DE602005001895D1 - Abnehmbare Prüfspitze für Abtastsystem - Google Patents
Abnehmbare Prüfspitze für AbtastsystemInfo
- Publication number
- DE602005001895D1 DE602005001895D1 DE602005001895T DE602005001895T DE602005001895D1 DE 602005001895 D1 DE602005001895 D1 DE 602005001895D1 DE 602005001895 T DE602005001895 T DE 602005001895T DE 602005001895 T DE602005001895 T DE 602005001895T DE 602005001895 D1 DE602005001895 D1 DE 602005001895D1
- Authority
- DE
- Germany
- Prior art keywords
- scanning system
- detachable probe
- detachable
- probe
- scanning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06788—Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US856230 | 2004-05-27 | ||
US10/856,230 US7056134B2 (en) | 2004-05-27 | 2004-05-27 | Attachable/detachable probing tip system for a measurement probing system |
Publications (2)
Publication Number | Publication Date |
---|---|
DE602005001895D1 true DE602005001895D1 (de) | 2007-09-20 |
DE602005001895T2 DE602005001895T2 (de) | 2008-04-24 |
Family
ID=35106670
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602005001895T Active DE602005001895T2 (de) | 2004-05-27 | 2005-05-20 | Abnehmbare Sondierspitze für ein Messondiersystem |
Country Status (7)
Country | Link |
---|---|
US (1) | US7056134B2 (de) |
EP (1) | EP1607750B1 (de) |
JP (1) | JP4575838B2 (de) |
KR (1) | KR101164539B1 (de) |
CN (2) | CN101487852B (de) |
DE (1) | DE602005001895T2 (de) |
TW (1) | TWI368034B (de) |
Families Citing this family (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7371129B2 (en) * | 2005-04-27 | 2008-05-13 | Samtec, Inc. | Elevated height electrical connector |
DE102005053146A1 (de) * | 2005-11-04 | 2007-05-10 | Suss Microtec Test Systems Gmbh | Messspitze zur Hochfrequenzmessung |
US7532492B2 (en) * | 2005-12-20 | 2009-05-12 | Tektronix, Inc. | Host controlled voltage input system for an accessory device |
US9140724B1 (en) * | 2006-01-06 | 2015-09-22 | Lecroy Corporation | Compensating resistance probing tip optimized adapters for use with specific electrical test probes |
US9404940B1 (en) | 2006-01-06 | 2016-08-02 | Teledyne Lecroy, Inc. | Compensating probing tip optimized adapters for use with specific electrical test probes |
US20070222468A1 (en) * | 2006-03-22 | 2007-09-27 | Mctigue Michael T | High bandwidth probe system |
US8109883B2 (en) | 2006-09-28 | 2012-02-07 | Tyco Healthcare Group Lp | Cable monitoring apparatus |
US8668651B2 (en) | 2006-12-05 | 2014-03-11 | Covidien Lp | ECG lead set and ECG adapter system |
US20090085591A1 (en) * | 2007-10-01 | 2009-04-02 | Samtec Inc. | Probe tip including a flexible circuit board |
CA2646037C (en) | 2007-12-11 | 2017-11-28 | Tyco Healthcare Group Lp | Ecg electrode connector |
US7592822B2 (en) * | 2007-12-17 | 2009-09-22 | Tektronix, Inc. | Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips |
KR200448808Y1 (ko) * | 2007-12-18 | 2010-05-24 | 파인텍 씨오., 엘티디. | 변환기용 보호 케이싱 |
US20100073018A1 (en) * | 2008-09-23 | 2010-03-25 | Tektronix, Inc. | Adjustable probe head |
USD737979S1 (en) | 2008-12-09 | 2015-09-01 | Covidien Lp | ECG electrode connector |
US8694080B2 (en) | 2009-10-21 | 2014-04-08 | Covidien Lp | ECG lead system |
US8963568B2 (en) | 2010-03-31 | 2015-02-24 | Tektronix, Inc. | Resistive probing tip system for logic analyzer probing system |
CA2746944C (en) | 2010-07-29 | 2018-09-25 | Tyco Healthcare Group Lp | Ecg adapter system and method |
US8643396B2 (en) | 2011-05-31 | 2014-02-04 | Tektronix, Inc. | Probing tip for a signal acquisition probe |
DK2734106T3 (da) | 2011-07-22 | 2020-01-06 | Kpr Us Llc | Ekg-elektrodekonnektor |
US8634901B2 (en) | 2011-09-30 | 2014-01-21 | Covidien Lp | ECG leadwire system with noise suppression and related methods |
CN103163338B (zh) * | 2011-12-14 | 2016-04-06 | 北京普源精电科技有限公司 | 一种具有屏蔽罩的探头 |
EP2687858B1 (de) | 2012-07-19 | 2019-01-23 | Tektronix, Inc. | Sondenspitze für eine Signalerfassungssonde |
CN103575943B (zh) * | 2012-07-31 | 2018-08-03 | 特克特朗尼克公司 | 信号获取探针的探查端头 |
US9255654B2 (en) | 2012-09-14 | 2016-02-09 | United Technologies Corporation | Hard lead egress adapter for an instrumentation component |
JP2014106019A (ja) * | 2012-11-26 | 2014-06-09 | Stack Electronics Co Ltd | プローブ |
US9261535B2 (en) * | 2013-03-13 | 2016-02-16 | SanDisk Technologies, Inc. | Active probe adaptor |
CN105120742B (zh) | 2013-03-15 | 2017-07-28 | 柯惠有限合伙公司 | 具有导电部件的电极连接器 |
USD771818S1 (en) | 2013-03-15 | 2016-11-15 | Covidien Lp | ECG electrode connector |
US9408546B2 (en) | 2013-03-15 | 2016-08-09 | Covidien Lp | Radiolucent ECG electrode system |
US9188606B2 (en) | 2013-04-29 | 2015-11-17 | Keysight Technologies, Inc. | Oscilloscope current probe with interchangeable range and sensitivity setting modules |
CN107623219A (zh) * | 2016-07-14 | 2018-01-23 | 富士康(昆山)电脑接插件有限公司 | 电连接器组件、电子装置组合及外部设备 |
US10663486B2 (en) * | 2017-02-06 | 2020-05-26 | International Business Machines Corporation | Portable electrical noise probe structure |
US10886588B2 (en) | 2018-09-26 | 2021-01-05 | Keysight Technologies, Inc. | High dynamic range probe using pole-zero cancellation |
US20220011361A1 (en) * | 2020-07-08 | 2022-01-13 | Tektronix, Inc. | Securing a probe to a device under test |
WO2023009077A1 (en) * | 2021-07-26 | 2023-02-02 | Minkon Tekstil Sanayi Ve Dis Ticaret Limited Sirketi | Twin-probe electrical tester used in high-voltage transmission lines |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5334931A (en) * | 1991-11-12 | 1994-08-02 | International Business Machines Corporation | Molded test probe assembly |
JPH075201A (ja) * | 1993-06-18 | 1995-01-10 | Yokogawa Electric Corp | プローブ |
US6466000B1 (en) | 2000-05-31 | 2002-10-15 | Tektronix, Inc. | Replaceable probe tip holder and measurement probe head |
US6605934B1 (en) * | 2000-07-31 | 2003-08-12 | Lecroy Corporation | Cartridge system for a probing head for an electrical test probe |
US6603297B1 (en) * | 2000-08-21 | 2003-08-05 | Tektronix, Inc. | Probe tip adapter for a measurement probe |
US6400167B1 (en) | 2000-08-21 | 2002-06-04 | Tektronix, Inc. | Probe tip adapter for a measurement probe |
US6704670B2 (en) | 2002-04-16 | 2004-03-09 | Agilent Technologies, Inc. | Systems and methods for wideband active probing of devices and circuits in operation |
-
2004
- 2004-05-27 US US10/856,230 patent/US7056134B2/en active Active
-
2005
- 2005-05-20 EP EP05253120A patent/EP1607750B1/de not_active Expired - Fee Related
- 2005-05-20 DE DE602005001895T patent/DE602005001895T2/de active Active
- 2005-05-25 JP JP2005152442A patent/JP4575838B2/ja not_active Expired - Fee Related
- 2005-05-27 CN CN2009100067392A patent/CN101487852B/zh not_active Expired - Fee Related
- 2005-05-27 CN CNB2005100739315A patent/CN100529764C/zh not_active Expired - Fee Related
- 2005-05-27 KR KR1020050045049A patent/KR101164539B1/ko active IP Right Grant
- 2005-05-27 TW TW094117560A patent/TWI368034B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
US7056134B2 (en) | 2006-06-06 |
CN101487852B (zh) | 2012-06-20 |
JP4575838B2 (ja) | 2010-11-04 |
EP1607750B1 (de) | 2007-08-08 |
DE602005001895T2 (de) | 2008-04-24 |
EP1607750A1 (de) | 2005-12-21 |
JP2005338088A (ja) | 2005-12-08 |
CN100529764C (zh) | 2009-08-19 |
KR101164539B1 (ko) | 2012-07-10 |
TW200602643A (en) | 2006-01-16 |
CN1702464A (zh) | 2005-11-30 |
KR20060046224A (ko) | 2006-05-17 |
CN101487852A (zh) | 2009-07-22 |
US20050266733A1 (en) | 2005-12-01 |
TWI368034B (en) | 2012-07-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |