JP2007149372A5 - - Google Patents

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Publication number
JP2007149372A5
JP2007149372A5 JP2005338593A JP2005338593A JP2007149372A5 JP 2007149372 A5 JP2007149372 A5 JP 2007149372A5 JP 2005338593 A JP2005338593 A JP 2005338593A JP 2005338593 A JP2005338593 A JP 2005338593A JP 2007149372 A5 JP2007149372 A5 JP 2007149372A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005338593A
Other languages
Japanese (ja)
Other versions
JP4645424B2 (ja
JP2007149372A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2005338593A priority Critical patent/JP4645424B2/ja
Priority claimed from JP2005338593A external-priority patent/JP4645424B2/ja
Priority to US11/603,159 priority patent/US7482583B2/en
Publication of JP2007149372A publication Critical patent/JP2007149372A/ja
Publication of JP2007149372A5 publication Critical patent/JP2007149372A5/ja
Application granted granted Critical
Publication of JP4645424B2 publication Critical patent/JP4645424B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2005338593A 2005-11-24 2005-11-24 飛行時間型質量分析装置 Expired - Fee Related JP4645424B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2005338593A JP4645424B2 (ja) 2005-11-24 2005-11-24 飛行時間型質量分析装置
US11/603,159 US7482583B2 (en) 2005-11-24 2006-11-22 Time of flight mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005338593A JP4645424B2 (ja) 2005-11-24 2005-11-24 飛行時間型質量分析装置

Publications (3)

Publication Number Publication Date
JP2007149372A JP2007149372A (ja) 2007-06-14
JP2007149372A5 true JP2007149372A5 (enExample) 2008-03-27
JP4645424B2 JP4645424B2 (ja) 2011-03-09

Family

ID=38052532

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005338593A Expired - Fee Related JP4645424B2 (ja) 2005-11-24 2005-11-24 飛行時間型質量分析装置

Country Status (2)

Country Link
US (1) US7482583B2 (enExample)
JP (1) JP4645424B2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7347294B2 (en) * 2003-05-21 2008-03-25 Gonzalez Encarnacion H Power system for electrically powered land vehicle
JP4980583B2 (ja) * 2004-05-21 2012-07-18 日本電子株式会社 飛行時間型質量分析方法及び装置
JP2006228435A (ja) * 2005-02-15 2006-08-31 Shimadzu Corp 飛行時間型質量分析装置
JP4743125B2 (ja) * 2007-01-22 2011-08-10 株式会社島津製作所 質量分析装置
US7932487B2 (en) * 2008-01-11 2011-04-26 Thermo Finnigan Llc Mass spectrometer with looped ion path
US20110248161A1 (en) * 2008-10-02 2011-10-13 Shimadzu Corporation Multi-Turn Time-of-Flight Mass Spectrometer
GB2476964A (en) * 2010-01-15 2011-07-20 Anatoly Verenchikov Electrostatic trap mass spectrometer
JP5419047B2 (ja) * 2010-03-19 2014-02-19 株式会社島津製作所 質量分析データ処理方法及び質量分析装置
CN105470098B (zh) * 2015-12-30 2017-09-15 东南大学 基于磁场的离子阱飞行时间质谱仪设置方法
JP7606682B2 (ja) * 2020-10-23 2024-12-26 国立大学法人東北大学 荷電粒子輸送装置
JP7616649B2 (ja) * 2021-05-18 2025-01-17 国立大学法人東北大学 電子分光器

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0574410A (ja) * 1991-02-22 1993-03-26 Shimadzu Corp イオン散乱分析装置
JP4151926B2 (ja) 1997-10-28 2008-09-17 日本電子株式会社 飛行時間型質量分析計のイオン光学系
JP2000067807A (ja) * 1998-08-25 2000-03-03 Perkin Elmer Corp:The イオンビームからイオンを分離するための方法及び装置
JP3571566B2 (ja) * 1999-02-19 2004-09-29 日本電子株式会社 飛行時間型質量分析計のイオン光学系
JP3571567B2 (ja) 1999-02-19 2004-09-29 日本電子株式会社 飛行時間型質量分析計のイオン光学系
JP3773430B2 (ja) * 2001-09-12 2006-05-10 日本電子株式会社 飛行時間型質量分析計のイオン光学系
JP3967694B2 (ja) * 2003-06-26 2007-08-29 日本電子株式会社 飛行時間型質量分析装置
JP4001100B2 (ja) * 2003-11-14 2007-10-31 株式会社島津製作所 質量分析装置

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