JP4659119B2 - 電子ヒューズの最適フィールド・プログラミングを提供する方法。 - Google Patents

電子ヒューズの最適フィールド・プログラミングを提供する方法。 Download PDF

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Publication number
JP4659119B2
JP4659119B2 JP2009533792A JP2009533792A JP4659119B2 JP 4659119 B2 JP4659119 B2 JP 4659119B2 JP 2009533792 A JP2009533792 A JP 2009533792A JP 2009533792 A JP2009533792 A JP 2009533792A JP 4659119 B2 JP4659119 B2 JP 4659119B2
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Japan
Prior art keywords
chip
fuse
programming
fuse programming
optimal
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Expired - Fee Related
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JP2009533792A
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English (en)
Japanese (ja)
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JP2010508654A5 (cg-RX-API-DMAC7.html
JP2010508654A (ja
Inventor
ウェレット、マイケル、リチャード
ペリー、トロイ、ジョセフ
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International Business Machines Corp
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International Business Machines Corp
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Publication date
Priority claimed from US11/555,323 external-priority patent/US7518899B2/en
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JP2010508654A publication Critical patent/JP2010508654A/ja
Publication of JP2010508654A5 publication Critical patent/JP2010508654A5/ja
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18—Auxiliary circuits, e.g. for writing into memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
    • G11C17/165—Memory cells which are electrically programmed to cause a change in resistance, e.g. to permit multiple resistance steps to be programmed rather than conduct to or from non-conduct change of fuses and antifuses
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G11C29/027—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in fuses

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  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Powder Metallurgy (AREA)
JP2009533792A 2006-11-01 2007-10-17 電子ヒューズの最適フィールド・プログラミングを提供する方法。 Expired - Fee Related JP4659119B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/555,323 US7518899B2 (en) 2006-11-01 2006-11-01 Method of providing optimal field programming of electronic fuses
US11/850,477 US7791972B2 (en) 2006-11-01 2007-09-05 Design structure for providing optimal field programming of electronic fuses
PCT/EP2007/061109 WO2008052885A1 (en) 2006-11-01 2007-10-17 Method of providing optimal field programming of electronic fuses

Publications (3)

Publication Number Publication Date
JP2010508654A JP2010508654A (ja) 2010-03-18
JP2010508654A5 JP2010508654A5 (cg-RX-API-DMAC7.html) 2010-09-16
JP4659119B2 true JP4659119B2 (ja) 2011-03-30

Family

ID=38969791

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009533792A Expired - Fee Related JP4659119B2 (ja) 2006-11-01 2007-10-17 電子ヒューズの最適フィールド・プログラミングを提供する方法。

Country Status (7)

Country Link
US (1) US7791972B2 (cg-RX-API-DMAC7.html)
EP (1) EP2078304B1 (cg-RX-API-DMAC7.html)
JP (1) JP4659119B2 (cg-RX-API-DMAC7.html)
KR (1) KR101055917B1 (cg-RX-API-DMAC7.html)
AT (1) ATE503251T1 (cg-RX-API-DMAC7.html)
DE (1) DE602007013438D1 (cg-RX-API-DMAC7.html)
WO (1) WO2008052885A1 (cg-RX-API-DMAC7.html)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8028924B2 (en) * 2009-09-15 2011-10-04 International Business Machines Corporation Device and method for providing an integrated circuit with a unique identification
US8719648B2 (en) 2011-07-27 2014-05-06 International Business Machines Corporation Interleaving of memory repair data compression and fuse programming operations in single fusebay architecture
US8537627B2 (en) 2011-09-01 2013-09-17 International Business Machines Corporation Determining fusebay storage element usage
US10598703B2 (en) 2015-07-20 2020-03-24 Eaton Intelligent Power Limited Electric fuse current sensing systems and monitoring methods
JP6207670B1 (ja) * 2016-05-24 2017-10-04 三菱電機株式会社 ワンタイムメモリの制御装置
US10223531B2 (en) 2016-12-30 2019-03-05 Google Llc Secure device state apparatus and method and lifecycle management
US10523048B2 (en) * 2018-02-16 2019-12-31 Monolithic Power Systems, Inc. Power supply and power supplying method with power backup and power sharing
US10855174B2 (en) * 2018-02-16 2020-12-01 Monolithic Power Systems, Inc. Power supply and power supply method with power sharing and overshoot preventing
US10892637B2 (en) * 2018-02-16 2021-01-12 Monolithic Power Systems, Inc. Power supply and power supplying method with power backup
US11289298B2 (en) 2018-05-31 2022-03-29 Eaton Intelligent Power Limited Monitoring systems and methods for estimating thermal-mechanical fatigue in an electrical fuse
US11143718B2 (en) 2018-05-31 2021-10-12 Eaton Intelligent Power Limited Monitoring systems and methods for estimating thermal-mechanical fatigue in an electrical fuse

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4268911A (en) 1979-06-21 1981-05-19 Fairchild Camera And Instrument Corp. ROM Program security circuits
JPS5736497A (en) * 1980-08-14 1982-02-27 Toshiba Corp Semiconductor integrated circuit
JPS5936497A (ja) 1982-08-23 1984-02-28 Mitsuyoshi Sangyo Kk 音響機器の前面に装着するプラスチツクグリル枠に金属グリルを取付ける方法
US6034882A (en) * 1998-11-16 2000-03-07 Matrix Semiconductor, Inc. Vertically stacked field programmable nonvolatile memory and method of fabrication
US6483736B2 (en) 1998-11-16 2002-11-19 Matrix Semiconductor, Inc. Vertically stacked field programmable nonvolatile memory and method of fabrication
US6437653B1 (en) 2000-09-28 2002-08-20 Sun Microsystems, Inc. Method and apparatus for providing a variable inductor on a semiconductor chip
US6876594B2 (en) * 2002-12-26 2005-04-05 Texas Instruments Incorporated Integrated circuit with programmable fuse array
GB0419465D0 (en) * 2004-09-02 2004-10-06 Cavendish Kinetics Ltd Method and apparatus for programming and reading codes
US20060136858A1 (en) 2004-12-17 2006-06-22 International Business Machines Corporation Utilizing fuses to store control parameters for external system components
JP2008097696A (ja) * 2006-10-11 2008-04-24 Elpida Memory Inc 半導体装置

Also Published As

Publication number Publication date
WO2008052885A1 (en) 2008-05-08
US20080104551A1 (en) 2008-05-01
EP2078304B1 (en) 2011-03-23
EP2078304A1 (en) 2009-07-15
US7791972B2 (en) 2010-09-07
JP2010508654A (ja) 2010-03-18
ATE503251T1 (de) 2011-04-15
KR20090068322A (ko) 2009-06-26
KR101055917B1 (ko) 2011-08-09
DE602007013438D1 (de) 2011-05-05

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