CN1184485C - 浮动平板电压监视器 - Google Patents
浮动平板电压监视器 Download PDFInfo
- Publication number
- CN1184485C CN1184485C CNB008092389A CN00809238A CN1184485C CN 1184485 C CN1184485 C CN 1184485C CN B008092389 A CNB008092389 A CN B008092389A CN 00809238 A CN00809238 A CN 00809238A CN 1184485 C CN1184485 C CN 1184485C
- Authority
- CN
- China
- Prior art keywords
- voltage
- amplifier
- surveillance
- ion
- ionic conduction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/24—Arrangements for measuring quantities of charge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0061—Measuring currents of particle-beams, currents from electron multipliers, photocurrents, ion currents; Measuring in plasmas
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13033199P | 1999-04-21 | 1999-04-21 | |
| US60/130,331 | 1999-04-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1375061A CN1375061A (zh) | 2002-10-16 |
| CN1184485C true CN1184485C (zh) | 2005-01-12 |
Family
ID=22444187
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB008092389A Expired - Lifetime CN1184485C (zh) | 1999-04-21 | 2000-04-21 | 浮动平板电压监视器 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6433552B1 (enExample) |
| EP (1) | EP1192474B1 (enExample) |
| JP (1) | JP4990435B2 (enExample) |
| CN (1) | CN1184485C (enExample) |
| WO (1) | WO2000063707A1 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6985346B2 (en) * | 2003-01-29 | 2006-01-10 | Credence Technologies, Inc. | Method and device for controlling ionization |
| KR101236856B1 (ko) * | 2004-10-29 | 2013-02-26 | 트렉 인코포레이티드 | 이온 밸런스 모니터 |
| US7439746B2 (en) * | 2006-10-27 | 2008-10-21 | Trek, Inc. | Electrostatic voltmeter |
| ES2338975B1 (es) * | 2008-11-12 | 2011-03-11 | Instituto De Tecnologia Electrica, Ite | Sensor de campo electrico. |
| CN101881791B (zh) * | 2009-04-30 | 2015-08-05 | 日置电机株式会社 | 电压检测装置 |
| CN104237620B (zh) * | 2009-04-30 | 2017-04-12 | 日置电机株式会社 | 电压检测装置 |
| JP2012103056A (ja) * | 2010-11-09 | 2012-05-31 | Hugle Electronics Inc | チャージプレートモニタ |
| JP5909785B2 (ja) * | 2010-12-07 | 2016-04-27 | デスコ インダストリーズ, インコーポレイテッド | イオン平衡測定及び調整のための遮蔽されたコンデンサ回路を有する電離平衡装置 |
| WO2013085952A1 (en) | 2011-12-08 | 2013-06-13 | 3M Innovative Properties Company | An ionization monitoring device and method |
| CN104267064A (zh) * | 2014-09-04 | 2015-01-07 | 兰州空间技术物理研究所 | 一种用于航天器表面电位在轨监测的传感器 |
| CN104237605B (zh) * | 2014-09-04 | 2018-01-09 | 兰州空间技术物理研究所 | 一种高压静电电压测量装置 |
| JP6296965B2 (ja) * | 2014-11-28 | 2018-03-20 | 株式会社アドバンテスト | 電流測定回路および塩基配列解析装置 |
| CN105445526B (zh) * | 2015-11-20 | 2018-10-12 | 国家电网公司 | 一种运行条件下单芯电缆绝缘泄漏电流的测量结构 |
| FR3045160A1 (fr) * | 2015-12-09 | 2017-06-16 | Teqoya | Dispositif de mesure de charges electriques faibles, notamment ions. |
| CN105785246B (zh) * | 2016-04-25 | 2018-08-03 | 国网江苏省电力公司电力科学研究院 | 用于超高压电力电缆绝缘诊断的带电检测及在线监测装置 |
| CN206583996U (zh) * | 2016-11-25 | 2017-10-24 | 上海荣威塑胶工业有限公司 | 接地检测装置及水池系统 |
| US10548206B2 (en) | 2017-09-05 | 2020-01-28 | International Business Machines Corporation | Automated static control |
| CN111404505B (zh) * | 2020-04-24 | 2023-05-26 | 北京卫星环境工程研究所 | 一种用于空间低能等离子体探测器的电压放大器装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4370616A (en) * | 1980-08-15 | 1983-01-25 | Williams Bruce T | Low impedance electrostatic detector |
| US4433297A (en) * | 1981-06-22 | 1984-02-21 | Xerox Corporation | Time averaged amplitude comparison electrometer |
| US4835461A (en) * | 1984-04-13 | 1989-05-30 | Xerox Corporation | Microdeflector probe for electrostatic voltmeter |
| US4716371A (en) | 1985-07-22 | 1987-12-29 | The Simco Company, Inc. | Non-contact autoranging electrostatic fieldmeter with automatic distance indicator |
| US4928057A (en) * | 1986-10-28 | 1990-05-22 | Williams Bruce T | High speed D.C. non-contacting electrostatic voltage follower |
| US4740862A (en) * | 1986-12-16 | 1988-04-26 | Westward Electronics, Inc. | Ion imbalance monitoring device |
| US4809127A (en) * | 1987-08-11 | 1989-02-28 | Ion Systems, Inc. | Self-regulating air ionizing apparatus |
| US5016136A (en) * | 1989-02-17 | 1991-05-14 | Semtronics Corporation | Charge build-up and decay monitor |
| DE4231905C2 (de) * | 1992-09-18 | 1999-05-20 | Stiehl Hans Henrich Dr | Vorrichtung zur Messung von Ionen in einem Gas |
| JPH09280806A (ja) * | 1996-04-09 | 1997-10-31 | Nissan Motor Co Ltd | 静電容量式変位計 |
| US5886528A (en) * | 1996-09-10 | 1999-03-23 | Monroe Electronics, Inc. | Electrostatic voltage metering apparatus |
| US6130815A (en) * | 1997-11-10 | 2000-10-10 | Ion Systems, Inc. | Apparatus and method for monitoring of air ionization |
-
2000
- 2000-04-21 CN CNB008092389A patent/CN1184485C/zh not_active Expired - Lifetime
- 2000-04-21 WO PCT/US2000/010791 patent/WO2000063707A1/en not_active Ceased
- 2000-04-21 JP JP2000612761A patent/JP4990435B2/ja not_active Expired - Lifetime
- 2000-04-21 EP EP00930129A patent/EP1192474B1/en not_active Expired - Lifetime
- 2000-04-21 US US09/556,922 patent/US6433552B1/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US6433552B1 (en) | 2002-08-13 |
| EP1192474A1 (en) | 2002-04-03 |
| JP4990435B2 (ja) | 2012-08-01 |
| WO2000063707A1 (en) | 2000-10-26 |
| EP1192474B1 (en) | 2012-05-23 |
| JP2003508725A (ja) | 2003-03-04 |
| WO2000063707A9 (en) | 2002-06-06 |
| HK1050566A1 (en) | 2003-06-27 |
| CN1375061A (zh) | 2002-10-16 |
| EP1192474A4 (en) | 2006-08-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1184485C (zh) | 浮动平板电压监视器 | |
| Laurenceau et al. | New principle for the determination of potential distributions in dielectrics | |
| JPH05240901A (ja) | 液晶表示装置用基板の粒子線式試験方法 | |
| KR850002326A (ko) | 반도체 장치의 정전기 파괴 시험방법 및 장치 | |
| EP2365347A1 (en) | Electrical field sensor | |
| CN206773072U (zh) | 一种非接触测试半绝缘半导体电阻率的装置 | |
| US7317325B2 (en) | Line short localization in LCD pixel arrays | |
| Okubo et al. | Creepage discharge propagation in air and SF/sub 6/gas influenced by surface charge on solid dielectrics | |
| US7439746B2 (en) | Electrostatic voltmeter | |
| KR102344038B1 (ko) | 정전기 방전 테스트 장치 및 방법 | |
| HK1050566B (en) | Floating plate voltage monitor | |
| WO2013187383A1 (ja) | 除電装置 | |
| CN210803599U (zh) | 一种静电检测消除装置 | |
| CN114965660A (zh) | 一种介质材料静电衰减时间一体化测试装置 | |
| WO1991012541A1 (en) | Atmospheric potential measurement device | |
| KR100434525B1 (ko) | 전계방출 표시소자의 특성 측정 시스템 | |
| Batalović et al. | Modeling of Partial Discharge Activity inside the Defects in Power Cable using COMSOL Mph-Matlab Software Platform | |
| US7071674B1 (en) | Micro-electrometer | |
| Zacher | New charged-plate monitor design offers greater flexibility | |
| CN2337558Y (zh) | 多电花产生器 | |
| Kindel et al. | Methods of Wall Charge Determination in External Electrode Gas Discharges. I. Experimental Arrangement | |
| JP2002148297A (ja) | 誘導電位測定方法と装置 | |
| CN120928074A (zh) | 一种电子器件放电敏感特性测试方法和系统 | |
| JPH0627490A (ja) | マトリクス配線基板およびその製造方法 | |
| Laurentie et al. | Contactless electric field and space charge measurement across solid dielectrics: A fully non-intrusive thermal technique |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20050112 |
|
| CX01 | Expiry of patent term |