JP4426295B2 - 物質構造分析装置 - Google Patents

物質構造分析装置 Download PDF

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Publication number
JP4426295B2
JP4426295B2 JP2003532970A JP2003532970A JP4426295B2 JP 4426295 B2 JP4426295 B2 JP 4426295B2 JP 2003532970 A JP2003532970 A JP 2003532970A JP 2003532970 A JP2003532970 A JP 2003532970A JP 4426295 B2 JP4426295 B2 JP 4426295B2
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Japan
Prior art keywords
delay
irradiation
circuit
probe
material structure
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP2003532970A
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English (en)
Japanese (ja)
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JP2005504319A5 (enExample
JP2005504319A (ja
Inventor
コプレ，フィリップ
Original Assignee
ソコマット アンテルナショナル
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Publication of JP2005504319A5 publication Critical patent/JP2005504319A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/38—Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0645—Display representation or displayed parameters, e.g. A-, B- or C-Scan
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/262—Arrangements for orientation or scanning by relative movement of the head and the sensor by electronic orientation or focusing, e.g. with phased arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
    • G01N29/341—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with time characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/10—Number of transducers
    • G01N2291/106—Number of transducers one or more transducer arrays
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S367/00—Communications, electrical: acoustic wave systems and devices
    • Y10S367/906—Airborne shock-wave detection
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S367/00—Communications, electrical: acoustic wave systems and devices
    • Y10S367/907—Coordinate determination

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP2003532970A 2001-09-28 2002-09-26 物質構造分析装置 Expired - Lifetime JP4426295B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR0112516A FR2830328B1 (fr) 2001-09-28 2001-09-28 Dispositif et procede d'analyse de la structure d'un materiau
PCT/FR2002/003283 WO2003029808A1 (fr) 2001-09-28 2002-09-26 Dispositif et procede d'analyse de la structure d'un materiau

Publications (3)

Publication Number Publication Date
JP2005504319A JP2005504319A (ja) 2005-02-10
JP2005504319A5 JP2005504319A5 (enExample) 2009-11-26
JP4426295B2 true JP4426295B2 (ja) 2010-03-03

Family

ID=8867720

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003532970A Expired - Lifetime JP4426295B2 (ja) 2001-09-28 2002-09-26 物質構造分析装置

Country Status (5)

Country Link
US (1) US7181356B2 (enExample)
EP (1) EP1430299B1 (enExample)
JP (1) JP4426295B2 (enExample)
FR (1) FR2830328B1 (enExample)
WO (1) WO2003029808A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2849368A1 (fr) * 2002-12-30 2004-07-02 Koninkl Philips Electronics Nv Detection de defauts de petite taille en imagerie ultrasonore medicale
FR2855271B1 (fr) * 2003-05-22 2006-01-21 Jacques Dory Procede pour l'exploration et l'analyse d'une structure volumique
JP2008504057A (ja) * 2004-06-28 2008-02-14 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 超音波システムにより発生した送信波形を増幅するためのシステム及び方法
EP1798549A1 (de) 2005-12-06 2007-06-20 BAM Bundesanstalt für Materialforschung und -prüfung Verfahren und Vorrichtung zur Ultraschalldetektion von Diskontinuitäten in einem Materialbereich
JP2011011366A (ja) * 2009-06-30 2011-01-20 Sumitomo Electric Ind Ltd 金属積層構造体の製造方法
US10025272B2 (en) 2013-01-25 2018-07-17 General Electric Company Ultrasonic holography imaging system and method
US9639056B2 (en) 2013-09-17 2017-05-02 General Electric Company Acoustical holography with multi-level square wave excitation signals
US10557832B2 (en) * 2017-04-28 2020-02-11 GM Global Technology Operations LLC Portable acoustic apparatus for in-situ monitoring of a weld in a workpiece
FR3113135B1 (fr) 2020-07-30 2022-07-01 Socomate Int Procédé de détection de discontinuités et système mettant en œuvre ce procédé
FR3153407A1 (fr) 2023-09-25 2025-03-28 Farès Abda Systèmes et procédés de mesures par effet doppler à l’aide d’une architecture hexagonale optimale à géométrie fixe ou adaptative

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US3936791A (en) * 1973-09-13 1976-02-03 The Commonwealth Of Australia Linear array ultrasonic transducer
AU534828B2 (en) * 1979-05-16 1984-02-16 Yoshino Kogosho Co. Ltd. Atomizer
US4371097A (en) * 1980-05-07 1983-02-01 Diamond International Corporation Liquid dispensing pump
US4459851A (en) * 1980-09-10 1984-07-17 Crostack Horst A Method and device for the localization and analysis of sound emissions
DE3315334A1 (de) * 1983-04-28 1984-10-31 Pfeiffer Erich Gmbh & Co Kg Zerstaeuber- oder dosierpumpe
JPS59225374A (ja) * 1983-06-06 1984-12-18 Hitachi Ltd 音源位置標定方法とその装置
JPH0771556B2 (ja) * 1986-11-13 1995-08-02 株式会社東芝 超音波診断装置
US4835478A (en) * 1987-02-17 1989-05-30 Haddon Merrill K Method and apparatus for acoustic detection of faults in underground cables
EP0335578A3 (en) * 1988-03-28 1990-08-01 Hewlett-Packard Company Ultrasound imaging system utilizing two or more simultaneously-active apertures
US5010503A (en) * 1988-04-20 1991-04-23 Institut Elektrosvarki Imeni E.O. Patona Akademii Nauk Ukrainskoi Ssr Apparatus for acoustic-emission inspection of articles
FR2631707B1 (fr) * 1988-05-20 1991-11-29 Labo Electronique Physique Echographe ultrasonore a coherence de phase controlable
JP3322694B2 (ja) * 1992-05-25 2002-09-09 株式会社日立メディコ 超音波撮像装置
US5456113A (en) * 1992-11-06 1995-10-10 Southwest Research Institute Nondestructive evaluation of ferromagnetic cables and ropes using magnetostrictively induced acoustic/ultrasonic waves and magnetostrictively detected acoustic emissions
US5581037A (en) * 1992-11-06 1996-12-03 Southwest Research Institute Nondestructive evaluation of pipes and tubes using magnetostrictive sensors
US5351863A (en) * 1993-03-08 1994-10-04 Dupont Industries, Inc. Manually-operated dispensing pump
FR2718372B1 (fr) * 1994-04-08 1996-06-28 Sofab Dispensateur de produits fluides.
US5487306A (en) * 1994-09-26 1996-01-30 General Electric Company Phase aberration correction in phased-array imaging systems
US6050457A (en) * 1995-12-06 2000-04-18 The Procter & Gamble Company High pressure manually-actuated spray pump
DE19602811C1 (de) * 1996-01-26 1997-06-12 Siemens Ag Vefahren zur Ortung von Körperschallereignissen bei zu überwachenden Druckumschließungen in Kraftwerken
DE19604348C2 (de) * 1996-02-07 2003-10-23 Deutsche Telekom Ag Verfahren zur Herstellung einer kalibrierten Längenskala im Nanometerbereich für technische Geräte, die der hochauflösenden bis ultrahochauflösenden Abbildung von Strukturen dienen
US20020158212A1 (en) * 1998-04-17 2002-10-31 French Todd E. Apparatus and methods for time-resolved optical spectroscopy
DE19840721A1 (de) * 1998-09-07 2000-03-09 Pfeiffer Erich Gmbh & Co Kg Spender für Medien
US6741524B2 (en) * 1999-12-28 2004-05-25 Kabushiki Kaisha Toshiba Thermally-assisted magnetic recording and reproducing device having an electron beam thermal source
US6490533B2 (en) * 2001-04-26 2002-12-03 Affymetrix, Inc. System, method, and product for dynamic noise reduction in scanning of biological materials

Also Published As

Publication number Publication date
FR2830328B1 (fr) 2003-12-05
US20040249589A1 (en) 2004-12-09
JP2005504319A (ja) 2005-02-10
EP1430299B1 (fr) 2017-11-08
WO2003029808A1 (fr) 2003-04-10
FR2830328A1 (fr) 2003-04-04
EP1430299A1 (fr) 2004-06-23
US7181356B2 (en) 2007-02-20

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