JP4364995B2 - 散乱吸収体内部の光路分布計算方法 - Google Patents
散乱吸収体内部の光路分布計算方法 Download PDFInfo
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- JP4364995B2 JP4364995B2 JP2000078534A JP2000078534A JP4364995B2 JP 4364995 B2 JP4364995 B2 JP 4364995B2 JP 2000078534 A JP2000078534 A JP 2000078534A JP 2000078534 A JP2000078534 A JP 2000078534A JP 4364995 B2 JP4364995 B2 JP 4364995B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
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- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
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- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000078534A JP4364995B2 (ja) | 2000-03-21 | 2000-03-21 | 散乱吸収体内部の光路分布計算方法 |
| PCT/JP2001/001724 WO2001071319A1 (fr) | 2000-03-21 | 2001-03-06 | Procede de determination de la distribution de parcours optique a l'interieur d'un absorbant de diffusion |
| DE60138543T DE60138543D1 (de) | 2000-03-21 | 2001-03-06 | Verfahren zur berechnung der optischen wegverteilung in einem streuenden absorbierer |
| EP01908345A EP1284416B1 (en) | 2000-03-21 | 2001-03-06 | Method of calculating optical path distribution inside scattering absorber |
| AU2001236105A AU2001236105A1 (en) | 2000-03-21 | 2001-03-06 | Method of calculating optical path distribution inside scattering absorber |
| US10/239,245 US6975401B2 (en) | 2000-03-21 | 2001-03-06 | Method of calculating optical path distribution inside scattering absorber |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000078534A JP4364995B2 (ja) | 2000-03-21 | 2000-03-21 | 散乱吸収体内部の光路分布計算方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001264245A JP2001264245A (ja) | 2001-09-26 |
| JP2001264245A5 JP2001264245A5 (enExample) | 2006-12-28 |
| JP4364995B2 true JP4364995B2 (ja) | 2009-11-18 |
Family
ID=18595931
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000078534A Expired - Lifetime JP4364995B2 (ja) | 2000-03-21 | 2000-03-21 | 散乱吸収体内部の光路分布計算方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US6975401B2 (enExample) |
| EP (1) | EP1284416B1 (enExample) |
| JP (1) | JP4364995B2 (enExample) |
| AU (1) | AU2001236105A1 (enExample) |
| DE (1) | DE60138543D1 (enExample) |
| WO (1) | WO2001071319A1 (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4084307B2 (ja) * | 2001-12-26 | 2008-04-30 | 浜松ホトニクス株式会社 | 不均質媒質の光学的分析方法 |
| US7286214B2 (en) * | 2003-08-25 | 2007-10-23 | University Of South Florida | Method and program product for determining a radiance field in an optical environment |
| US7057182B2 (en) * | 2004-03-12 | 2006-06-06 | Hewlett-Packard Development Company, L.P. | Method and system for determining distortion in a circuit image |
| EP1952091A1 (en) * | 2005-10-17 | 2008-08-06 | Arryx, Inc. | Apparatus and method for detecting deformability of cells using spatially modulated optical force microscopy |
| US8243071B2 (en) * | 2008-02-29 | 2012-08-14 | Microsoft Corporation | Modeling and rendering of heterogeneous translucent materials using the diffusion equation |
| JP5782314B2 (ja) | 2011-07-07 | 2015-09-24 | 浜松ホトニクス株式会社 | 生体計測装置および画像作成方法 |
| JP6154613B2 (ja) * | 2013-01-18 | 2017-06-28 | 浜松ホトニクス株式会社 | 断面画像計測装置及び計測方法 |
| JP6358573B2 (ja) | 2014-05-15 | 2018-07-18 | 国立大学法人浜松医科大学 | 乳房計測装置の作動方法及び乳房計測装置 |
| US11654635B2 (en) | 2019-04-18 | 2023-05-23 | The Research Foundation For Suny | Enhanced non-destructive testing in directed energy material processing |
| CN114204985A (zh) * | 2021-11-12 | 2022-03-18 | 西安理工大学 | 无线紫外光非直视通信中光子检测概率快速估算方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3310782B2 (ja) * | 1994-07-14 | 2002-08-05 | 株式会社日立製作所 | 吸収物質濃度の空間分布画像化装置 |
| JP3771339B2 (ja) | 1996-01-18 | 2006-04-26 | 浜松ホトニクス株式会社 | 光ct装置及び光ctによる画像再構成方法 |
| JP3662376B2 (ja) * | 1996-05-10 | 2005-06-22 | 浜松ホトニクス株式会社 | 内部特性分布の計測方法および装置 |
| JP3836941B2 (ja) * | 1997-05-22 | 2006-10-25 | 浜松ホトニクス株式会社 | 光ct装置及び画像再構成方法 |
| JPH11311569A (ja) | 1998-04-28 | 1999-11-09 | Hamamatsu Photonics Kk | 内部特性分布の計測方法及び装置 |
| JP3887486B2 (ja) * | 1998-05-26 | 2007-02-28 | 浜松ホトニクス株式会社 | 散乱吸収体の内部特性分布の計測方法及び装置 |
-
2000
- 2000-03-21 JP JP2000078534A patent/JP4364995B2/ja not_active Expired - Lifetime
-
2001
- 2001-03-06 DE DE60138543T patent/DE60138543D1/de not_active Expired - Lifetime
- 2001-03-06 WO PCT/JP2001/001724 patent/WO2001071319A1/ja not_active Ceased
- 2001-03-06 EP EP01908345A patent/EP1284416B1/en not_active Expired - Lifetime
- 2001-03-06 US US10/239,245 patent/US6975401B2/en not_active Expired - Lifetime
- 2001-03-06 AU AU2001236105A patent/AU2001236105A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| DE60138543D1 (de) | 2009-06-10 |
| EP1284416A1 (en) | 2003-02-19 |
| WO2001071319A1 (fr) | 2001-09-27 |
| US20030078503A1 (en) | 2003-04-24 |
| EP1284416A4 (en) | 2004-10-20 |
| US6975401B2 (en) | 2005-12-13 |
| AU2001236105A1 (en) | 2001-10-03 |
| EP1284416B1 (en) | 2009-04-29 |
| JP2001264245A (ja) | 2001-09-26 |
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