JP5049249B2 - Polishing liquid composition - Google Patents

Description

The present invention relates to a polishing composition having a high polishing rate and capable of reducing waviness of a substrate to be polished. Furthermore, the present invention relates to a method for reducing waviness and a method for producing a substrate using the polishing composition.

The hard disk is required to reduce the flying height of the magnetic head in order to reduce the minimum recording area and increase the capacity. In order to reduce the flying height of the head, it is necessary to reduce short wavelength waviness (wavelength of 50 to 500 μm) and long wavelength waviness (wavelength of 0.5 mm or more) in the polishing process of the hard disk substrate. “Waviness” as used herein refers to surface irregularities having a wavelength longer than the surface roughness. In order to manufacture such a substrate with reduced waviness, mechanical conditions such as controlling the hole diameter of the polishing pad, controlling the hardness, and controlling the polishing load and the number of rotations during polishing have been studied. However, such mechanical conditions are effective but not sufficient. On the other hand, reduction of waviness due to the polishing composition has also been studied. Patent Document 1 examines α-alumina, water-soluble peroxide and boehmite, and Patent Document 2 studies a polishing liquid composition containing primary abrasive particles, dispersed colloidal particles and an oxidizing agent. Further, Patent Document 3 discloses a polishing liquid composition containing colloidal silica, an oxidizing agent, and organic phosphonic acid, and Patent Document 4 discloses a polishing liquid composition using intermediate alumina. However, these polishing liquid compositions are not sufficient in terms of reducing waviness while having a polishing rate necessary for practical use.
Japanese Patent Laid-Open No. 3-115383 JP 2001-260005 A JP 2002-327170 A JP 2003-41239 A

The present invention provides a polishing composition having a high polishing rate and capable of reducing waviness of a substrate to be polished,
An object of the present invention is to provide a method for reducing waviness of a substrate to be polished using the polishing liquid composition, and a method for producing a high-quality substrate with reduced waviness using the polishing liquid composition.

That is, the gist of the present invention is as follows.
[1] Polishing liquid composition containing α-alumina, intermediate alumina, oxidizing agent and water,
[2] A method for reducing waviness of a substrate to be polished using the polishing composition according to [1], and [3] Polishing a substrate to be polished using the polishing composition according to [1]. It is related with the manufacturing method of the board | substrate which has a process to do.

By using the polishing composition of the present invention for polishing a precision component substrate or the like, the effect of reducing the waviness of the object to be polished at a high polishing rate is exhibited. In addition, since the object to be polished is less adhered to dirt such as polishing debris, cleaning after polishing can be easily performed, and thus a high-quality substrate with reduced waviness is economically manufactured. The effect that it can be performed is produced.

The polishing liquid composition of the present invention has a great feature in using α-alumina and intermediate alumina in combination with an abrasive and using an oxidizing agent as a polishing accelerator. By using a polishing liquid composition having such characteristics, Thus, a significant effect is achieved that a high polishing rate can be achieved and the waviness of the substrate to be polished can be significantly reduced.
About the working mechanism of the polishing speed improvement and swell reduction effect by the combined use of α-alumina and intermediate alumina, the filling properties are improved by the different particle size particles and different hardness, and the polishing physics on the surface of the object to be polished I suspect that the force works effectively.

The polishing composition of the present invention contains α-alumina as an abrasive. As the α-alumina, alumina obtained by calcining gibbsite, bayerite, nordstrandite, diaspore, boehmite, pseudoboehmite, aluminogel, γ-alumina, θ-alumina, etc. at a temperature of 1100 ° C. or higher is preferable. The α-alumina is preferably aluminum oxide having a purity of 95% or more, more preferably 97%, more preferably 99% or more, from the viewpoint of reducing waviness, reducing the surface roughness, improving the polishing rate and preventing surface defects. It is.

The average particle size of the primary particles of α-alumina is preferably 0.005 to 0.8 μm, more preferably 0.01 to 0.4 μm, and the average particle size of the secondary particles is preferably 0.01 to 2 μm from the viewpoint of reducing waviness. More preferably, it is 0.05-1.0 micrometer, More preferably, it is 0.1-0.5 micrometer. The average particle size of the primary particles of the abrasive is observed with a scanning electron microscope (preferably 3000-30000 times)
Or it can observe with a transmission electron microscope (preferably 10000-300000 times), perform image analysis, and can obtain | require as a number average particle diameter from the average value of a major axis and a minor axis. The average particle size of the secondary particles can be measured as a volume average particle size using a laser beam diffraction method.
The specific surface area measured by the BET method of α-alumina is preferably from 0.1 to 50 m ² / g, more preferably from 1 to 40 m ² / g, most preferably from the viewpoint of improving the polishing rate and reducing waviness. ^{2 to 20} m ² / g.

The content of α-alumina is preferably 0.05% by weight or more, more preferably 0.1% by weight or more, and further preferably 0. 0% by weight in the polishing composition from the viewpoint of improving the polishing rate and reducing waviness.
5% by weight or more, particularly preferably 1% by weight or more. From the viewpoint of surface quality and economy, it is preferably 40% by weight or less, more preferably 30% by weight or less, and still more preferably 25% by weight.
Hereinafter, it is particularly preferably 20% by weight or less. That is, the content of α-alumina in the polishing composition is preferably 0.05 to 40% by weight, more preferably 0.1 to 30% by weight, still more preferably 0.5.
-25% by weight, particularly preferably 1-20% by weight.

The present invention contains intermediate alumina from the viewpoint of improving the polishing rate and reducing waviness. The intermediate alumina of the present invention is a general term for alumina particles other than α-alumina particles, and specifically includes γ-alumina, δ-alumina, θ-alumina, η-alumina, κ-alumina, and mixtures thereof. It is done. Among these, the following intermediate alumina is preferable from the viewpoint of improving the polishing rate and reducing the waviness. The crystal form is preferably γ-alumina, δ-alumina, θ-alumina and mixtures thereof, particularly preferably γ-alumina, θ-alumina. The specific surface area measured by the BET method is preferably 30 to 300 m ² / g, more preferably 50 to ²⁰⁰ m ² / g. The average particle size of secondary particles of the intermediate alumina is preferably 0.01 to 5 μm, more preferably 0.01 to 2 μm, still more preferably 0.05 to 1 μm, and particularly preferably 0.1 to 0.5 from the viewpoint of reducing waviness.
μm. This average particle diameter can be measured as a volume average particle diameter using a laser light diffraction method such as “LA-920” manufactured by Horiba, Ltd.

The content of alkali metal and alkaline earth metal in the intermediate alumina is preferably 0.1% by weight or less, more preferably 0.05% by weight or less, and still more preferably 0.01% by weight or less. For example, when aluminum hydroxide having a relatively large specific surface area and a low alkali metal and alkaline earth metal content is used as a raw material, the surface of the object to be polished is less because the produced intermediate alumina is less fused and the particle strength is small. Effective for defects.

The aluminum hydroxide used as the raw material for the intermediate alumina preferably has a specific surface area by the BET method of 10 to 500 m ² / g, more preferably 30 to 400 m ² / g, and particularly preferably 50 to 300 m ² / g. Further, the content of alkali metal and alkaline earth metal is preferably 0.1% by weight or less, 0.05
% By weight or less is more preferable, and further 0.01% by weight or less is particularly preferable. Further, when intermediate alumina is produced from aluminum hydroxide by heat dehydration, introducing dry air or nitrogen gas at the time of heating is effective in preventing surface defects of the object to be polished. In addition, the said heat | fever dehydration process can be performed by a conventional method. These intermediate aluminas can be adjusted to a predetermined particle size by wet or dry pulverization with a pulverizer such as a ball mill, a bead mill high-pressure homogenizer, or a jet mill, if necessary.

Aluminum hydroxide has the chemical formula Al (OH) ₃ , AlOOH, AlOOH · nH _2.
There is no particular limitation as long as it is represented by O or Al ₂ O ₃ .nH ₂ O (n is 1 to 3) and can produce intermediate alumina by heat dehydration. Specific examples are Gibbsite,
Examples include bayerite, nordstrandite, diaspore, boehmite, pseudoboehmite, and aluminogel.

The mechanism of action at the time of polishing of this intermediate alumina is unclear, but compared with α-alumina alone or intermediate alumina alone, the mixing rate of both improves the polishing rate, so the physical force on the surface of the workpiece is improved. It is thought that the improvement is manifested.

The content of the intermediate alumina is preferably 0.05% by weight or more, more preferably 0.1% by weight or more, and further preferably 0. 0% by weight in the polishing composition from the viewpoint of improving the polishing rate and reducing waviness.
5% by weight or more, particularly preferably 1% by weight or more. Further, from the viewpoint of surface quality and economy, it is preferably 40% by weight or less, more preferably 30% by weight or less, still more preferably 25% by weight or less, and particularly preferably 20% by weight or less. That is, the content of intermediate alumina in the polishing composition is preferably 0.05 to 40% by weight, more preferably 0.1 to 30% by weight, still more preferably 0.5 to 25% by weight, and particularly preferably 1 to 20% by weight. .

The weight ratio of α-alumina and intermediate alumina (α-alumina / intermediate alumina) is preferably from 99/1 to 30/70, more preferably from 97/3 to 40, from the viewpoint of improving the polishing rate and reducing waviness. / 60, more preferably 95/5 to 50/50, most preferably 93
/ 7-55 / 45.

In addition, the total amount of α-alumina and intermediate alumina is preferably 0.1 to 45% by weight, more preferably 0.2 to 35% by weight, and still more preferably 1 in order to efficiently improve the polishing rate and reduce waviness. -30% by weight, particularly preferably 2-25% by weight.

The polishing composition of the present invention contains an oxidizing agent from the viewpoint of improving the polishing rate and reducing waviness. Although the polishing mechanism is unknown, it is presumed that the state is changed to a state in which the polishing effect of alumina can be sufficiently exhibited by applying an oxidizing agent to the material to be polished. Examples of the oxidizing agent of the present invention include peroxides, metal peroxo acids or salts thereof, oxygen acids or salts thereof, nitrates, sulfates,
Examples include acid metal salts. Oxidizing agents are roughly classified into inorganic oxidizing agents and organic oxidizing agents based on their structures. Specific examples of these oxidizing agents are shown below. Examples of inorganic oxidizing agents include hydrogen peroxide, and also alkali metals such as sodium peroxide, potassium peroxide, calcium peroxide, barium peroxide, magnesium peroxide, or alkaline earth metal peroxides, peroxocarbonic acid. Peroxo carbonates such as sodium and potassium peroxocarbonate, peroxosulfuric acid such as ammonium peroxodisulfate, sodium peroxodisulfate, potassium peroxodisulfate, and peroxomonosulfuric acid, peroxonitric acid such as peroxonitric acid, sodium peroxonitrate, potassium peroxonitrate, or Peroxophosphoric acid such as its salts, sodium peroxophosphate, potassium peroxophosphate, ammonium peroxophosphate or its salts, peroxoboric acid such as sodium peroxoborate, potassium peroxoborate , Peroxochromates such as potassium peroxochromate and sodium peroxochromate, permanganates such as potassium permanganate and sodium permanganate, sodium perchlorate, potassium perchlorate, chloric acid, hypochlorite Acid, sodium periodate, potassium periodate, iodic acid, halogen acid such as sodium iodate or derivatives thereof, iron (III) chloride,
An inorganic acid metal salt such as iron (III) sulfate can be used. As the organic oxidizing agent, percarboxylic acids such as peracetic acid, performic acid and perbenzoic acid, peroxides such as t-butyl peroxide and cumene peroxide, and iron (III) citrate can be used. Of these, inorganic oxidizers are preferred when the polishing rate improvement property, availability, and handleability such as water solubility are compared. Furthermore, in view of environmental problems, an inorganic peroxide containing no heavy metal is preferable. Also,
From the viewpoint of preventing surface contamination of the substrate to be polished, hydrogen peroxide, peroxosulfates, halogen acids or derivatives thereof are more preferable, and hydrogen peroxide is particularly preferable. These peroxides may be used alone or in combination of two or more.

The content of the oxidizing agent is preferably 0.002% by weight or more, more preferably 0.005% by weight or more, and further preferably 0.
007% by weight or more, particularly preferably 0.01% by weight or more. From the viewpoint of surface quality and economy, it is preferably 20% by weight or less, more preferably 15% by weight or less, and still more preferably 10% by weight.
Hereinafter, it is particularly preferably 5% by weight or less. That is, the content of the oxidizing agent in the polishing composition is preferably 0.002 to 20% by weight, more preferably 0.005 to 15% by weight, and still more preferably 0.007.
-10% by weight, particularly preferably 0.01-5% by weight.

The polishing composition of the present invention preferably further contains an acid from the viewpoints of improving the polishing rate and reducing waviness.

The acid used in the present invention has a pK1 of preferably 7 or less, more preferably 5 or less, still more preferably 3 or less, and particularly preferably 2 or less from the viewpoint of improving the polishing rate and reducing waviness. Here, pK1 is the logarithm of the reciprocal of the first acid dissociation constant, when the logarithm of the reciprocal of the acid dissociation constant (25 ° C.) is expressed as pKa. PK1 of each compound is revised, for example, in Chemical Handbook 4
Edition (Basic) II, pp316-325 (The Chemical Society of Japan).

Specific examples of the acid used in the present invention are shown below. Inorganic compounds include monovalent mineral acids such as nitric acid, hydrochloric acid, perchloric acid, amidosulfuric acid, sulfuric acid, sulfurous acid, phosphoric acid, pyrophosphoric acid, polyphosphoric acid,
Examples thereof include polyvalent mineral acids such as phosphonic acid and phosphinic acid. Organic compounds include formic acid, acetic acid, glycolic acid, lactic acid, propanoic acid, hydroxypropanoic acid, butyric acid, benzoic acid, glycine and other monocarboxylic acids, oxalic acid, succinic acid, glutaric acid, adipic acid, maleic acid, fumaric acid Acid, itaconic acid, malic acid, tartaric acid, citric acid, isocitric acid, phthalic acid, polyvalent carboxylic acids such as nitrotriacetic acid, ethylenediaminetetraacetic acid, alkylsulfonic acids such as methanesulfonic acid and paratoluenesulfonic acid, ethylphosphoric acid, butylphosphorus Examples thereof include alkylphosphoric acids such as acids, phosphonohydroxyacetic acid, hydroxytylidenediphosphonic acid, phosphonobutanetricarboxylic acid, and phosphonic acids such as ethylenediaminetetramethylenephosphonic acid. Of these, polyvalent acids are preferable from the viewpoint of improving the polishing rate and reducing waviness, more preferably polyvalent mineral acids, polyvalent organic carboxylic acids and polyvalent organic phosphonic acids, most preferably polyvalent mineral acids and polyvalent acids. Divalent organic carboxylic acid. Here, the polyvalent acid represents an acid having two or more hydrogen atoms capable of generating hydrogen ions in the molecule. Further, nitric acid, sulfuric acid, sulfonic acid and carboxylic acid are preferable from the viewpoint of preventing surface contamination of the object to be polished.

Although the said acid may be used independently, it is preferable to mix 2 or more types. In particular, when polishing a metal surface such as a Ni-P plated substrate, when the metal ions of the object to be polished are eluted during polishing and the pH of the polishing composition rises and a high polishing rate cannot be obtained, the pH changes. P to reduce
A combination of an acid having a K1 of less than 2.5 and an acid having a pK1 of 2.5 or more is preferred.
A combination of an acid having 5 or less and an acid having a pK1 of 2.5 or more is more preferable. In the case of containing such two or more acids, in consideration of improvement in polishing rate, reduction in waviness, and availability, pK1
Among acids having a pH of less than 2.5, it is preferable to use mineral acids such as nitric acid, sulfuric acid, phosphoric acid and polyphosphoric acid, and organic phosphones. On the other hand, as an acid having a pK1 of 2.5 or more, acetic acid,
Organic carboxylic acids such as succinic acid, malic acid, tartaric acid and citric acid are preferred.

The acid content is preferably 0.002% by weight or more, more preferably 0.005% by weight or more, and still more preferably 0.007% in the polishing composition from the viewpoint of improving the polishing rate and reducing waviness.
% By weight or more, particularly preferably 0.01% by weight or more. From the viewpoint of surface quality and economy, it is preferably 20% by weight or less, more preferably 15% by weight or less, still more preferably 10% by weight or less, and particularly preferably 5% by weight or less. That is, the acid content in the polishing composition is preferably
It is 0.002 to 20% by weight, more preferably 0.005 to 15% by weight, still more preferably 0.007 to 10% by weight, and particularly preferably 0.01 to 5% by weight. From the viewpoint of improving the polishing rate, the weight ratio of an acid having a pK1 of less than 2.5 and an acid having a pK1 of 2.5 or more [(an acid having a pK1 of less than 2.5) / (pK1 of 2
. 5 or more acids)] is preferably 9/1 to 1/9, more preferably 7/1 to 1/7, and 5/1.
~ 1/5 is more preferable.

Water in the polishing composition of the present invention is used as a medium, and the content thereof is preferably 50 to 99% by weight, more preferably 60 to 97, from the viewpoint of efficiently polishing an object to be polished. % By weight, more preferably 70 to 95% by weight.

Further, the polishing composition of the present invention can further contain other components according to the purpose of improving the polishing rate, reducing waviness, and other purposes. For example, inorganic salts, thickeners, rust inhibitors, bases For example. Examples of inorganic salts include ammonium nitrate, ammonium sulfate, potassium sulfate, nickel sulfate, aluminum nitrate, aluminum sulfate, and ammonium sulfamate. These components may be used alone or in combination of two or more. Further, the content is preferably 0.05 to 20% by weight, more preferably 0.05 to 10% by weight, and still more preferably 0.05 to 5% by weight in the polishing composition from the viewpoint of economy. .

Furthermore, a disinfectant, an antibacterial agent, etc. can be mix | blended as another component as needed. The content of these bactericides and antibacterial agents is 0.0001 to 0.1% by weight, more preferably 0.001 to 0.05% by weight in the polishing liquid composition, more preferably 0.001 to 0.05% by weight, more preferably from the viewpoints of exerting functions, effects on polishing performance, and economic aspects Is 0.002 to 0.02% by weight.

In addition, although each component density | concentration of the polishing liquid composition of this invention is a density | concentration preferable at the time of grinding | polishing, it may be a density | concentration at the time of manufacture of this composition. Usually, the composition is produced as a concentrated solution and is often diluted before use or during use.

  The polishing composition can be produced by adding and mixing the target components by any method.

The pH of the polishing composition is preferably determined as appropriate according to the type of the object to be polished and the required quality. For example, the pH of the polishing composition is preferably less than 7, preferably 0.1 to 6, more preferably 0.5, from the viewpoints of polishing rate, waviness reduction, corrosion prevention of processing machines, and operator safety. -5, particularly preferably 1-4, and most preferably 1-3. The pH
If necessary, inorganic acids such as nitric acid and sulfuric acid, oxycarboxylic acids, organic acids such as polycarboxylic acids, aminopolycarboxylic acids, amino acids, and metal salts and ammonium salts thereof, ammonia, sodium hydroxide, potassium hydroxide It can be adjusted by blending a basic substance such as an amine in a desired amount as appropriate.

The manufacturing method of the board | substrate of this invention has the process of grind | polishing a to-be-polished board | substrate using the said polishing liquid composition.

The material of the object to be polished typified by the substrate to be polished, which is the subject of the present invention, is, for example, a metal or semi-metal such as silicon, aluminum, nickel, tungsten, copper, tantalum, titanium, and these metals as a main component. And glassy materials such as glass, glassy carbon, and amorphous carbon, ceramic materials such as alumina, silicon dioxide, silicon nitride, tantalum nitride, and titanium nitride, resins such as polyimide resin, and the like. Among these, metals such as aluminum, nickel, tungsten, and copper, and alloys containing these metals as main components are objects to be polished, or semiconductor substrates such as semiconductor elements containing these metals are objects to be polished. It is suitable for. In particular, when the polishing composition of the present invention is applied to a substrate made of a Ni—P plated aluminum alloy, the undulation can be remarkably reduced, which is preferable. The shape of the object to be polished is not particularly limited, for example, a shape having a flat portion such as a disk shape, a plate shape, a slab shape, a prism shape,
A shape having a curved surface portion such as a lens is an object of polishing using the polishing composition of the present invention. Among these, it is particularly excellent for polishing a disk-shaped workpiece.

The present invention also relates to a method for reducing waviness of the substrate to be polished. In the method for reducing waviness of a substrate to be polished using the polishing composition of the present invention, the waviness can be remarkably reduced by polishing the substrate to be polished mentioned above with the polishing composition of the present invention. For example, by sandwiching the substrate with a polishing machine with a porous organic polymer polishing cloth or the like attached thereto, supplying the polishing composition of the present invention to the polishing surface, and moving the polishing machine or substrate while applying pressure A high-quality substrate with reduced undulation can be manufactured.

The polishing composition of the present invention is suitably used for polishing precision component substrates. For example, it is suitable for polishing a substrate of a magnetic recording medium such as a magnetic disk, an optical disk, and a magneto-optical disk, a photomask substrate, an optical lens, an optical mirror, an optical prism, and a semiconductor substrate. Polishing of a semiconductor substrate includes polishing performed in a silicon wafer (bare wafer) polishing process, a buried element isolation film forming process, an interlayer insulating film flattening process, a buried metal wiring forming process, a buried capacitor forming process, and the like. Although it is particularly effective in the polishing process, it can be similarly applied to other polishing processes such as a lapping process. The polishing composition of the present invention is particularly suitable for polishing a magnetic disk substrate.

Examples 1 to 17 and Comparative Examples 1 to 5 (However, Examples 1, 11 and 15 to 17 are reference examples.)
[Polishing method]
Α-alumina (average primary particle size 0.07 μm, secondary particle average particle size 0.3 μm, specific surface area 15 m ² / g, purity 99.9%), θ-alumina (average of secondary particles) shown in Tables 1-3 particle size 0.2 [mu] m, a specific surface area of 120 m ² / g, 99.9% purity), a predetermined amount of an oxidizing agent and an acid or other additives, the residue with ammonia to pH adjustment with stirring mixture as an ion-exchanged water polishing A liquid composition was obtained.

[Polishing method]
Rank Taylor Hobson's tally step (stylus tip size: 25μm x 25μm,
Centerline average roughness Ra measured by high-pass filter: 80μm, measurement length: 0.64mm)
Polishing the surface of a substrate made of Ni-P plated aluminum alloy with a thickness of 0.2 μm, thickness 1.27 mm, and 3.5 inches with a double-sided machine under the following double-sided machine setting conditions, and used as a substrate for magnetic recording media A polished product of the Ni-P plated aluminum alloy substrate was obtained.

The setting conditions for the double-sided machine are shown below.
<Setting conditions of double-sided machine>
Double-sided processing machine: Speed Farm Co., Ltd., 9B type double-sided processing machine Processing pressure: 9.8kPa
Polishing pad: “H9900S” (trade name) manufactured by Fujibow Corporation
Plate rotation speed: 50r / min
Polishing liquid composition supply flow rate: 100ml / min
Polishing time: 5min
Number of substrates loaded: 10

[Polishing speed]
Weigh each substrate before and after polishing (measured by “BP-210S” manufactured by Sartorius) to determine the change in the weight of each substrate. The average value of 10 substrates is taken as the reduction amount and divided by the polishing time. The value was used as the weight reduction rate. The weight reduction rate was introduced into the following equation and converted to a polishing rate (μm / min).
The relative value (relative speed) of the polishing rate of each experimental example was determined with the polishing rate of Comparative Example 1 as the reference value 1.
Weight reduction rate (g / min) = {weight before polishing (g) −weight after polishing (g)}
/ Polishing time (min)
Polishing rate (μm / min) = Weight reduction rate (g / min) / Substrate single side area (mm ² )
/ Ni-P plating density (g / cm ³ ) × 10 ⁶

[undulation]
Each substrate after polishing was measured under the following conditions.
Equipment: "Zygo NewView200"
Lens: 2.5x "Micheison"
Zoom ratio: 0.5
Remove: Cylinder
Filter: FFT Fixed Band Pass
Short wavelength swell 50-500 μm
Long wave swell 0.5 to 5mm
Area: 4.33mm x 5.77mm

[Surface contamination]
Each substrate after polishing was washed with detergent water and ion-exchanged water using a PVA pad with a single wafer washer, then observed with a polarizing microscope at 300 times, and the surface contamination was evaluated in four stages.
A: No alumina residue or polishing debris is seen on the surface.
○: Almost no alumina residue or polishing waste is observed on the surface.
(Triangle | delta): Alumina residue and grinding | polishing waste are seen in some places on the surface.
X: Many alumina residues and polishing debris are observed on the surface.

Tables 1 and 2 show the results. The values of polishing rate and waviness were relative values with the value of Comparative Example 1 as the reference value 1. Compared with the comparative example, it can be seen that the polishing liquid compositions obtained in Examples 1 to 12 having α-alumina, intermediate alumina, and oxidizing agent are extremely excellent in both performance of improving the polishing rate and reducing waviness. In particular, when an acid is added, the effect is remarkable. Moreover, it turns out that the polishing liquid composition obtained in Examples 1-12 also has the stain | pollution | contamination prevention effect of a to-be-polished substrate.

Table 3 shows the results when the pH is higher than that in Table 1 in consideration of safety to the human body and corrosivity to the machine. It can be seen that the polishing liquid compositions obtained in Examples 13 to 17 are superior to those of Comparative Example 1 in both improvement in polishing rate and reduction in waviness. In the case of a single acid (Example 13)
14), it can also be seen that the effect of improving the polishing rate and reducing the waviness is further enhanced when two kinds of acids, for example, carboxylic acids and sulfuric acid, which is a mineral acid, are used in combination as in Examples 15-17. Moreover, it turns out that all the polishing liquid compositions obtained in Examples 13 to 17 also have a stain preventing effect on the substrate to be polished.

The polishing composition of the present invention is used for polishing precision component substrates, for example, magnetic recording media such as magnetic disks, optical disks, and magneto-optical disks, photomask substrates, optical lenses, optical mirrors, optical prisms, and semiconductor substrates. Can be applied to.

Claims (5)

Average particle diameter of α- alumina 0.1 to 0.5 [mu] m 0.05 to 40 wt% of the secondary particles, the average particle diameter of the secondary particles is an intermediate alumina 0.1 to 0.5 [mu] m 0.05 A polishing liquid composition having a pH of 0.1 to 2.2 containing ˜40 wt% hydrogen peroxide, 0.01 to 5 wt% acid, and water, and the weight of α-alumina and intermediate alumina ratio (alpha-alumina / transition alumina) is 99 / 1-1 / 3, which is a type of acid mineral acids, selected from citric acid and either Ranaru group methanesulfonic acid, the polishing composition for a magnetic disk substrate . The polishing liquid composition according to claim 1, wherein the polishing liquid composition has a pH of 0.1 to 0.8 and the acid is any one of sulfuric acid and methanesulfonic acid . The polishing composition according to claim 1 or 2 , wherein the content of hydrogen peroxide is 0.002 to 20% by weight. Claim 1-3 by using the polishing composition according to any method of reducing the waviness of the magnetic disk substrate. A method for producing a magnetic disk substrate, comprising a step of polishing a substrate to be polished using the polishing composition according to any one of claims 1 to 3 .