JP2003221698A - Plating apparatus - Google Patents

Plating apparatus

Info

Publication number
JP2003221698A
JP2003221698A JP2002020193A JP2002020193A JP2003221698A JP 2003221698 A JP2003221698 A JP 2003221698A JP 2002020193 A JP2002020193 A JP 2002020193A JP 2002020193 A JP2002020193 A JP 2002020193A JP 2003221698 A JP2003221698 A JP 2003221698A
Authority
JP
Japan
Prior art keywords
plating
tank
inlet
plating solution
partition plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002020193A
Other languages
Japanese (ja)
Inventor
Hiroshi Kuroki
洋志 黒木
Yasushi Uehara
康 上原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2002020193A priority Critical patent/JP2003221698A/en
Publication of JP2003221698A publication Critical patent/JP2003221698A/en
Pending legal-status Critical Current

Links

Abstract

<P>PROBLEM TO BE SOLVED: To transfer a plating solution to a filter located outside a plating tank through a flow of the plating solution without retaining the plating solution at the bottom of the plating tank and depositing foreign matters, and to prevent the foreign matters at the bottom of the plating tank from diffusing and being raised by liquid flow to the proximity of an object to be plated. <P>SOLUTION: The plating tank has a divider having penetrating holes for dividing the upper and lower tank parts, a first plating solution inlet established on the lower tank part of a side wall of the plating tank, a second plating solution inlet established on the upper tank part of the side wall with the first inlet and a plating solution outlet at the lower tank part of a side wall that faces the side wall with the first and the second inlets. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、めっき装置、特に
半導体装置の製造工程に用いるめっき装置に関するもの
である。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plating apparatus, and more particularly to a plating apparatus used in a semiconductor device manufacturing process.

【0002】[0002]

【従来の技術】一般に、めっき装置は、被めっき物に均
一な厚さのめっき層を形成するため、めっき液の攪拌機
構が設けられている。例えば、特開2000−2568
91号公報には、攪拌機構として、めっき槽内に設けら
れた攪拌プロペラファンあるいはめっき槽外に設けたポ
ンプによるめっき液の循環機構が記載されている。それ
と、半導体装置の製造工程では、めっき処理は、半導体
装置の電極の形成や配線パターンの形成等に用いられて
おり、形成するめっき膜は、薄く均一であり、そして微
細であるので、めっき膜中に異物が混入すると半導体装
置の不良の原因となる。しかし、上記のようにめっき液
は攪拌されるので、めっき液中に発生する異物は、被め
っき物と接触し、めっき膜中に混入する恐れがあり、半
導体装置の製造工程で用いるめっき装置は、めっき槽内
部に発生するめっき液中の異物を除去する手段が不可欠
である。特開2000−256891号公報には、異物
を除去する手段として、めっき液の循環路中にろ過機を
設けることが記載されている。
2. Description of the Related Art Generally, a plating apparatus is provided with a plating solution stirring mechanism in order to form a plating layer having a uniform thickness on an object to be plated. For example, Japanese Patent Laid-Open No. 2000-2568
As a stirring mechanism, Japanese Patent Publication No. 91 describes a circulation mechanism of a plating solution by a stirring propeller fan provided inside the plating tank or a pump provided outside the plating tank. In addition, in the manufacturing process of a semiconductor device, the plating process is used for forming electrodes and wiring patterns of the semiconductor device, and the plating film to be formed is thin, uniform, and fine. When foreign matter is mixed in, it causes a defect in the semiconductor device. However, since the plating solution is agitated as described above, foreign matter generated in the plating solution may come into contact with the object to be plated and mix into the plating film. A means for removing foreign matters in the plating solution generated inside the plating tank is indispensable. Japanese Unexamined Patent Application Publication No. 2000-256891 describes that a filter is provided in the circulation path of the plating solution as a means for removing foreign matter.

【0003】[0003]

【発明が解決しようとする課題】一般に、めっき液中に
発生する異物は、めっき槽の底部に堆積し、これが、め
っき液の攪拌により浮遊し、被めっき物の表面に付着す
る。すなわち、特開2000−256891号公報に記
載の循環型のめっき装置では、めっき槽の底部に堆積し
た異物は、めっき槽に設けられためっき液供給パイプの
開口から、めっき液を回収するめっき槽底部の開口への
液流により、めっき槽外のろ過機まで運ばれて除かれ
る。しかし、異物の一部は、めっき槽内のめっき液中に
拡散し、被めっき物の表面に付着して、めっき不良の原
因となるという問題があった。特に、めっき槽の、側壁
と底部とが接合する部分の近傍は、めっき液が滞留して
おり、異物が堆積しやすく、異物の堆積量が多くなる
と、めっき液中に拡散したり巻き上げられる異物も多く
なり、被めっき物表面の異物付着によるめっき不良が多
くなるという問題があった。
In general, foreign matter generated in the plating solution is deposited on the bottom of the plating bath, which floats when the plating solution is stirred and adheres to the surface of the object to be plated. That is, in the circulation type plating apparatus described in Japanese Patent Application Laid-Open No. 2000-256891, the foreign matter deposited on the bottom of the plating tank collects the plating solution from the opening of the plating solution supply pipe provided in the plating tank. The liquid flow to the opening at the bottom is carried to the filter outside the plating tank and removed. However, there is a problem in that some of the foreign substances diffuse into the plating solution in the plating tank and adhere to the surface of the object to be plated, causing plating failure. Particularly, in the vicinity of the part where the side wall and the bottom part are joined in the plating tank, the plating solution is retained, and the foreign matter is likely to be accumulated. When the accumulated amount of the foreign matter is large, the foreign matter diffuses into the plating solution or is wound up. However, there has been a problem that plating defects due to adhesion of foreign matter on the surface of the object to be plated increase.

【0004】本発明は、上記のような、従来のめっき槽
の課題を解決するためになされたものであり、めっき槽
底部にめっき液が滞留する部分をなくし、めっき槽底部
に集まる異物を堆積させることなく、めっき液流により
めっき槽外のろ過機まで異物を移送することができると
ともに、また、めっき槽底部に集まった異物が、被めっ
き物の近傍まで、拡散したり、液流により巻き上げられ
たりすることを防止できるめっき装置を提供することで
ある。
The present invention has been made in order to solve the problems of the conventional plating bath as described above, and eliminates the portion where the plating solution stays at the bottom of the plating bath and accumulates the foreign substances that collect at the bottom of the plating bath. The foreign matter can be transferred to the filter outside the plating tank without causing the foreign matter to collect, and the foreign matter collected at the bottom of the plating tank diffuses to the vicinity of the object to be plated or is wound up by the liquid flow. It is an object of the present invention to provide a plating apparatus that can prevent the occurrence of damage.

【0005】[0005]

【課題を解決するための手段】本発明に係わる第1のめ
っき装置は、めっき槽と、このめっき槽を上槽部と下槽
部とに分割するとともに貫通孔を備えた仕切板と、上記
めっき槽の側壁の上記仕切板より下側の部分に設けられ
ためっき液の第1の流入口と、この第1の流入口を備え
た上記側壁の上記仕切板より上側の部分に設けられため
っき液の第2の流入口と、上記めっき槽の、上記第1の
流入口と上記第2の流入口とを備えた側壁に対向する側
壁の上記仕切板より下側の部分に設けられためっき液の
排出口と、この排出口に流路により吸入口が接続されて
いる液流ポンプと、この液流ポンプの噴出口に流路によ
り液の取入口が接続されているろ過装置と、このろ過装
置の液の取出口と上記第1の流入口とを接続する流路中
に設けられた第1の流速制御機構と、上記ろ過装置の液
の取出口と上記第2の流入口とを接続する流路中に設け
られた第2の流速制御機構とからなるものである。
A first plating apparatus according to the present invention comprises a plating tank, a partition plate which divides the plating tank into an upper tank portion and a lower tank portion, and which has a through hole, A first inlet of the plating solution is provided in a portion of the side wall of the plating tank below the partition plate, and a portion of the side wall having the first inlet is provided above the partition plate. A second inlet of the plating solution and a portion of a side wall of the plating tank opposite to the side wall provided with the first inlet and the second inlet are provided below the partition plate. An outlet for the plating solution, a liquid flow pump having a suction port connected to this discharge port by a flow path, and a filtration device having a liquid intake port connected to the jet port of this liquid flow pump by a flow path, A first provided in a flow path connecting a liquid outlet of the filtering device and the first inlet. A flow rate control mechanism is made of a second flow rate control mechanism provided in the channel that connects the outlet and the second inlet of the liquid of the filtration device.

【0006】本発明に係わる第2のめっき装置は、第1
のめっき装置において、めっき槽の下槽部におけるめっ
き液の流速を、上記めっき槽の上槽部におけるめっき液
の流速より大きくなるように、第1の流速制御機構と第
2の流速制御機構とが設定されているものである。
The second plating apparatus according to the present invention is the first plating apparatus.
In the plating apparatus, the first flow rate control mechanism and the second flow rate control mechanism are provided so that the flow rate of the plating solution in the lower tank section of the plating tank is higher than the flow rate of the plating solution in the upper tank section of the plating tank. Is set.

【0007】本発明に係わる第3のめっき装置は、めっ
き槽と、このめっき槽を上槽部と下槽部とに分割すると
ともに貫通孔を備えた仕切板と、上記めっき槽の側壁の
上記仕切板より下側の部分に設けられためっき液の第1
の流入口と、この第1の流入口を備えた上記側壁の上記
仕切板より上側の部分に設けられためっき液の第2の流
入口と、上記めっき槽の、上記第1の流入口と上記第2
の流入口とを備えた側壁に対向する側壁の上記仕切板よ
り下側の部分に設けられためっき液の排出口と、この排
出口に流路により吸入口が接続されている液流ポンプ
と、この液流ポンプの噴出口に流路により液の取入口が
接続されている第1のろ過装置と、この第1のろ過装置
における液の取出口と上記第1の流入口とを接続する流
路と、上記第1のろ過装置における液の取出口と上記第
2の流入口とを接続する流路中に設けられた上記第1の
ろ過装置のフィルタより細かいフィルタを有する第2の
ろ過装置とからなるものである。
A third plating apparatus according to the present invention comprises a plating tank, a partition plate which divides the plating tank into an upper tank portion and a lower tank portion and which is provided with through holes, and the side wall of the plating tank. The first plating solution provided in the part below the partition plate
Inlet, a second inlet of the plating solution provided in a portion of the side wall provided with the first inlet above the partition plate, and the first inlet of the plating tank. Second above
A discharge port of the plating solution provided in a portion of the side wall opposite to the side wall provided with the flow inlet of the partition plate, and a liquid flow pump having a suction port connected to the discharge port by a flow path. , A first filtration device having a liquid intake port connected to a jet port of the liquid flow pump by a flow path, and connecting the liquid intake port of the first filtration device to the first inflow port Second filtration having a finer filter than the filter of the first filtration device provided in the flow channel, which connects the liquid outlet and the second inflow port of the first filtration device. It consists of a device.

【0008】本発明に係わる第4のめっき装置は、第1
ないし3のいずれかのめっき装置において、仕切板を設
ける位置が、めっき槽の底から第1の流入口及び排出口
を設けることができる高さ以上であり、めっき液の液面
からめっき槽の底までの深さをdとした場合、めっき槽
の底から(1/3)dの高さ以下のものである。
The fourth plating apparatus according to the present invention is the first plating apparatus.
In the plating apparatus according to any one of 1 to 3, the position where the partition plate is provided is higher than the height at which the first inlet and the discharge port can be provided from the bottom of the plating tank, When the depth to the bottom is d, the height is not more than (1/3) d from the bottom of the plating tank.

【0009】本発明に係わる第5のめっき装置は、第1
ないし4のいずれかのめっき装置において、仕切板の貫
通孔が、めっき槽の第1及び第2の流入口を備えた側壁
に近い側ほど、多いものである。
The fifth plating apparatus according to the present invention is the first
In any of the plating apparatuses of Nos. 4 to 4, the number of through holes of the partition plate is larger on the side closer to the side wall of the plating tank having the first and second inlets.

【0010】本発明に係わる第6のめっき装置は、第1
ないし5のいずれかのめっき装置において、仕切板にお
ける貫通孔部の下槽部側の面に、排出口を備えた側壁側
に80度以下の角度で傾斜させてパイプを取り付けたも
のである。
The sixth plating apparatus according to the present invention is the first
In the plating apparatus of any one of 1 to 5, a pipe is attached to the surface of the partition plate on the side of the lower tank portion of the through-hole, which is inclined at an angle of 80 degrees or less toward the side wall having the outlet.

【0011】[0011]

【発明の実施の形態】実施の形態1.図1は、実施の形
態1におけるめっき装置の構成を示す模式図である。図
1において、1はめっき槽、2は仕切板、3は仕切板の
貫通孔、4は第1の流入口、5は第2の流入口、6は排
出口、7,7a,7bは流路、8は液流ポンプ、9はろ
過装置、10は第1の流速制御機構、11は第2の流速
制御機構、20はめっき液、21は異物、22は被めっ
き物、30はめっき装置である。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiment 1. FIG. 1 is a schematic diagram showing the configuration of the plating apparatus according to the first embodiment. In FIG. 1, 1 is a plating tank, 2 is a partition plate, 3 is a through hole of the partition plate, 4 is a first inflow port, 5 is a second inflow port, 6 is a discharge port, and 7 7a and 7b are flows. A passage, 8 is a liquid flow pump, 9 is a filtration device, 10 is a first flow velocity control mechanism, 11 is a second flow velocity control mechanism, 20 is a plating solution, 21 is a foreign substance, 22 is an object to be plated, and 30 is a plating device. Is.

【0012】本実施の形態のめっき装置30は、めっき
槽1の底部とほぼ平行に仕切板2を備えており、めっき
槽1が上槽部と下槽部に分割されている。仕切板2には
貫通孔3が設けられており、めっき槽1の上槽部と下槽
部とのめっき液20は連通している。めっき槽1の下槽
部の側壁には、第1の流入口4が設けられ、上記第1の
流入口4が設けられた側壁の上槽部には、第2の流入口
5が設けられている。また、めっき槽1の、第1流入口
4と第2の流入口5とが設けられた側壁に対向する側壁
の下槽部には排出口6が設けられている。
The plating apparatus 30 of the present embodiment is provided with a partition plate 2 substantially parallel to the bottom of the plating tank 1, and the plating tank 1 is divided into an upper tank portion and a lower tank portion. The partition plate 2 is provided with a through hole 3 so that the plating solution 20 in the upper tank portion and the lower tank portion of the plating tank 1 communicates with each other. A first inflow port 4 is provided on the side wall of the lower bath part of the plating bath 1, and a second inflow port 5 is provided on the upper bath part of the side wall on which the first inflow port 4 is provided. ing. Further, a discharge port 6 is provided in a lower tank portion of a side wall of the plating tank 1, which is opposed to a side wall provided with the first inlet 4 and the second inlet 5.

【0013】めっき槽1の排出口6は、流路7により液
流ポンプ8の吸入口と接続されている。液流ポンプ8の
噴出口は、流路7によりろ過装置9の液の取入口に接続
されている。ろ過装置9の液の取出口に接続された流路
7は、2つに分岐しており、分岐した一方の流路7aは
第1の流速制御機構10に接続されており、分岐した他
方の流路7bは第2の流速制御機構11に接続されてい
る。第1の流速制御機構10の流出口は、流路7aによ
りめっき槽1の第1流入口4に接続されており、第2の
流速制御機構11の流出口は、流路7bによりめっき槽
1の第2流入口5に接続されている。被めっき物22は
めっき槽1の上槽部のめっき液20中に置かれている。
A discharge port 6 of the plating tank 1 is connected to a suction port of a liquid flow pump 8 by a flow path 7. The jet outlet of the liquid flow pump 8 is connected to the liquid intake of the filtering device 9 by the flow path 7. The flow path 7 connected to the liquid outlet of the filtering device 9 is branched into two, one branched flow path 7a is connected to the first flow velocity control mechanism 10, and the other branched flow path 7a is connected. The flow path 7b is connected to the second flow velocity control mechanism 11. The outlet of the first flow velocity control mechanism 10 is connected to the first inlet 4 of the plating tank 1 by the flow passage 7a, and the outlet of the second flow velocity control mechanism 11 is connected by the flow passage 7b. Is connected to the second inflow port 5. The object 22 to be plated is placed in the plating solution 20 in the upper tank portion of the plating tank 1.

【0014】次に、本実施の形態において、めっき槽1
の底部に異物21が堆積するのを防ぐとともに、異物2
1をめっき槽1の外にあるろ過装置9まで運んで取り除
き、被めっき物22の近傍まで異物21が拡散したり巻
き上げられたりして、被めっき物22がめっき不良にな
るのを防止する機構を説明する。
Next, in the present embodiment, the plating tank 1
Foreign matter 21 is prevented from accumulating on the bottom of the
A mechanism for preventing the object 22 from becoming defective in plating due to the foreign material 21 being diffused or rolled up to the vicinity of the object 22 to be plated, by carrying 1 to the filtering device 9 outside the plating tank 1 and removing it. Will be explained.

【0015】まず、液流ポンプ8により吐出圧力が加え
られためっき液20を、第1の流速制御機構10で第1
の流速に制御して第1の流入口4からめっき槽1の下槽
部に流入させ、第2の流速制御機構11で第2の流速に
制御して第2の流入口5からめっき槽1の上槽部に流入
させる。この時、第1の流速制御機構10及び第2の流
速制御機構11により、下槽部におけるめっき液の流速
が、上槽部におけるめっき液の流速より大きくなるよう
に設定されている。そして、第1の流入口4と第2の流
入口5とが設けられた側壁と対向する側壁の下槽部のみ
に設けられた排出口6から、めっき液20が排出する。
First, the plating solution 20 to which the discharge pressure has been applied by the liquid flow pump 8 is first subjected to the first flow rate control mechanism 10.
Flow rate is controlled to flow from the first inlet 4 into the lower bath of the plating tank 1, and the second flow velocity control mechanism 11 controls the second flow rate to control the second flow rate from the second inlet 5 to the plating tank 1. Pour into the upper tank part. At this time, the first flow velocity control mechanism 10 and the second flow velocity control mechanism 11 are set so that the flow velocity of the plating solution in the lower bath part is higher than the flow velocity of the plating liquid in the upper bath part. Then, the plating solution 20 is discharged from the discharge port 6 provided only in the lower tank portion of the side wall opposite to the side wall provided with the first inflow port 4 and the second inflow port 5.

【0016】すなわち、上槽部にあるめっき液20は仕
切板2の貫通孔3を通過して、下槽部に流れ、排出口6
から排出されるので、めっき液20とともに下槽部に移
送された異物21は被めっき物22がある上槽部に戻る
ことはない。そして、下槽部では、第1の流入口4から
のめっき液20が、直接、排出口6から排出されるの
で、めっき槽1の底部に異物21を堆積させることな
く、異物21をめっき液20とともにめっき槽1の外に
排出できる。それと、下槽部でのめっき液の流速が、上
槽部でのめっき液の流速より大きく設定されているの
で、粘性流の作用により、流速の小さい上槽部から流速
の大きい下槽部へめっき液20が流動する力が働くの
で、第2の流入口5の近くにある異物21も、被めっき
物22と接触する前に、下槽部へ移送され、めっき液2
0とともにめっき槽1の外に排出できる。特に、下槽部
におけるめっき液の流速を、上槽部におけるめっき液の
流速の2倍以上にすると、異物21が被めっき物22に
接触する前に、下槽部へ移送させる効果がさらに顕著に
なる。
That is, the plating solution 20 in the upper tank portion passes through the through hole 3 of the partition plate 2, flows into the lower tank portion, and the discharge port 6
Therefore, the foreign matter 21 transferred to the lower tank portion together with the plating solution 20 does not return to the upper tank portion where the object 22 is to be plated. Then, in the lower tank portion, the plating solution 20 from the first inlet 4 is directly discharged from the discharge port 6, so that the foreign matter 21 is deposited on the bottom of the plating tank 1 without depositing the foreign matter 21. It can be discharged together with 20 to the outside of the plating tank 1. Also, since the flow rate of the plating solution in the lower tank is set to be higher than the flow rate of the plating solution in the upper tank, viscous flow causes the flow from the upper tank with a low flow rate to the lower tank with a high flow rate. Since the force causing the plating solution 20 to flow acts, the foreign matter 21 near the second inflow port 5 is also transferred to the lower tank portion before coming into contact with the object 22 to be plated, and the plating solution 2
It can be discharged to the outside of the plating tank 1 together with 0. In particular, when the flow rate of the plating solution in the lower tank section is twice or more the flow rate of the plating solution in the upper tank section, the effect of transferring the foreign matter 21 to the lower tank section before contacting the object 22 to be plated is more remarkable. become.

【0017】本実施の形態では、仕切板2は、めっき装
置30で設定されている通常に使用するめっき液量にお
ける液面からめっき槽1の底までの深さをdとすると、
めっき槽1の底面から(1/2)d未満の高さの位置に
設けられる。仕切板2を設ける位置が、底面から(1/
2)d未満であるので、第1の流入口4から流入するめ
っき液の流速を第2の流入口5から流入するめっき液の
流速より大きくすると、下槽部におけるめっき液の流速
が上槽部におけるめっき液の流速より必ず大きくなり、
上槽部から下槽部へめっき液20が流動する力が働き、
異物21を下槽部へ移送できる。
In the present embodiment, when the partition plate 2 has a depth d from the liquid surface to the bottom of the plating tank 1 in the amount of plating liquid normally used in the plating apparatus 30,
It is provided at a position lower than (1/2) d from the bottom surface of the plating tank 1. The position where the partition plate 2 is provided is (1 /
2) Since it is less than d, when the flow rate of the plating solution flowing in from the first inlet 4 is made higher than the flow rate of the plating solution flowing in from the second inlet 5, the flow rate of the plating solution in the lower tank portion becomes The flow rate of the plating solution in the
The force of the plating solution 20 flowing from the upper tank to the lower tank works,
The foreign material 21 can be transferred to the lower tank part.

【0018】貫通孔3は、仕切板2に複数個設けられ、
その形状は、例えば直径が3〜10mmの円形である。
そして、仕切板2における複数の貫通孔3が占める面積
の比率は、20〜60%であり、好ましくは30〜50
%である。貫通孔3の直径が3mm未満であると、めっ
き槽1の上槽部から下槽部へのめっき液20の流動に対
して抵抗が大きくなり、異物21を上槽部から下槽部へ
移送するのを妨げる場合がある。また、貫通孔3の直径
が10mmより大きいと、異物21が下槽部から上槽部
へ拡散する場合がある。仕切板2における複数の貫通孔
3が占める面積の比率が20%未満であると、めっき槽
1の上槽部から下槽部へのめっき液20の流動に対して
抵抗が大きくなり、異物21を上槽部から下槽部へ移送
するのを妨げる場合がある。また、仕切板2における複
数の貫通孔3が占める面積の比率が60%より大きい
と、異物21が下槽部から上槽部へ拡散する場合があ
る。
A plurality of through holes 3 are provided in the partition plate 2,
The shape is, for example, a circle having a diameter of 3 to 10 mm.
The ratio of the area occupied by the plurality of through holes 3 in the partition plate 2 is 20 to 60%, preferably 30 to 50.
%. If the diameter of the through hole 3 is less than 3 mm, the resistance to the flow of the plating solution 20 from the upper tank portion to the lower tank portion of the plating tank 1 becomes large, and the foreign matter 21 is transferred from the upper tank portion to the lower tank portion. May prevent you from doing so. If the diameter of the through hole 3 is larger than 10 mm, the foreign matter 21 may diffuse from the lower tank portion to the upper tank portion. If the ratio of the area occupied by the plurality of through holes 3 in the partition plate 2 is less than 20%, the resistance to the flow of the plating solution 20 from the upper tank portion to the lower tank portion of the plating tank 1 becomes large, and the foreign matter 21 May be prevented from being transferred from the upper tank section to the lower tank section. Further, when the ratio of the area occupied by the plurality of through holes 3 in the partition plate 2 is larger than 60%, the foreign matter 21 may diffuse from the lower tank portion to the upper tank portion.

【0019】本実施の形態では、貫通孔3の形状を円形
としたが、これに限定されるものではなく、楕円形、三
角形、四角形、その他多角形であっても良い。本実施の
形態では、仕切板2に設ける複数の貫通孔3の分布は、
特に限定されないが、均一な分布で設けるのが、仕切板
2の加工の点からは好ましい。
In the present embodiment, the shape of the through hole 3 is circular, but the shape is not limited to this, and it may be oval, triangular, quadrangular, or other polygonal shape. In the present embodiment, the distribution of the plurality of through holes 3 provided in the partition plate 2 is
Although not particularly limited, it is preferable to provide the partition plate 2 in a uniform distribution from the viewpoint of processing the partition plate 2.

【0020】本実施の形態では、仕切板2の材質は、貫
通孔3の加工が容易で、めっき液20に対する耐性があ
れば特に限定されないが、例えばポリテトラフルオロエ
チレン(PTFE)やポリプロピレン(PP)等のプラ
スチックやステンレス等の金属が挙げられる。また、液
流ポンプ8としては、ベローズポンプ{形式:FF-1
0型(IWAKI PUMP社製)}が挙げられ、ろ過
装置としては、カートリッジフィルタ{コーテッドタイ
プカートリッジフィルタ(ADVANTEC社製)}が
挙げられる。また、第1の流速制御機構10及び第2の
流速制御機構11としては、例えばボールバルブ{PV
DFボールバルブ(小松製作所社製)}が挙げられる。
本実施の形態では、2つの流速制御機構10と11を用
いたが、1つの流速制御機構で、その内部にニードルバ
ルブ{テフロン(登録商標)ニードルバルブ(小松製作
所社製)}からなる2つの流速制御ユニットを有するも
の用いても良い。
In the present embodiment, the material of the partition plate 2 is not particularly limited as long as the through holes 3 can be easily processed and has resistance to the plating solution 20, for example, polytetrafluoroethylene (PTFE) or polypropylene (PP). ) And other metals, and stainless steel and other metals. Further, as the liquid flow pump 8, a bellows pump {type: FF-1
Type 0 (manufactured by IWAKI PUMP Co., Ltd.)}, and a cartridge filter {coated type cartridge filter (manufactured by ADVANTEC Co.)} can be used as the filtration device. Further, as the first flow velocity control mechanism 10 and the second flow velocity control mechanism 11, for example, a ball valve {PV
DF ball valve (manufactured by Komatsu Ltd.)}.
In the present embodiment, the two flow rate control mechanisms 10 and 11 are used, but one flow rate control mechanism includes two needle valves {Teflon (registered trademark) needle valve (manufactured by Komatsu Ltd.)}. A device having a flow rate control unit may be used.

【0021】また、流路7、7a、7bとしては、めっ
き液に対する耐性と耐圧力性を有するパイプまたはホー
ス等を用いることができる。また、めっき槽1には、第
1の流入口4、第2の流入口5または排出口6の各々
が、複数個設けられても良い。また、本実施の形態のめ
っき装置30は、無電界めっきに用いるものであり、図
1には、陽極及びめっき用電源は記載されていないが、
本発明は、陽極及びめっき用電源を追加して、電気めっ
きにも用いることができる。さらに、本実施の形態のめ
っき装置30は、半導体装置のみならず、プリント配線
基板、金属、プラスチックのめっきにも用いることがで
きる。
As the flow paths 7, 7a, 7b, pipes or hoses having resistance to the plating solution and pressure resistance can be used. Further, the plating tank 1 may be provided with a plurality of first inflow ports 4, second inflow ports 5 or discharge ports 6. Further, the plating apparatus 30 of the present embodiment is used for electroless plating, and although the anode and the power supply for plating are not shown in FIG. 1,
The present invention can also be used for electroplating with the addition of an anode and a plating power supply. Furthermore, the plating apparatus 30 of the present embodiment can be used not only for semiconductor devices but also for plating of printed wiring boards, metals and plastics.

【0022】実施の形態2.図2は、実施の形態2にお
けるめっき装置の構成を示す模式図である。図2におい
て、12は第1のろ過装置、13は第2のろ過装置であ
る。本実施の形態のめっき装置30は、本発明のめっき
装置において、液流ポンプ8の噴出口が、流路7により
第1のろ過装置12の液の取入口に接続されている。第
1のろ過装置12の液の取出口からの流路は分岐されて
おり、流路7aによりめっき槽の第1の流入口4に接続
され、また、流路7bにより第2のろ過装置13の液の
取入口に接続されている。第2のろ過装置13の液の取
出口からの流路7aはめっき槽の第2の流入口5に接続
されている。そして、第1のろ過装置12に用いられて
いるフィルタは、孔径が10〜50μmの粗いフィルタ
であり、第2のろ過装置13に用いられているフィルタ
は、孔径が0.1〜1μmの細かいフィルタである。
Embodiment 2. FIG. 2 is a schematic diagram showing the configuration of the plating apparatus according to the second embodiment. In FIG. 2, 12 is a first filtering device and 13 is a second filtering device. In the plating apparatus 30 of the present embodiment, in the plating apparatus of the present invention, the jet port of the liquid flow pump 8 is connected to the liquid intake of the first filtering device 12 by the flow path 7. The flow path from the liquid outlet of the first filtering device 12 is branched and connected to the first inflow port 4 of the plating tank by the flow path 7a, and the second filtering device 13 by the flow path 7b. Is connected to the liquid intake. The flow path 7a from the liquid outlet of the second filtration device 13 is connected to the second inlet 5 of the plating tank. The filter used in the first filtration device 12 is a coarse filter having a pore size of 10 to 50 μm, and the filter used in the second filtration device 13 is a fine filter having a pore size of 0.1 to 1 μm. It is a filter.

【0023】すなわち、粗いフィルタを用いた第1のろ
過装置12のみでろ過されためっき液が第1の流入口4
からめっき槽1の下槽部に流入する。第1のろ過装置1
2を通過し、さらに細かいフィルタを用いた第2のろ過
装置13でろ過されためっき液は第2の流入口5からめ
っき槽1の上槽部に流入する。すなわち、めっき槽1の
下槽部には、粗いフィルタの第1のろ過装置12を通過
しためっき液が流入するので、ろ過装置による流速の低
下が少なく、下槽部に大きい速度でのめっき液の流れを
可能にする。めっき槽1の上槽部には、第1のろ過装置
12に加え、細かいフィルタの第2のろ過装置13を通
過しためっき液を流入させるので、下槽部よりめっき液
の流速が小さくなる。本実施の形態のめっき装置30で
は、特別な流速制御機構を用いなくても、めっき槽1の
下槽部でのめっき液の流速を上槽部より大きくでき、上
槽部から下槽部へめっき液20を流動させる力が働き、
異物21を上槽部から下槽部へ移送できる。
That is, the plating solution filtered only by the first filtering device 12 using the coarse filter is the first inflow port 4
Flows into the lower tank portion of the plating tank 1. First filtration device 1
The plating solution that has passed through 2 and has been filtered by the second filtering device 13 using a finer filter flows into the upper tank portion of the plating tank 1 from the second inlet 5. That is, since the plating solution that has passed through the first filter device 12 of the coarse filter flows into the lower tank part of the plating tank 1, there is little decrease in the flow rate due to the filter device, and the plating solution at a large speed flows into the lower tank part. Enable the flow of. In addition to the first filtering device 12, the plating solution that has passed through the second filtering device 13 having a fine filter is caused to flow into the upper tank portion of the plating tank 1, so that the flow velocity of the plating solution becomes smaller than that of the lower tank portion. In the plating apparatus 30 of the present embodiment, the flow velocity of the plating solution in the lower tank portion of the plating tank 1 can be made higher than that in the upper tank portion without using a special flow rate control mechanism, and the upper tank portion can be moved to the lower tank portion. The force to flow the plating solution 20 works,
The foreign material 21 can be transferred from the upper tank portion to the lower tank portion.

【0024】下槽部へは、粗いフィルタを用いた第1の
ろ過装置12を通過しためっき液20が流入するので、
めっき液中に細かい異物が存在する可能性があるが、め
っき液20には上槽部から下槽部へ流動する力が働くの
で、細かい異物が上槽部に拡散することは防止できる。
また、上槽部へは、細かいフィルタの第2のろ過装置1
3を通過しためっき液20が流入するので、めっき液中
の細かい異物も取り除かれ、被めっき物22に異物21
が接触することなく、めっき不良を防止できる。
Since the plating solution 20 that has passed through the first filtration device 12 using a coarse filter flows into the lower tank portion,
Fine foreign matter may exist in the plating solution, but since the plating solution 20 has a force to flow from the upper tank portion to the lower tank portion, it is possible to prevent the fine foreign material from diffusing into the upper tank portion.
In addition, to the upper tank part, the second filtering device 1 of a fine filter is used.
Since the plating solution 20 that has passed through 3 flows in, fine foreign matter in the plating solution is also removed, and the foreign matter 21 remains on the object 22 to be plated.
It is possible to prevent defective plating without touching.

【0025】実施の形態3.本実施の形態のめっき装置
30は、本発明のめっき装置において、仕切板2を設け
る位置が、めっき槽1の下槽部に第1の流入口4及び排
出口6を設けることができる高さ以上であり、めっき装
置30で設定されている通常に使用するめっき液量にお
ける液面からめっき槽1の底面までの深さdとした場
合、めっき槽の底部から(1/3)dの高さ以下であ
る。
Embodiment 3. In the plating apparatus 30 of the present embodiment, in the plating apparatus of the present invention, the position where the partition plate 2 is provided is such a height that the first inflow port 4 and the discharge port 6 can be provided in the lower tank portion of the plating tank 1. As described above, when the depth d from the liquid surface to the bottom surface of the plating tank 1 in the amount of plating solution normally used in the plating apparatus 30 is set to a height of (1/3) d from the bottom of the plating tank. Or less.

【0026】すなわち、仕切板2を設ける位置が、底面
から(1/3)d以下であるので、上槽部より下槽部の
容積が小さく、例えば、第1の流入口4から流入するめ
っき液の流速を第2の流入口5から流入するめっき液の
流速の1.1倍以上と、わずかに大きくしても、下槽部
の流速が上槽部より十分に大きくなり、上槽部から下槽
部へめっき液20が流動させるのに必要な力が働き、被
めっき物22に接触する前に異物21を下槽部へ移送で
きる。また、仕切板2を設ける位置が、底面から(1/
3)d以下であるので、被めっき物22を設置する上槽
部の容積が十分にあり、被めっき物22の大きさを制限
することや、被めっき物22の数量を限定することが少
なく、めっき装置30の使用効率が優れている。
That is, since the position where the partition plate 2 is provided is (1/3) d or less from the bottom surface, the volume of the lower tank portion is smaller than that of the upper tank portion. For example, the plating that flows in from the first inlet 4 Even if the flow rate of the solution is 1.1 times or more the flow rate of the plating solution flowing in from the second inflow port 5, the flow rate in the lower tank section becomes sufficiently higher than that in the upper tank section. The force necessary for causing the plating solution 20 to flow from the lower tank portion to the lower tank portion allows the foreign matter 21 to be transferred to the lower tank portion before coming into contact with the object 22 to be plated. Moreover, the position where the partition plate 2 is provided is (1 /
3) Since it is d or less, the volume of the upper tank portion in which the object 22 to be plated is installed is sufficient, and the size of the object 22 to be plated and the number of the object 22 to be plated are not limited. The use efficiency of the plating apparatus 30 is excellent.

【0027】実施の形態4.図3は、実施の形態4のめ
っき装置におけるめっき槽の上面図である。本実施の形
態のめっき装置30は、本発明のめっき装置において、
仕切板2の貫通孔3が、めっき槽1のめっき液流入口4
及び5を設けた側壁に近い側ほど多く、排出口6を設け
た側壁側に行くほど少なくなっている。すなわち、流入
口4に近い部分に多くの貫通孔3があるので、第2の流
入口4に近い部分の上槽部のめっき液が容易に下槽部へ
移動でき、より多くの異物21を、被めっき物22に接
触する前に、上槽部から下槽部へ移送し、異物21によ
るめっき不良を防止する効果がおおきい。
Fourth Embodiment FIG. 3 is a top view of a plating tank in the plating apparatus according to the fourth embodiment. The plating apparatus 30 of the present embodiment is the same as the plating apparatus of the present invention.
The through hole 3 of the partition plate 2 is the plating solution inlet 4 of the plating tank 1.
The number is larger on the side closer to the side wall provided with Nos. 5 and 5, and is smaller on the side closer to the side wall provided with the discharge port 6. That is, since there are many through holes 3 near the inflow port 4, the plating solution in the upper tank part near the second inflow port 4 can easily move to the lower tank part, and more foreign matter 21 can be removed. Before being brought into contact with the object 22 to be plated, it is transferred from the upper tank portion to the lower tank portion, and the effect of preventing defective plating due to the foreign matter 21 is large.

【0028】実施の形態5.図4は、実施の形態5のめ
っき装置におけるめっき槽の構造を示す断面模式図であ
る。図4において、14はパイプである。本実施の形態
のめっき装置30は、本発明のめっき装置において、仕
切板2の下槽部側の面に、貫通孔3と連通したパイプ1
4が設けられている。このパイプ14は、80度未満の
角度で、排出口を備えた側壁側に傾斜させて取り付けら
れている。このような、構成にすることにより、めっき
槽1の下槽部におけるめっき液の流速を上槽部のめっき
液の流速より大きくしなくても、下槽部のめっき液中の
異物が上槽部に移動することが防止できる。また、パイ
プ14の取り付け角度が排出口側に向かって80度未満
の角度で傾斜しているので、めっき槽1の上槽部から下
槽部へのめっき液20の流動に対する抵抗が小さく、上
槽部の異物21が容易に下槽部へ移送でき、めっき不良
が防止できる。
Embodiment 5. FIG. 4 is a schematic sectional view showing the structure of the plating tank in the plating apparatus of the fifth embodiment. In FIG. 4, 14 is a pipe. The plating apparatus 30 of the present embodiment is different from the plating apparatus of the present invention in that the pipe 1 communicating with the through hole 3 is formed on the surface of the partition plate 2 on the lower tank portion side.
4 are provided. The pipe 14 is attached at an angle of less than 80 degrees so as to be inclined toward the side wall provided with the discharge port. With such a configuration, even if the flow rate of the plating solution in the lower tank part of the plating tank 1 is not made higher than the flow rate of the plating solution in the upper tank part, foreign matter in the plating solution in the lower tank part It can be prevented from moving to the section. Moreover, since the mounting angle of the pipe 14 is inclined toward the outlet side at an angle of less than 80 degrees, the resistance to the flow of the plating solution 20 from the upper tank portion to the lower tank portion of the plating tank 1 is small, and The foreign matter 21 in the tank portion can be easily transferred to the lower tank portion, and defective plating can be prevented.

【0029】[0029]

【発明の効果】本発明に係わる第1のめっき装置は、め
っき槽と、このめっき槽を上槽部と下槽部とに分割する
とともに貫通孔を備えた仕切板と、上記めっき槽の側壁
の上記仕切板より下側の部分に設けられためっき液の第
1の流入口と、この第1の流入口を備えた上記側壁の上
記仕切板より上側の部分に設けられためっき液の第2の
流入口と、上記めっき槽の、上記第1の流入口と上記第
2の流入口とを備えた側壁に対向する側壁の上記仕切板
より下側の部分に設けられためっき液の排出口と、この
排出口に流路により吸入口が接続されている液流ポンプ
と、この液流ポンプの噴出口に流路により液の取入口が
接続されているろ過装置と、このろ過装置の液の取出口
と上記第1の流入口とを接続する流路中に設けられた第
1の流速制御機構と、上記ろ過装置の液の取出口と上記
第2の流入口とを接続する流路中に設けられた第2の流
速制御機構とからなるものであり、めっき槽において、
上槽部にあるめっき液が、仕切板の貫通孔を通過して下
槽部に流れ、排出口から排出されるので、上槽部にある
異物はめっき液とともに下槽部に移送され、下槽部に移
送された異物は被めっき物がある上槽部に戻ることはな
く排出口からめっき槽の外に排出される。また、下槽部
では、第1の流入口からのめっき液が、直接、排出口か
ら排出されるので、めっき槽の底部に異物を堆積させる
ことなく、めっき液とともにめっき槽の外に排出され
る。そして、めっき液とともに排出された異物はろ過装
置により除去できるので、異物によるめっき不良が防止
できる。
The first plating apparatus according to the present invention comprises a plating tank, a partition plate which divides the plating tank into an upper tank portion and a lower tank portion and which has through holes, and a side wall of the plating tank. A first inlet of the plating solution provided in a portion below the partition plate, and a first plating solution provided in a portion of the side wall having the first inlet above the partition plate. Drainage of the plating solution provided in a portion of the side wall of the plating tank facing the side wall provided with the first inflow port and the second inflow port below the partition plate. An outlet, a liquid flow pump having a suction port connected to the discharge port by a flow path, a filtration device having a liquid intake port connected by a flow path to the jet port of the liquid flow pump, and a filtration device of the filtration device. A first flow velocity control mechanism provided in a flow path connecting a liquid outlet and the first inlet , Which consist of a second flow rate control mechanism provided in the channel that connects the outlet and the second inlet of the liquid of the filtering device, in the plating bath,
Since the plating solution in the upper tank part flows through the through hole of the partition plate to the lower tank part and is discharged from the discharge port, the foreign matter in the upper tank part is transferred to the lower tank part together with the plating solution. The foreign matter transferred to the bath does not return to the upper bath where the object is to be plated, but is discharged from the outlet to the outside of the plating bath. Further, in the lower tank part, the plating solution from the first inlet is directly discharged from the discharge port, so that it is discharged together with the plating solution to the outside of the plating tank without depositing foreign matter on the bottom of the plating tank. It Since the foreign matter discharged together with the plating solution can be removed by the filtering device, it is possible to prevent defective plating due to the foreign matter.

【0030】本発明に係わる第2のめっき装置は、第1
のめっき装置において、めっき槽の下槽部におけるめっ
き液の流速を、上記めっき槽の上槽部におけるめっき液
の流速より大きくなるように、第1の流速制御機構と第
2の流速制御機構とが設定されているものであり、下槽
部でのめっき液の流速が、上槽部でのめっき液の流速よ
り大きく設定されているので、粘性流の作用により、流
速の小さい上槽部から流速の大きい下槽部へめっき液が
流動する力が働き、第2の流入口の近くにある異物も、
被めっき物と接触する前に、効率良く下槽部へ移送さ
れ、めっき液とともにめっき槽の外に排出でき、異物に
よるめっき不良が防止できる。
The second plating apparatus according to the present invention is the first plating apparatus.
In the plating apparatus, the first flow rate control mechanism and the second flow rate control mechanism are provided so that the flow rate of the plating solution in the lower tank section of the plating tank is higher than the flow rate of the plating solution in the upper tank section of the plating tank. Is set and the flow rate of the plating solution in the lower tank is set to be higher than the flow rate of the plating solution in the upper tank. The force that the plating solution flows to the lower tank part where the flow velocity is high acts, and foreign matter near the second inlet also
Before being brought into contact with the object to be plated, it can be efficiently transferred to the lower tank part and discharged out of the plating tank together with the plating solution, so that defective plating due to foreign matter can be prevented.

【0031】本発明に係わる第3のめっき装置は、めっ
き槽と、このめっき槽を上槽部と下槽部とに分割すると
ともに貫通孔を備えた仕切板と、上記めっき槽の側壁の
上記仕切板より下側の部分に設けられためっき液の第1
の流入口と、この第1の流入口を備えた上記側壁の上記
仕切板より上側の部分に設けられためっき液の第2の流
入口と、上記めっき槽の、上記第1の流入口と上記第2
の流入口とを備えた側壁に対向する側壁の上記仕切板よ
り下側の部分に設けられためっき液の排出口と、この排
出口に流路により吸入口が接続されている液流ポンプ
と、この液流ポンプの噴出口に流路により液の取入口が
接続されている第1のろ過装置と、この第1のろ過装置
における液の取出口と上記第1の流入口とを接続する流
路と、上記第1のろ過装置における液の取出口と上記第
2の流入口とを接続する流路中に設けられた上記第1の
ろ過装置のフィルタより細かいフィルタを有する第2の
ろ過装置とからなるものであり、特別な流速制御機構を
用いなくても、めっき槽の下槽部でのめっき液の流速を
上槽部より大きくでき、上槽部から下槽部へめっき液を
流動させる力が働き、第2の流入口の近くにある異物
も、被めっき物と接触する前に、効率良く下槽部へ移送
され、めっき液とともにめっき槽の外に排出でき、異物
によるめっき不良が防止できる。
A third plating apparatus according to the present invention comprises a plating tank, a partition plate which divides the plating tank into an upper tank portion and a lower tank portion and which has through holes, and the side wall of the plating tank. The first plating solution provided in the part below the partition plate
Inlet, a second inlet of the plating solution provided in a portion of the side wall provided with the first inlet above the partition plate, and the first inlet of the plating tank. Second above
A discharge port of the plating solution provided in a portion of the side wall opposite to the side wall provided with the flow inlet of the partition plate, and a liquid flow pump having a suction port connected to the discharge port by a flow path. , A first filtration device having a liquid intake port connected to a jet port of the liquid flow pump by a flow path, and connecting the liquid intake port of the first filtration device to the first inflow port Second filtration having a finer filter than the filter of the first filtration device provided in the flow channel, which connects the liquid outlet and the second inflow port of the first filtration device. It is composed of a device, and the flow rate of the plating solution in the lower tank part of the plating tank can be made higher than that in the upper tank part without using a special flow rate control mechanism, and the plating solution can be transferred from the upper tank part to the lower tank part. The fluidizing force works and foreign matter near the second inlet also contacts the object to be plated. Before being transferred to efficiently lower tank section, it is discharged to the outside of the plating tank with the plating solution, plating failure can be prevented by the foreign matter.

【0032】本発明に係わる第4のめっき装置は、第1
ないし3のいずれかのめっき装置において、仕切板を設
ける位置が、めっき槽の底から第1の流入口及び排出口
を設けることができる高さ以上であり、めっき液の液面
からめっき槽の底までの深さをdとした場合、めっき槽
の底から(1/3)dの高さ以下のものであり、上槽部
より下槽部の容積が小さく、第1の流入口から流入する
めっき液の流速を第2の流入口から流入するめっき液の
流速よりわずかに大きくしても、下槽部の流速が上槽部
より十分に大きくなり、上槽部から下槽部へめっき液を
流動させるのに必要な力が働き、被めっき物に接触する
前に異物を下槽部へ移送でき、異物によるめっき不良が
防止できる。
The fourth plating apparatus according to the present invention is the first plating apparatus.
In the plating apparatus according to any one of 1 to 3, the position where the partition plate is provided is higher than the height at which the first inlet and the discharge port can be provided from the bottom of the plating tank, When the depth to the bottom is d, the height is (1/3) d or less from the bottom of the plating tank, the volume of the lower tank is smaller than that of the upper tank, and the inflow is from the first inlet. Even if the flow rate of the plating solution to be applied is slightly higher than the flow rate of the plating solution flowing from the second inlet, the flow rate in the lower tank is sufficiently higher than that in the upper tank, and the plating from the upper tank to the lower tank is performed. The force necessary to make the liquid flow works, and the foreign matter can be transferred to the lower bath before contacting the object to be plated, and the plating failure due to the foreign matter can be prevented.

【0033】本発明に係わる第5のめっき装置は、第1
ないし4のいずれかのめっき装置において、仕切板の貫
通孔が、めっき槽の第1及び第2の流入口を備えた側壁
に近い側ほど、多いものであり、第2の流入口に近い部
分の上槽部のめっき液が容易に下槽部へ移動できるの
で、より多くの異物を、被めっき物に接触する前に、上
槽部から下槽部へ移送することができる。
The fifth plating apparatus according to the present invention is the first plating apparatus.
In the plating apparatus according to any one of 1 to 4, the number of through holes of the partition plate is greater on the side closer to the side wall of the plating tank provided with the first and second inlets, and is closer to the second inlet. Since the plating solution in the upper tank portion can be easily moved to the lower tank portion, more foreign matter can be transferred from the upper tank portion to the lower tank portion before contacting the object to be plated.

【0034】本発明に係わる第6のめっき装置は、第1
ないし5のいずれかのめっき装置において、仕切板にお
ける貫通孔部の下槽部側の面に、排出口を備えた側壁側
に80度以下の角度で傾斜させてパイプを取り付けたも
のであり、下槽部におけるめっき液の流速を上槽部のめ
っき液の流速より大きくしなくても、下槽部のめっき液
中の異物が上槽部に移動することが防止できる。
The sixth plating apparatus according to the present invention is the first
In the plating apparatus according to any one of 1 to 5 above, a pipe is attached to a surface of the partition plate on the lower tank portion side of the through hole portion at a side wall side provided with an outlet inclined at an angle of 80 degrees or less, Even if the flow rate of the plating solution in the lower tank section is not made higher than the flow rate of the plating solution in the upper tank section, foreign matter in the plating solution in the lower tank section can be prevented from moving to the upper tank section.

【図面の簡単な説明】[Brief description of drawings]

【図1】 実施の形態1におけるめっき装置の構成を示
す模式図である。
FIG. 1 is a schematic diagram showing a configuration of a plating apparatus according to a first embodiment.

【図2】 実施の形態2におけるめっき装置の構成を示
す模式図である。
FIG. 2 is a schematic diagram showing a configuration of a plating apparatus according to a second embodiment.

【図3】 実施の形態4のめっき装置におけるめっき槽
の上面図である。
FIG. 3 is a top view of a plating tank in the plating apparatus according to the fourth embodiment.

【図4】 実施の形態5のめっき装置におけるめっき槽
の構造を示す断面模式図である。
FIG. 4 is a schematic sectional view showing a structure of a plating tank in a plating apparatus according to a fifth embodiment.

【符号の説明】[Explanation of symbols]

1 めっき槽、2 仕切板、3 仕切板の貫通孔、4
第1の流入口、5 第2の流入口、6 排出口、7,7
a,7b 流路、8 液流ポンプ、9 ろ過装置、10
第1の流速制御機構、11 第2の流速制御機構、1
2 第1のろ過装置、13 第2のろ過装置、14 パ
イプ、20 めっき液、21 異物、22 被めっき
物、30 めっき装置。
1 plating tank, 2 partition plates, 3 partition plate through holes, 4
1st inflow port, 5 2nd inflow port, 6 discharge port, 7, 7
a, 7b flow path, 8 liquid flow pump, 9 filtration device, 10
1st flow velocity control mechanism, 11 2nd flow velocity control mechanism, 1
2 1st filtration apparatus, 13 2nd filtration apparatus, 14 pipe, 20 plating solution, 21 foreign material, 22 plated object, 30 plating apparatus.

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】 めっき槽と、このめっき槽を上槽部と下
槽部とに分割するともに貫通孔を備えた仕切板と、上記
めっき槽の側壁の上記仕切板より下側の部分に設けられ
ためっき液の第1の流入口と、この第1の流入口を備え
た上記側壁の上記仕切板より上側の部分に設けられため
っき液の第2の流入口と、上記めっき槽の、上記第1の
流入口と上記第2の流入口とを備えた側壁に対向する側
壁の上記仕切板より下側の部分に設けられためっき液の
排出口と、この排出口に流路により吸入口が接続されて
いる液流ポンプと、この液流ポンプの噴出口に流路によ
り液の取入口が接続されているろ過装置と、このろ過装
置の液の取出口と上記第1の流入口とを接続する流路中
に設けられた第1の流速制御機構と、上記ろ過装置の液
の取出口と上記第2の流入口とを接続する流路中に設け
られた第2の流速制御機構とからなるめっき装置。
1. A plating tank, a partition plate which divides the plating tank into an upper tank portion and a lower tank portion and which is provided with a through hole, and a side wall of the plating tank which is provided below the partition plate. A first inlet of the plating solution, a second inlet of the plating solution provided in a portion of the side wall having the first inlet above the partition plate, and the plating tank, A discharge port of the plating solution provided in a portion of the side wall opposite to the side wall provided with the first inflow port and the second inflow port, the part being below the partition plate, and the discharge port is sucked by a flow path. A liquid flow pump having a mouth connected thereto, a filtration device having a liquid intake port connected to a jet port of the liquid flow pump by a flow path, a liquid intake port of the filtration device and the first inflow port. A first flow velocity control mechanism provided in a flow path connecting the above, a liquid outlet of the filtering device, and the second And a second flow velocity control mechanism provided in a flow path connecting the inflow port of the plating apparatus.
【請求項2】 めっき槽の下槽部におけるめっき液の流
速を、上記めっき槽の上槽部におけるめっき液の流速よ
り大きくなるように、第1の流速制御機構と第2の流速
制御機構とが設定されていることを特徴とする請求項1
に記載のめっき装置。
2. A first flow velocity control mechanism and a second flow velocity control mechanism so that the flow velocity of the plating liquid in the lower bath portion of the plating bath is higher than the flow velocity of the plating liquid in the upper bath portion of the plating bath. 2. The method according to claim 1, wherein
The plating apparatus described in.
【請求項3】 めっき槽と、このめっき槽を上槽部と下
槽部とに分割するとともに貫通孔を備えた仕切板と、上
記めっき槽の側壁の上記仕切板より下側の部分に設けら
れためっき液の第1の流入口と、この第1の流入口を備
えた上記側壁の上記仕切板より上側の部分に設けられた
めっき液の第2の流入口と、上記めっき槽の、上記第1
の流入口と上記第2の流入口とを備えた側壁に対向する
側壁の上記仕切板より下側の部分に設けられためっき液
の排出口と、この排出口に流路により吸入口が接続され
ている液流ポンプと、この液流ポンプの噴出口に流路に
より液の取入口が接続されている第1のろ過装置と、こ
の第1のろ過装置における液の取出口と上記第1の流入
口とを接続する流路と、上記第1のろ過装置における液
の取出口と上記第2の流入口とを接続する流路中に設け
られた上記第1のろ過装置のフィルタより細かいフィル
タを有する第2のろ過装置とからなるめっき装置。
3. A plating tank, a partition plate which divides the plating tank into an upper tank portion and a lower tank portion and which has a through hole, and a side wall of the plating tank which is provided below the partition plate. A first inlet of the plating solution, a second inlet of the plating solution provided in a portion of the side wall having the first inlet above the partition plate, and the plating tank, First above
Outlet of the plating solution provided at a portion of the side wall opposite to the side wall having the inlet and the second inlet of the plating solution, and the inlet is connected to this outlet by a flow path. A liquid flow pump, a first filtration device in which a liquid intake port is connected to a jet port of the liquid flow pump by a flow path, a liquid removal port in the first filtration device and the first filter device. Is smaller than the filter of the first filtration device provided in the flow passage that connects the liquid inlet of the first filtration device and the flow passage that connects the second fluid inlet of the first filtration device. A plating apparatus comprising a second filtering device having a filter.
【請求項4】 仕切板を設ける位置が、めっき槽の底か
ら第1の流入口及び排出口を設けることができる高さ以
上であり、めっき液の液面からめっき槽の底までの深さ
をdとした場合、めっき槽の底から(1/3)dの高さ
以下であることを特徴とする請求項1ないし3のいずれ
かに記載のめっき装置。
4. The position where the partition plate is provided is higher than the height where the first inlet and outlet can be provided from the bottom of the plating tank, and the depth from the liquid surface of the plating solution to the bottom of the plating tank. The plating apparatus according to any one of claims 1 to 3, wherein the height is (1/3) d or less from the bottom of the plating tank, where d is d.
【請求項5】 仕切板の貫通孔が、めっき槽の第1及び
第2の流入口を備えた側壁に近い側ほど、多いことを特
徴とする請求項1ないし4のいずれかに記載のめっき装
置。
5. The plating according to any one of claims 1 to 4, wherein the partition plate has more through holes on the side closer to the side wall of the plating tank having the first and second inlets. apparatus.
【請求項6】 仕切板における貫通孔部の下槽部側の面
に、排出口を備えた側壁側に80度以下の角度で傾斜さ
せてパイプを取り付けたことを特徴とする請求項1ない
し5のいずれかに記載のめっき装置。
6. The pipe is attached to the surface of the partition plate on the lower tank portion side of the through hole portion on the side wall side provided with the outlet at an angle of 80 degrees or less. The plating apparatus according to any one of 5 above.
JP2002020193A 2002-01-29 2002-01-29 Plating apparatus Pending JP2003221698A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002020193A JP2003221698A (en) 2002-01-29 2002-01-29 Plating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002020193A JP2003221698A (en) 2002-01-29 2002-01-29 Plating apparatus

Publications (1)

Publication Number Publication Date
JP2003221698A true JP2003221698A (en) 2003-08-08

Family

ID=27743761

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002020193A Pending JP2003221698A (en) 2002-01-29 2002-01-29 Plating apparatus

Country Status (1)

Country Link
JP (1) JP2003221698A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007182613A (en) * 2006-01-06 2007-07-19 Murata Mfg Co Ltd Plating apparatus
CN104213180A (en) * 2014-09-17 2014-12-17 丹阳市新光电子有限公司 Electroplating liquid circulating system of flexible circuit board
CN104562155A (en) * 2014-12-17 2015-04-29 无锡市星亿涂装环保设备有限公司 Electroplating tank bottom sewage collection hopper
US10711364B2 (en) 2013-11-06 2020-07-14 Lam Research Corporation Uniform flow behavior in an electroplating cell

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007182613A (en) * 2006-01-06 2007-07-19 Murata Mfg Co Ltd Plating apparatus
US10711364B2 (en) 2013-11-06 2020-07-14 Lam Research Corporation Uniform flow behavior in an electroplating cell
CN104213180A (en) * 2014-09-17 2014-12-17 丹阳市新光电子有限公司 Electroplating liquid circulating system of flexible circuit board
CN104213180B (en) * 2014-09-17 2016-06-08 丹阳市新光电子有限公司 Flexible PCB electroplate liquid blood circulation
CN104562155A (en) * 2014-12-17 2015-04-29 无锡市星亿涂装环保设备有限公司 Electroplating tank bottom sewage collection hopper

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