JP4718472B2 - 磁場測定用装置 - Google Patents
磁場測定用装置 Download PDFInfo
- Publication number
- JP4718472B2 JP4718472B2 JP2006530429A JP2006530429A JP4718472B2 JP 4718472 B2 JP4718472 B2 JP 4718472B2 JP 2006530429 A JP2006530429 A JP 2006530429A JP 2006530429 A JP2006530429 A JP 2006530429A JP 4718472 B2 JP4718472 B2 JP 4718472B2
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- JP
- Japan
- Prior art keywords
- frequency
- sensor
- magnetic field
- circuit
- measuring device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000005259 measurement Methods 0.000 claims description 38
- 230000010355 oscillation Effects 0.000 claims description 10
- 230000006698 induction Effects 0.000 claims description 6
- 238000012545 processing Methods 0.000 description 25
- 239000000523 sample Substances 0.000 description 20
- 238000000034 method Methods 0.000 description 7
- 230000003321 amplification Effects 0.000 description 6
- 239000003990 capacitor Substances 0.000 description 6
- 238000003199 nucleic acid amplification method Methods 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 5
- 230000005284 excitation Effects 0.000 description 3
- 238000004088 simulation Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 238000004804 winding Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000001914 filtration Methods 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 229910000640 Fe alloy Inorganic materials 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910000595 mu-metal Inorganic materials 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
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- 230000004044 response Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 230000005641 tunneling Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
- G01R31/002—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing where the device under test is an electronic circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Measuring Magnetic Variables (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
―バンドパスフィルタが演算増幅器を有する。
J=RotBを適用して決定される。なお、Jは電流ベクトル、Bは磁場ベクトルである。
Claims (7)
- 少なくとも1つの磁場成分を測定する装置(16)であって、磁気抵抗又は磁気誘導センサ(102)と測定装置(28)を有し、前記装置の1つの入力は磁気抵抗又は磁気誘導センサ(102)に接続され、前記装置の出力はセンサが置かれた領域の磁場を表す情報を提供するものであって、
−前記センサ(102)が組み込まれ、3つの他の固定抵抗(106,108,110)を有するWestonブリッジ(但し、前記センサ(102)及び前記3つの他の固定抵抗は直列に接続され、ループを形成する)
−磁気抵抗センサ又は磁気誘導センサ(102)のための、周波数(f)の交流電源(116)(但し、前記周波数(f)は分離周波数成分の所定周波数(FI)より大きいか等しい)、
−前記測定装置(28)は、センサからの磁場を表す信号周波数成分から単一の所定周波数(FI)を分離するための手段(138;178;198)を有することを特徴とする測定装置。 - 測定装置群(28)はバンドパスフィルタ(138)を有し、同フィルタは磁場を表すセンサからの信号から単一の所定周波数(FI)における周波数成分だけを分離するように設けられることを特徴とする請求項1記載の測定装置。
- バンドパスフィルタ(138)が演算増幅器(130)を有することを特徴とする請求項2に記載の測定装置。
- 測定装置群(28)が、レファレンス周波数のための発振器を有すること(但し、前記レファレンス周波数(F)は分離するための周波数成分の単一の所定周波数(FI)より大きいか又は等しい)、及び、センサからの信号と前記レファレンス信号の乗算を行う乗算器(180,210)を有することを特徴とする請求項1に記載の測定装置。
- 前記乗算器(180)は、前記2つの信号のアナログ乗算を実行することを特徴とする請求項4に記載の測定装置。
- 測定装置群(24)は、センサからの信号とレファレンス信号を変換する、2つのアナログ/デジタル変換器(206,208)、並びに、該アナログ/デジタル変換器(206,208)からの2つのデジタル信号の乗算を行うことのできるデジタルプロセッサ(210)を有することを特徴とする請求項4に記載の測定装置。
- 所定周波数(FC)で回路を発振するための手段(14)及び請求項1ないし6のいずれか一項に基づく測定装置を有し、分離された周波数成分から分離される単一の所定の周波数(FI)が回路の発振周波数(FC)に等しいことを特徴とする、動作中に回路が生成する磁場を解析する装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0311769A FR2860877B1 (fr) | 2003-10-08 | 2003-10-08 | Dispositif de mesure d'un champ magnetique |
FR0311769 | 2003-10-08 | ||
PCT/FR2004/002561 WO2005036187A1 (fr) | 2003-10-08 | 2004-10-08 | Dispositif de mesure d'un champ magnetique |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007508534A JP2007508534A (ja) | 2007-04-05 |
JP4718472B2 true JP4718472B2 (ja) | 2011-07-06 |
Family
ID=34355322
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006530429A Expired - Fee Related JP4718472B2 (ja) | 2003-10-08 | 2004-10-08 | 磁場測定用装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7417424B2 (ja) |
EP (1) | EP1671140B1 (ja) |
JP (1) | JP4718472B2 (ja) |
CN (1) | CN100561240C (ja) |
FR (1) | FR2860877B1 (ja) |
WO (1) | WO2005036187A1 (ja) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4933733B2 (ja) * | 2005-01-11 | 2012-05-16 | 株式会社アドバンテスト | 信号伝送システム、信号出力回路基板、信号受信回路基板、信号出力方法、及び信号受信方法 |
US8026715B2 (en) * | 2008-10-03 | 2011-09-27 | International Business Machines Corporation | Magneto-resistance based nano-scale position sensor |
WO2010132541A2 (en) | 2009-05-14 | 2010-11-18 | University Of Delaware | Electromagnetic detection apparatus and methods |
US8941379B2 (en) * | 2009-05-14 | 2015-01-27 | University Of Delaware | Electromagnetic wave detection systems and methods |
WO2011103406A2 (en) * | 2010-02-18 | 2011-08-25 | University Of Delaware | Electromagnetic wave detection systems and methods |
CN103399187A (zh) * | 2013-08-19 | 2013-11-20 | 国家电网公司 | 一种能够识别强磁窃电的芯片 |
CN103869263A (zh) * | 2014-03-27 | 2014-06-18 | 华北电力大学(保定) | 一种简易磁场检测仪 |
EP3276308B1 (de) * | 2016-07-27 | 2018-09-05 | Siemens Aktiengesellschaft | Messgerät |
US10324144B2 (en) | 2016-12-20 | 2019-06-18 | Infineon Technologies Austria Ag | Lateral transmission of signals across a galvanic isolation barrier |
EP3531082B1 (de) * | 2018-02-23 | 2020-12-23 | Kistler Holding AG | Verfahren und computerprogrammprodukt zur ermittlung einer messkette für die erfassung einer physikalischen messgrösse |
CN109116273B (zh) * | 2018-08-29 | 2024-01-30 | 中国地质大学(武汉) | 一种快速响应的负反馈型gmi磁场测量传感器 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55143448A (en) * | 1978-10-13 | 1980-11-08 | Anritsu Corp | Selective level measuring instrument |
JPS55164522A (en) * | 1979-03-17 | 1980-12-22 | Happich Gmbh Gebr | Sun visor for vehicle |
JPH074986A (ja) * | 1993-01-21 | 1995-01-10 | Nippondenso Co Ltd | 基準位置検出装置 |
JPH07225251A (ja) * | 1994-02-15 | 1995-08-22 | Hitachi Ltd | 近磁界測定方法およびその装置 |
JP2000266860A (ja) * | 1999-03-19 | 2000-09-29 | Toshiba Corp | 磁性テープ検出装置 |
JP2002372574A (ja) * | 2001-06-14 | 2002-12-26 | Toyota Motor Corp | 磁界検出装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4465974A (en) * | 1980-03-03 | 1984-08-14 | Raytheon Company | Apparatus for measuring magnetic field characteristics of magnetic materials |
DE3884615T2 (de) * | 1987-04-14 | 1994-03-17 | Sec Dep For Defence London | Eine vom schlingern unabhängige magnetometeranordnung. |
US5351005A (en) * | 1992-12-31 | 1994-09-27 | Honeywell Inc. | Resetting closed-loop magnetoresistive magnetic sensor |
WO1996016316A1 (de) | 1994-11-22 | 1996-05-30 | Robert Bosch Gmbh | Anordnung zur berührungslosen drehwinkelerfassung eines drehbaren elements |
US6118284A (en) * | 1996-10-04 | 2000-09-12 | Ghoshal; Uttam S. | High speed magnetic flux sampling |
DE19812307C2 (de) * | 1998-03-20 | 2000-04-13 | Siemens Ag | Diagnoseeinrichtung für einen Giant Magnetoresistiven Sensor |
DE19947761A1 (de) * | 1999-10-02 | 2001-04-12 | Bosch Gmbh Robert | Verfahren und Schaltungsanordnung zur Feststellung einer Richtung eines äußeren magnetischen Feldes |
DE10025273C2 (de) * | 2000-05-22 | 2002-03-28 | Siemens Ag | Kernspin- oder Elektronenspin-Magnetometer |
US6930479B2 (en) * | 2002-03-08 | 2005-08-16 | Brown University Research Foundation | High resolution scanning magnetic microscope operable at high temperature |
-
2003
- 2003-10-08 FR FR0311769A patent/FR2860877B1/fr not_active Expired - Lifetime
-
2004
- 2004-10-08 EP EP04791508.7A patent/EP1671140B1/fr not_active Not-in-force
- 2004-10-08 CN CNB2004800330947A patent/CN100561240C/zh not_active Expired - Fee Related
- 2004-10-08 JP JP2006530429A patent/JP4718472B2/ja not_active Expired - Fee Related
- 2004-10-08 WO PCT/FR2004/002561 patent/WO2005036187A1/fr active Application Filing
- 2004-10-08 US US10/575,231 patent/US7417424B2/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS55143448A (en) * | 1978-10-13 | 1980-11-08 | Anritsu Corp | Selective level measuring instrument |
JPS55164522A (en) * | 1979-03-17 | 1980-12-22 | Happich Gmbh Gebr | Sun visor for vehicle |
JPH074986A (ja) * | 1993-01-21 | 1995-01-10 | Nippondenso Co Ltd | 基準位置検出装置 |
JPH07225251A (ja) * | 1994-02-15 | 1995-08-22 | Hitachi Ltd | 近磁界測定方法およびその装置 |
JP2000266860A (ja) * | 1999-03-19 | 2000-09-29 | Toshiba Corp | 磁性テープ検出装置 |
JP2002372574A (ja) * | 2001-06-14 | 2002-12-26 | Toyota Motor Corp | 磁界検出装置 |
Also Published As
Publication number | Publication date |
---|---|
EP1671140B1 (fr) | 2018-05-16 |
CN100561240C (zh) | 2009-11-18 |
WO2005036187A1 (fr) | 2005-04-21 |
CN1879024A (zh) | 2006-12-13 |
FR2860877A1 (fr) | 2005-04-15 |
FR2860877B1 (fr) | 2006-02-03 |
EP1671140A1 (fr) | 2006-06-21 |
US7417424B2 (en) | 2008-08-26 |
US20070052412A1 (en) | 2007-03-08 |
JP2007508534A (ja) | 2007-04-05 |
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