JP4885165B2 - Vacuum adsorption device - Google Patents

Vacuum adsorption device Download PDF

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JP4885165B2
JP4885165B2 JP2008064669A JP2008064669A JP4885165B2 JP 4885165 B2 JP4885165 B2 JP 4885165B2 JP 2008064669 A JP2008064669 A JP 2008064669A JP 2008064669 A JP2008064669 A JP 2008064669A JP 4885165 B2 JP4885165 B2 JP 4885165B2
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基宏 梅津
伸也 佐藤
達也 塩貝
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Taiheiyo Cement Corp
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Description

本発明は、例えば、半導体ウエハやガラス基板等を吸着保持する真空吸着装置に関する。 The present invention relates to a vacuum suction apparatus that holds, for example, a semiconductor wafer or a glass substrate by suction.

従来、例えば半導体装置の製造工程において、半導体ウエハ等の基板を搬送、加工、検査する場合には、真空圧を利用した真空吸着装置が使用され、均一な吸着を行うために、基板を吸着載置する面を多孔質体で形成した真空吸着装置が用いられている。例えば、図1に示したような円板形状の多孔質体からなる載置部11を樹脂またはガラスなどの接着剤により器状の緻密質体からなる支持部13に接合してなり、下方の吸引孔14より真空吸引することにより、上記載置部の載置面に基板Wを吸着するものが提案されている。 Conventionally, when a substrate such as a semiconductor wafer is transported, processed, or inspected in a manufacturing process of a semiconductor device, for example, a vacuum suction device using a vacuum pressure has been used. A vacuum suction device in which a surface to be placed is formed of a porous body is used. For example, a mounting portion 11 made of a disk-shaped porous body as shown in FIG. 1 is joined to a support portion 13 made of a vessel-like dense body with an adhesive such as resin or glass, and It has been proposed that the substrate W is adsorbed on the placement surface of the placement portion by vacuum suction from the suction hole 14.

このような接着剤を使用して載置部と支持部を接合する方法では、接合面となる載置部の底面及び側面、支持部の内面を研削加工する必要があるため、製造コストが割高になるという問題があった。また、支持部と載置部の接合面に加工を施したとしても、載置部と支持部とを接合する際に、接着剤として使用する樹脂、ガラスなどの一部が多孔質体に浸透して接着不良が生じ、接合強度が低下するため、支持部から載置部が外れ、装置の破損を招くという課題があった。 In the method of bonding the mounting portion and the support portion using such an adhesive, it is necessary to grind the bottom surface and side surface of the mounting portion, which becomes the bonding surface, and the inner surface of the support portion. There was a problem of becoming. In addition, even when the joint surface between the support part and the mounting part is processed, when the mounting part and the support part are joined, a part of the resin, glass, etc. used as an adhesive penetrates the porous body. As a result, poor adhesion occurs and bonding strength decreases, so that there is a problem that the mounting portion is detached from the support portion and the device is damaged.

また、加工装置に用いられる真空吸着装置では、研削屑が多孔質体の内部に吸い込まれて目詰まりを起こし、吸着が不均一になったり、研削屑が基板裏面に転移して基板を汚染したりするおそれがあるため、目詰まりした研削屑を除去する必要がある。しかしながら、載置部と支持部との間に隙間があると、載置部の裏面側から洗浄液を注入して多孔質体を洗浄しようとしても、洗浄液の大部分がこの隙間を通過するため、多孔質体を十分に洗浄できなくなるという課題があった。 Also, in vacuum suction devices used in processing equipment, grinding dust is sucked into the porous body, causing clogging, resulting in non-uniform suction, or grinding dust moving to the back of the substrate and contaminating the substrate. Therefore, it is necessary to remove clogged grinding debris. However, if there is a gap between the mounting part and the support part, even when trying to clean the porous body by injecting the cleaning liquid from the back side of the mounting part, the majority of the cleaning liquid passes through this gap, There was a problem that the porous body could not be sufficiently cleaned.

そこで、本出願人は、多孔質体からなる載置部と緻密質体からなる支持部とを具備する真空吸着装置であって、該載置部と該支持部との接合界面が実質的に隙間なく一体的に焼成されてなる真空吸着装置を提案した(特許文献1)。この真空吸着装置は、セラミックス粉末とガラス粉末にアルコール等を加えて混合して得られたスラリーを、支持部の載置部が形成される凹部に充填し、ガラスの軟化点以上の温度で焼成することによって作製される。このような方法によれば、低コストで載置部と支持部とを接合でき、隙間の問題も解消できる。
特開2005−22027号公報
Therefore, the applicant of the present invention is a vacuum adsorption device including a mounting portion made of a porous body and a support portion made of a dense body, wherein the bonding interface between the mounting portion and the support portion is substantially A vacuum suction device that is integrally fired without a gap has been proposed (Patent Document 1). This vacuum adsorption device fills the concave part where the mounting part of the support part is formed with the slurry obtained by adding alcohol etc. to the ceramic powder and glass powder, and fires it at a temperature above the softening point of the glass It is produced by doing. According to such a method, the mounting portion and the support portion can be joined at a low cost, and the problem of the gap can be solved.
JP 2005-22027 A

しかしながら、基板の加工時には、支持部表面13aと基板との間のわずかな隙間から研削液が吸い込まれて載置部が汚染される。しかも、載置部の外周部が集中的に汚染されるため、長期間使用すると洗浄を施しても除去できなくなる問題があった。通常このような真空吸着装置は、表面が汚れたり磨耗したりすると、表面を研削加工して新しい載置面を形成しながら長期間使用されるが、載置部の内部まで研削屑が詰まると使用できなくなるため、載置部内部の目詰まりを防止することが望まれていた。 However, when the substrate is processed, the grinding liquid is sucked from a slight gap between the support portion surface 13a and the substrate, and the placement portion is contaminated. In addition, since the outer peripheral portion of the mounting portion is intensively contaminated, there is a problem that it cannot be removed even after cleaning for a long time. Normally, such a vacuum suction device is used for a long period of time while the surface becomes dirty or worn to form a new mounting surface by grinding the surface. Since it cannot be used, it has been desired to prevent clogging inside the mounting portion.

一方で、近年は基板の大口径化、薄型化に伴って要求される加工精度も高度化しているため、表面の僅かな目詰まりであっても吸着力が不均一になり精度不良を起こすおそれがあり、内部だけでなく表面の目詰まりも問題となってきている。 On the other hand, in recent years, the processing accuracy required as the substrate has become larger and thinner has become more sophisticated, and even if the surface is clogged slightly, the adsorption force becomes non-uniform and may cause inaccuracy. Clogging of the surface as well as the inside has become a problem.

本発明は、かかる事情に鑑みてなされたものであって、載置部の多孔質体の目詰まりを防止し、均一な吸着力を発揮し、装置の長寿命化を可能とすることを目的とする。 The present invention has been made in view of such circumstances, and it is an object of the present invention to prevent clogging of the porous body of the mounting portion, to exhibit a uniform adsorption force, and to extend the life of the apparatus. And

本発明は、上記課題を解決するために、基板を吸着保持するためのセラミックス多孔質体からなる載置部と、
該載置部の周囲を取り囲むセラミックス多孔質体からなる凹型吸引部と、
前記凹型吸引部の気孔に連通する吸引孔を有し、前記凹型吸引部を支持する支持部と、
を備えた真空吸着装置であって、
前記載置部及び前記支持部は、前記凹型吸引部と実質的に隙間なく直接接合されており、
前記凹型吸引部の平均気孔径は前記載置部の平均気孔径よりも大きいことを特徴とする真空吸着装置を提供するものである。
In order to solve the above-described problems, the present invention provides a mounting portion made of a ceramic porous body for adsorbing and holding a substrate;
A concave suction portion made of a ceramic porous body surrounding the mounting portion;
A suction hole communicating with the pores of the concave suction part, and a support part for supporting the concave suction part;
A vacuum adsorption device comprising:
The placing portion and the supporting portion are directly joined to the concave suction portion substantially without a gap,
The vacuum suction device is characterized in that an average pore diameter of the concave suction portion is larger than an average pore diameter of the mounting portion.

本発明では、凹型吸引部を備えているので、載置部の目詰まりを防ぐことができる。また、凹型吸引部は載置部を取り囲むように形成されているため、研削屑が載置部に侵入することを防ぐことができる。また、凹型吸引部の平均気孔径は載置部の平均気孔径よりも大きいため、研削屑が選択的に凹型吸引部に取り込まれ、容易に除去することができる。 In the present invention, since the concave suction portion is provided, clogging of the placement portion can be prevented. Moreover, since the concave suction part is formed so as to surround the placing part, it is possible to prevent grinding waste from entering the placing part. Moreover, since the average pore diameter of the concave suction portion is larger than the average pore diameter of the mounting portion, the grinding dust is selectively taken into the concave suction portion and can be easily removed.

載置部の開気孔率は20%〜50%、その平均気孔径は10μm〜50μmであることが望ましい。このような気孔率及び平均気孔径であれば、載置部に適用できる強度を有し、十分な吸着力で基板を載置できる。 The open porosity of the mounting portion is desirably 20% to 50%, and the average pore diameter is desirably 10 μm to 50 μm. With such a porosity and an average pore diameter, the substrate can be placed with sufficient adsorption power with sufficient strength to be applied to the placement portion.

凹型吸引部の開気孔率は20〜50%、その平均気孔径は50μm〜200μmであることが望ましい。開気孔率については、載置部と同様に強度面から上記範囲が適している。凹型吸引部にも基板の一部が載置されるため、所定の強度が必要となる。開気孔率が50%よりも大きいと強度が弱くなり、それ自体の面精度および基板の加工精度が低下する。逆に開気孔率が20%よりも小さいと研削屑を取り込んだときに目詰まりを起こしやすくなるので好ましくない。 The open porosity of the concave suction part is preferably 20 to 50%, and the average pore diameter is preferably 50 μm to 200 μm. About the open porosity, the said range is suitable from an intensity | strength surface similarly to a mounting part. Since a part of the substrate is also placed on the concave suction part, a predetermined strength is required. When the open porosity is larger than 50%, the strength is weakened, and the surface accuracy of itself and the processing accuracy of the substrate are lowered. Conversely, if the open porosity is less than 20%, clogging is likely to occur when grinding waste is taken in, which is not preferable.

また、多孔質体の載置部に比べて緻密質体の支持部は強度が大きいため、基板を載置して加工したときに支持部に置かれた部分と載置部に載置された部分とで加工後の基板形状に段差が生じる場合がある。これを防ぐには、凹型吸引部の強度を載置部よりも大きく、支持部よりも小さくすることで著しい段差を緩和できる。具体的には、載置部の原料としても用いるセラミックス粉末よりも平均粒径の大きいセラミックス粉末を凹型吸引部の原料に用いて上記所定の気孔率に形成することにより適切な強度にすることができる。 In addition, since the support portion of the dense body has a higher strength than the placement portion of the porous body, the portion placed on the support portion and the placement portion when the substrate is placed and processed are placed on the placement portion. There may be a step in the substrate shape after processing. In order to prevent this, a significant step can be mitigated by making the strength of the concave suction portion larger than the placement portion and smaller than the support portion. Specifically, the ceramic powder having an average particle size larger than that of the ceramic powder used also as the raw material for the mounting portion is used as the raw material for the concave suction portion to form the above-mentioned predetermined porosity so as to obtain an appropriate strength. it can.

さらに、多孔質体の載置部は、基板を吸着載置したときに基板を介して大気圧により載置面が押され変形を起こす。このとき、載置部よりも強度の高い凹型吸引部が載置部を取り囲んで形成されているため、この大気圧による変形を抑制することができる。 Furthermore, the placement surface of the porous body is deformed by the placement surface being pushed by atmospheric pressure through the substrate when the substrate is sucked and placed. At this time, since the concave suction portion having higher strength than the placement portion is formed surrounding the placement portion, the deformation due to the atmospheric pressure can be suppressed.

凹型吸引部の平均気孔径は、50μmよりも小さいと研削屑の目詰まりが生じやすくなる。一方、200μmよりも大きいと、基板吸着時に気孔に基板が追従して加工不良が生じるおそれがある。 If the average pore diameter of the concave suction portion is smaller than 50 μm, clogging of grinding dust tends to occur. On the other hand, if it is larger than 200 μm, the substrate may follow the pores when the substrate is adsorbed, which may cause a processing defect.

凹型吸引部は、基板を研削加工した際に生じる研削屑を、前記凹型吸引部に取り込んだ後に除去することができる。研削屑の取り込みは、基板を載置し吸引する際に行われ、研削屑の除去は、吸引と同時に行っても良いし、洗浄時に別個に行っても良い。 The concave suction part can remove grinding dust generated when the substrate is ground after being taken into the concave suction part. The grinding scraps are taken in when the substrate is placed and sucked, and the grinding scraps may be removed simultaneously with the suction or separately during the cleaning.

上述のように本発明の真空吸着装置によれば、載置部の多孔質体の目詰まりを防止することにより、均一な吸着力を発揮でき、装置の長寿命化を可能となる。 As described above, according to the vacuum suction device of the present invention, by preventing clogging of the porous body of the mounting portion, a uniform suction force can be exhibited and the life of the device can be extended.

以下、本発明の実施の形態について図面を参照しながら説明する。ここでは、基板としてシリコン基板を取り上げて説明する。 Hereinafter, embodiments of the present invention will be described with reference to the drawings. Here, a silicon substrate will be taken up for explanation.

図2は本発明の真空吸着装置20の概略断面図である。真空吸着装置20は、円板状の載置部21と、載置部21の載置面21aを除く全体を取り囲むように設けられた凹型吸引部22と、載置部21および凹型吸引部22を支持する器状の支持部23とを備えている。図2に示すように、シリコン基板Wは、載置面21a、環状に露出した凹型吸引部表面22aおよび支持部表面23aの一部を覆うようにして、真空吸着装置20に吸着保持される。 FIG. 2 is a schematic sectional view of the vacuum suction device 20 of the present invention. The vacuum suction device 20 includes a disk-shaped mounting portion 21, a concave suction portion 22 provided so as to surround the entire mounting surface 21 a of the mounting portion 21, and the mounting portion 21 and the concave suction portion 22. And a vessel-like support portion 23 for supporting the above. As shown in FIG. 2, the silicon substrate W is sucked and held by the vacuum suction device 20 so as to cover the placement surface 21a, the annularly exposed concave suction portion surface 22a, and a part of the support portion surface 23a.

載置部21の開気孔率は20%以上50%以下であることが好ましく、かつ、その平均気孔径は10μm以上50μm以下であることが好ましい。載置部21の開気孔率をこのような範囲とする理由は、前記範囲内であれば、圧損が大きくなって、十分な吸着力を得ることが困難となったり、十分な機械的強度を得ることができなかったり、載置面21aの平坦性が低下したりすることがないためである。また、平均気孔径を前記範囲とするのは、平均気孔径が10μm未満では圧損が大きくなって吸着力が弱くなるおそれがあり、逆に50μm超では載置面21aの面精度が悪化するおそれがあるからである。 The open porosity of the mounting portion 21 is preferably 20% or more and 50% or less, and the average pore diameter is preferably 10 μm or more and 50 μm or less. The reason why the open porosity of the mounting portion 21 is in such a range is that if it is within the above range, the pressure loss becomes large and it becomes difficult to obtain sufficient adsorption force, or sufficient mechanical strength is obtained. This is because it cannot be obtained or the flatness of the mounting surface 21a is not lowered. In addition, the average pore diameter is set in the above range. If the average pore diameter is less than 10 μm, the pressure loss may increase and the adsorption force may be weakened. Conversely, if the average pore diameter exceeds 50 μm, the surface accuracy of the mounting surface 21a may be deteriorated. Because there is.

載置部21および凹型吸引部はセラミックス多孔質体からなる。これらは、所定のセラミックス粉末と結合材のガラスから構成され、連通する開気孔を有する多孔質組織を有している。セラミックス粉末には、例えば、アルミナ、ジルコニア、炭化珪素、窒化珪素等を用いることができる。 The mounting part 21 and the concave suction part are made of a ceramic porous body. These are composed of a predetermined ceramic powder and a glass of a binder, and have a porous structure having open pores communicating therewith. For the ceramic powder, for example, alumina, zirconia, silicon carbide, silicon nitride or the like can be used.

載置部21に用いられるガラスの軟化点は、凹型吸引部22に用いられるガラスの軟化点と同等か、それよりも低いことが好ましい。先に凹型吸引部22が形成されるので、凹型吸引部に含まれるガラスが、載置部21を形成するための焼成時に著しく軟化、溶融して、変形や収縮を起こさないようにするためである。例えば、凹型吸引部のガラスとしては軟化点が1000℃近傍のアルミノ珪酸塩系ガラスを、載置部のガラスとしては軟化点が900℃以下のホウ珪酸系ガラスを、それぞれ選定することができる。また、凹型吸引部22のセラミックス粉末には載置部21と同じものを用いることができる。 The softening point of the glass used for the mounting part 21 is preferably equal to or lower than the softening point of the glass used for the concave suction part 22. Since the concave suction part 22 is formed first, the glass contained in the concave suction part is remarkably softened and melted during firing for forming the placement part 21 so as not to be deformed or contracted. is there. For example, an aluminosilicate glass having a softening point near 1000 ° C. can be selected as the glass of the concave suction section, and a borosilicate glass having a softening point of 900 ° C. or less can be selected as the glass of the placement section. Further, the same ceramic powder as the placement portion 21 can be used for the ceramic powder of the concave suction portion 22.

凹型吸引部22のヤング率は、載置部21のヤング率よりも大きく、支持部23のヤング率よりも小さいことが望ましい。このような構成とすることで基板を加工したときに支持部に置かれた部分と載置部に載置された部分とで加工後の基板形状に生じる段差を緩和できる。具体的には、載置部の原料としても用いるセラミックス粉末よりも平均粒径の大きいセラミックス粉末を凹型吸引部の原料に用いて上記所定の気孔率に形成することにより適切な強度にすることができる。 It is desirable that the Young's modulus of the concave suction part 22 is larger than the Young's modulus of the placement part 21 and smaller than the Young's modulus of the support part 23. With such a configuration, it is possible to relieve a step generated in the processed substrate shape between a portion placed on the support portion and a portion placed on the placement portion when the substrate is processed. Specifically, the ceramic powder having an average particle size larger than that of the ceramic powder used also as the raw material for the mounting portion is used as the raw material for the concave suction portion to form the above-mentioned predetermined porosity so as to obtain an appropriate strength. it can.

凹型吸引部表面22aの幅は、4mm以上であって、かつ、基板半径の2〜25%、より好ましくは10〜18%である。この幅が大きすぎると面精度が低下し、小さすぎると研削屑が載置部に侵入しやすくなるので除去機能が低下する。このような範囲であれば面精度の低下もほとんどなく、研削屑も除去できるので長期間の使用が可能となる。吸引孔側に面した凹型吸引部の厚さも同様の理由から5mm以上が望ましい。載置部の厚さについては、載置面を研削加工しながら使用するため、厚くすれば長期間使用できるが、厚すぎると大気圧による変形が大きくなり望ましくないことから、20mm以内とすることが好ましい。 The width of the concave suction part surface 22a is 4 mm or more and 2 to 25%, more preferably 10 to 18% of the substrate radius. If this width is too large, the surface accuracy is lowered, and if it is too small, grinding scraps easily enter the mounting portion, so that the removal function is lowered. If it is in such a range, there will be almost no fall of surface accuracy, and since grinding waste can also be removed, it will become possible to use it for a long time. The thickness of the concave suction part facing the suction hole side is desirably 5 mm or more for the same reason. About the thickness of the mounting part, it is used while grinding the mounting surface, so if it is thick, it can be used for a long time, but if it is too thick, deformation due to atmospheric pressure becomes large and undesirable, so it should be within 20 mm Is preferred.

載置部21のセラミックス粉末としては、30〜180μmの粉末を用いることができ、凹型吸引部のセラミックス粉末としては、180〜1000μmの粉末を用いることができる。凹型吸引部の平均気孔径を載置部の平均気孔径よりも大きくするには、原料のセラミックス粉末に載置部よりも大きいものを用いると良い。 As the ceramic powder of the mounting portion 21, a powder of 30 to 180 μm can be used, and as the ceramic powder of the concave suction portion, a powder of 180 to 1000 μm can be used. In order to make the average pore diameter of the concave suction part larger than the average pore diameter of the mounting part, it is preferable to use a material ceramic powder larger than the mounting part.

支持部23の材質も特に限定せず、アルミナ、ジルコニア、炭化珪素、窒化珪素等のセラミックスが用いられる。ただし熱膨張の観点から、載置部のセラミックス粉末と同じものを使用することが好ましい。 The material of the support portion 23 is not particularly limited, and ceramics such as alumina, zirconia, silicon carbide, and silicon nitride are used. However, from the viewpoint of thermal expansion, it is preferable to use the same ceramic powder as the placement portion.

支持部23には吸引孔24が設けられている。吸引孔は真空ポンプ等の真空源と連結して真空吸引するための機能の他に、洗浄液を多孔質体に注入するのに用いることもできる。また、真空吸引の際に研削屑を含む研削液も吸い込まれるため、真空源との間にトラップ等を設けてこれらを除去する構成としても良い。当然のことながら、吸引孔、洗浄液注入孔及び研削屑除去のための孔をそれぞれ別個に設けても良い。吸引孔の配置は十分かつ均一な真空吸着力が得られるものであれば良く、特に限定しない。吸引孔に加えて吸引溝を形成する場合も同様であり、溝を同心円に所定間隔で配置したもの、放射状に配置したもの、円溝と放射状溝を組み合わせたもの等、種々の形状を採用できる。 A suction hole 24 is provided in the support portion 23. The suction hole can be used for injecting the cleaning liquid into the porous body in addition to the function of vacuum suction by connecting to a vacuum source such as a vacuum pump. In addition, since the grinding fluid containing grinding scraps is also sucked in during vacuum suction, a trap or the like may be provided between the vacuum source and these may be removed. As a matter of course, a suction hole, a cleaning liquid injection hole, and a hole for removing grinding dust may be provided separately. The arrangement of the suction holes is not particularly limited as long as a sufficient and uniform vacuum suction force can be obtained. The same applies to the case of forming suction grooves in addition to the suction holes, and various shapes such as concentric circles arranged at predetermined intervals, those arranged radially, and combinations of circular grooves and radial grooves can be adopted. .

次に、本発明の真空吸着装置20の製造方法について説明する。
はじめに凹型吸引部22を形成するセラミックス多孔質体の原料であるセラミックス粉末およびガラス粉末に、水またはアルコールを加えて混合してスラリーを調整する。原料の混合は、ボールミル、ミキサー等、公知の方法が適用できる。ここで、水またはアルコール量は特に限定しないが、セラミックス粉末の粒度、ガラス粉末の添加量を考慮し所望の流動性が得られるように、水またはアルコールの添加量を調整する。セラミックス粉末とガラス粉末の量は、目標とする開気孔率、セラミックス粉末の粒度、焼成温度およびガラス粘性等を考慮して調整されるが、概ねセラミックス粉末100質量部に対してガラス粉末を5〜30質量部の範囲で添加することが望ましい。
Next, the manufacturing method of the vacuum suction apparatus 20 of this invention is demonstrated.
First, water or alcohol is added to and mixed with ceramic powder and glass powder, which are raw materials for the ceramic porous body forming the concave suction portion 22, to prepare a slurry. For mixing the raw materials, a known method such as a ball mill or a mixer can be applied. Here, the amount of water or alcohol is not particularly limited, but the amount of water or alcohol added is adjusted so that desired fluidity can be obtained in consideration of the particle size of the ceramic powder and the amount of glass powder added. The amount of the ceramic powder and the glass powder is adjusted in consideration of the target open porosity, the particle size of the ceramic powder, the firing temperature, the glass viscosity, and the like. It is desirable to add in the range of 30 parts by mass.

次に、CIP成形や鋳込み成形等の公知の成形方法、電気炉焼成やホットプレス等の公知の焼成方法、およびダイヤモンド砥石等による公知の研削加工方法により作製したセラミックスの支持部23の凹型吸引部が形成される凹部(図示せず)に前記スラリーを充填する。この際、必要に応じて、スラリー中の粗大気泡を除去するための真空脱泡や、充填を高めるための振動を加えると良い。また、吸引孔24には、載置部となる混合物を注ぐ前に、ろう、樹脂等の焼失部材により閉塞しておく。支持部には、真空吸引を円滑に行えるように吸引溝を設けても良い。 Next, the concave suction portion of the ceramic support portion 23 produced by a known molding method such as CIP molding or cast molding, a known firing method such as electric furnace firing or hot press, and a known grinding method using a diamond grindstone or the like. The slurry is filled in a recess (not shown) in which is formed. At this time, it is preferable to apply vacuum defoaming for removing coarse bubbles in the slurry and vibration for enhancing the filling as necessary. In addition, the suction hole 24 is closed by a burned-out member such as wax or resin before pouring the mixture serving as the placement portion. The support portion may be provided with a suction groove so that vacuum suction can be performed smoothly.

支持部の凹部にスラリーを充填し十分に乾燥させた後、ガラスの軟化点以上の温度で焼成する。この際、焼成温度がガラスの軟化点より低いとガラスが溶けずにセラミックス粉末を結合することができず、反対に焼成温度が高すぎると変形や収縮を起こすため、セラミックス粉末を結合し得る範囲で、できるだけ低温で焼成することが望ましい。 After the slurry is filled in the concave portion of the support portion and sufficiently dried, it is fired at a temperature equal to or higher than the softening point of the glass. At this time, if the firing temperature is lower than the softening point of the glass, the glass does not melt and the ceramic powder cannot be bonded. Conversely, if the firing temperature is too high, deformation or shrinkage occurs. Thus, it is desirable to fire at as low a temperature as possible.

次に、載置部21を形成するためのザグリ加工を行う。ザグリ加工はマシニングセンタ等による公知の方法が適用できる。 Next, a counterbore process for forming the placement portion 21 is performed. A known method using a machining center or the like can be applied to the counterboring process.

載置部21は、凹型吸引部22と同様にセラミックス粉末とガラス粉末のスラリーを充填することにより作製する。この際、凹型吸引部の気孔を樹脂等の消失部材により埋めておくことにより、載置部のセラミックス粉末とガラス粉末が気孔に入り込む不具合を防ぐことができる。 The mounting part 21 is produced by filling a slurry of ceramic powder and glass powder in the same manner as the concave suction part 22. At this time, by filling the pores of the concave suction portion with a disappearing member such as a resin, it is possible to prevent a problem that the ceramic powder and the glass powder of the mounting portion enter the pores.

載置部の焼成を凹型吸引部の焼成温度と同等か、または、より低い温度で行った後、載置面21a、凹型吸引部表面22aおよび支持部表面23aが略同一平面になるように研削加工を行う。研削加工はダイヤモンド砥石等の通常用いる研削方法により行うことができる。 After the mounting portion is fired at a temperature equal to or lower than the firing temperature of the concave suction portion, the mounting surface 21a, the concave suction portion surface 22a, and the support portion surface 23a are ground so as to be substantially flush with each other. Processing. Grinding can be performed by a commonly used grinding method such as a diamond grindstone.

上述した製法により、真空吸着装置を作製した。なお、作製した真空吸着装置は、載置部の直径250mm、厚さ5mm、凹型吸引部の直径298mm、凹型吸引部表面22aの幅24mm、吸引孔側に面した凹型吸引部の厚さ15mm、全体の直径350mm、厚さ25mmである。支持部としてアルミナ焼結体(ヤング率390GPa)を使用し、アルミナ粉末(平均粒径125〜2000μm)、ガラス粉末(アルミノケイ酸塩ガラス、平均粒径:5〜20μm、軟化点950℃)の多孔質体からなる凹型吸引部を形成した後、ザグリ加工を行って、載置部も同様にアルミナ粉末(平均粒径40〜180μm)とガラス粉末(ホウ珪酸ガラス、平均粒径:2〜10μm、軟化点650℃)を使用して形成した。なお、セラミックス粉末等の平均粒径は、レーザー回折式粒度分布測定によるものである。 A vacuum suction apparatus was produced by the above-described manufacturing method. The produced vacuum suction device has a mounting portion diameter of 250 mm, a thickness of 5 mm, a concave suction portion diameter of 298 mm, a concave suction portion surface 22 a width of 24 mm, a concave suction portion thickness facing the suction hole side of 15 mm, The overall diameter is 350 mm and the thickness is 25 mm. Alumina sintered body (Young's modulus 390 GPa) is used as the support, and alumina powder (average particle size 125 to 2000 μm) and glass powder (aluminosilicate glass, average particle size 5 to 20 μm, softening point 950 ° C.) After forming the concave suction part made of the material, counterbore processing is performed, and the placing part is similarly alumina powder (average particle size 40 to 180 μm) and glass powder (borosilicate glass, average particle size: 2 to 10 μm, Softening point 650 ° C.). The average particle size of the ceramic powder is based on laser diffraction particle size distribution measurement.

表1に、作製した各真空吸着装置について、それぞれの載置部および凹型吸引部の平均気孔径、開気孔率、およびシリコン基板を真空吸着して評価した結果を記した。開気孔率については各部より約10×10×10mmの試料を5個切り出してアルキメデス法により、平均気孔径は同試料を用いて水銀圧入法により測定した。 Table 1 shows the average pore diameter of each mounting part and the concave suction part, the open porosity, and the results of evaluating the silicon substrate by vacuum adsorption for each of the produced vacuum adsorption apparatuses. For the open porosity, five samples of about 10 × 10 × 10 mm were cut out from each part and measured by Archimedes method, and the average pore diameter was measured by mercury intrusion method using the same sample.

研削結果の評価は、−50kPaの真空度(ゲージ圧)で真空吸着したシリコン基板(直径300mm、厚さ800μm)を800番のダイヤモンド砥石を使用して100μm研削加工した後、基板の外周端部と中央部の厚みの差が1μm以下にすることができたものを良好(○)とし、1μmよりも大きいものを不良(×)とした。研削屑の除去試験は、吸着させた基板の上から研削屑を含む研削液を10分間流した後、洗浄液を吸引孔側から多孔質体に流す工程を10回繰り返した後に、真空吸着装置を切断して断面を観察し、目詰まりの程度によって良(○)、不良(×)を相対評価した。 The evaluation of the grinding results was performed by grinding a silicon substrate (diameter 300 mm, thickness 800 μm) vacuum-adsorbed at a vacuum degree (gauge pressure) of −50 kPa using a 800-th diamond grinding stone, and then the outer peripheral edge of the substrate The difference in thickness between the center part and the central part was 1 μm or less. In the grinding scrap removal test, after a grinding liquid containing grinding scraps was allowed to flow for 10 minutes from above the adsorbed substrate, the process of flowing the cleaning liquid from the suction hole side to the porous body was repeated 10 times, and then the vacuum suction device was After slicing and observing the cross section, good (◯) and bad (×) were relatively evaluated according to the degree of clogging.

Figure 0004885165
Figure 0004885165

本発明の範囲内である作製No.1〜5については、全て良好な結果が得られた。 Good results were obtained for production Nos. 1 to 5 within the scope of the present invention.

一方、本発明の範囲外である作製No.6では、載置部と凹型吸引部に同じ多孔質体を用いたので、研削屑が除去されず、加工精度の向上も見られなかった。凹型吸引部の気孔率の小さい作製No.7では、研削精度は良好であったものの、研削屑による汚染が著しかった。なお、このような装置の場合、研削当初の精度は良くても使用時間が経つにつれて精度が低下するため適用できない。凹型吸引部の気孔径が大きい作製No.8では、凹型吸引部上の基板部分が気孔に追従し、研削不良が生じたため加工精度が悪かった。また、これに伴い、支持部表面の隙間も大きくなったため研削液が大量に流入し研削屑の汚染が著しかった。凹型吸引部の気孔率が大きく、ヤング率の低い作製No.9では、凹型吸引部と支持部の境界近傍に生じた段差が大きく、このような面精度の低下に起因して研削液の流入も多くなり載置部が汚染されていた。 On the other hand, in Production No. 6, which is outside the scope of the present invention, the same porous material was used for the placement portion and the concave suction portion, so that grinding dust was not removed and no improvement in processing accuracy was observed. In Production No. 7 having a low porosity of the concave suction portion, although the grinding accuracy was good, the contamination with grinding dust was remarkable. In the case of such an apparatus, even if the accuracy at the beginning of grinding is good, it cannot be applied because the accuracy decreases as the usage time elapses. In Production No. 8 in which the pore diameter of the concave suction portion was large, the substrate portion on the concave suction portion followed the pores, resulting in poor grinding, resulting in poor processing accuracy. Further, along with this, a gap on the surface of the support portion was increased, so that a large amount of grinding fluid flowed in and the grinding dust was significantly contaminated. In production No. 9 where the porosity of the concave suction part is large and the Young's modulus is low, the step formed near the boundary between the concave suction part and the support part is large. And the mounting part was contaminated.

従来の真空吸着装置の概略断面図。The schematic sectional drawing of the conventional vacuum suction apparatus. 本発明の真空吸着装置の概略断面図。The schematic sectional drawing of the vacuum suction apparatus of this invention.

符号の説明Explanation of symbols

20:真空吸着装置
21:載置部
21a:載置面
22:凹型吸引部
22a:凹型吸引部表面
23:支持部
23a:支持部表面
24:吸引孔
W:シリコン基板
20: Vacuum suction device 21: Placement part 21a: Placement surface 22: Recessed suction part 22a: Recessed suction part surface 23: Support part 23a: Support part surface 24: Suction hole W: Silicon substrate

Claims (4)

基板を吸着保持するためのセラミックス多孔質体からなる載置部と、
該載置部の周囲を取り囲むセラミックス多孔質体からなる凹型吸引部と、
前記凹型吸引部の気孔に連通する吸引孔を有し、前記凹型吸引部を支持する支持部と、
を備えた真空吸着装置であって、
前記載置部及び前記支持部は、前記凹型吸引部と実質的に隙間なく直接接合されており、
前凹型吸引部の平均気孔径は前記載置部の平均気孔径よりも大きいことを特徴とする真空吸着装置。
A mounting portion made of a ceramic porous body for adsorbing and holding a substrate;
A concave suction portion made of a ceramic porous body surrounding the mounting portion;
A suction hole communicating with the pores of the concave suction part, and a support part for supporting the concave suction part;
A vacuum adsorption device comprising:
The placing portion and the supporting portion are directly joined to the concave suction portion substantially without a gap,
A vacuum suction device, wherein an average pore diameter of the front concave suction portion is larger than an average pore diameter of the placement portion.
前記載置部の開気孔率が20%〜50%、その平均気孔径が10μm〜50μmである請求項1に記載の真空吸着装置。 2. The vacuum adsorption device according to claim 1, wherein the placement portion has an open porosity of 20% to 50% and an average pore diameter of 10 μm to 50 μm. 前記凹型吸引部の開気孔率は20〜50%、その平均気孔径が50μm〜200μmである請求項1または2記載の真空吸着装置。 The vacuum suction device according to claim 1 or 2, wherein the concave suction portion has an open porosity of 20 to 50% and an average pore diameter of 50 µm to 200 µm. 基板を研削加工した際に生じる研削屑を、前記凹型吸引部に取り込んだ後に除去することを特徴とする請求項1〜3記載の真空吸着装置の使用方法。 The method of using the vacuum suction device according to claim 1, wherein grinding scrap generated when the substrate is ground is removed after being taken into the concave suction portion.
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