JP4443421B2 - 固体x線検出器 - Google Patents
固体x線検出器 Download PDFInfo
- Publication number
- JP4443421B2 JP4443421B2 JP2004560515A JP2004560515A JP4443421B2 JP 4443421 B2 JP4443421 B2 JP 4443421B2 JP 2004560515 A JP2004560515 A JP 2004560515A JP 2004560515 A JP2004560515 A JP 2004560515A JP 4443421 B2 JP4443421 B2 JP 4443421B2
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- Prior art keywords
- sensor
- scintillator
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- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 239000007787 solid Substances 0.000 title claims description 4
- 239000000758 substrate Substances 0.000 claims description 39
- 230000005855 radiation Effects 0.000 claims description 19
- 230000005684 electric field Effects 0.000 claims description 6
- 239000011888 foil Substances 0.000 claims description 6
- 239000011159 matrix material Substances 0.000 claims description 6
- 239000000126 substance Substances 0.000 claims description 5
- 238000011144 upstream manufacturing Methods 0.000 claims description 3
- 239000000463 material Substances 0.000 description 30
- 239000000853 adhesive Substances 0.000 description 9
- 230000001070 adhesive effect Effects 0.000 description 9
- 238000000151 deposition Methods 0.000 description 7
- 239000004020 conductor Substances 0.000 description 6
- 230000008021 deposition Effects 0.000 description 6
- 230000008901 benefit Effects 0.000 description 5
- XQPRBTXUXXVTKB-UHFFFAOYSA-M caesium iodide Chemical compound [I-].[Cs+] XQPRBTXUXXVTKB-UHFFFAOYSA-M 0.000 description 5
- -1 rare earth oxysulfides Chemical class 0.000 description 5
- 238000000354 decomposition reaction Methods 0.000 description 4
- 229910001508 alkali metal halide Inorganic materials 0.000 description 3
- 150000008045 alkali metal halides Chemical class 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- UPIZSELIQBYSMU-UHFFFAOYSA-N lanthanum;sulfur monoxide Chemical compound [La].S=O UPIZSELIQBYSMU-UHFFFAOYSA-N 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 239000012080 ambient air Substances 0.000 description 2
- 229910021417 amorphous silicon Inorganic materials 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000010410 layer Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- MFGOFGRYDNHJTA-UHFFFAOYSA-N 2-amino-1-(2-fluorophenyl)ethanol Chemical compound NCC(O)C1=CC=CC=C1F MFGOFGRYDNHJTA-UHFFFAOYSA-N 0.000 description 1
- ZCYVEMRRCGMTRW-UHFFFAOYSA-N 7553-56-2 Chemical compound [I] ZCYVEMRRCGMTRW-UHFFFAOYSA-N 0.000 description 1
- 229910000531 Co alloy Inorganic materials 0.000 description 1
- RWSOTUBLDIXVET-UHFFFAOYSA-N Dihydrogen sulfide Chemical compound S RWSOTUBLDIXVET-UHFFFAOYSA-N 0.000 description 1
- 229910000640 Fe alloy Inorganic materials 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 229910000990 Ni alloy Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000004026 adhesive bonding Methods 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- HUCVOHYBFXVBRW-UHFFFAOYSA-M caesium hydroxide Inorganic materials [OH-].[Cs+] HUCVOHYBFXVBRW-UHFFFAOYSA-M 0.000 description 1
- 238000005234 chemical deposition Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000013626 chemical specie Substances 0.000 description 1
- 239000010941 cobalt Substances 0.000 description 1
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000002594 fluoroscopy Methods 0.000 description 1
- DQZARQCHJNPXQP-UHFFFAOYSA-N gadolinium;sulfur monoxide Chemical class [Gd].S=O DQZARQCHJNPXQP-UHFFFAOYSA-N 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000011630 iodine Substances 0.000 description 1
- 229910052740 iodine Inorganic materials 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910000833 kovar Inorganic materials 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 1
- 238000009607 mammography Methods 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920000307 polymer substrate Polymers 0.000 description 1
- 238000006116 polymerization reaction Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 238000002601 radiography Methods 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 230000007480 spreading Effects 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 1
- 238000007751 thermal spraying Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 238000009279 wet oxidation reaction Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
- G01T1/20189—Damping or insulation against damage, e.g. caused by heat or pressure
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20188—Auxiliary details, e.g. casings or cooling
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Measurement Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Description
Claims (9)
- 感光素子がマトリックスに配列された感光センサ(1)と、X線を前記センサが感受できる放射線に変換するシンチレータ(5)と、前記シンチレータ(5)の上流のX線が通過する入射窓(8、9)とを含む固体X線検出器であって、
動作中に前記感光センサ(1)のマトリックスと前記シンチレータ(5)の基板との間に誘導される電界を除去するための手段であり、前記入射窓(8、9)と前記感光センサ(1)との間で電圧を印加するための手段を含むことを特徴とする固体X線検出器。 - 前記シンチレータ(5)が基板(8)およびシンチレーション物質(7)を含むことと、前記基板(8)が前記センサ(1)と別個であることと、前記基板(8)が前記センサ(1)の前記入射窓を形成することとを特徴とする、請求項1に記載のX線検出器。
- 前記シンチレータ(5)がシンチレーション物質(7)を含むことと、前記センサ(1)が前記シンチレーション物質(7)用の基板として用いられることと、前記シンチレータ(5)を保護するためのホイル(9)が前記シンチレーション物質(7)を覆うことと、前記ホイル(9)が前記センサ(1)の前記入射窓を形成することとを特徴とする、請求項1に記載のX線検出器。
- 前記検出器が、前記電圧を前記入射窓(8、9)にほぼ均一に印加するための手段を含むことを特徴とする、請求項1〜3のいずれか一項に記載の検出器。
- 前記電圧が経時的に変調されることを特徴とする、請求項1〜4のいずれか一項に記載の検出器。
- 追加窓(10)が、前記シンチレータ(5)に固定されることなく、前記シンチレータ(5)に配置されることと、不透湿性シール(11)が、前記追加窓(10)および前記センサ(1)を固定することとを特徴とする、請求項1〜5のいずれか一項に記載の検出器。
- 前記電圧をほぼ均一に印加するための前記手段が、前記追加窓(10)を通過する電気接合部(20)を含むことを特徴とする、請求項6に記載の検出器。
- 前記電圧をほぼ均一に印加するための前記手段が、前記シール(11)を通過する導電路(30)を含むことを特徴とする、請求項6に記載の検出器。
- 前記電圧をほぼ均一に印加するための前記手段が、前記感光センサ(1)に作製されたトラック(40)を含むことを特徴とする、請求項6に記載の検出器。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0215995A FR2848677B1 (fr) | 2002-12-17 | 2002-12-17 | Detecteur de rayonnement x a l'etat solide |
PCT/EP2003/051016 WO2004055549A1 (fr) | 2002-12-17 | 2003-12-16 | Détecteur de rayonnement x à l'état solide |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006510022A JP2006510022A (ja) | 2006-03-23 |
JP4443421B2 true JP4443421B2 (ja) | 2010-03-31 |
Family
ID=32338882
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004560515A Expired - Fee Related JP4443421B2 (ja) | 2002-12-17 | 2003-12-16 | 固体x線検出器 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7291843B2 (ja) |
EP (1) | EP1573363B1 (ja) |
JP (1) | JP4443421B2 (ja) |
CN (1) | CN1726408A (ja) |
AU (1) | AU2003299241A1 (ja) |
CA (1) | CA2510192C (ja) |
FR (1) | FR2848677B1 (ja) |
WO (1) | WO2004055549A1 (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7389013B2 (en) * | 2004-09-30 | 2008-06-17 | Stmicroelectronics, Inc. | Method and system for vertical optical coupling on semiconductor substrate |
US20060071149A1 (en) * | 2004-09-30 | 2006-04-06 | Stmicroelectronics, Inc. | Microlens structure for opto-electric semiconductor device, and method of manufacture |
US7214947B2 (en) * | 2005-03-25 | 2007-05-08 | General Electric Company | Detector assembly and method of manufacture |
US7684545B2 (en) * | 2007-10-30 | 2010-03-23 | Rigaku Innovative Technologies, Inc. | X-ray window and resistive heater |
JP5343970B2 (ja) * | 2008-07-25 | 2013-11-13 | コニカミノルタ株式会社 | 放射線画像検出装置 |
JP2012177623A (ja) * | 2011-02-25 | 2012-09-13 | Fujifilm Corp | 放射線画像検出装置、及び放射線画像検出装置の製造方法 |
US10126433B2 (en) | 2014-11-10 | 2018-11-13 | Halliburton Energy Services, Inc. | Energy detection apparatus, methods, and systems |
WO2018213076A1 (en) * | 2017-05-19 | 2018-11-22 | Saint-Gobain Ceramics & Plastics, Inc. | System for fastening a scintillator device, a scintillator thereof, and a method thereof |
JP2019152595A (ja) * | 2018-03-06 | 2019-09-12 | 富士フイルム株式会社 | 放射線画像検出装置 |
DE102018130510A1 (de) * | 2018-11-30 | 2020-06-04 | Vishay Semiconductor Gmbh | Strahlungssensor und Herstellungsverfahren hierfür |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2605166B1 (fr) * | 1986-10-09 | 1989-02-10 | Thomson Csf | Dispositif photosensible a l'etat solide, procede de lecture et procede de fabrication |
US5932880A (en) * | 1996-05-09 | 1999-08-03 | Hitachi, Ltd. | Scintillator device and image pickup apparatus using the same |
FR2758656B1 (fr) * | 1997-01-21 | 1999-04-09 | Thomson Tubes Electroniques | Procede de realisation d'un detecteur de rayonnement par assemblage de dalles elementaires et detecteur ainsi obtenu |
FR2758654B1 (fr) * | 1997-01-21 | 1999-04-09 | Thomson Tubes Electroniques | Procede de realisation d'un detecteur de rayonnement a ecran plat et detecteur obtenu par ce procede |
FR2760585B1 (fr) * | 1997-03-07 | 1999-05-28 | Thomson Tubes Electroniques | Procede de commande d'un dispositif photosensible a faible remanence, et dispositif photosensible mettant en oeuvre le procede |
US6455855B1 (en) * | 2000-04-20 | 2002-09-24 | Ge Medical Systems Global Technology Company Llc | Sealed detector for a medical imaging device and a method of manufacturing the same |
FR2831671B1 (fr) * | 2001-10-26 | 2004-05-28 | Trixell Sas | Detecteur de rayonnement x a l'etat solide |
-
2002
- 2002-12-17 FR FR0215995A patent/FR2848677B1/fr not_active Expired - Fee Related
-
2003
- 2003-12-16 CA CA2510192A patent/CA2510192C/fr not_active Expired - Fee Related
- 2003-12-16 WO PCT/EP2003/051016 patent/WO2004055549A1/fr active Application Filing
- 2003-12-16 EP EP03799574A patent/EP1573363B1/fr not_active Expired - Lifetime
- 2003-12-16 JP JP2004560515A patent/JP4443421B2/ja not_active Expired - Fee Related
- 2003-12-16 US US10/539,620 patent/US7291843B2/en not_active Expired - Lifetime
- 2003-12-16 CN CN200380106586.XA patent/CN1726408A/zh active Pending
- 2003-12-16 AU AU2003299241A patent/AU2003299241A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP1573363B1 (fr) | 2011-09-21 |
AU2003299241A1 (en) | 2004-07-09 |
US20060153334A1 (en) | 2006-07-13 |
FR2848677A1 (fr) | 2004-06-18 |
WO2004055549A1 (fr) | 2004-07-01 |
US7291843B2 (en) | 2007-11-06 |
CA2510192C (fr) | 2013-03-19 |
CN1726408A (zh) | 2006-01-25 |
CA2510192A1 (fr) | 2004-07-01 |
EP1573363A1 (fr) | 2005-09-14 |
FR2848677B1 (fr) | 2005-04-15 |
JP2006510022A (ja) | 2006-03-23 |
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