JP4512439B2 - Ｘ線検出器アセンブリ - Google Patents

Ｘ線検出器アセンブリ Download PDF

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Publication number
JP4512439B2
JP4512439B2 JP2004221027A JP2004221027A JP4512439B2 JP 4512439 B2 JP4512439 B2 JP 4512439B2 JP 2004221027 A JP2004221027 A JP 2004221027A JP 2004221027 A JP2004221027 A JP 2004221027A JP 4512439 B2 JP4512439 B2 JP 4512439B2
Authority
JP
Japan
Prior art keywords
layer
disposed
encapsulating coating
scintillator
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004221027A
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English (en)
Japanese (ja)
Other versions
JP2005134370A (ja
JP2005134370A5 (enExample
Inventor
ジェフリー・ジョン・ショー
チン−イウ・ウェイ
デビッド・フランシス・フォベア
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2005134370A publication Critical patent/JP2005134370A/ja
Publication of JP2005134370A5 publication Critical patent/JP2005134370A5/ja
Application granted granted Critical
Publication of JP4512439B2 publication Critical patent/JP4512439B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/805—Coatings
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/40—Optical elements or arrangements
    • H10F77/496—Luminescent members, e.g. fluorescent sheets

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP2004221027A 2003-07-30 2004-07-29 Ｘ線検出器アセンブリ Expired - Fee Related JP4512439B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/631,197 US7053381B2 (en) 2001-12-06 2003-07-30 Dual para-xylylene layers for an X-ray detector

Publications (3)

Publication Number Publication Date
JP2005134370A JP2005134370A (ja) 2005-05-26
JP2005134370A5 JP2005134370A5 (enExample) 2007-09-13
JP4512439B2 true JP4512439B2 (ja) 2010-07-28

Family

ID=33541516

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004221027A Expired - Fee Related JP4512439B2 (ja) 2003-07-30 2004-07-29 Ｘ線検出器アセンブリ

Country Status (4)

Country Link
US (1) US7053381B2 (enExample)
EP (1) EP1503419B1 (enExample)
JP (1) JP4512439B2 (enExample)
DE (1) DE602004030748D1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1500314A1 (en) * 2002-04-11 2005-01-26 Koninklijke Philips Electronics N.V. Electrically insulating body, and electronic device
JP4112448B2 (ja) * 2003-07-28 2008-07-02 株式会社東芝 電気光配線基板及び半導体装置
JP5905672B2 (ja) * 2011-06-28 2016-04-20 株式会社東芝 放射線検出器及びその製造方法
US8415628B1 (en) 2011-10-31 2013-04-09 General Electric Company Hermetically sealed radiation detector and methods for making
JP6041594B2 (ja) * 2012-09-14 2016-12-14 浜松ホトニクス株式会社 シンチレータパネル、及び、放射線検出器
US9935152B2 (en) 2012-12-27 2018-04-03 General Electric Company X-ray detector having improved noise performance
US9917133B2 (en) 2013-12-12 2018-03-13 General Electric Company Optoelectronic device with flexible substrate
EP3117204B1 (en) 2014-03-13 2021-06-16 General Electric Company Curved digital x-ray detector for weld inspection
US9515276B2 (en) 2014-09-02 2016-12-06 General Electric Company Organic X-ray detector and X-ray systems
US9535173B2 (en) 2014-09-11 2017-01-03 General Electric Company Organic x-ray detector and x-ray systems
US9513383B1 (en) 2015-06-03 2016-12-06 Perkinelmer Holdings, Inc. Scintillator sealing with foil

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4011454A (en) 1975-04-28 1977-03-08 General Electric Company Structured X-ray phosphor screen
JPH03211757A (ja) 1989-12-21 1991-09-17 General Electric Co <Ge> 気密封じの物体
US5187369A (en) 1990-10-01 1993-02-16 General Electric Company High sensitivity, high resolution, solid state x-ray imaging device with barrier layer
US5153438A (en) 1990-10-01 1992-10-06 General Electric Company Method of forming an x-ray imaging array and the array
US5171996A (en) 1991-07-31 1992-12-15 Regents Of The University Of California Particle detector spatial resolution
US5179284A (en) 1991-08-21 1993-01-12 General Electric Company Solid state radiation imager having a reflective and protective coating
US5132539A (en) 1991-08-29 1992-07-21 General Electric Company Planar X-ray imager having a moisture-resistant sealing structure
US5227635A (en) 1991-11-22 1993-07-13 Xsirious, Inc. Mercuric iodide x-ray detector
US5336928A (en) 1992-09-18 1994-08-09 General Electric Company Hermetically sealed packaged electronic system
US5368882A (en) 1993-08-25 1994-11-29 Minnesota Mining And Manufacturing Company Process for forming a radiation detector
US5401668A (en) 1993-09-02 1995-03-28 General Electric Company Method for fabrication solid state radiation imager having improved scintillator adhesion
CA2131243A1 (en) 1993-09-27 1995-03-28 Kenneth R. Paulson Process for forming a phosphor
US5654084A (en) 1994-07-22 1997-08-05 Martin Marietta Energy Systems, Inc. Protective coatings for sensitive materials
KR100514547B1 (ko) 1997-02-14 2005-12-14 하마마츠 포토닉스 가부시키가이샤 방사선검출소자및그제조방법
DE69803438T2 (de) 1997-02-14 2002-07-11 Hamamatsu Photonics K.K., Hamamatsu Strahlungsdetektor und verfahren zu seiner herstellung
JP3405706B2 (ja) * 1997-02-14 2003-05-12 浜松ホトニクス株式会社 放射線検出素子
JP3924352B2 (ja) 1997-06-05 2007-06-06 浜松ホトニクス株式会社 裏面照射型受光デバイス
JP3789646B2 (ja) * 1998-06-19 2006-06-28 浜松ホトニクス株式会社 放射線イメージセンサ
US6146489A (en) 1998-11-19 2000-11-14 General Electric Company Method and apparatus for depositing scintillator material on radiation imager
JP3276614B2 (ja) * 1999-04-22 2002-04-22 浜松ホトニクス株式会社 光学素子、放射線イメージセンサ及び光学素子の製造方法
US6720561B2 (en) * 2001-12-06 2004-04-13 General Electric Company Direct CsI scintillator coating for improved digital X-ray detector assembly longevity

Also Published As

Publication number Publication date
JP2005134370A (ja) 2005-05-26
DE602004030748D1 (de) 2011-02-10
US7053381B2 (en) 2006-05-30
EP1503419B1 (en) 2010-12-29
EP1503419A2 (en) 2005-02-02
EP1503419A3 (en) 2006-05-31
US20040021084A1 (en) 2004-02-05

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