JP4542814B2 - 超音波検査方法 - Google Patents

超音波検査方法 Download PDF

Info

Publication number
JP4542814B2
JP4542814B2 JP2004135243A JP2004135243A JP4542814B2 JP 4542814 B2 JP4542814 B2 JP 4542814B2 JP 2004135243 A JP2004135243 A JP 2004135243A JP 2004135243 A JP2004135243 A JP 2004135243A JP 4542814 B2 JP4542814 B2 JP 4542814B2
Authority
JP
Japan
Prior art keywords
transducers
array
transmission delay
delay profile
excitation signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004135243A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004333497A5 (enExample
JP2004333497A (ja
Inventor
トマス・ジェームズ・バツィンゲル
リー・ウェイ
ジョン・ブロッダス・ディートン，ジュニア
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2004333497A publication Critical patent/JP2004333497A/ja
Publication of JP2004333497A5 publication Critical patent/JP2004333497A5/ja
Application granted granted Critical
Publication of JP4542814B2 publication Critical patent/JP4542814B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/262—Arrangements for orientation or scanning by relative movement of the head and the sensor by electronic orientation or focusing, e.g. with phased arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/011—Velocity or travel time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/015—Attenuation, scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/10—Number of transducers
    • G01N2291/106—Number of transducers one or more transducer arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/269—Various geometry objects
    • G01N2291/2694—Wings or other aircraft parts

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP2004135243A 2003-04-30 2004-04-30 超音波検査方法 Expired - Fee Related JP4542814B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/426,444 US6792808B1 (en) 2003-04-30 2003-04-30 Ultrasonic inspection method

Publications (3)

Publication Number Publication Date
JP2004333497A JP2004333497A (ja) 2004-11-25
JP2004333497A5 JP2004333497A5 (enExample) 2007-06-14
JP4542814B2 true JP4542814B2 (ja) 2010-09-15

Family

ID=32990407

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004135243A Expired - Fee Related JP4542814B2 (ja) 2003-04-30 2004-04-30 超音波検査方法

Country Status (4)

Country Link
US (1) US6792808B1 (enExample)
EP (1) EP1473562B1 (enExample)
JP (1) JP4542814B2 (enExample)
DE (1) DE602004029415D1 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004283490A (ja) * 2003-03-25 2004-10-14 Fuji Photo Film Co Ltd 超音波送受信装置
US7817843B2 (en) * 2004-03-04 2010-10-19 The Boeing Company Manufacturing process or in service defects acoustic imaging using sensor array
US7234354B2 (en) * 2004-12-03 2007-06-26 General Electric Company Ultrasonic probe and inspection method and system
CN101017155B (zh) * 2006-02-07 2010-09-08 哈尔滨工业大学 管节点焊缝超声相控阵检测成像系统
US7454974B2 (en) * 2006-09-29 2008-11-25 General Electric Company Probe system, ultrasound system and method of generating ultrasound
FR2907901B1 (fr) * 2006-10-31 2009-04-24 Airbus France Sas Procede de controle non destructif par ultrasons et sonde de mesure pour la mise en oeuvre du procede
DE102008002860A1 (de) * 2008-05-28 2009-12-03 Ge Inspection Technologies Gmbh Verfahren zur zerstörungsfreien Prüfung von Gegenständen mittels Ultraschall
EP2148216B1 (en) 2008-07-14 2013-01-09 Ecole Polytechnique Fédérale de Lausanne (EPFL) Time of flight estimation method using beamforming for acoustic tomography
EP2527829A1 (de) * 2011-05-24 2012-11-28 Siemens Aktiengesellschaft Vorrichtung und Verfahren zur Ultraschallprüfung eines Werkstücks
US10148131B2 (en) 2011-05-27 2018-12-04 uBeam Inc. Power density control for wireless power transfer
US9722671B2 (en) 2011-05-27 2017-08-01 uBeam Inc. Oscillator circuits for wireless power transfer
US9094112B2 (en) 2011-05-27 2015-07-28 uBeam Inc. Sender controller for wireless power transfer
US9537322B2 (en) 2011-05-27 2017-01-03 uBeam Inc. Sub-apertures with interleaved transmit elements for wireless power transfer
US9819399B2 (en) 2011-05-27 2017-11-14 uBeam Inc. Beam interaction control for wireless power transfer
US9831920B2 (en) 2011-05-27 2017-11-28 uBeam Inc. Motion prediction for wireless power transfer
US9404896B2 (en) 2012-11-19 2016-08-02 General Electric Company Two-dimensional TR probe array
US9746445B2 (en) * 2013-04-16 2017-08-29 The Boeing Company Apparatus for automated non-destructive inspection of airfoil-shaped bodies
EP3308376A4 (en) * 2015-06-10 2019-05-15 Ubeam Inc. SUB-APERTURES WITH INTERLOCKED TRANSMITTERS FOR WIRELESS POWER TRANSMISSION
JP6597063B2 (ja) * 2015-08-31 2019-10-30 セイコーエプソン株式会社 超音波デバイス、超音波モジュール、及び超音波測定機

Family Cites Families (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1193044A (fr) * 1958-02-14 1959-10-29 Realisations Ultrasoniques Sa Procédé et dispositifs d'examen de corps solides par les ultra-sons
US4180790A (en) 1977-12-27 1979-12-25 General Electric Company Dynamic array aperture and focus control for ultrasonic imaging systems
US4180791A (en) 1978-03-09 1979-12-25 General Electric Company Simplified sector scan ultrasonic imaging system
US4317369A (en) * 1978-09-15 1982-03-02 University Of Utah Ultrasound imaging apparatus and method
US4471785A (en) * 1982-09-29 1984-09-18 Sri International Ultrasonic imaging system with correction for velocity inhomogeneity and multipath interference using an ultrasonic imaging array
FR2550345B1 (fr) * 1983-08-01 1985-10-11 Commissariat Energie Atomique Sonde ultrasonore multitransducteurs, a transducteurs de tailles differentes
JPS60260847A (ja) * 1984-06-07 1985-12-24 Nippon Dempa Kogyo Co Ltd 超音波探触子
AU593171B2 (en) * 1987-06-11 1990-02-01 Commonwealth Of Australia, The Ultrasonic beam compensation
JPH0781995B2 (ja) * 1989-10-25 1995-09-06 三菱電機株式会社 超音波探触子および超音波探傷装置
US5014712A (en) 1989-12-26 1991-05-14 General Electric Company Coded excitation for transmission dynamic focusing of vibratory energy beam
US5111695A (en) 1990-07-11 1992-05-12 General Electric Company Dynamic phase focus for coherent imaging beam formation
US5235982A (en) 1991-09-30 1993-08-17 General Electric Company Dynamic transmit focusing of a steered ultrasonic beam
US5230340A (en) 1992-04-13 1993-07-27 General Electric Company Ultrasound imaging system with improved dynamic focusing
US5329930A (en) 1993-10-12 1994-07-19 General Electric Company Phased array sector scanner with multiplexed acoustic transducer elements
US5345939A (en) 1993-11-24 1994-09-13 General Electric Company Ultrasound imaging system with dynamic window function
US5487306A (en) 1994-09-26 1996-01-30 General Electric Company Phase aberration correction in phased-array imaging systems
US5568813A (en) 1994-11-23 1996-10-29 General Electric Company Method for combining ultrasound vector data from multiple firings to improve image quality
JP3625305B2 (ja) * 1994-12-28 2005-03-02 株式会社東芝 超音波診断装置
US5891038A (en) 1996-12-30 1999-04-06 General Electric Company Method, apparatus and applications for combining transmit wave functions to obtain synthetic waveform in ultrasonic imaging system
US5853367A (en) 1997-03-17 1998-12-29 General Electric Company Task-interface and communications system and method for ultrasound imager control
US5897501A (en) 1997-05-07 1999-04-27 General Electric Company Imaging system with multiplexer for controlling a multi-row ultrasonic transducer array
US5817023A (en) 1997-05-12 1998-10-06 General Electrical Company Ultrasound imaging system with dynamic window function generator
US5902241A (en) 1997-11-24 1999-05-11 General Electric Company Large-aperture imaging using transducer array with adaptive element pitch control
US6210332B1 (en) 1998-03-31 2001-04-03 General Electric Company Method and apparatus for flow imaging using coded excitation
US6279399B1 (en) * 1998-08-03 2001-08-28 Vingmed Sound A/S Multi-dimensional transducer array apparatus
US6048315A (en) 1998-09-28 2000-04-11 General Electric Company Method and apparatus for ultrasonic synthetic transmit aperture imaging using orthogonal complementary codes
US5951479A (en) 1998-09-29 1999-09-14 General Electric Company Method and apparatus for synthetic transmit aperture imaging
US6183419B1 (en) 1999-02-01 2001-02-06 General Electric Company Multiplexed array transducers with improved far-field performance
US6296612B1 (en) 1999-07-09 2001-10-02 General Electric Company Method and apparatus for adaptive wall filtering in spectral Doppler ultrasound imaging
JP3535417B2 (ja) * 1999-07-13 2004-06-07 日立エンジニアリング株式会社 超音波による欠陥高さ測定装置及び欠陥高さ測定方法
US6056693A (en) 1999-08-16 2000-05-02 General Electric Company Ultrasound imaging with synthetic transmit focusing
US6253618B1 (en) * 1999-12-08 2001-07-03 Massachusetts Intitute Of Technology Apparatus and method for synthetic phase tuning of acoustic guided waves
JP3609975B2 (ja) * 2000-02-15 2005-01-12 日立エンジニアリング株式会社 サイジング用超音波探傷装置およびサイジング探傷方法
US6475150B2 (en) * 2000-12-01 2002-11-05 The Regents Of The University Of California System and method for ultrasonic tomography
US6537220B1 (en) * 2001-08-31 2003-03-25 Siemens Medical Solutions Usa, Inc. Ultrasound imaging with acquisition of imaging data in perpendicular scan planes
US6789427B2 (en) * 2002-09-16 2004-09-14 General Electric Company Phased array ultrasonic inspection method for industrial applications

Also Published As

Publication number Publication date
DE602004029415D1 (de) 2010-11-18
US6792808B1 (en) 2004-09-21
EP1473562B1 (en) 2010-10-06
EP1473562A1 (en) 2004-11-03
JP2004333497A (ja) 2004-11-25

Similar Documents

Publication Publication Date Title
JP4542814B2 (ja) 超音波検査方法
JP4414177B2 (ja) 工業用フェーズドアレイ超音波検査方法
Drinkwater et al. Ultrasonic arrays for non-destructive evaluation: A review
CN108169331B (zh) 薄板栅格翼结构焊缝相控阵超声检测装置及检测方法
Clay et al. Experimental study of phased array beam steering characteristics
EP1965208A1 (en) Ultrasonic section inspection method and device
US6716173B2 (en) Ultrasonic imaging method and ultrasonic imaging apparatus
JP3635453B2 (ja) 超音波横波斜角探傷方法及び装置
US7234354B2 (en) Ultrasonic probe and inspection method and system
EP2495562A2 (en) Two-dimensional virtual array probe for three-dimensional ultrasonic imaging
JP6517539B2 (ja) 超音波探傷装置及び方法
Holmes et al. Post-processing of ultrasonic phased array data for optimal performance
CN107340331A (zh) 用于板状结构检测的真时延无频散sh0波相控阵系统
US10502715B2 (en) Systems and methods for specimen inspection using ultrasonic wave generation
Zhou et al. Effects of directivity function on total focusing method imaging performance
Lukacs et al. Grating-lobe suppression through angular weighting for laser induced phased arrays
JP5145783B2 (ja) 超音波による断面検査方法及び装置
Higuti Ultrasonic image compounding method based on the instantaneous phase image
Reverdy The Evolution Of Ultrasonic Testing (UT) From Conventional UT To Total Focusing Method
Schmitz et al. Reconstruction of defects by ultrasonic testing using synthetic aperture procedures
Kachanov et al. Features of applying the method of focusing to a point in ultrasonic testing of products manufactured from complexly structured materials
Pettigrew et al. Investigating post-processing of phased array data for detection and sizing capabilities using incoherent compounding
JPH06148151A (ja) 超音波探傷方法及び装置
Friedl Jr Focusing aberration corrections for ultrasonic inspections of disk forgings when using a surface compensating mirror and segmented annular phased array
JP2006208326A (ja) 超音波による断面検査方法及び装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070426

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070426

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20090724

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090728

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20091021

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20091021

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20091021

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20091026

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100126

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100216

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100511

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100601

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100628

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

Ref document number: 4542814

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130702

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees