AU2001236105A1 - Method of calculating optical path distribution inside scattering absorber - Google Patents

Method of calculating optical path distribution inside scattering absorber

Info

Publication number
AU2001236105A1
AU2001236105A1 AU2001236105A AU3610501A AU2001236105A1 AU 2001236105 A1 AU2001236105 A1 AU 2001236105A1 AU 2001236105 A AU2001236105 A AU 2001236105A AU 3610501 A AU3610501 A AU 3610501A AU 2001236105 A1 AU2001236105 A1 AU 2001236105A1
Authority
AU
Australia
Prior art keywords
optical path
distribution inside
path distribution
calculating optical
scattering absorber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001236105A
Inventor
Yutaka Tsuchiya
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of AU2001236105A1 publication Critical patent/AU2001236105A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium

Landscapes

  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
AU2001236105A 2000-03-21 2001-03-06 Method of calculating optical path distribution inside scattering absorber Abandoned AU2001236105A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000/78534 2000-03-21
JP2000078534A JP4364995B2 (en) 2000-03-21 2000-03-21 Calculation method of optical path distribution inside scattering medium
PCT/JP2001/001724 WO2001071319A1 (en) 2000-03-21 2001-03-06 Method of calculating optical path distribution inside scattering absorber

Publications (1)

Publication Number Publication Date
AU2001236105A1 true AU2001236105A1 (en) 2001-10-03

Family

ID=18595931

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001236105A Abandoned AU2001236105A1 (en) 2000-03-21 2001-03-06 Method of calculating optical path distribution inside scattering absorber

Country Status (6)

Country Link
US (1) US6975401B2 (en)
EP (1) EP1284416B1 (en)
JP (1) JP4364995B2 (en)
AU (1) AU2001236105A1 (en)
DE (1) DE60138543D1 (en)
WO (1) WO2001071319A1 (en)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003056307A1 (en) * 2001-12-26 2003-07-10 Hamamatsu Photonics K.K. Optical analysis method for heterogeneous medium
US7286214B2 (en) * 2003-08-25 2007-10-23 University Of South Florida Method and program product for determining a radiance field in an optical environment
US7057182B2 (en) * 2004-03-12 2006-06-06 Hewlett-Packard Development Company, L.P. Method and system for determining distortion in a circuit image
JP5214455B2 (en) * 2005-10-17 2013-06-19 アリックス インク Apparatus and method for detecting cell deformability using spatially modulated optical force microscopy
US8243071B2 (en) * 2008-02-29 2012-08-14 Microsoft Corporation Modeling and rendering of heterogeneous translucent materials using the diffusion equation
JP5782314B2 (en) 2011-07-07 2015-09-24 浜松ホトニクス株式会社 Biological measurement device and image creation method
JP6154613B2 (en) * 2013-01-18 2017-06-28 浜松ホトニクス株式会社 Cross-sectional image measuring apparatus and measuring method
JP6358573B2 (en) 2014-05-15 2018-07-18 国立大学法人浜松医科大学 Operation method of breast measurement apparatus and breast measurement apparatus
US11654635B2 (en) 2019-04-18 2023-05-23 The Research Foundation For Suny Enhanced non-destructive testing in directed energy material processing
CN114204985A (en) * 2021-11-12 2022-03-18 西安理工大学 Method for rapidly estimating photon detection probability in wireless ultraviolet light non-direct-view communication

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3310782B2 (en) 1994-07-14 2002-08-05 株式会社日立製作所 Imaging device for spatial distribution of absorption substance concentration
JP3771339B2 (en) * 1996-01-18 2006-04-26 浜松ホトニクス株式会社 Optical CT apparatus and image reconstruction method using optical CT
JP3662376B2 (en) 1996-05-10 2005-06-22 浜松ホトニクス株式会社 Internal characteristic distribution measuring method and apparatus
JP3836941B2 (en) * 1997-05-22 2006-10-25 浜松ホトニクス株式会社 Optical CT apparatus and image reconstruction method
JPH11311569A (en) * 1998-04-28 1999-11-09 Hamamatsu Photonics Kk Method and apparatus for measurement of distribution of internal characteristic
JP3887486B2 (en) 1998-05-26 2007-02-28 浜松ホトニクス株式会社 Method and apparatus for measuring internal characteristic distribution of scattering medium

Also Published As

Publication number Publication date
JP2001264245A (en) 2001-09-26
JP4364995B2 (en) 2009-11-18
EP1284416B1 (en) 2009-04-29
EP1284416A4 (en) 2004-10-20
DE60138543D1 (en) 2009-06-10
US6975401B2 (en) 2005-12-13
WO2001071319A1 (en) 2001-09-27
US20030078503A1 (en) 2003-04-24
EP1284416A1 (en) 2003-02-19

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