ATE503251T1 - Verfahren zur bereitstellung optimaler einsatzortprogrammierung von elektronischen schmelzverbindungen - Google Patents
Verfahren zur bereitstellung optimaler einsatzortprogrammierung von elektronischen schmelzverbindungenInfo
- Publication number
- ATE503251T1 ATE503251T1 AT07821474T AT07821474T ATE503251T1 AT E503251 T1 ATE503251 T1 AT E503251T1 AT 07821474 T AT07821474 T AT 07821474T AT 07821474 T AT07821474 T AT 07821474T AT E503251 T1 ATE503251 T1 AT E503251T1
- Authority
- AT
- Austria
- Prior art keywords
- customer
- fuse programming
- fusted
- connections
- electronic
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 230000002596 correlated effect Effects 0.000 abstract 2
- 238000004519 manufacturing process Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/18—Auxiliary circuits, e.g. for writing into memory
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
- G11C17/165—Memory cells which are electrically programmed to cause a change in resistance, e.g. to permit multiple resistance steps to be programmed rather than conduct to or from non-conduct change of fuses and antifuses
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/027—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in fuses
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
- Powder Metallurgy (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/555,323 US7518899B2 (en) | 2006-11-01 | 2006-11-01 | Method of providing optimal field programming of electronic fuses |
| US11/850,477 US7791972B2 (en) | 2006-11-01 | 2007-09-05 | Design structure for providing optimal field programming of electronic fuses |
| PCT/EP2007/061109 WO2008052885A1 (en) | 2006-11-01 | 2007-10-17 | Method of providing optimal field programming of electronic fuses |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE503251T1 true ATE503251T1 (de) | 2011-04-15 |
Family
ID=38969791
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT07821474T ATE503251T1 (de) | 2006-11-01 | 2007-10-17 | Verfahren zur bereitstellung optimaler einsatzortprogrammierung von elektronischen schmelzverbindungen |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7791972B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2078304B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP4659119B2 (cg-RX-API-DMAC7.html) |
| KR (1) | KR101055917B1 (cg-RX-API-DMAC7.html) |
| AT (1) | ATE503251T1 (cg-RX-API-DMAC7.html) |
| DE (1) | DE602007013438D1 (cg-RX-API-DMAC7.html) |
| WO (1) | WO2008052885A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8028924B2 (en) * | 2009-09-15 | 2011-10-04 | International Business Machines Corporation | Device and method for providing an integrated circuit with a unique identification |
| US8719648B2 (en) | 2011-07-27 | 2014-05-06 | International Business Machines Corporation | Interleaving of memory repair data compression and fuse programming operations in single fusebay architecture |
| US8537627B2 (en) | 2011-09-01 | 2013-09-17 | International Business Machines Corporation | Determining fusebay storage element usage |
| US10598703B2 (en) | 2015-07-20 | 2020-03-24 | Eaton Intelligent Power Limited | Electric fuse current sensing systems and monitoring methods |
| JP6207670B1 (ja) * | 2016-05-24 | 2017-10-04 | 三菱電機株式会社 | ワンタイムメモリの制御装置 |
| US10223531B2 (en) | 2016-12-30 | 2019-03-05 | Google Llc | Secure device state apparatus and method and lifecycle management |
| US10523048B2 (en) * | 2018-02-16 | 2019-12-31 | Monolithic Power Systems, Inc. | Power supply and power supplying method with power backup and power sharing |
| US10855174B2 (en) * | 2018-02-16 | 2020-12-01 | Monolithic Power Systems, Inc. | Power supply and power supply method with power sharing and overshoot preventing |
| US10892637B2 (en) * | 2018-02-16 | 2021-01-12 | Monolithic Power Systems, Inc. | Power supply and power supplying method with power backup |
| US11289298B2 (en) | 2018-05-31 | 2022-03-29 | Eaton Intelligent Power Limited | Monitoring systems and methods for estimating thermal-mechanical fatigue in an electrical fuse |
| US11143718B2 (en) | 2018-05-31 | 2021-10-12 | Eaton Intelligent Power Limited | Monitoring systems and methods for estimating thermal-mechanical fatigue in an electrical fuse |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4268911A (en) | 1979-06-21 | 1981-05-19 | Fairchild Camera And Instrument Corp. | ROM Program security circuits |
| JPS5736497A (en) * | 1980-08-14 | 1982-02-27 | Toshiba Corp | Semiconductor integrated circuit |
| JPS5936497A (ja) | 1982-08-23 | 1984-02-28 | Mitsuyoshi Sangyo Kk | 音響機器の前面に装着するプラスチツクグリル枠に金属グリルを取付ける方法 |
| US6034882A (en) * | 1998-11-16 | 2000-03-07 | Matrix Semiconductor, Inc. | Vertically stacked field programmable nonvolatile memory and method of fabrication |
| US6483736B2 (en) | 1998-11-16 | 2002-11-19 | Matrix Semiconductor, Inc. | Vertically stacked field programmable nonvolatile memory and method of fabrication |
| US6437653B1 (en) | 2000-09-28 | 2002-08-20 | Sun Microsystems, Inc. | Method and apparatus for providing a variable inductor on a semiconductor chip |
| US6876594B2 (en) * | 2002-12-26 | 2005-04-05 | Texas Instruments Incorporated | Integrated circuit with programmable fuse array |
| GB0419465D0 (en) * | 2004-09-02 | 2004-10-06 | Cavendish Kinetics Ltd | Method and apparatus for programming and reading codes |
| US20060136858A1 (en) | 2004-12-17 | 2006-06-22 | International Business Machines Corporation | Utilizing fuses to store control parameters for external system components |
| JP2008097696A (ja) * | 2006-10-11 | 2008-04-24 | Elpida Memory Inc | 半導体装置 |
-
2007
- 2007-09-05 US US11/850,477 patent/US7791972B2/en not_active Expired - Fee Related
- 2007-10-17 JP JP2009533792A patent/JP4659119B2/ja not_active Expired - Fee Related
- 2007-10-17 AT AT07821474T patent/ATE503251T1/de not_active IP Right Cessation
- 2007-10-17 EP EP07821474A patent/EP2078304B1/en not_active Not-in-force
- 2007-10-17 WO PCT/EP2007/061109 patent/WO2008052885A1/en not_active Ceased
- 2007-10-17 DE DE602007013438T patent/DE602007013438D1/de active Active
- 2007-10-17 KR KR1020097006381A patent/KR101055917B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| WO2008052885A1 (en) | 2008-05-08 |
| US20080104551A1 (en) | 2008-05-01 |
| EP2078304B1 (en) | 2011-03-23 |
| EP2078304A1 (en) | 2009-07-15 |
| US7791972B2 (en) | 2010-09-07 |
| JP2010508654A (ja) | 2010-03-18 |
| JP4659119B2 (ja) | 2011-03-30 |
| KR20090068322A (ko) | 2009-06-26 |
| KR101055917B1 (ko) | 2011-08-09 |
| DE602007013438D1 (de) | 2011-05-05 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| RER | Ceased as to paragraph 5 lit. 3 law introducing patent treaties |