JP4990435B2 - 浮遊プレート電圧モニタ - Google Patents

浮遊プレート電圧モニタ Download PDF

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Publication number
JP4990435B2
JP4990435B2 JP2000612761A JP2000612761A JP4990435B2 JP 4990435 B2 JP4990435 B2 JP 4990435B2 JP 2000612761 A JP2000612761 A JP 2000612761A JP 2000612761 A JP2000612761 A JP 2000612761A JP 4990435 B2 JP4990435 B2 JP 4990435B2
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JP
Japan
Prior art keywords
voltage
ion
operational amplifier
conductive surface
circuit
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Expired - Lifetime
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JP2000612761A
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English (en)
Japanese (ja)
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JP2003508725A5 (enExample
JP2003508725A (ja
Inventor
ウイリアムズ、ブルース・ティー
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Publication of JP4990435B2 publication Critical patent/JP4990435B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/24—Arrangements for measuring quantities of charge
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2000612761A 1999-04-21 2000-04-21 浮遊プレート電圧モニタ Expired - Lifetime JP4990435B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13033199P 1999-04-21 1999-04-21
US60/130,331 1999-04-21
PCT/US2000/010791 WO2000063707A1 (en) 1999-04-21 2000-04-21 Floating plate voltage monitor

Publications (3)

Publication Number Publication Date
JP2003508725A JP2003508725A (ja) 2003-03-04
JP2003508725A5 JP2003508725A5 (enExample) 2006-12-28
JP4990435B2 true JP4990435B2 (ja) 2012-08-01

Family

ID=22444187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000612761A Expired - Lifetime JP4990435B2 (ja) 1999-04-21 2000-04-21 浮遊プレート電圧モニタ

Country Status (5)

Country Link
US (1) US6433552B1 (enExample)
EP (1) EP1192474B1 (enExample)
JP (1) JP4990435B2 (enExample)
CN (1) CN1184485C (enExample)
WO (1) WO2000063707A1 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6985346B2 (en) * 2003-01-29 2006-01-10 Credence Technologies, Inc. Method and device for controlling ionization
KR101236856B1 (ko) * 2004-10-29 2013-02-26 트렉 인코포레이티드 이온 밸런스 모니터
US7439746B2 (en) * 2006-10-27 2008-10-21 Trek, Inc. Electrostatic voltmeter
ES2338975B1 (es) * 2008-11-12 2011-03-11 Instituto De Tecnologia Electrica, Ite Sensor de campo electrico.
CN101881791B (zh) * 2009-04-30 2015-08-05 日置电机株式会社 电压检测装置
CN104237620B (zh) * 2009-04-30 2017-04-12 日置电机株式会社 电压检测装置
JP2012103056A (ja) * 2010-11-09 2012-05-31 Hugle Electronics Inc チャージプレートモニタ
JP5909785B2 (ja) * 2010-12-07 2016-04-27 デスコ インダストリーズ， インコーポレイテッド イオン平衡測定及び調整のための遮蔽されたコンデンサ回路を有する電離平衡装置
WO2013085952A1 (en) 2011-12-08 2013-06-13 3M Innovative Properties Company An ionization monitoring device and method
CN104267064A (zh) * 2014-09-04 2015-01-07 兰州空间技术物理研究所 一种用于航天器表面电位在轨监测的传感器
CN104237605B (zh) * 2014-09-04 2018-01-09 兰州空间技术物理研究所 一种高压静电电压测量装置
JP6296965B2 (ja) * 2014-11-28 2018-03-20 株式会社アドバンテスト 電流測定回路および塩基配列解析装置
CN105445526B (zh) * 2015-11-20 2018-10-12 国家电网公司 一种运行条件下单芯电缆绝缘泄漏电流的测量结构
FR3045160A1 (fr) * 2015-12-09 2017-06-16 Teqoya Dispositif de mesure de charges electriques faibles, notamment ions.
CN105785246B (zh) * 2016-04-25 2018-08-03 国网江苏省电力公司电力科学研究院 用于超高压电力电缆绝缘诊断的带电检测及在线监测装置
CN206583996U (zh) * 2016-11-25 2017-10-24 上海荣威塑胶工业有限公司 接地检测装置及水池系统
US10548206B2 (en) 2017-09-05 2020-01-28 International Business Machines Corporation Automated static control
CN111404505B (zh) * 2020-04-24 2023-05-26 北京卫星环境工程研究所 一种用于空间低能等离子体探测器的电压放大器装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4370616A (en) * 1980-08-15 1983-01-25 Williams Bruce T Low impedance electrostatic detector
US4433297A (en) * 1981-06-22 1984-02-21 Xerox Corporation Time averaged amplitude comparison electrometer
US4835461A (en) * 1984-04-13 1989-05-30 Xerox Corporation Microdeflector probe for electrostatic voltmeter
US4716371A (en) 1985-07-22 1987-12-29 The Simco Company, Inc. Non-contact autoranging electrostatic fieldmeter with automatic distance indicator
US4928057A (en) * 1986-10-28 1990-05-22 Williams Bruce T High speed D.C. non-contacting electrostatic voltage follower
US4740862A (en) * 1986-12-16 1988-04-26 Westward Electronics, Inc. Ion imbalance monitoring device
US4809127A (en) * 1987-08-11 1989-02-28 Ion Systems, Inc. Self-regulating air ionizing apparatus
US5016136A (en) * 1989-02-17 1991-05-14 Semtronics Corporation Charge build-up and decay monitor
DE4231905C2 (de) * 1992-09-18 1999-05-20 Stiehl Hans Henrich Dr Vorrichtung zur Messung von Ionen in einem Gas
JPH09280806A (ja) * 1996-04-09 1997-10-31 Nissan Motor Co Ltd 静電容量式変位計
US5886528A (en) * 1996-09-10 1999-03-23 Monroe Electronics, Inc. Electrostatic voltage metering apparatus
US6130815A (en) * 1997-11-10 2000-10-10 Ion Systems, Inc. Apparatus and method for monitoring of air ionization

Also Published As

Publication number Publication date
US6433552B1 (en) 2002-08-13
EP1192474A1 (en) 2002-04-03
WO2000063707A1 (en) 2000-10-26
EP1192474B1 (en) 2012-05-23
JP2003508725A (ja) 2003-03-04
CN1184485C (zh) 2005-01-12
WO2000063707A9 (en) 2002-06-06
HK1050566A1 (en) 2003-06-27
CN1375061A (zh) 2002-10-16
EP1192474A4 (en) 2006-08-09

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