JP4777203B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP4777203B2
JP4777203B2 JP2006260304A JP2006260304A JP4777203B2 JP 4777203 B2 JP4777203 B2 JP 4777203B2 JP 2006260304 A JP2006260304 A JP 2006260304A JP 2006260304 A JP2006260304 A JP 2006260304A JP 4777203 B2 JP4777203 B2 JP 4777203B2
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JP
Japan
Prior art keywords
electrode layer
layer
line
droplets
drain electrode
Prior art date
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Expired - Fee Related
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JP2006260304A
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English (en)
Japanese (ja)
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JP2007073976A (ja
JP2007073976A5 (enrdf_load_stackoverflow
Inventor
敏行 伊佐
厳 藤井
将文 森末
郁子 川俣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Priority to JP2006260304A priority Critical patent/JP4777203B2/ja
Publication of JP2007073976A publication Critical patent/JP2007073976A/ja
Publication of JP2007073976A5 publication Critical patent/JP2007073976A5/ja
Application granted granted Critical
Publication of JP4777203B2 publication Critical patent/JP4777203B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Liquid Crystal (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Thin Film Transistor (AREA)
  • Electroluminescent Light Sources (AREA)
  • Electrodes Of Semiconductors (AREA)
JP2006260304A 2005-01-28 2006-09-26 半導体装置 Expired - Fee Related JP4777203B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006260304A JP4777203B2 (ja) 2005-01-28 2006-09-26 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2005022214 2005-01-28
JP2005022214 2005-01-28
JP2006260304A JP4777203B2 (ja) 2005-01-28 2006-09-26 半導体装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2006017033A Division JP4777078B2 (ja) 2005-01-28 2006-01-26 半導体装置の作製方法

Publications (3)

Publication Number Publication Date
JP2007073976A JP2007073976A (ja) 2007-03-22
JP2007073976A5 JP2007073976A5 (enrdf_load_stackoverflow) 2010-04-15
JP4777203B2 true JP4777203B2 (ja) 2011-09-21

Family

ID=37935104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006260304A Expired - Fee Related JP4777203B2 (ja) 2005-01-28 2006-09-26 半導体装置

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JP (1) JP4777203B2 (enrdf_load_stackoverflow)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI626744B (zh) * 2008-07-31 2018-06-11 半導體能源研究所股份有限公司 半導體裝置及半導體裝置的製造方法
JP2010056541A (ja) 2008-07-31 2010-03-11 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法
US9666719B2 (en) 2008-07-31 2017-05-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP5480554B2 (ja) * 2008-08-08 2014-04-23 株式会社半導体エネルギー研究所 半導体装置
JP5608347B2 (ja) * 2008-08-08 2014-10-15 株式会社半導体エネルギー研究所 半導体装置及び半導体装置の作製方法
KR101634411B1 (ko) 2008-10-31 2016-06-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 구동 회로, 표시 장치 및 전자 장치
US8841661B2 (en) * 2009-02-25 2014-09-23 Semiconductor Energy Laboratory Co., Ltd. Staggered oxide semiconductor TFT semiconductor device and manufacturing method thereof
KR101107158B1 (ko) * 2009-07-10 2012-01-25 삼성모바일디스플레이주식회사 유기 발광 표시 장치 및 그 제조 방법
KR102009813B1 (ko) 2009-09-16 2019-08-12 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치 및 이의 제조 방법
KR102106817B1 (ko) * 2018-10-30 2020-05-14 재단법인대구경북과학기술원 색순도 조절 다층 구조 필터 및 이의 제조 방법

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002100621A (ja) * 2000-09-20 2002-04-05 Seiko Epson Corp 成膜装置、成膜方法、これにより成膜された基板及びこの基板を用いた液晶装置
JP2003133691A (ja) * 2001-10-22 2003-05-09 Seiko Epson Corp 膜パターンの形成方法、膜パターン形成装置、導電膜配線、電気光学装置、電子機器、並びに非接触型カード媒体
JP4566578B2 (ja) * 2003-02-24 2010-10-20 株式会社半導体エネルギー研究所 薄膜集積回路の作製方法

Also Published As

Publication number Publication date
JP2007073976A (ja) 2007-03-22

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