JP4575838B2 - 測定プローブ用着脱自在プローブ・チップ装置 - Google Patents
測定プローブ用着脱自在プローブ・チップ装置 Download PDFInfo
- Publication number
- JP4575838B2 JP4575838B2 JP2005152442A JP2005152442A JP4575838B2 JP 4575838 B2 JP4575838 B2 JP 4575838B2 JP 2005152442 A JP2005152442 A JP 2005152442A JP 2005152442 A JP2005152442 A JP 2005152442A JP 4575838 B2 JP4575838 B2 JP 4575838B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- probe tip
- mounting member
- arms
- flexible substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Description
なお、参照符号は、本発明の実施例との対応関係を単に示すだけである。また、特許請求の範囲及び本明細書において、「可逆圧縮可能な弾性部材」とは、力を加えると圧縮されるが、この力を除くと圧縮が元の状態に戻る弾性部材をいう。
12 ハウジング
14 プローブ・チップ装着部材
16、18 取り付けアーム
26 リブ
34 チャネル
36 ハウジング
38 プローブ・チップ部材
40 ボス
42、44 プローブ・チップ
56 可逆圧縮可能な弾性部材
58 突出部
60 突出部(ラッチ手段)
66 凹部(ラッチ手段)
70 柔軟な基板材
72、74 プローブ・チップ・アーム
78、80 導電路
82、84 電気接触パッド
90 抵抗要素
92、94 導電ワイヤ
96 突出部(ラッチ手段)
100 開口(ラッチ手段)
118、120 ノッチ(ラッチ手段)
124 ノッチ
128 チャネル部分
130 環状部分
136 ボア
Claims (1)
- 被測定装置に取り付ける測定プローブ用の着脱自在プローブ・チップ装置であって、
プローブ・チップ装着部材と、該プローブ・チップ装着部材から互いに向かい合って略直角に伸びた複数の取り付けアームとを有し、該取り付けアームにより上記プローブ・チップ装着部材の内面が決まるハウジングと、
上記プローブ・チップ装着部材の上記内面内に配置された可逆圧縮可能な弾性部材と、
ノッチで定まる第1及び第2プローブ・チップ・アーム並びに上記第1及び第2プローブ・チップ・アームの夫々に沿って伸びる第1及び第2導電路を有し、上記可逆圧縮可能な弾性部材を覆うように配置された柔軟な基板材の上記第1及び第2導電路の一部として形成される第1及び第2プローブ・チップと、
上記第1及び第2導電路夫々の一方の端部側の上記柔軟な基板材上に隣接して形成され、上記可逆圧縮可能な弾性部材から見て外方向に配置される電気接触パッドと、
上記第1及び第2導電路の他方の端部側の上記第1及び第2プローブ・チップ・アーム上に形成された電気接触パッドと、
上記第1及び第2プローブ・チップを有する上記柔軟な基板材を上記ハウジングに固定するラッチ手段と
を具えた測定プローブ用着脱自在プローブ・チップ装置。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/856,230 US7056134B2 (en) | 2004-05-27 | 2004-05-27 | Attachable/detachable probing tip system for a measurement probing system |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005338088A JP2005338088A (ja) | 2005-12-08 |
JP4575838B2 true JP4575838B2 (ja) | 2010-11-04 |
Family
ID=35106670
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005152442A Expired - Fee Related JP4575838B2 (ja) | 2004-05-27 | 2005-05-25 | 測定プローブ用着脱自在プローブ・チップ装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7056134B2 (ja) |
EP (1) | EP1607750B1 (ja) |
JP (1) | JP4575838B2 (ja) |
KR (1) | KR101164539B1 (ja) |
CN (2) | CN101487852B (ja) |
DE (1) | DE602005001895T2 (ja) |
TW (1) | TWI368034B (ja) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7371129B2 (en) * | 2005-04-27 | 2008-05-13 | Samtec, Inc. | Elevated height electrical connector |
DE102005053146A1 (de) * | 2005-11-04 | 2007-05-10 | Suss Microtec Test Systems Gmbh | Messspitze zur Hochfrequenzmessung |
US7532492B2 (en) * | 2005-12-20 | 2009-05-12 | Tektronix, Inc. | Host controlled voltage input system for an accessory device |
US9140724B1 (en) * | 2006-01-06 | 2015-09-22 | Lecroy Corporation | Compensating resistance probing tip optimized adapters for use with specific electrical test probes |
US9404940B1 (en) | 2006-01-06 | 2016-08-02 | Teledyne Lecroy, Inc. | Compensating probing tip optimized adapters for use with specific electrical test probes |
US20070222468A1 (en) * | 2006-03-22 | 2007-09-27 | Mctigue Michael T | High bandwidth probe system |
US8109883B2 (en) | 2006-09-28 | 2012-02-07 | Tyco Healthcare Group Lp | Cable monitoring apparatus |
US8668651B2 (en) | 2006-12-05 | 2014-03-11 | Covidien Lp | ECG lead set and ECG adapter system |
US20090085591A1 (en) * | 2007-10-01 | 2009-04-02 | Samtec Inc. | Probe tip including a flexible circuit board |
CA2646037C (en) | 2007-12-11 | 2017-11-28 | Tyco Healthcare Group Lp | Ecg electrode connector |
US7592822B2 (en) * | 2007-12-17 | 2009-09-22 | Tektronix, Inc. | Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips |
KR200448808Y1 (ko) * | 2007-12-18 | 2010-05-24 | 파인텍 씨오., 엘티디. | 변환기용 보호 케이싱 |
US20100073018A1 (en) * | 2008-09-23 | 2010-03-25 | Tektronix, Inc. | Adjustable probe head |
USD737979S1 (en) | 2008-12-09 | 2015-09-01 | Covidien Lp | ECG electrode connector |
US8694080B2 (en) | 2009-10-21 | 2014-04-08 | Covidien Lp | ECG lead system |
US8963568B2 (en) * | 2010-03-31 | 2015-02-24 | Tektronix, Inc. | Resistive probing tip system for logic analyzer probing system |
CA2746944C (en) | 2010-07-29 | 2018-09-25 | Tyco Healthcare Group Lp | Ecg adapter system and method |
US8643396B2 (en) | 2011-05-31 | 2014-02-04 | Tektronix, Inc. | Probing tip for a signal acquisition probe |
CN103687537B (zh) | 2011-07-22 | 2016-02-24 | 柯惠有限合伙公司 | Ecg电极连接器 |
US8634901B2 (en) | 2011-09-30 | 2014-01-21 | Covidien Lp | ECG leadwire system with noise suppression and related methods |
CN103163338B (zh) * | 2011-12-14 | 2016-04-06 | 北京普源精电科技有限公司 | 一种具有屏蔽罩的探头 |
EP2687858B1 (en) | 2012-07-19 | 2019-01-23 | Tektronix, Inc. | Probing tip for a signal acquisition probe |
CN103575943B (zh) * | 2012-07-31 | 2018-08-03 | 特克特朗尼克公司 | 信号获取探针的探查端头 |
US9255654B2 (en) | 2012-09-14 | 2016-02-09 | United Technologies Corporation | Hard lead egress adapter for an instrumentation component |
JP2014106019A (ja) * | 2012-11-26 | 2014-06-09 | Stack Electronics Co Ltd | プローブ |
US9261535B2 (en) * | 2013-03-13 | 2016-02-16 | SanDisk Technologies, Inc. | Active probe adaptor |
US9408546B2 (en) | 2013-03-15 | 2016-08-09 | Covidien Lp | Radiolucent ECG electrode system |
USD771818S1 (en) | 2013-03-15 | 2016-11-15 | Covidien Lp | ECG electrode connector |
WO2014149548A1 (en) | 2013-03-15 | 2014-09-25 | Covidien Lp | Electrode connector with a conductive member |
US9188606B2 (en) | 2013-04-29 | 2015-11-17 | Keysight Technologies, Inc. | Oscilloscope current probe with interchangeable range and sensitivity setting modules |
CN107623219A (zh) * | 2016-07-14 | 2018-01-23 | 富士康(昆山)电脑接插件有限公司 | 电连接器组件、电子装置组合及外部设备 |
US10663486B2 (en) * | 2017-02-06 | 2020-05-26 | International Business Machines Corporation | Portable electrical noise probe structure |
US10886588B2 (en) | 2018-09-26 | 2021-01-05 | Keysight Technologies, Inc. | High dynamic range probe using pole-zero cancellation |
US20220011361A1 (en) * | 2020-07-08 | 2022-01-13 | Tektronix, Inc. | Securing a probe to a device under test |
WO2023009077A1 (en) * | 2021-07-26 | 2023-02-02 | Minkon Tekstil Sanayi Ve Dis Ticaret Limited Sirketi | Twin-probe electrical tester used in high-voltage transmission lines |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH075201A (ja) * | 1993-06-18 | 1995-01-10 | Yokogawa Electric Corp | プローブ |
JP2002031649A (ja) * | 2000-05-31 | 2002-01-31 | Tektronix Inc | 測定プローブ・ヘッド用交換可能プローブ・チップ・ホルダ及び高周波プローブ・ヘッド |
JP2002107376A (ja) * | 2000-08-21 | 2002-04-10 | Tektronix Inc | 測定プローブ用プローブ・チップ・アダプタ |
JP2002116223A (ja) * | 2000-08-21 | 2002-04-19 | Tektronix Inc | 測定プローブ用プローブ・チップ・アダプタ |
US20030195713A1 (en) * | 2002-04-16 | 2003-10-16 | Mctigue Michael T. | Systems and methods for wideband active probing of devices and circuits in operation |
US20040008046A1 (en) * | 2000-07-31 | 2004-01-15 | Lecroy Corporation | Cartridge system for a probing head for an electrical test probe |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5334931A (en) * | 1991-11-12 | 1994-08-02 | International Business Machines Corporation | Molded test probe assembly |
-
2004
- 2004-05-27 US US10/856,230 patent/US7056134B2/en active Active
-
2005
- 2005-05-20 DE DE602005001895T patent/DE602005001895T2/de active Active
- 2005-05-20 EP EP05253120A patent/EP1607750B1/en not_active Expired - Fee Related
- 2005-05-25 JP JP2005152442A patent/JP4575838B2/ja not_active Expired - Fee Related
- 2005-05-27 CN CN2009100067392A patent/CN101487852B/zh not_active Expired - Fee Related
- 2005-05-27 TW TW094117560A patent/TWI368034B/zh not_active IP Right Cessation
- 2005-05-27 KR KR1020050045049A patent/KR101164539B1/ko active IP Right Grant
- 2005-05-27 CN CNB2005100739315A patent/CN100529764C/zh not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH075201A (ja) * | 1993-06-18 | 1995-01-10 | Yokogawa Electric Corp | プローブ |
JP2002031649A (ja) * | 2000-05-31 | 2002-01-31 | Tektronix Inc | 測定プローブ・ヘッド用交換可能プローブ・チップ・ホルダ及び高周波プローブ・ヘッド |
US20040008046A1 (en) * | 2000-07-31 | 2004-01-15 | Lecroy Corporation | Cartridge system for a probing head for an electrical test probe |
JP2002107376A (ja) * | 2000-08-21 | 2002-04-10 | Tektronix Inc | 測定プローブ用プローブ・チップ・アダプタ |
JP2002116223A (ja) * | 2000-08-21 | 2002-04-19 | Tektronix Inc | 測定プローブ用プローブ・チップ・アダプタ |
US20030195713A1 (en) * | 2002-04-16 | 2003-10-16 | Mctigue Michael T. | Systems and methods for wideband active probing of devices and circuits in operation |
Also Published As
Publication number | Publication date |
---|---|
JP2005338088A (ja) | 2005-12-08 |
CN1702464A (zh) | 2005-11-30 |
US20050266733A1 (en) | 2005-12-01 |
CN101487852A (zh) | 2009-07-22 |
KR101164539B1 (ko) | 2012-07-10 |
US7056134B2 (en) | 2006-06-06 |
DE602005001895D1 (de) | 2007-09-20 |
KR20060046224A (ko) | 2006-05-17 |
TW200602643A (en) | 2006-01-16 |
DE602005001895T2 (de) | 2008-04-24 |
CN101487852B (zh) | 2012-06-20 |
EP1607750B1 (en) | 2007-08-08 |
TWI368034B (en) | 2012-07-11 |
CN100529764C (zh) | 2009-08-19 |
EP1607750A1 (en) | 2005-12-21 |
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