JP4645424B2 - 飛行時間型質量分析装置 - Google Patents

飛行時間型質量分析装置 Download PDF

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Publication number
JP4645424B2
JP4645424B2 JP2005338593A JP2005338593A JP4645424B2 JP 4645424 B2 JP4645424 B2 JP 4645424B2 JP 2005338593 A JP2005338593 A JP 2005338593A JP 2005338593 A JP2005338593 A JP 2005338593A JP 4645424 B2 JP4645424 B2 JP 4645424B2
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JP
Japan
Prior art keywords
magnetic field
ions
time
flight
deflection
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Expired - Fee Related
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JP2005338593A
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English (en)
Japanese (ja)
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JP2007149372A5 (enExample
JP2007149372A (ja
Inventor
良弘 上野
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Shimadzu Corp
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Shimadzu Corp
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Priority to JP2005338593A priority Critical patent/JP4645424B2/ja
Priority to US11/603,159 priority patent/US7482583B2/en
Publication of JP2007149372A publication Critical patent/JP2007149372A/ja
Publication of JP2007149372A5 publication Critical patent/JP2007149372A5/ja
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Publication of JP4645424B2 publication Critical patent/JP4645424B2/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/30—Static spectrometers using magnetic analysers, e.g. Dempster spectrometer
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2005338593A 2005-11-24 2005-11-24 飛行時間型質量分析装置 Expired - Fee Related JP4645424B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2005338593A JP4645424B2 (ja) 2005-11-24 2005-11-24 飛行時間型質量分析装置
US11/603,159 US7482583B2 (en) 2005-11-24 2006-11-22 Time of flight mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005338593A JP4645424B2 (ja) 2005-11-24 2005-11-24 飛行時間型質量分析装置

Publications (3)

Publication Number Publication Date
JP2007149372A JP2007149372A (ja) 2007-06-14
JP2007149372A5 JP2007149372A5 (enExample) 2008-03-27
JP4645424B2 true JP4645424B2 (ja) 2011-03-09

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ID=38052532

Family Applications (1)

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JP2005338593A Expired - Fee Related JP4645424B2 (ja) 2005-11-24 2005-11-24 飛行時間型質量分析装置

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US (1) US7482583B2 (enExample)
JP (1) JP4645424B2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7347294B2 (en) * 2003-05-21 2008-03-25 Gonzalez Encarnacion H Power system for electrically powered land vehicle
JP4980583B2 (ja) * 2004-05-21 2012-07-18 日本電子株式会社 飛行時間型質量分析方法及び装置
JP2006228435A (ja) * 2005-02-15 2006-08-31 Shimadzu Corp 飛行時間型質量分析装置
JP4743125B2 (ja) * 2007-01-22 2011-08-10 株式会社島津製作所 質量分析装置
US7932487B2 (en) * 2008-01-11 2011-04-26 Thermo Finnigan Llc Mass spectrometer with looped ion path
US20110248161A1 (en) * 2008-10-02 2011-10-13 Shimadzu Corporation Multi-Turn Time-of-Flight Mass Spectrometer
GB2476964A (en) * 2010-01-15 2011-07-20 Anatoly Verenchikov Electrostatic trap mass spectrometer
JP5419047B2 (ja) * 2010-03-19 2014-02-19 株式会社島津製作所 質量分析データ処理方法及び質量分析装置
CN105470098B (zh) * 2015-12-30 2017-09-15 东南大学 基于磁场的离子阱飞行时间质谱仪设置方法
JP7606682B2 (ja) * 2020-10-23 2024-12-26 国立大学法人東北大学 荷電粒子輸送装置
JP7616649B2 (ja) * 2021-05-18 2025-01-17 国立大学法人東北大学 電子分光器

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0574410A (ja) * 1991-02-22 1993-03-26 Shimadzu Corp イオン散乱分析装置
JP4151926B2 (ja) 1997-10-28 2008-09-17 日本電子株式会社 飛行時間型質量分析計のイオン光学系
JP2000067807A (ja) * 1998-08-25 2000-03-03 Perkin Elmer Corp:The イオンビームからイオンを分離するための方法及び装置
JP3571566B2 (ja) * 1999-02-19 2004-09-29 日本電子株式会社 飛行時間型質量分析計のイオン光学系
JP3571567B2 (ja) 1999-02-19 2004-09-29 日本電子株式会社 飛行時間型質量分析計のイオン光学系
JP3773430B2 (ja) * 2001-09-12 2006-05-10 日本電子株式会社 飛行時間型質量分析計のイオン光学系
JP3967694B2 (ja) * 2003-06-26 2007-08-29 日本電子株式会社 飛行時間型質量分析装置
JP4001100B2 (ja) * 2003-11-14 2007-10-31 株式会社島津製作所 質量分析装置

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Publication number Publication date
US7482583B2 (en) 2009-01-27
US20070114383A1 (en) 2007-05-24
JP2007149372A (ja) 2007-06-14

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