JP4544904B2 - 光学系 - Google Patents

光学系 Download PDF

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Publication number
JP4544904B2
JP4544904B2 JP2004132994A JP2004132994A JP4544904B2 JP 4544904 B2 JP4544904 B2 JP 4544904B2 JP 2004132994 A JP2004132994 A JP 2004132994A JP 2004132994 A JP2004132994 A JP 2004132994A JP 4544904 B2 JP4544904 B2 JP 4544904B2
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JP
Japan
Prior art keywords
optical system
lens
lens group
light
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004132994A
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English (en)
Japanese (ja)
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JP2005316068A5 (OSRAM
JP2005316068A (ja
Inventor
貞志 安達
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2004132994A priority Critical patent/JP4544904B2/ja
Priority to TW094113230A priority patent/TW200538758A/zh
Priority to CNB2005800066722A priority patent/CN100498411C/zh
Priority to EP05736657A priority patent/EP1717623A4/en
Priority to KR1020067017592A priority patent/KR100854175B1/ko
Priority to PCT/JP2005/007995 priority patent/WO2005106558A1/ja
Publication of JP2005316068A publication Critical patent/JP2005316068A/ja
Priority to US11/512,509 priority patent/US7439477B2/en
Publication of JP2005316068A5 publication Critical patent/JP2005316068A5/ja
Application granted granted Critical
Publication of JP4544904B2 publication Critical patent/JP4544904B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Microscoopes, Condenser (AREA)
JP2004132994A 2004-04-28 2004-04-28 光学系 Expired - Fee Related JP4544904B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2004132994A JP4544904B2 (ja) 2004-04-28 2004-04-28 光学系
TW094113230A TW200538758A (en) 2004-04-28 2005-04-26 Laser-light-concentrating optical system
EP05736657A EP1717623A4 (en) 2004-04-28 2005-04-27 OPTICAL LASER FOCUSING SYSTEM
KR1020067017592A KR100854175B1 (ko) 2004-04-28 2005-04-27 레이저 집광 광학계
CNB2005800066722A CN100498411C (zh) 2004-04-28 2005-04-27 激光聚光光学系统
PCT/JP2005/007995 WO2005106558A1 (ja) 2004-04-28 2005-04-27 レーザ集光光学系
US11/512,509 US7439477B2 (en) 2004-04-28 2006-08-30 Laser condensing optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004132994A JP4544904B2 (ja) 2004-04-28 2004-04-28 光学系

Publications (3)

Publication Number Publication Date
JP2005316068A JP2005316068A (ja) 2005-11-10
JP2005316068A5 JP2005316068A5 (OSRAM) 2007-06-21
JP4544904B2 true JP4544904B2 (ja) 2010-09-15

Family

ID=35443586

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004132994A Expired - Fee Related JP4544904B2 (ja) 2004-04-28 2004-04-28 光学系

Country Status (2)

Country Link
JP (1) JP4544904B2 (OSRAM)
CN (1) CN100498411C (OSRAM)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006153851A (ja) * 2004-11-08 2006-06-15 Matsushita Electric Ind Co Ltd 共焦点光学装置及び球面収差補正方法
DE102006058358A1 (de) * 2006-12-05 2008-06-12 Carl Zeiss Surgical Gmbh Kameraadapter mit Kamerahalterung und Optikadapter
JP5065862B2 (ja) * 2007-11-15 2012-11-07 株式会社オプセル 光束測定装置
JP4401410B2 (ja) * 2007-11-21 2010-01-20 三菱電機株式会社 レーザ加工装置
JP2009210762A (ja) * 2008-03-04 2009-09-17 Yutaka Suenaga 対物レンズ光学系
CA2762684A1 (en) * 2009-05-19 2010-11-25 Bionano Genomics, Inc. Devices and methods for dynamic determination of sample position and orientation and dynamic repositioning
US8634131B2 (en) * 2009-12-14 2014-01-21 Intelligent Imaging Innovations, Inc. Spherical aberration correction for non-descanned applications
US9935775B2 (en) 2011-10-13 2018-04-03 International Business Machines Corporation Deterring information copying including deterrence of currency counterfeiting
CN105144346B (zh) 2013-02-21 2017-12-15 恩耐公司 多层结构的激光刻图
US9537042B2 (en) * 2013-02-21 2017-01-03 Nlight, Inc. Non-ablative laser patterning
US9842665B2 (en) 2013-02-21 2017-12-12 Nlight, Inc. Optimization of high resolution digitally encoded laser scanners for fine feature marking
US10464172B2 (en) 2013-02-21 2019-11-05 Nlight, Inc. Patterning conductive films using variable focal plane to control feature size
US10618131B2 (en) 2014-06-05 2020-04-14 Nlight, Inc. Laser patterning skew correction
DE102014110208B4 (de) * 2014-07-21 2022-05-25 Leica Microsystems Cms Gmbh Abtastmikroskop
US9837783B2 (en) 2015-01-26 2017-12-05 Nlight, Inc. High-power, single-mode fiber sources
US10050404B2 (en) 2015-03-26 2018-08-14 Nlight, Inc. Fiber source with cascaded gain stages and/or multimode delivery fiber with low splice loss
WO2017008022A1 (en) 2015-07-08 2017-01-12 Nlight, Inc. Fiber with depressed central index for increased beam parameter product
US11179807B2 (en) 2015-11-23 2021-11-23 Nlight, Inc. Fine-scale temporal control for laser material processing
US10074960B2 (en) 2015-11-23 2018-09-11 Nlight, Inc. Predictive modification of laser diode drive current waveform in order to optimize optical output waveform in high power laser systems
CN108367389B (zh) 2015-11-23 2020-07-28 恩耐公司 激光加工方法和装置
EP3389915B1 (en) 2016-01-19 2021-05-05 NLIGHT, Inc. Method of processing calibration data in 3d laser scanner systems
US10730785B2 (en) 2016-09-29 2020-08-04 Nlight, Inc. Optical fiber bending mechanisms
JP7186695B2 (ja) 2016-09-29 2022-12-09 エヌライト,インコーポレーテッド 調節可能なビーム特性
US10732439B2 (en) 2016-09-29 2020-08-04 Nlight, Inc. Fiber-coupled device for varying beam characteristics
DE102016120683A1 (de) * 2016-10-28 2018-05-03 Carl Zeiss Microscopy Gmbh Lichtblattmikroskop
KR102611837B1 (ko) 2017-04-04 2023-12-07 엔라이트 인크. 검류계 스캐너 보정을 위한 광학 기준 생성
JP6850684B2 (ja) * 2017-06-01 2021-03-31 株式会社日立製作所 光計測装置
WO2018235166A1 (ja) * 2017-06-20 2018-12-27 オリンパス株式会社 内視鏡システム
DE102017009472B4 (de) * 2017-10-12 2025-09-18 Precitec Gmbh & Co. Kg Vorrichtung für ein Laserbearbeitungssystem, Laserbearbeitungssystem mit derselben und Verfahren zum Einstellen einer Fokuslage eines optischen Elements
CN110095856B (zh) * 2018-01-30 2022-03-01 顾士平 同步正交激光图像重建超分辨率显微镜
CN109188672B (zh) * 2018-09-12 2020-09-25 天津大学 一种光镊系统的可控旋转操作装置及方法
CN109633858B (zh) * 2019-02-19 2020-07-07 浙江大学 一种光镊中对射光束焦点对准的装置及方法
CN114459736B (zh) * 2021-12-21 2023-06-09 浙江大学 一种激光对焦成像系统及系统的偏移量的自动化检测方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3280402B2 (ja) * 1991-10-28 2002-05-13 オリンパス光学工業株式会社 顕微鏡対物レンズ
DE9407288U1 (de) * 1994-05-02 1994-08-04 Trumpf Gmbh & Co, 71254 Ditzingen Laserschneidmaschine mit Fokuslageneinstellung
US6087617A (en) * 1996-05-07 2000-07-11 Troitski; Igor Nikolaevich Computer graphics system for generating an image reproducible inside optically transparent material
JPH10227977A (ja) * 1997-02-14 1998-08-25 Nikon Corp 球面収差補正光学系
JP4441831B2 (ja) * 1999-09-16 2010-03-31 株式会社ニコン 顕微鏡装置

Also Published As

Publication number Publication date
CN100498411C (zh) 2009-06-10
CN1926460A (zh) 2007-03-07
JP2005316068A (ja) 2005-11-10

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