JP4898728B2 - 画像形成装置、及び画像形成方法 - Google Patents

画像形成装置、及び画像形成方法 Download PDF

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Publication number
JP4898728B2
JP4898728B2 JP2008070499A JP2008070499A JP4898728B2 JP 4898728 B2 JP4898728 B2 JP 4898728B2 JP 2008070499 A JP2008070499 A JP 2008070499A JP 2008070499 A JP2008070499 A JP 2008070499A JP 4898728 B2 JP4898728 B2 JP 4898728B2
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JP
Japan
Prior art keywords
electromagnetic wave
signal
spatial
modulation
image forming
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Expired - Fee Related
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JP2008070499A
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English (en)
Japanese (ja)
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JP2008275595A (ja
JP2008275595A5 (enExample
Inventor
道徳 塩田
敏彦 尾内
亮太 関口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
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Canon Inc
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Priority to JP2008070499A priority Critical patent/JP4898728B2/ja
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Publication of JP2008275595A5 publication Critical patent/JP2008275595A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2008070499A 2007-04-02 2008-03-19 画像形成装置、及び画像形成方法 Expired - Fee Related JP4898728B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008070499A JP4898728B2 (ja) 2007-04-02 2008-03-19 画像形成装置、及び画像形成方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2007095950 2007-04-02
JP2007095950 2007-04-02
JP2008070499A JP4898728B2 (ja) 2007-04-02 2008-03-19 画像形成装置、及び画像形成方法

Publications (3)

Publication Number Publication Date
JP2008275595A JP2008275595A (ja) 2008-11-13
JP2008275595A5 JP2008275595A5 (enExample) 2011-02-17
JP4898728B2 true JP4898728B2 (ja) 2012-03-21

Family

ID=39795790

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008070499A Expired - Fee Related JP4898728B2 (ja) 2007-04-02 2008-03-19 画像形成装置、及び画像形成方法

Country Status (2)

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US (1) US8053731B2 (enExample)
JP (1) JP4898728B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013134079A (ja) * 2011-12-26 2013-07-08 Seiko Epson Corp テラヘルツカメラ及び電子機器
JP6296681B2 (ja) * 2012-01-19 2018-03-20 キヤノン株式会社 発振素子、発振器及びこれを用いた撮像装置
JP6438872B2 (ja) * 2015-09-30 2018-12-19 浜松ホトニクス株式会社 画像取得装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07123317A (ja) * 1993-10-21 1995-05-12 Canon Inc 防振機能付き撮影装置
US5623145A (en) * 1995-02-15 1997-04-22 Lucent Technologies Inc. Method and apparatus for terahertz imaging
US5710430A (en) * 1995-02-15 1998-01-20 Lucent Technologies Inc. Method and apparatus for terahertz imaging
JPH10241611A (ja) * 1996-12-25 1998-09-11 Kagaku Gijutsu Shinko Jigyodan ２次元ロックイン画像増幅観測装置
JP2001289781A (ja) * 2000-04-07 2001-10-19 Japan Science & Technology Corp 光波鉛直断面トモグラフィー観測装置
US6815683B2 (en) 2002-05-31 2004-11-09 New Jersey Institute Of Technology Terahertz imaging system and method
US20050061977A1 (en) * 2003-09-24 2005-03-24 Carr William N. Radiation sensor with electro-thermal gain
JP4724822B2 (ja) * 2005-06-28 2011-07-13 株式会社アドバンテスト 一体型構造体、測定装置、方法およびプログラム

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Publication number Publication date
JP2008275595A (ja) 2008-11-13
US20080243410A1 (en) 2008-10-02
US8053731B2 (en) 2011-11-08

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