が配設されためっき槽4の側面4aと対向する側面4bの下部に配設されている。
また、循環ライン6には濾過手段14が配設されており、吸込口5を経てめっき槽4内から吸い込んだめっき液3を濾過して異物を除去して、めっき液3中の異物の濃度の上昇を抑制することができるように構成されている。
In the plating apparatus of the first embodiment, the suction port 5 is disposed below the one side surface 4 a of the plating tank 4, and the jet port 7 is a side surface facing the side surface 4 a of the plating tank 4 in which the suction port 5 is disposed. It is arranged at the lower part of 4b.
Further, the circulation line 6 is provided with a filtering means 14, which removes foreign matter by filtering the plating solution 3 sucked from the plating tank 4 through the suction port 5, and the concentration of the foreign matter in the plating solution 3. It is comprised so that a raise of can be suppressed.

そして、この実施例1のめっき装置においては、上記緩衝部材9は、耐熱性塩化ビニル製で、貫通孔などが形成されておらず、めっき液3を通過させない板状材料を用いて形成されている。また、緩衝部材9は、噴出口7と吸込口5の間を遮るように配設されており、噴出口7から噴出されためっき液3の流動がバレル2に直接に達することがほとんどなく、バレル2内の被めっき物1が舞い上がることを抑制して、接触媒体13を介しての陰極電極11から被めっき物1への電流の供給が少なくなることを防止することができるように構成されている。   In the plating apparatus of Example 1, the buffer member 9 is made of a heat-resistant vinyl chloride, is not formed with a through hole, and is formed using a plate-like material that does not allow the plating solution 3 to pass through. Yes. Further, the buffer member 9 is disposed so as to block between the ejection port 7 and the suction port 5, and the flow of the plating solution 3 ejected from the ejection port 7 hardly reaches the barrel 2 directly, The object to be plated 1 in the barrel 2 is prevented from flying up, and the supply of current from the cathode electrode 11 to the object to be plated 1 via the contact medium 13 can be prevented from being reduced. ing.

上述のように構成されためっき装置においては、緩衝部材が、噴出口から噴出されるめっき液3の流動の影響により、バレル2内の被めっき物1が舞い上がることを抑制する機能を果たすため、バレル2内の被めっき物1が舞い上がって、接触媒体13を介しての、陰極電極11から被めっき物1への電流の供給が少なくなることを防止することが可能になる。すなわち、この実施例1の構成の場合、緩衝部材9が、噴出口7と吸込口5の間を遮断するように配設されており、噴出口7よりも下側まで達しているので、めっき液の流動が、下方からバレル2に向かうことを防止することが可能で、バレル2内での被めっき物1の舞い上がりを確実に抑制、防止することができる。その結果、めっき膜厚が薄すぎたり、全くめっき膜が形成されなかったりする、いわゆるめっき不足不良が発生することを防止しつつ、めっき槽4内のめっき液を十分に撹拌して異物の堆積をなくし、良好なバレルめっきを行うことができる。   In the plating apparatus configured as described above, the buffer member functions to suppress the object to be plated 1 in the barrel 2 from rising due to the influence of the flow of the plating solution 3 ejected from the ejection port. It is possible to prevent the object to be plated 1 in the barrel 2 from rising and reducing the supply of current from the cathode electrode 11 to the object to be plated 1 via the contact medium 13. That is, in the case of the configuration of the first embodiment, the buffer member 9 is disposed so as to block between the jet port 7 and the suction port 5 and reaches the lower side than the jet port 7. It is possible to prevent the liquid flow from moving from below to the barrel 2, and it is possible to reliably suppress and prevent the rising of the workpiece 1 in the barrel 2. As a result, the plating solution in the plating tank 4 is sufficiently agitated to prevent foreign matter from being deposited while preventing the so-called plating shortage defect that the plating film thickness is too thin or no plating film is formed at all. This makes it possible to perform good barrel plating.

なお、めっき液3を通過させない材料を用いて緩衝部材9を形成する場合には、バレル2内のめっき液3が更新されるように、めっき槽4内の、バレル1の浸漬されている領域と、他の領域とが、緩衝部材9により完全に仕切られてしまわないようにすることが必要である。   In addition, when forming the buffer member 9 using the material which does not allow the plating solution 3 to pass, the area | region where the barrel 1 is immersed in the plating tank 4 so that the plating solution 3 in the barrel 2 may be updated. It is necessary to prevent the other area from being completely partitioned by the buffer member 9.

図2は本願発明が関連する発明の実施例(実施例2)にかかるめっき装置を示す図であり、(a)は正面断面図、(b)は要部の平面図である。
このめっき装置においては、めっき液3を通過させるメッシュ材料を用いて形成した緩衝部材19を備えており、緩衝部材19は、垂直部19aと、水平部19bとを備えたL字状の構造を有している。
2A and 2B are diagrams showing a plating apparatus according to an embodiment (Example 2) of the invention to which the present invention relates, wherein FIG. 2A is a front sectional view, and FIG. 2B is a plan view of a main part.
The plating apparatus includes a buffer member 19 formed using a mesh material that allows the plating solution 3 to pass through. The buffer member 19 has an L-shaped structure including a vertical portion 19a and a horizontal portion 19b. Have.

なお、緩衝部材19を構成するメッシュ材料としては、例えば、線径0.05mm、開口0.12mm(150メッシュ)の絶縁性のメッシュなどが、好適な材料として用いられる。
この実施例2のめっき装置のその他の構成は、前述の実施例1のめっき装置と同じである。なお、この実施例2のめっき装置を示す図2(a)、(b)においては、陽極電極の図示を省略している。
In addition, as a mesh material which comprises the buffer member 19, for example, an insulating mesh having a wire diameter of 0.05 mm and an opening of 0.12 mm (150 mesh) is used as a suitable material.
Other configurations of the plating apparatus of the second embodiment are the same as those of the above-described plating apparatus of the first embodiment. In FIGS. 2A and 2B showing the plating apparatus of Example 2, the anode electrode is not shown.

この実施例2の場合のように、緩衝部材19としてメッシュ材料からなるものを用いるようにした場合にも、緩衝部材19が、噴出口7から噴出されるめっき液3の流動の影響により、バレル2内の被めっき物1が舞い上がることを抑制する機能を果たすため、バレル2内の被めっき物1が舞い上がって、接触媒体13を介しての、陰極電極11から被めっき物1への電流の供給が少なくなることを防止することが可能になる。その結果、めっき膜厚が薄すぎたり、全くめっき膜が形成されなかったりする、いわゆるめっき不足不良が発生することを防止しつつ、めっき槽内のめっき液を十分に撹拌して異物の堆積をなくし、良好なバレルめっきを行うことができる。   Even in the case of using a mesh material as the buffer member 19 as in the case of the second embodiment, the buffer member 19 is barreled by the influence of the flow of the plating solution 3 ejected from the ejection port 7. In order to perform the function of suppressing the object to be plated 1 in 2 from rising, the object to be plated 1 in the barrel 2 rises, and the current flowing from the cathode electrode 11 to the object 1 through the contact medium 13 is increased. It is possible to prevent the supply from being reduced. As a result, the plating solution in the plating tank is sufficiently agitated to prevent foreign matter from depositing while preventing the so-called plating shortage failure that the plating film thickness is too thin or no plating film is formed at all. And good barrel plating can be performed.

なお、この実施例2ではメッシュ材料を用いて形成した緩衝部材19を用いているが、例えば、パンチングメタルのような多数の貫通孔(小孔)を有する板状材料を用いた緩衝部材を備えた構成とした場合にも、この実施例2のめっき装置の場合と同様の作用効果を得ることができる。   In addition, in this Example 2, although the buffer member 19 formed using the mesh material is used, for example, a buffer member using a plate-like material having many through holes (small holes) such as punching metal is provided. Even in the case of the configuration described above, the same effects as those of the plating apparatus of Example 2 can be obtained.

また、緩衝部材に貫通孔を有する板状材料を用いる場合、めっき液の流動をバレルに伝えないようにするためには、緩衝部材の開孔率があまり高くならないようにすることが好ましい。このことは、メッシュ材料を用いる場合も同様である。   Moreover, when using the plate-shaped material which has a through-hole for a buffer member, in order not to transmit the flow of a plating solution to a barrel, it is preferable that the opening rate of a buffer member does not become so high. The same applies to the case of using a mesh material.

[めっき試験]
板状材料を用いて形成した緩衝部材9を備えた実施例1のめっき装置、メッシュ材料を用いて形成した緩衝部材19を備えた、本願発明が関連する発明の実施例2のめっき装置を用いて、幅W:0.3mm、長さL:0.6mm、厚みT:0.3mmの積層セラミックコンデンサを被めっき物1として、その外部電極の表面にNiめっきを施し、めっき不足不良の発生率を調べた。
[Plating test]
The plating apparatus of Example 1 provided with the buffer member 9 formed using a plate-shaped material, and the plating apparatus of Example 2 of the invention to which the present invention relates, including the buffer member 19 formed using a mesh material. Then, using a multilayer ceramic capacitor with a width W of 0.3 mm, a length L of 0.6 mm, and a thickness T of 0.3 mm as the object 1 to be plated, Ni plating is applied to the surface of the external electrode, resulting in insufficient plating failure. The rate was examined.

また、比較のため、緩衝部材を備えていないめっき装置(比較例)を用いて、同じ条件でめっきを行い、めっき不足不良の発生率を調べた。   For comparison, plating was performed under the same conditions using a plating apparatus (comparative example) that does not include a buffer member, and the occurrence rate of insufficient plating defects was examined.

実施例1,2、および、比較例のめっき装置を用いてめっきを行った場合のめっき不足不良の発生率を表1に示す。   Table 1 shows the incidence of insufficient plating defects when plating is performed using the plating apparatuses of Examples 1 and 2 and the comparative example.

Figure 0005092240
Figure 0005092240

表1に示すように、緩衝部材を備えていない比較例のめっき装置を用いた場合には、めっき不足不良発生率が多いときには100ppmにまで高くなることが確認された。   As shown in Table 1, it was confirmed that when a plating apparatus of a comparative example that does not include a buffer member was used, it increased to 100 ppm when the occurrence rate of insufficient plating defects was large.

一方、本願発明の実施例1および本願発明が関連する発明の実施例である、実施例2にかかるめっき装置を用いた場合、めっき不足不良の発生率が10ppm以下になることが確認された。 On the other hand, when the plating apparatus according to Example 2 which is Example 1 of the present invention and the invention to which the present invention relates is used, it was confirmed that the occurrence rate of insufficient plating failure is 10 ppm or less.

また、板状材料を用いて形成した緩衝部材9を備えた実施例1のめっき装置を用いた場合と、メッシュ材料を用いて形成した緩衝部材19を備えた実施例2のめっき装置を用いた場合とを比較すると、板状材料を用いて形成した緩衝部材9を備えた実施例1のめっき装置を用いた場合のほうが、めっき不足不良の発生率が低くなることが確認された。これは、板状材料を用いて形成した緩衝部材9がめっき液の流動を完全に遮断するのに対し、メッシュ材料を用いて形成した緩衝部材19がある程度のめっき液の通過を許すことに起因するものと考えられる。   Moreover, the case where the plating apparatus of Example 1 provided with the buffer member 9 formed using the plate-shaped material and the plating apparatus of Example 2 provided with the buffer member 19 formed using the mesh material were used. When compared with the case, it was confirmed that the incidence of insufficient plating defects was lower when the plating apparatus of Example 1 including the buffer member 9 formed using a plate-like material was used. This is because the buffer member 9 formed using the plate material completely blocks the flow of the plating solution, whereas the buffer member 19 formed using the mesh material allows a certain amount of the plating solution to pass. It is thought to do.

ただし、貫通孔を有する板状部材を用いた緩衝部材や、メッシュ状の緩衝部材などの、めっき液を流通させることが可能な材料からなる緩衝部材を用いる場合には、バレル全体を覆うように緩衝部材を配設することが可能になり、安定したバレルめっきを行うことが可能なめっき装置を構成することが可能になる。   However, when using a buffer member made of a material capable of circulating a plating solution, such as a buffer member using a plate-like member having a through hole or a mesh-like buffer member, the entire barrel should be covered. A buffer member can be provided, and a plating apparatus capable of performing stable barrel plating can be configured.

[変形例]
本願発明のめっき装置においては、緩衝部材の構造や構成材料などに関し、種々の応用、変形を加えることができる。
以下、本願発明のめっき装置の種々の変形例について説明する。
[Modification]
In the plating apparatus of the present invention, various applications and modifications can be made with respect to the structure and constituent materials of the buffer member.
Hereinafter, various modifications of the plating apparatus of the present invention will be described.

<変形例1>
図3は、本願発明の変形例1にかかるめっき装置の構成を示す図であり、(a)は正面断面図、(b)は要部の平面図である。
この変形例1のめっき装置においては、緩衝部材9として耐熱性塩化ビニル製で、貫通孔などのない板状材料が用いられている。
<Modification 1>
FIGS. 3A and 3B are diagrams showing a configuration of a plating apparatus according to Modification 1 of the present invention, in which FIG. 3A is a front sectional view and FIG. 3B is a plan view of a main part.
In the plating apparatus of Modification 1, a plate-like material made of heat-resistant vinyl chloride and having no through holes is used as the buffer member 9.

また、緩衝部材9は、垂直部9aと、水平部9bとを備えたL字状の構造を有しており、バレル2の下面に噴出口7から噴出しためっき液3が直接にあたらず、噴出口7と吸込口5の間が緩衝部材9により遮られるように配設されている。その他の構成は前述の実施例1のめっき装置と同様である。   Further, the buffer member 9 has an L-shaped structure including a vertical portion 9a and a horizontal portion 9b, and the plating solution 3 ejected from the ejection port 7 does not directly hit the lower surface of the barrel 2, It arrange | positions so that between the jet nozzle 7 and the suction inlet 5 may be interrupted | blocked by the buffer member 9. FIG. Other configurations are the same as those of the plating apparatus of the first embodiment.

このめっき装置においては、L字状の緩衝部材9が、噴出口7から噴出されるめっき液3の流動の影響により、バレル2内の被めっき物1が舞い上がることを抑制する機能を十分に果たすため、接触媒体13を介しての、陰極電極11から被めっき物1への電流の供給が少なくなることを防止することが可能になる。その結果、めっき膜厚が薄すぎたり、全くめっき膜が形成されなかったりする、いわゆるめっき不足不良が発生することを防止しつつ、めっき槽4内のめっき液3を十分に撹拌して異物の堆積をなくし、良好なバレルめっきを行うことができる。   In this plating apparatus, the L-shaped buffer member 9 sufficiently functions to suppress the object to be plated 1 in the barrel 2 from rising due to the influence of the flow of the plating solution 3 ejected from the ejection port 7. Therefore, it is possible to prevent the supply of current from the cathode electrode 11 to the workpiece 1 via the contact medium 13 from being reduced. As a result, the plating solution 3 in the plating tank 4 is sufficiently stirred to prevent the occurrence of foreign matters while preventing the so-called plating deficiency defect that the plating film thickness is too thin or no plating film is formed at all. Deposition is eliminated and good barrel plating can be performed.

<変形例2>
図4は、本願発明の変形例2にかかるめっき装置の構成を示す図であり、(a)は正面断面図、(b)は要部の平面図である。
この変形例2のめっき装置においては、緩衝部材9として耐熱性塩化ビニル製で、貫通孔などのない板状材料が用いられている。
<Modification 2>
4A and 4B are diagrams showing a configuration of a plating apparatus according to Modification 2 of the present invention, in which FIG. 4A is a front sectional view, and FIG. 4B is a plan view of a main part.
In the plating apparatus of Modification 2, a plate-like material made of heat-resistant vinyl chloride and having no through-holes is used as the buffer member 9.

緩衝部材9は、4つの側壁部9c,9d,9e,9fを備え、上面と下面が開口した平面形状が四角形の枠状で、平面視した場合にバレル2を取り囲むような構造を有しており、バレル2の下面に噴出口7から噴出しためっき液3が直接にあたらないように、噴出口7との位置関係を考慮して配設され、噴出口7と吸込口5の間が緩衝部材9により遮られるように構成されている。その他の構成は前述の実施例1のめっき装置と同様である。   The shock-absorbing member 9 includes four side walls 9c, 9d, 9e, and 9f, and has a structure that surrounds the barrel 2 when viewed from above in a plan view with a planar shape having an open top and bottom surface. In view of the positional relationship with the spout 7 so that the plating solution 3 spouted from the spout 7 does not directly hit the lower surface of the barrel 2, the space between the spout 7 and the suction port 5 is buffered. It is configured to be blocked by the member 9. Other configurations are the same as those of the plating apparatus of the first embodiment.

このめっき装置においても、枠状の緩衝部材9が、噴出口7から噴出されるめっき液3の流動の影響により、バレル2内の被めっき物1が舞い上がることを抑制する機能を十分に果たすため、接触媒体13を介しての、陰極電極11から被めっき物1への電流の供給が少なくなることを防止することが可能になる。その結果、めっき膜厚が薄すぎたり、全くめっき膜が形成されなかったりする、いわゆるめっき不足不良が発生することを防止しつつ、めっき槽内のめっき液を十分に撹拌して異物の堆積をなくし、良好なバレルめっきを行うことができる。   Also in this plating apparatus, the frame-shaped buffer member 9 sufficiently functions to suppress the plating object 1 in the barrel 2 from rising due to the influence of the flow of the plating solution 3 ejected from the ejection port 7. It is possible to prevent the supply of current from the cathode electrode 11 to the workpiece 1 through the contact medium 13 from being reduced. As a result, the plating solution in the plating tank is sufficiently agitated to prevent foreign matter from depositing while preventing the so-called plating shortage failure that the plating film thickness is too thin or no plating film is formed at all. And good barrel plating can be performed.

<変形例3>
図5は、本願発明の変形例3にかかるめっき装置の構成を示す図であり、(a)は正面断面図、(b)は要部の平面図である。
この変形例3のめっき装置においては、緩衝部材9として耐熱性塩化ビニル製で、貫通孔などのない板状材料が用いられている。
<Modification 3>
5A and 5B are diagrams showing a configuration of a plating apparatus according to Modification 3 of the present invention, in which FIG. 5A is a front cross-sectional view, and FIG. 5B is a plan view of a main part.
In the plating apparatus of Modification 3, a plate-like material made of heat-resistant vinyl chloride and having no through-holes is used as the buffer member 9.

また、この緩衝部材9は、略垂直の一対の両側壁部9g,9h、中央が谷折りの折り曲げ部となるように鈍角に折り曲げられた形状を有する底部9iを備えた船底形の構造を有しており、バレル2の下面に噴出口7から噴出しためっき液が直接にあたらないように、噴出口7との位置関係を考慮して配設され、噴出口7と吸込口5の間が緩衝部材9により遮られるように構成されている。その他の構成は前述の実施例1のめっき装置と同様である。   Further, the buffer member 9 has a bottom-like structure including a pair of substantially vertical side wall portions 9g and 9h and a bottom portion 9i that is bent at an obtuse angle so that the center is a valley-folded bent portion. It is arranged in consideration of the positional relationship with the spout 7 so that the plating solution spouted from the spout 7 does not directly hit the lower surface of the barrel 2, and the space between the spout 7 and the suction opening 5 is It is configured to be blocked by the buffer member 9. Other configurations are the same as those of the plating apparatus of the first embodiment.

このめっき装置においても、中央が谷折りの折り曲げ部となるように鈍角に折り曲げられた形状の緩衝部材9が、噴出口7から噴出されるめっき液3の流動の影響により、バレル2内の被めっき物1が舞い上がることを抑制する機能を十分に果たすため、接触媒体13を介しての、陰極電極11から被めっき物1への電流の供給が少なくなることを防止することが可能になる。その結果、めっき膜厚が薄すぎたり、全くめっき膜が形成されなかったりする、いわゆるめっき不足不良が発生することを防止しつつ、めっき槽内のめっき液を十分に撹拌して異物の堆積をなくし、良好なバレルめっきを行うことができる。   Also in this plating apparatus, the buffer member 9 having a shape that is bent at an obtuse angle so that the center is a bent portion of the valley fold is applied to the inside of the barrel 2 due to the influence of the flow of the plating solution 3 ejected from the ejection port 7. In order to sufficiently perform the function of suppressing the plating object 1 from flying up, it is possible to prevent the supply of current from the cathode electrode 11 to the object to be plated 1 via the contact medium 13 from being reduced. As a result, the plating solution in the plating tank is sufficiently agitated to prevent foreign matter from depositing while preventing the so-called plating shortage failure that the plating film thickness is too thin or no plating film is formed at all. And good barrel plating can be performed.

<変形例4>
図6は、本願発明が関連する発明の変形例4めっき装置の構成を示す図であり、(a)は正面断面図、(b)は要部の平面図である。
この変形例4のめっき装置においては、ポリエチレン製のメッシュ材料を用いて形成した緩衝部材19が用いられている。
<Modification 4>
6A and 6B are diagrams showing a configuration of a plating apparatus according to Modification 4 of the invention to which the present invention relates, wherein FIG. 6A is a front sectional view, and FIG. 6B is a plan view of the main part.
In the plating apparatus of Modification 4, a buffer member 19 formed using a polyethylene mesh material is used.

また、緩衝部材19は、上面のみが開放面となった直方体形状を有する箱状の構造を有しており、バレル2が箱状の緩衝部材19に収容されるような態様、すなわち、バレル2の上面側を除いた部分が緩衝部材19により覆われるような態様で配設されており、バレル2の下面側に噴出口7から噴出しためっき液3が直接にあたらないように構成されている。   Further, the buffer member 19 has a box-like structure having a rectangular parallelepiped shape in which only the upper surface is an open surface, and the barrel 2 is accommodated in the box-shaped buffer member 19, that is, the barrel 2. The portion excluding the upper surface side is disposed so as to be covered with the buffer member 19, and the plating solution 3 ejected from the ejection port 7 does not directly hit the lower surface side of the barrel 2. .

なお、この変形例4のめっき装置においては、緩衝部材19として、めっき液3を通過させるメッシュ材料が用いられているので、緩衝部材19を、バレル2の全体を覆うような構成とした場合にも、箱状の緩衝部材19の内部のバレル周囲のめっき液3が、箱状の緩衝部材19の外側のめっき液3と入れ替わるため、めっきに支障をきたすことはない。
その他の構成は前述の実施例1のめっき装置と同様である。
In addition, in the plating apparatus of this modification 4, since the mesh material which allows the plating solution 3 to pass through is used as the buffer member 19, the buffer member 19 is configured so as to cover the entire barrel 2. However, since the plating solution 3 around the barrel inside the box-shaped buffer member 19 is replaced with the plating solution 3 outside the box-shaped buffer member 19, the plating is not hindered.
Other configurations are the same as those of the plating apparatus of the first embodiment.

この変形例4の構成の場合にも、箱状の緩衝部材19が、噴出口7から噴出されるめっき液3の流動の影響により、バレル2内の被めっき物1が舞い上がることを抑制する機能を十分に果たすため、接触媒体13を介しての、陰極電極11から被めっき物1への電流の供給が少なくなることを防止することが可能になる。その結果、めっき膜厚が薄すぎたり、全くめっき膜が形成されなかったりする、いわゆるめっき不足不良が発生することを防止しつつ、めっき槽内のめっき液を十分に撹拌して異物の堆積をなくし、良好なバレルめっきを行うことができる。   Also in the case of the configuration of the modified example 4, the box-shaped buffer member 19 has a function of suppressing the plating object 1 in the barrel 2 from rising due to the influence of the flow of the plating solution 3 ejected from the ejection port 7. Therefore, it is possible to prevent the supply of current from the cathode electrode 11 to the workpiece 1 through the contact medium 13 from being reduced. As a result, the plating solution in the plating tank is sufficiently agitated to prevent foreign matter from depositing while preventing the so-called plating shortage failure that the plating film thickness is too thin or no plating film is formed at all. And good barrel plating can be performed.

なお、本願発明は上記の各実施例、変形例に限定されるものではなく、バレルの具体的な形状や構成、バレルが備える陰極電極の配設態様、めっき槽の具体的な構造、吸込口、噴出口、循環ラインを備えためっき液の循環手段の具体的な構成、めっき液の種類や組成、被めっき物の種類などに関し、発明の範囲内において、種々の応用、変形を加えることが可能である。   The invention of the present application is not limited to the above-described embodiments and modifications, but the specific shape and configuration of the barrel, the arrangement of the cathode electrode provided in the barrel, the specific structure of the plating tank, and the suction port In the scope of the invention, various applications and modifications may be made within the scope of the invention regarding the specific configuration of the plating solution circulation means provided with the spout, the circulation line, the type and composition of the plating solution, the type of the object to be plated, etc. Is possible.

上述のように、本願発明によれば、めっき膜厚が薄すぎたり、全くめっき膜が形成されなかったりする、いわゆるめっき不足不良が発生することを防止しつつ、めっき槽内のめっき液を十分に撹拌して異物の堆積をなくし、良好なバレルめっきを行うことが可能になる。
したがって、本願発明は、めっきを施すことが必要な外部電極などを備えた、例えば、積層セラミックコンデンサなどの電子部品の製造技術の分野などに広く適用することが可能である。
As described above, according to the present invention, the plating solution in the plating tank is sufficiently removed while preventing the so-called plating shortage failure that the plating film thickness is too thin or no plating film is formed at all. It is possible to perform good barrel plating by eliminating the accumulation of foreign matters by stirring.
Therefore, the present invention can be widely applied to the field of manufacturing technology of electronic parts such as a multilayer ceramic capacitor provided with an external electrode that needs to be plated.

本願発明の一実施例(実施例1)にかかるめっき装置の構成を示す図であり、(a)は正面断面図、(b)は側面断面図である。It is a figure which shows the structure of the plating apparatus concerning one Example (Example 1) of this invention, (a) is front sectional drawing, (b) is side sectional drawing. 本願発明が関連する発明の実施例(実施例2)にかかるめっき装置の構成を示す図であり、(a)は正面断面図、(b)は要部の平面図である。It is a figure which shows the structure of the plating apparatus concerning the Example (Example 2) of the invention with which this invention relates, (a) is front sectional drawing, (b) is a top view of the principal part. 本願発明の変形例1にかかるめっき装置を示す図であり、(a)は正面断面図、(b)は要部の平面図である。It is a figure which shows the plating apparatus concerning the modification 1 of this invention, (a) is front sectional drawing, (b) is a top view of the principal part. 本願発明の変形例2にかかるめっき装置の構成を示す図であり、(a)は正面断面図、(b)は要部の平面図である。It is a figure which shows the structure of the plating apparatus concerning the modification 2 of this invention, (a) is front sectional drawing, (b) is a top view of the principal part. 本願発明の変形例3にかかるめっき装置の構成を示す図であり、(a)は正面断面図、(b)は要部の平面図である。It is a figure which shows the structure of the plating apparatus concerning the modification 3 of this invention, (a) is front sectional drawing, (b) is a top view of the principal part. 本願発明が関連する発明にかかる変形例4めっき装置の構成を示す図であり、(a)は正面断面図、(b)は要部の平面図である。It is a figure which shows the structure of the plating apparatus of the modification 4 concerning the invention with which this invention relates, (a) is front sectional drawing, (b) is a top view of the principal part. 従来の、電子部品にめっきを施す場合に用いられる、バレルめっき装置の構成の一例を示す図である。It is a figure which shows an example of a structure of the conventional barrel plating apparatus used when plating an electronic component. 従来の、めっき装置の他の例を示す図である。It is a figure which shows the other example of the conventional plating apparatus. 従来のめっき装置において、めっき液流入口からめっき槽内に流入するめっき液の流れによりバレル内で被めっき物が舞い上がる状態を模式的に示す図である。In the conventional plating apparatus, it is a figure which shows typically the state which a to-be-plated object soars in a barrel with the flow of the plating solution which flows in into a plating tank from a plating solution inflow port.

1 被めっき物
2 バレル
2a 周壁部
2b 端面
3 めっき液
4 めっき槽
4a、4b めっき槽の側面
5 吸込口
6 循環ライン
7 噴出口
8 循環手段
9 緩衝部材
9a 垂直部
9b 水平部
9c、9d、9e、9f 側壁部
9g、9h 一対の両側壁部
9i 底部
10 陰極線
11 陰極電極
12 陽極電極
13 接触媒体
14 濾過手段
19 緩衝部材
19a 垂直部
19b 水平部
DESCRIPTION OF SYMBOLS 1 To-be-plated object 2 Barrel 2a Perimeter wall part 2b End surface 3 Plating liquid 4 Plating tank 4a, 4b Side surface of a plating tank 5 Suction port 6 Circulation line 7 Spout 8 Circulation means 9 Buffer member 9a Vertical part 9b Horizontal part 9c, 9d, 9e 9f Side wall portion 9g, 9h A pair of side wall portions 9i Bottom portion 10 Cathode line 11 Cathode electrode 12 Anode electrode 13 Contact medium 14 Filtering means 19 Buffer member 19a Vertical portion 19b Horizontal portion

Claims (2)

筒状で回転可能に構成され、被めっき物に給電するための陰極電極を備え、かつ、周壁部の少なくとも一部が、被めっき物を通過させることなくめっき液を通過させる材料から形成されたバレルと、
前記バレル内に収容された被めっき物をめっきする際に、前記バレルが浸漬されるめっき液を収容するめっき槽と、
前記バレルの外側に位置し、前記めっき槽内のめっき液を吸い込む吸込口と、前記バレルの外側に位置し、前記吸込口から吸い込んだめっき液を、循環ラインを経て、前記めっき槽に噴出する噴出口とを備えた、前記めっき槽内のめっき液を循環するための循環手段と、
めっき液を通過させない板状材料を用いて形成され、前記めっき槽内の、噴出口とバレルとの間の領域に、少なくとも一部が前記噴出口と対向するように配設され、前記噴出口から噴出されるめっき液の流動が、前記バレル内の被めっき物の動きに影響を与えることを防止するための緩衝部材と
を具備することを特徴とするめっき装置。
The tube is configured to be rotatable and includes a cathode electrode for supplying power to the object to be plated, and at least a part of the peripheral wall portion is made of a material that allows the plating solution to pass through without passing the object to be plated. Barrel,
When plating an object to be plated accommodated in the barrel, a plating tank for accommodating a plating solution in which the barrel is immersed,
A suction port that is located outside the barrel and sucks the plating solution in the plating tank, and a plating solution that is located outside the barrel and sucked from the suction port is jetted to the plating tank through a circulation line. A circulation means for circulating the plating solution in the plating tank,
It is formed using a plate-like material that does not allow the plating solution to pass, and is disposed in a region between the jet port and the barrel in the plating tank so that at least a part thereof faces the jet port. And a buffer member for preventing the flow of the plating solution ejected from the above from affecting the movement of the object to be plated in the barrel.
前記緩衝部材が、平面視した場合に前記バレルを取り囲むような態様で配設されていることを特徴とする請求項1記載のめっき装置。 The plating apparatus according to claim 1, wherein the buffer member is disposed in such a manner as to surround the barrel when viewed in plan .
JP2006001881A 2006-01-06 2006-01-06 Plating equipment Active JP5092240B2 (en)

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