JP4871725B2 - 磁場測定プローブ - Google Patents

磁場測定プローブ Download PDF

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Publication number
JP4871725B2
JP4871725B2 JP2006530428A JP2006530428A JP4871725B2 JP 4871725 B2 JP4871725 B2 JP 4871725B2 JP 2006530428 A JP2006530428 A JP 2006530428A JP 2006530428 A JP2006530428 A JP 2006530428A JP 4871725 B2 JP4871725 B2 JP 4871725B2
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Japan
Prior art keywords
magnetic field
sensors
probe
sensor
circuit
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Expired - Fee Related
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JP2006530428A
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English (en)
Japanese (ja)
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JP2007508533A (ja
JP2007508533A5 (https=
Inventor
デスプラト，ロマン
クレペル，オリビエ
ボードワン，フェリ
ペルドゥ，フィリップ
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サントル ナシオナル デチュード スパシアル
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Publication of JP2007508533A5 publication Critical patent/JP2007508533A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux

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  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2006530428A 2003-10-08 2004-10-08 磁場測定プローブ Expired - Fee Related JP4871725B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR0311773A FR2860879B1 (fr) 2003-10-08 2003-10-08 Sonde de mesure d'un champ magnetique.
FR0311773 2003-10-08
PCT/FR2004/002560 WO2005036193A2 (fr) 2003-10-08 2004-10-08 Sonde de mesure d'un champ magnetique

Publications (3)

Publication Number Publication Date
JP2007508533A JP2007508533A (ja) 2007-04-05
JP2007508533A5 JP2007508533A5 (https=) 2007-11-29
JP4871725B2 true JP4871725B2 (ja) 2012-02-08

Family

ID=34355326

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006530428A Expired - Fee Related JP4871725B2 (ja) 2003-10-08 2004-10-08 磁場測定プローブ

Country Status (6)

Country Link
US (1) US7408342B2 (https=)
EP (1) EP1702220B1 (https=)
JP (1) JP4871725B2 (https=)
CN (1) CN100559206C (https=)
FR (1) FR2860879B1 (https=)
WO (1) WO2005036193A2 (https=)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009052963A (ja) * 2007-08-24 2009-03-12 Denso Corp 磁気ベクトル分布測定プローブ
FR2930042A1 (fr) * 2008-04-15 2009-10-16 Centre Nat Rech Scient Capteur de champ magnetique.
FR2933200B1 (fr) * 2008-06-25 2010-09-10 Centre Nat Etd Spatiales Procede et machine de test multidimensionnel d'un dispositif electronique a partir d'une sonde monodirectionnelle
US20120105058A1 (en) * 2010-10-29 2012-05-03 Iakov Veniaminovitch Kopelevitch Magnetic field sensing
US10132843B2 (en) * 2013-07-11 2018-11-20 Infineon Technologies Austria Ag Detector and a voltage converter
CN104062512B (zh) * 2014-06-11 2017-02-15 工业和信息化部电子第五研究所 双向板级射频磁场探头
US9910108B2 (en) * 2016-06-27 2018-03-06 Daniel Clyde Ross Real-time magnetic field camera
US11647678B2 (en) 2016-08-23 2023-05-09 Analog Devices International Unlimited Company Compact integrated device packages
EP3510414B1 (en) * 2016-09-07 2023-07-26 Texas Tech University System Electric current imaging system
US10697800B2 (en) * 2016-11-04 2020-06-30 Analog Devices Global Multi-dimensional measurement using magnetic sensors and related systems, methods, and integrated circuits
EP3520695A3 (en) 2018-01-31 2019-11-06 Analog Devices, Inc. Electronic devices
JP2019215322A (ja) * 2018-06-08 2019-12-19 旭化成エレクトロニクス株式会社 磁場計測装置、磁場計測方法、磁場計測プログラム
JP6664568B1 (ja) 2018-08-22 2020-03-13 旭化成エレクトロニクス株式会社 磁場計測装置、磁場計測方法、磁場計測プログラム
JP6936405B2 (ja) 2018-12-26 2021-09-15 旭化成エレクトロニクス株式会社 磁場計測装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03200083A (ja) * 1989-12-28 1991-09-02 Mishima Taimu Ind:Kk 磁場測定器
JPH07191119A (ja) * 1993-12-27 1995-07-28 Victor Co Of Japan Ltd 磁界測定用ホールプローブ
JPH09243725A (ja) * 1996-03-06 1997-09-19 Kanazawa Kogyo Univ 磁気分布測定方法，磁気分布測定装置および磁気検出器板
JP2002177233A (ja) * 1997-03-07 2002-06-25 Hitachi Ltd 生体磁場計測装置
JP2003222664A (ja) * 2001-11-15 2003-08-08 Chikayoshi Sumi 電流密度ベクトル推定装置および電気導電率推定装置
JP2004154556A (ja) * 1993-10-06 2004-06-03 Biosense Inc 位置および配向の磁気測定

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5132620A (en) * 1990-05-21 1992-07-21 The Boeing Company Surface/subsurface corrosion detector with optical paths alterable by magnetically sensitive transducers
WO1996002847A1 (en) * 1994-07-20 1996-02-01 Honeywell Inc. Miniature magnetometer
CN2277078Y (zh) * 1995-03-22 1998-03-25 中国科学院物理研究所 各向同性的磁场传感器
FR2750769B1 (fr) * 1996-07-05 1998-11-13 Thomson Csf Capteur de champ magnetique en couche mince
DE19725200A1 (de) * 1997-06-14 1998-08-13 Vallon Gmbh Vorrichtung und Verfahren zum Messen eines Magnetfeldes mit Sondentripel
DE19755534B4 (de) * 1997-12-13 2005-05-25 International Business Machines Corp. Verfahren und Vorrichtung zur Messung der Verteilung von Magnetfeldern
US6304082B1 (en) * 1999-07-13 2001-10-16 Honeywell International Inc. Printed circuit boards multi-axis magnetometer
CN1274086A (zh) * 1999-12-21 2000-11-22 南京大学 巨磁电阻效应交、直流两用电流检测、控制器件
US6792303B2 (en) * 2001-05-11 2004-09-14 Scimed Life Systems, Inc. Apparatus for improved sensor accuracy
US7126330B2 (en) * 2004-06-03 2006-10-24 Honeywell International, Inc. Integrated three-dimensional magnetic sensing device and method to fabricate an integrated three-dimensional magnetic sensing device
WO2006008799A1 (ja) * 2004-07-16 2006-01-26 C & N Inc 磁気センサ組立体、地磁気検出装置、素子組立体および携帯端末装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03200083A (ja) * 1989-12-28 1991-09-02 Mishima Taimu Ind:Kk 磁場測定器
JP2004154556A (ja) * 1993-10-06 2004-06-03 Biosense Inc 位置および配向の磁気測定
JPH07191119A (ja) * 1993-12-27 1995-07-28 Victor Co Of Japan Ltd 磁界測定用ホールプローブ
JPH09243725A (ja) * 1996-03-06 1997-09-19 Kanazawa Kogyo Univ 磁気分布測定方法，磁気分布測定装置および磁気検出器板
JP2002177233A (ja) * 1997-03-07 2002-06-25 Hitachi Ltd 生体磁場計測装置
JP2003222664A (ja) * 2001-11-15 2003-08-08 Chikayoshi Sumi 電流密度ベクトル推定装置および電気導電率推定装置

Also Published As

Publication number Publication date
CN1879031A (zh) 2006-12-13
CN100559206C (zh) 2009-11-11
JP2007508533A (ja) 2007-04-05
FR2860879A1 (fr) 2005-04-15
EP1702220A2 (fr) 2006-09-20
WO2005036193A3 (fr) 2005-06-30
US7408342B2 (en) 2008-08-05
EP1702220B1 (fr) 2018-08-08
WO2005036193A2 (fr) 2005-04-21
FR2860879B1 (fr) 2006-02-03
US20070108975A1 (en) 2007-05-17

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