JP4576152B2 - 一体型のシンチレータ及びコリメータを有する検出器を製造する方法 - Google Patents
一体型のシンチレータ及びコリメータを有する検出器を製造する方法 Download PDFInfo
- Publication number
- JP4576152B2 JP4576152B2 JP2004132862A JP2004132862A JP4576152B2 JP 4576152 B2 JP4576152 B2 JP 4576152B2 JP 2004132862 A JP2004132862 A JP 2004132862A JP 2004132862 A JP2004132862 A JP 2004132862A JP 4576152 B2 JP4576152 B2 JP 4576152B2
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- Prior art keywords
- collimator
- scintillator
- array
- detector
- formwork
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 238000004519 manufacturing process Methods 0.000 title claims description 25
- 238000009415 formwork Methods 0.000 claims description 34
- 239000000203 mixture Substances 0.000 claims description 25
- 238000000034 method Methods 0.000 claims description 21
- 238000012545 processing Methods 0.000 claims description 20
- 150000001875 compounds Chemical class 0.000 claims description 5
- 229910052721 tungsten Inorganic materials 0.000 claims description 5
- 239000010937 tungsten Substances 0.000 claims description 5
- 239000004593 Epoxy Substances 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 238000005498 polishing Methods 0.000 claims description 2
- 229910001220 stainless steel Inorganic materials 0.000 claims 1
- 239000010935 stainless steel Substances 0.000 claims 1
- 238000002591 computed tomography Methods 0.000 description 31
- 239000000463 material Substances 0.000 description 18
- 238000003491 array Methods 0.000 description 9
- 238000003384 imaging method Methods 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 238000007689 inspection Methods 0.000 description 5
- 238000003754 machining Methods 0.000 description 5
- 230000002238 attenuated effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000000843 powder Substances 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000013170 computed tomography imaging Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000002059 diagnostic imaging Methods 0.000 description 2
- 230000005484 gravity Effects 0.000 description 2
- 238000003672 processing method Methods 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- CVOFKRWYWCSDMA-UHFFFAOYSA-N 2-chloro-n-(2,6-diethylphenyl)-n-(methoxymethyl)acetamide;2,6-dinitro-n,n-dipropyl-4-(trifluoromethyl)aniline Chemical compound CCC1=CC=CC(CC)=C1N(COC)C(=O)CCl.CCCN(CCC)C1=C([N+]([O-])=O)C=C(C(F)(F)F)C=C1[N+]([O-])=O CVOFKRWYWCSDMA-UHFFFAOYSA-N 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 239000013256 coordination polymer Substances 0.000 description 1
- 238000013036 cure process Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 238000001125 extrusion Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000001746 injection moulding Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 150000003657 tungsten Chemical class 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/161—Applications in the field of nuclear medicine, e.g. in vivo counting
- G01T1/164—Scintigraphy
- G01T1/1641—Static instruments for imaging the distribution of radioactivity in one or two dimensions using one or several scintillating elements; Radio-isotope cameras
- G01T1/1648—Ancillary equipment for scintillation cameras, e.g. reference markers, devices for removing motion artifacts, calibration devices
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
- G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
Landscapes
- Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- General Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Optics & Photonics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Molecular Biology (AREA)
- Medical Informatics (AREA)
- Biomedical Technology (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
Description
2 コリメータ・プレート
3 シンチレータ
4 シンチレータ・アレイ
5 反射体ライン
6 フォトダイオード・アレイ
7 エア・ギャップ
10 コンピュータ断層(CT)イメージング・システム
12 ガントリ
14 X線源
16 X線ビーム
18 検出器アレイ
20 検出器
22 患者
24 回転中心
26 制御機構
28 X線制御装置
30 ガントリ・モータ制御装置
32 データ収集システム(DAS)
34 画像再構成装置
36 コンピュータ
38 大容量記憶装置
40 コンソール
42 陰極線管ディスプレイ
44 テーブル・モータ制御装置
46 モータ式テーブル
48 ガントリ開口
52 フォトダイオード・アレイ
56 シンチレータ・アレイ
57 シンチレータ
60 フォトダイオード
77 検出器フレーム
79 装着用ブラケット
80 スイッチアレイ
82 スイッチアレイ
84 電気的インタフェース
86 コリメータ・プレート
88 反射体ライン
90 上側反射面
92 加工アセンブリ
94 加工用土台
96 シンチレータ・アレイ造り込みパック
98 下側型枠空洞
100 上側型枠ハウジング
102 型枠
104 ダウエルピン整列アセンブリ
106 空洞
108 造り込みパックの上面
110 排気ゲート
112 真空ポンプ
114 CPU
116 インジェクタ
118 充填ゲート
150 梱包物/荷物検査システム
152 ガントリ
154 開口
156 高周波電磁エネルギー源
158 検出器アセンブリ
160 コンベヤ・システム
162 コンベヤ・ベルト
164 構造
166 梱包物、荷物
Claims (8)
- 一体型のシンチレータ及びコリメータ(144)を有する検出器(20)を製造する方法(120)であって、
加工用土台(94)上にシンチレータ・パックのブロックを位置決めする工程(122)と、
コリメータ型枠空洞(106)をその内部に有するコリメータ型枠ハウジングを前記ブロック(96)上に位置決めする工程(126)と、
前記ブロックと前記型枠ハウジングを整列させる工程(126)と、
前記型枠空洞内に入るようにコリメータ混合物を配置させる工程(136)と、
コリメータ混合物を直接前記ブロック(96)上で硬化させ一体型のシンチレータ及びコリメータ(144)を形成させる工程(140)と、
を含む方法。 - 前記整列の後に、前記ブロックと前記コリメータ型枠ハウジングを一緒に固定する工程(136)をさらに含む請求項1に記載の方法。
- 前記整列の工程が、一組のピン(104)を用いて前記ブロック(96)、前記コリメータ型枠ハウジング(102)及び前記型枠空洞(106)を互いを基準として適正な向きにする工程を含む、請求項1に記載の方法。
- 前記コリメータ型枠空洞(106)が、コリメータ混合物を受け入れるように設計している平行に整列させた一連の空洞を含む、請求項1に記載の方法。
- 前記コリメータ型枠ハウジング(102)がステンレス鋼から形成されている、請求項1に記載の方法。
- 真空ポンプ(112)を用いて前記型枠空洞から空気を除去する工程(138)をさらに含む請求項1に記載の方法。
- 前記コリメータ混合物がタングステンとエポキシの化合物である、請求項1に記載の方法。
- 前記一体型のシンチレータ及びコリメータを研磨する工程(144)をさらに含む請求項1に記載の方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/249,699 US7112797B2 (en) | 2003-04-30 | 2003-04-30 | Scintillator having integrated collimator and method of manufacturing same |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2004333490A JP2004333490A (ja) | 2004-11-25 |
JP2004333490A5 JP2004333490A5 (ja) | 2007-06-14 |
JP4576152B2 true JP4576152B2 (ja) | 2010-11-04 |
Family
ID=33309332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004132862A Expired - Fee Related JP4576152B2 (ja) | 2003-04-30 | 2004-04-28 | 一体型のシンチレータ及びコリメータを有する検出器を製造する方法 |
Country Status (4)
Country | Link |
---|---|
US (3) | US7112797B2 (ja) |
JP (1) | JP4576152B2 (ja) |
IL (1) | IL161464A (ja) |
NL (1) | NL1026089C2 (ja) |
Families Citing this family (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002098624A1 (en) * | 2001-06-05 | 2002-12-12 | Mikro Systems Inc. | Methods for manufacturing three-dimensional devices and devices created thereby |
US7963695B2 (en) | 2002-07-23 | 2011-06-21 | Rapiscan Systems, Inc. | Rotatable boom cargo scanning system |
US8275091B2 (en) | 2002-07-23 | 2012-09-25 | Rapiscan Systems, Inc. | Compact mobile cargo scanning system |
US7492857B2 (en) * | 2002-12-19 | 2009-02-17 | General Electric Company | Self-aligning scintillator-collimator assembly |
US7177387B2 (en) * | 2003-11-29 | 2007-02-13 | General Electric Company | Self-aligning scintillator-collimator assembly |
US9113839B2 (en) | 2003-04-25 | 2015-08-25 | Rapiscon Systems, Inc. | X-ray inspection system and method |
GB0309385D0 (en) | 2003-04-25 | 2003-06-04 | Cxr Ltd | X-ray monitoring |
GB0309379D0 (en) | 2003-04-25 | 2003-06-04 | Cxr Ltd | X-ray scanning |
US7949101B2 (en) | 2005-12-16 | 2011-05-24 | Rapiscan Systems, Inc. | X-ray scanners and X-ray sources therefor |
US8223919B2 (en) | 2003-04-25 | 2012-07-17 | Rapiscan Systems, Inc. | X-ray tomographic inspection systems for the identification of specific target items |
US8837669B2 (en) | 2003-04-25 | 2014-09-16 | Rapiscan Systems, Inc. | X-ray scanning system |
US8451974B2 (en) | 2003-04-25 | 2013-05-28 | Rapiscan Systems, Inc. | X-ray tomographic inspection system for the identification of specific target items |
US8804899B2 (en) | 2003-04-25 | 2014-08-12 | Rapiscan Systems, Inc. | Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners |
US8243876B2 (en) | 2003-04-25 | 2012-08-14 | Rapiscan Systems, Inc. | X-ray scanners |
GB0525593D0 (en) | 2005-12-16 | 2006-01-25 | Cxr Ltd | X-ray tomography inspection systems |
US7112797B2 (en) * | 2003-04-30 | 2006-09-26 | General Electric Company | Scintillator having integrated collimator and method of manufacturing same |
US6928141B2 (en) | 2003-06-20 | 2005-08-09 | Rapiscan, Inc. | Relocatable X-ray imaging system and method for inspecting commercial vehicles and cargo containers |
US7098460B2 (en) * | 2003-08-04 | 2006-08-29 | General Electric Company | Monolithic structure for x-ray CT collimator |
US7076029B2 (en) * | 2003-10-27 | 2006-07-11 | General Electric Company | Method and apparatus of radiographic imaging with an energy beam tailored for a subject to be scanned |
US7112798B2 (en) * | 2003-12-23 | 2006-09-26 | General Electric Company | Tailorable CT-detector assembly |
US7471764B2 (en) | 2005-04-15 | 2008-12-30 | Rapiscan Security Products, Inc. | X-ray imaging system having improved weather resistance |
DE102006024972B4 (de) * | 2006-05-29 | 2008-08-21 | Siemens Ag | Vorrichtung zur Kühlung eines Röntgenstrahlungsdetektors und Kühlsystem für eine Strahlungsdetektoranordnung |
US8492762B2 (en) * | 2006-06-27 | 2013-07-23 | General Electric Company | Electrical interface for a sensor array |
US20080023636A1 (en) * | 2006-07-25 | 2008-01-31 | Samir Chowdhury | Tungsten polymer collimator for medical imaging |
US20080068815A1 (en) * | 2006-09-18 | 2008-03-20 | Oliver Richard Astley | Interface Assembly And Method for Integrating A Data Acquisition System on a Sensor Array |
FR2922319B1 (fr) * | 2007-10-10 | 2013-08-02 | Commissariat Energie Atomique | Scintillateur pour dispositif d'imagerie, module scintillateur, dispositif d'imagerie avec un tel scintillateur et procede de fabrication d'un scintillateur |
GB0803641D0 (en) | 2008-02-28 | 2008-04-02 | Rapiscan Security Products Inc | Scanning systems |
GB0803644D0 (en) | 2008-02-28 | 2008-04-02 | Rapiscan Security Products Inc | Scanning systems |
GB0809110D0 (en) | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Gantry scanner systems |
US20110056618A1 (en) * | 2008-06-05 | 2011-03-10 | Hiromichi Tonami | Method of manufacturing radiation detector |
EP2362822A2 (en) | 2008-09-26 | 2011-09-07 | Mikro Systems Inc. | Systems, devices, and/or methods for manufacturing castings |
JP2010085259A (ja) * | 2008-09-30 | 2010-04-15 | Fujifilm Corp | 放射線検出装置及び放射線撮影システム |
DE102009004119A1 (de) * | 2009-01-08 | 2010-07-15 | Siemens Aktiengesellschaft | Sensoreinheit für einen Röntgendetektor und zugehöriges Fertigungsverfahren |
DE102009004121B4 (de) * | 2009-01-08 | 2010-12-02 | Siemens Aktiengesellschaft | Schwindungstolerantes Formteil zur Herstellung eines Strahlungswandlers |
US8699668B2 (en) * | 2011-04-26 | 2014-04-15 | General Electric Company | Composite material x-ray collimator and method of manufacturing thereof |
US9218933B2 (en) | 2011-06-09 | 2015-12-22 | Rapidscan Systems, Inc. | Low-dose radiographic imaging system |
DE102011087211B4 (de) * | 2011-11-28 | 2019-06-27 | Siemens Healthcare Gmbh | Detektoranordnung eines ionisierende Strahlung detektierenden Detektors eines bildgebenden Systems mit Luftkühlung und Verfahren zur Kühlung der Detektoranordnung |
US8813824B2 (en) | 2011-12-06 | 2014-08-26 | Mikro Systems, Inc. | Systems, devices, and/or methods for producing holes |
US9791590B2 (en) | 2013-01-31 | 2017-10-17 | Rapiscan Systems, Inc. | Portable security inspection system |
US10408947B2 (en) | 2016-09-06 | 2019-09-10 | General Electric Company | Direct attached tungsten 3-D printed collimator to scintillator array |
CN112114347B (zh) * | 2019-06-21 | 2024-05-17 | 清华大学 | 用于制造闪烁体探测器的设备和方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09127248A (ja) * | 1995-10-31 | 1997-05-16 | Shimadzu Corp | 放射線検出器 |
JP2001174563A (ja) * | 1999-12-15 | 2001-06-29 | Ge Yokogawa Medical Systems Ltd | X線検出器およびx線ct装置 |
JP2001188096A (ja) * | 1999-12-28 | 2001-07-10 | Shimadzu Corp | 2次元アレイ型放射線検出器及びx線遮蔽壁の製造方法 |
JP2002318283A (ja) * | 2001-04-24 | 2002-10-31 | Shimadzu Corp | 2次元アレイ型放射線検出器とそのx線遮蔽壁の製造方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2034148A (en) * | 1929-02-12 | 1936-03-17 | Rca Corp | Glow discharge tube for use for example in recording sound |
GB2034148B (en) * | 1978-08-30 | 1983-06-15 | Gen Electric | Multi element high resolution scintillator structure |
US4982096A (en) * | 1988-01-06 | 1991-01-01 | Hitachi Medical Corporation | Multi-element radiation detector |
US5262946A (en) | 1988-10-20 | 1993-11-16 | Picker International, Inc. | Dynamic volume scanning for CT scanners |
AU1747300A (en) * | 1998-11-30 | 2000-06-19 | Gerhard Fenkart | A nonintrusive inspection system |
US6396898B1 (en) * | 1999-12-24 | 2002-05-28 | Kabushiki Kaisha Toshiba | Radiation detector and x-ray CT apparatus |
US6479824B1 (en) * | 2000-11-08 | 2002-11-12 | Ge Medical Systems Global Technology Company, Llc | Scintillator arrays for CT imaging and other applications |
ITRM20010279A1 (it) * | 2001-05-23 | 2002-11-25 | C N R Consiglio Naz Delle Ri C | Dispositivo scintigrafico con collimatore a cristalli integrati con elevata risoluzione spaziale. |
WO2004033132A1 (en) * | 2002-10-07 | 2004-04-22 | Tecomet, Inc. | Cast collimator and method for making same |
EP1578552A4 (en) * | 2002-12-09 | 2006-11-22 | Tecomet Inc | COMPRESSED PARTICLE / BINDER COMPOSITE MATERIALS |
US7046761B2 (en) | 2003-01-23 | 2006-05-16 | Reveal Imaging Technologies, Inc. | System and method for CT scanning of baggage |
US6933504B2 (en) * | 2003-03-12 | 2005-08-23 | General Electric Company | CT detector having a segmented optical coupler and method of manufacturing same |
US7112797B2 (en) * | 2003-04-30 | 2006-09-26 | General Electric Company | Scintillator having integrated collimator and method of manufacturing same |
US6934354B2 (en) * | 2003-05-02 | 2005-08-23 | General Electric Company | Collimator assembly having multi-piece components |
US6990176B2 (en) * | 2003-10-30 | 2006-01-24 | General Electric Company | Methods and apparatus for tileable sensor array |
-
2003
- 2003-04-30 US US10/249,699 patent/US7112797B2/en not_active Expired - Lifetime
-
2004
- 2004-04-18 IL IL161464A patent/IL161464A/en active IP Right Grant
- 2004-04-28 JP JP2004132862A patent/JP4576152B2/ja not_active Expired - Fee Related
- 2004-04-29 NL NL1026089A patent/NL1026089C2/nl not_active IP Right Cessation
-
2006
- 2006-01-24 US US11/275,684 patent/US7247856B2/en not_active Expired - Lifetime
-
2007
- 2007-05-07 US US11/745,296 patent/US20070211848A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09127248A (ja) * | 1995-10-31 | 1997-05-16 | Shimadzu Corp | 放射線検出器 |
JP2001174563A (ja) * | 1999-12-15 | 2001-06-29 | Ge Yokogawa Medical Systems Ltd | X線検出器およびx線ct装置 |
JP2001188096A (ja) * | 1999-12-28 | 2001-07-10 | Shimadzu Corp | 2次元アレイ型放射線検出器及びx線遮蔽壁の製造方法 |
JP2002318283A (ja) * | 2001-04-24 | 2002-10-31 | Shimadzu Corp | 2次元アレイ型放射線検出器とそのx線遮蔽壁の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
US20060097174A1 (en) | 2006-05-11 |
US20040217291A1 (en) | 2004-11-04 |
US7112797B2 (en) | 2006-09-26 |
US20070211848A1 (en) | 2007-09-13 |
NL1026089A1 (nl) | 2004-11-02 |
IL161464A0 (en) | 2004-09-27 |
US7247856B2 (en) | 2007-07-24 |
JP2004333490A (ja) | 2004-11-25 |
IL161464A (en) | 2008-12-29 |
NL1026089C2 (nl) | 2007-07-17 |
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