JP4909554B2 - パターン識別方法 - Google Patents
パターン識別方法 Download PDFInfo
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- JP4909554B2 JP4909554B2 JP2005276407A JP2005276407A JP4909554B2 JP 4909554 B2 JP4909554 B2 JP 4909554B2 JP 2005276407 A JP2005276407 A JP 2005276407A JP 2005276407 A JP2005276407 A JP 2005276407A JP 4909554 B2 JP4909554 B2 JP 4909554B2
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- pattern
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- 238000000034 method Methods 0.000 title claims description 15
- 230000003252 repetitive effect Effects 0.000 claims description 4
- 239000011159 matrix material Substances 0.000 description 24
- 238000005259 measurement Methods 0.000 description 15
- 238000010586 diagram Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000011084 recovery Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000010200 validation analysis Methods 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000009956 central mechanism Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/24—Testing correct operation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
- G01R31/31711—Evaluation methods, e.g. shmoo plots
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31937—Timing aspects, e.g. measuring propagation delay
Description
・さらに、オシロスコープのトリガ帯域幅は、例えば、1.25Gbpsに制限されているので、1.5Gbps及び3Gbpsの帯域幅のシリアルATA信号の如き高帯域幅の信号に用いることができない。
・最後に、波形データベース・モードは、500×200の如く定義されたデータ・マトリクス分解能に制限されている。3Gbps信号にとって、単位インターバル(1クロック・サイクル)は、333.333ピコ秒であるので、20ビット・パターンの取込みは、約7ナノ秒である。このデータ・マトリクスの水平分解能は、約13ピコ秒である。シリアルATA規格の如き規格は、測定を行なうべき範囲、即ち、各ビットの45%及び55%の間であるビットの中央となる各ビットの領域を特定する。よって、33.3ピコ秒(ビットの45%及び55%)に利用できるピークの数は2であるが、これは、正しい電圧レベルを確かめるのに充分ではない。
(1)取り込んだ波形を1及び0、即ち、ビット・ストリームに変換する。
(2)このビット・ストリームから定義済パターン及びタイム・スタンプを識別する。
(3)ビット・ストリームから識別パターンを重ねるか又は重ね合わせる。
(4)重ね合わさったパターン上の各ビットの中央領域(45%〜55%)を識別する。
(5)ビット・ストリーム内のビットの電圧レベル測定を行なう。
[ビットの数]=[交差時間差]/[単位インターバル]
となる。この信号は、1及び0を検出するための最小振幅を有する。2個のしきい値電圧を識別できるようにして、信号が最大しきい値を超えた場合に「1」状態となり、信号が最小しきい値より下がった場合に「0」状態になる。一般的には、これら2個のしきい値を用いて、ノイズや、信号内の他の誤った低レベル変動による偽の状態検出を防ぐ。
Claims (1)
- パターンを識別する方法であって、
繰り返しパターンを含む入力波形信号を取り込むステップと、
取り込んだ上記入力波形信号を2進文字のビット・ストリーム・シーケンスに変換するステップと、
上記ビット・ストリーム・シーケンスから2進文字のビットの定義済パターンを識別するステップと、
上記ビット・ストリーム・シーケンスから識別された上記2進文字の定義済みパターンに対応する上記取り込んだ入力波形信号の部分を重ねて、重ね合わせパターンを形成するステップと、
上記重ね合わせパターンの各ビットの中央領域を識別して測定を行なうステップと
を具えたパターン識別方法。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US61288004P | 2004-09-24 | 2004-09-24 | |
US60/612,880 | 2004-09-24 | ||
US11/196,771 US7493223B2 (en) | 2005-08-02 | 2005-08-02 | Pattern identification and bit level measurements on repetitive patterns |
US11/196,771 | 2005-08-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006133218A JP2006133218A (ja) | 2006-05-25 |
JP4909554B2 true JP4909554B2 (ja) | 2012-04-04 |
Family
ID=35478872
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005276407A Active JP4909554B2 (ja) | 2004-09-24 | 2005-09-22 | パターン識別方法 |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP1643258B1 (ja) |
JP (1) | JP4909554B2 (ja) |
CN (1) | CN1769918B (ja) |
DE (1) | DE602005018299D1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4165580B2 (ja) * | 2006-06-29 | 2008-10-15 | トヨタ自動車株式会社 | 画像処理装置及び画像処理プログラム |
US9215063B2 (en) * | 2013-10-09 | 2015-12-15 | Qualcomm Incorporated | Specifying a 3-phase or N-phase eye pattern |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2681639B2 (ja) * | 1987-10-19 | 1997-11-26 | 株式会社アドバンテスト | アイパターン解析装置 |
EP0448322A3 (en) * | 1990-03-23 | 1992-11-25 | Tektronix, Inc. | Automatic extraction of pulseparametrics from multi-valued functions |
US5295155A (en) * | 1992-10-30 | 1994-03-15 | International Business Machines Corporation | Multi-level digital data regeneration system |
US6374388B1 (en) * | 1999-09-10 | 2002-04-16 | Agilent Technologies, Inc. | Equivalent time capture scheme for bit patterns within high data rate signals |
CN2411489Y (zh) * | 2000-02-22 | 2000-12-20 | 刘哲明 | 频率和占空比简易可测的逻辑测试探头 |
JP3654220B2 (ja) * | 2001-08-22 | 2005-06-02 | セイコーエプソン株式会社 | レンズ検査装置 |
US20030097226A1 (en) * | 2001-11-21 | 2003-05-22 | Synthesys | Apparatus and method for sampling eye diagrams with window comparators |
US7519874B2 (en) * | 2002-09-30 | 2009-04-14 | Lecroy Corporation | Method and apparatus for bit error rate analysis |
US6934647B2 (en) * | 2002-10-22 | 2005-08-23 | Agilent Technologies, Inc. | Efficient sampling of digital waveforms for eye diagram analysis |
US7467336B2 (en) * | 2004-02-02 | 2008-12-16 | Synthesys Research, Inc | Method and apparatus to measure and display data dependent eye diagrams |
-
2005
- 2005-09-22 JP JP2005276407A patent/JP4909554B2/ja active Active
- 2005-09-22 EP EP20050255893 patent/EP1643258B1/en active Active
- 2005-09-22 DE DE200560018299 patent/DE602005018299D1/de active Active
- 2005-09-26 CN CN 200510107685 patent/CN1769918B/zh active Active
Also Published As
Publication number | Publication date |
---|---|
CN1769918B (zh) | 2010-07-28 |
EP1643258B1 (en) | 2009-12-16 |
DE602005018299D1 (de) | 2010-01-28 |
CN1769918A (zh) | 2006-05-10 |
EP1643258A1 (en) | 2006-04-05 |
JP2006133218A (ja) | 2006-05-25 |
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