JP5030252B2 - 圧電アクチュエータ、圧電アクチュエータの製造方法及び液体吐出ヘッド - Google Patents
圧電アクチュエータ、圧電アクチュエータの製造方法及び液体吐出ヘッド Download PDFInfo
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- JP5030252B2 JP5030252B2 JP2005174155A JP2005174155A JP5030252B2 JP 5030252 B2 JP5030252 B2 JP 5030252B2 JP 2005174155 A JP2005174155 A JP 2005174155A JP 2005174155 A JP2005174155 A JP 2005174155A JP 5030252 B2 JP5030252 B2 JP 5030252B2
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- 238000003980 solgel method Methods 0.000 claims description 3
- 238000007740 vapor deposition Methods 0.000 claims description 2
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 16
- 229910052814 silicon oxide Inorganic materials 0.000 description 16
- 238000010438 heat treatment Methods 0.000 description 15
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 14
- 229910052710 silicon Inorganic materials 0.000 description 14
- 239000010703 silicon Substances 0.000 description 14
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 11
- 239000000203 mixture Substances 0.000 description 9
- 230000015572 biosynthetic process Effects 0.000 description 8
- 238000005530 etching Methods 0.000 description 8
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- 229910052786 argon Inorganic materials 0.000 description 6
- 238000001514 detection method Methods 0.000 description 6
- 238000001035 drying Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 4
- 238000005192 partition Methods 0.000 description 4
- 229920002120 photoresistant polymer Polymers 0.000 description 4
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
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- 230000000873 masking effect Effects 0.000 description 3
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- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
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- 238000001179 sorption measurement Methods 0.000 description 2
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- 239000010409 thin film Substances 0.000 description 2
- 238000011144 upstream manufacturing Methods 0.000 description 2
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 229910002659 PbMg1/3Nb2/3O3 Inorganic materials 0.000 description 1
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 229910052787 antimony Inorganic materials 0.000 description 1
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 description 1
- -1 argon ions Chemical class 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- ONRPGGOGHKMHDT-UHFFFAOYSA-N benzene-1,2-diol;ethane-1,2-diamine Chemical compound NCCN.OC1=CC=CC=C1O ONRPGGOGHKMHDT-UHFFFAOYSA-N 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
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- 238000001659 ion-beam spectroscopy Methods 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
- 229910052758 niobium Inorganic materials 0.000 description 1
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
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- 238000005488 sandblasting Methods 0.000 description 1
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- 229910052715 tantalum Inorganic materials 0.000 description 1
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 1
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- General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
- Particle Formation And Scattering Control In Inkjet Printers (AREA)
Description
Claims (6)
- 基材と、
前記基材上に形成された柱状の結晶体を含む複数の層から構成された圧電膜であって、前記柱状の結晶体の長さ方向に沿う直線と前記基材の法線とのなす角が0°より大きく、90°以下の所定の角度である圧電膜とを備え、
前記複数の層のうち少なくとも2つの層の間において、各層の結晶体の長さ方向に沿う直線と前記基材の法線とによって張られる平面の前記法線回りの角度が異なることを特徴とする圧電アクチュエータ。 - 前記複数の層の結晶体の長さ方向に沿う直線と前記基材の法線とによって張られる平面が1層ごとに90°回転していることを特徴とする請求項1記載の圧電アクチュエータ。
- 前記圧電膜は、前記基材上にスパッタ法、蒸着法、MOCVD法又はゾル・ゲル法によって成膜されていることを特徴とする請求項1又は2記載の圧電アクチュエータ。
- 前記所定の角度は、45°以下であることを特徴とする請求項3記載の圧電アクチュエータ。
- 請求項1から4のいずれか1項記載の圧電アクチュエータを備えることを特徴とする液体吐出ヘッド。
- (a)基材と、圧電体材料からなるターゲット材とのなす角が0°より大きく、90°以下の所定の角度となるように保持するステップと、
(b)前記ターゲット材をスパッタして、前記基材上に前記圧電体材料を堆積させ、層を形成するステップと、
(c)前記基材と前記ターゲット材とを相対的に回転させるステップと、
(d)前記ステップ(b)から(c)を繰り返すことにより、複数の層からなる圧電膜であって、前記複数の層のうち少なくとも2つの層の間において、各層の結晶体の長さ方向に沿う直線と前記基材の法線とによって張られる平面の前記法線回りの角度が異なる圧電膜を、前記基材上に成膜するステップと、
を備えることを特徴とする圧電アクチュエータの製造方法。
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JP5030252B2 true JP5030252B2 (ja) | 2012-09-19 |
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JP4993294B2 (ja) * | 2007-09-05 | 2012-08-08 | 富士フイルム株式会社 | ペロブスカイト型酸化物、強誘電体膜とその製造方法、強誘電体素子、及び液体吐出装置 |
JP5597368B2 (ja) * | 2009-07-29 | 2014-10-01 | 京セラ株式会社 | 積層型電子部品およびその製法 |
CN107369756A (zh) * | 2017-07-24 | 2017-11-21 | 中国工程物理研究院电子工程研究所 | 一种全集成压电驱动装置及其制备方法 |
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JPH1117125A (ja) * | 1997-06-25 | 1999-01-22 | Matsushita Electric Ind Co Ltd | 半導体記憶装置 |
JP3732631B2 (ja) * | 1997-09-29 | 2006-01-05 | 株式会社日立製作所 | 強誘電体素子および半導体装置 |
JP4122564B2 (ja) * | 1998-04-24 | 2008-07-23 | セイコーエプソン株式会社 | 圧電体素子、インクジェット式記録ヘッドおよびそれらの製造方法 |
JP3644267B2 (ja) * | 1998-08-12 | 2005-04-27 | セイコーエプソン株式会社 | 圧電アクチュエータの製造方法及びインクジェット式記録ヘッドの製造方法 |
JP2000357826A (ja) * | 1999-04-13 | 2000-12-26 | Seiko Epson Corp | 圧電体素子の製造方法、圧電体素子、インクジェット式記録ヘッドおよびプリンタ |
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