JP4546412B2 - 成分分析装置 - Google Patents
成分分析装置 Download PDFInfo
- Publication number
- JP4546412B2 JP4546412B2 JP2006069302A JP2006069302A JP4546412B2 JP 4546412 B2 JP4546412 B2 JP 4546412B2 JP 2006069302 A JP2006069302 A JP 2006069302A JP 2006069302 A JP2006069302 A JP 2006069302A JP 4546412 B2 JP4546412 B2 JP 4546412B2
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- parabolic mirror
- irradiation
- light
- mirror
- reflection
- Prior art date
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Description
つまり、前記照射用非軸放物面鏡と前記反射用非軸放物面鏡とを放物面鏡保持部材ごと移動させることが可能となるので、該放物面鏡保持部材を取り付ける際や、該放物面鏡保持部材の配設位置を調節する際に生じる誤差を小さくすることができる。
該判別結果は、表示部30に表示される。
2 被検体(青果物)
3 載置台
3a 透過孔
7 放物面鏡保持部材
8 照射用非軸放物面鏡
9 反射用非軸放物面鏡
8a・9a 鏡面
Claims (2)
- 赤外線の拡散反射光から変換される測定スペクトルを調べることによって、被検体(2)の成分分析を行なう成分分析装置(1)であって、検出光を投射する投光部(6)と拡散反射光を検知する検知手段(13)との間の測定光路に、上下方向の透過孔(3a)を有する載置台(3)と、該載置台(3)の下方から被検体(2)下面へと照射光(B)を投光する照射用非軸放物面鏡(8)と、該被検体(2)の下面にて反射した拡散反射光(C)を受光する反射用非軸放物面鏡(9)とを具備し、前記被検体(2)の下面への照射光(B)と、前記被検体(2)の下面からの拡散反射光(C)とが鋭角に交差するように、該照射用非軸放物面鏡(8)と該反射用非軸放物面鏡(9)とを配置し、前記照射用非軸放物面鏡(8)による反射前の照射光(A)と、反射後の照射光(B)とが、平面視において略直交し、前記反射用非軸放物面鏡(9)による反射前の拡散反射光(C)と、反射後の拡散反射光(D)とが、平面視において略直交するように、前記照射用非軸放物面鏡(8)と反射用非軸放物面鏡(9)とを配置したことを特徴とする成分分析装置。
- 請求項1記載の成分分析装置において、前記照射用非軸放物面鏡(8)と反射用非軸放物面鏡(9)とを、一つの放物面鏡保持部材で一体的に保持したことを特徴とする成分分析装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006069302A JP4546412B2 (ja) | 2006-03-14 | 2006-03-14 | 成分分析装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006069302A JP4546412B2 (ja) | 2006-03-14 | 2006-03-14 | 成分分析装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007248129A JP2007248129A (ja) | 2007-09-27 |
JP4546412B2 true JP4546412B2 (ja) | 2010-09-15 |
Family
ID=38592617
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2006069302A Expired - Fee Related JP4546412B2 (ja) | 2006-03-14 | 2006-03-14 | 成分分析装置 |
Country Status (1)
Country | Link |
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JP (1) | JP4546412B2 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2012147717A1 (ja) * | 2011-04-26 | 2012-11-01 | 株式会社島津製作所 | 樹脂識別装置 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62158351U (ja) * | 1986-03-29 | 1987-10-07 | ||
JPH0915148A (ja) * | 1995-06-29 | 1997-01-17 | Sumitomo Metal Mining Co Ltd | 非破壊糖度測定装置 |
JPH09297053A (ja) * | 1996-05-07 | 1997-11-18 | Kubota Corp | 物品検査装置 |
JP2004101510A (ja) * | 2002-07-15 | 2004-04-02 | Tochigi Nikon Corp | パルス光を用いた分光計測方法および装置 |
JP2004325135A (ja) * | 2003-04-22 | 2004-11-18 | Hiroaki Ishizawa | 残留農薬分析法 |
JP2004354246A (ja) * | 2003-05-29 | 2004-12-16 | Aisin Seiki Co Ltd | 反射型テラヘルツ分光測定装置及び測定方法 |
-
2006
- 2006-03-14 JP JP2006069302A patent/JP4546412B2/ja not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62158351U (ja) * | 1986-03-29 | 1987-10-07 | ||
JPH0915148A (ja) * | 1995-06-29 | 1997-01-17 | Sumitomo Metal Mining Co Ltd | 非破壊糖度測定装置 |
JPH09297053A (ja) * | 1996-05-07 | 1997-11-18 | Kubota Corp | 物品検査装置 |
JP2004101510A (ja) * | 2002-07-15 | 2004-04-02 | Tochigi Nikon Corp | パルス光を用いた分光計測方法および装置 |
JP2004325135A (ja) * | 2003-04-22 | 2004-11-18 | Hiroaki Ishizawa | 残留農薬分析法 |
JP2004354246A (ja) * | 2003-05-29 | 2004-12-16 | Aisin Seiki Co Ltd | 反射型テラヘルツ分光測定装置及び測定方法 |
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Publication number | Publication date |
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JP2007248129A (ja) | 2007-09-27 |
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