AU2001228515A1 - Optical column for charged particle beam device - Google Patents

Optical column for charged particle beam device

Info

Publication number
AU2001228515A1
AU2001228515A1 AU2001228515A AU2851501A AU2001228515A1 AU 2001228515 A1 AU2001228515 A1 AU 2001228515A1 AU 2001228515 A AU2001228515 A AU 2001228515A AU 2851501 A AU2851501 A AU 2851501A AU 2001228515 A1 AU2001228515 A1 AU 2001228515A1
Authority
AU
Australia
Prior art keywords
charged particle
particle beam
beam device
optical column
column
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001228515A
Inventor
Hans-Peter Feuerbaum
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
Original Assignee
ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH filed Critical ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik mbH
Publication of AU2001228515A1 publication Critical patent/AU2001228515A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252—Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256—Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2449—Detector devices with moving charges in electric or magnetic fields

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AU2001228515A 2000-02-01 2001-01-29 Optical column for charged particle beam device Abandoned AU2001228515A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP00101987A EP1122761B1 (en) 2000-02-01 2000-02-01 Optical column for charged particle beam device
EP00101987 2000-02-01
PCT/EP2001/000931 WO2001057910A1 (en) 2000-02-01 2001-01-29 Optical column for charged particle beam device

Publications (1)

Publication Number Publication Date
AU2001228515A1 true AU2001228515A1 (en) 2001-08-14

Family

ID=8167745

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001228515A Abandoned AU2001228515A1 (en) 2000-02-01 2001-01-29 Optical column for charged particle beam device

Country Status (8)

Country Link
US (1) US6936817B2 (en)
EP (1) EP1122761B1 (en)
JP (1) JP3905382B2 (en)
KR (1) KR100496496B1 (en)
CN (1) CN1222980C (en)
AU (1) AU2001228515A1 (en)
DE (1) DE60011031T2 (en)
WO (1) WO2001057910A1 (en)

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DE60011031T2 (en) * 2000-02-01 2005-06-23 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Optical column for particle beam device
FR2837931B1 (en) * 2002-03-29 2004-12-10 Cameca DEVICE FOR MEASURING THE X-RAY EMISSION PRODUCED BY AN OBJECT SUBJECT TO AN ELECTRON BEAM
US7626179B2 (en) 2005-09-30 2009-12-01 Virgin Island Microsystems, Inc. Electron beam induced resonance
US7586097B2 (en) 2006-01-05 2009-09-08 Virgin Islands Microsystems, Inc. Switching micro-resonant structures using at least one director
US7791290B2 (en) 2005-09-30 2010-09-07 Virgin Islands Microsystems, Inc. Ultra-small resonating charged particle beam modulator
WO2006018840A2 (en) * 2004-08-16 2006-02-23 Ellumina Vision Ltd. Electron microscope array for inspection and lithography
JP2006114225A (en) 2004-10-12 2006-04-27 Hitachi High-Technologies Corp Charged particle beam device
EP1801838B1 (en) * 2005-12-20 2012-05-09 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Charged particle beam emitting device and method for operating a charged particle beam emitting device
US20070200071A1 (en) * 2006-02-28 2007-08-30 Virgin Islands Microsystems, Inc. Coupling output from a micro resonator to a plasmon transmission line
US7443358B2 (en) * 2006-02-28 2008-10-28 Virgin Island Microsystems, Inc. Integrated filter in antenna-based detector
US7646991B2 (en) 2006-04-26 2010-01-12 Virgin Island Microsystems, Inc. Selectable frequency EMR emitter
US7876793B2 (en) 2006-04-26 2011-01-25 Virgin Islands Microsystems, Inc. Micro free electron laser (FEL)
US7986113B2 (en) 2006-05-05 2011-07-26 Virgin Islands Microsystems, Inc. Selectable frequency light emitter
US7436177B2 (en) 2006-05-05 2008-10-14 Virgin Islands Microsystems, Inc. SEM test apparatus
US7728702B2 (en) 2006-05-05 2010-06-01 Virgin Islands Microsystems, Inc. Shielding of integrated circuit package with high-permeability magnetic material
US7728397B2 (en) 2006-05-05 2010-06-01 Virgin Islands Microsystems, Inc. Coupled nano-resonating energy emitting structures
US7342441B2 (en) * 2006-05-05 2008-03-11 Virgin Islands Microsystems, Inc. Heterodyne receiver array using resonant structures
US7443577B2 (en) * 2006-05-05 2008-10-28 Virgin Islands Microsystems, Inc. Reflecting filtering cover
US7442940B2 (en) * 2006-05-05 2008-10-28 Virgin Island Microsystems, Inc. Focal plane array incorporating ultra-small resonant structures
US8188431B2 (en) 2006-05-05 2012-05-29 Jonathan Gorrell Integration of vacuum microelectronic device with integrated circuit
US7359589B2 (en) * 2006-05-05 2008-04-15 Virgin Islands Microsystems, Inc. Coupling electromagnetic wave through microcircuit
US20070258492A1 (en) * 2006-05-05 2007-11-08 Virgin Islands Microsystems, Inc. Light-emitting resonant structure driving raman laser
US7656094B2 (en) 2006-05-05 2010-02-02 Virgin Islands Microsystems, Inc. Electron accelerator for ultra-small resonant structures
US7718977B2 (en) * 2006-05-05 2010-05-18 Virgin Island Microsystems, Inc. Stray charged particle removal device
US7746532B2 (en) 2006-05-05 2010-06-29 Virgin Island Microsystems, Inc. Electro-optical switching system and method
US7723698B2 (en) 2006-05-05 2010-05-25 Virgin Islands Microsystems, Inc. Top metal layer shield for ultra-small resonant structures
US7732786B2 (en) 2006-05-05 2010-06-08 Virgin Islands Microsystems, Inc. Coupling energy in a plasmon wave to an electron beam
US7710040B2 (en) 2006-05-05 2010-05-04 Virgin Islands Microsystems, Inc. Single layer construction for ultra small devices
US7741934B2 (en) 2006-05-05 2010-06-22 Virgin Islands Microsystems, Inc. Coupling a signal through a window
US7679067B2 (en) 2006-05-26 2010-03-16 Virgin Island Microsystems, Inc. Receiver array using shared electron beam
CN101461026B (en) 2006-06-07 2012-01-18 Fei公司 Slider bearing for use with an apparatus comprising a vacuum chamber
JP5033873B2 (en) 2006-06-07 2012-09-26 エフ イー アイ カンパニ Slider bearing for use with equipment having a vacuum chamber
US7655934B2 (en) 2006-06-28 2010-02-02 Virgin Island Microsystems, Inc. Data on light bulb
US7450794B2 (en) * 2006-09-19 2008-11-11 Virgin Islands Microsystems, Inc. Microcircuit using electromagnetic wave routing
US7659513B2 (en) 2006-12-20 2010-02-09 Virgin Islands Microsystems, Inc. Low terahertz source and detector
WO2008098084A1 (en) * 2007-02-06 2008-08-14 Fei Company High pressure charged particle beam system
US7863563B2 (en) * 2007-03-08 2011-01-04 International Business Machines Corporation Carbon tube for electron beam application
US7990336B2 (en) 2007-06-19 2011-08-02 Virgin Islands Microsystems, Inc. Microwave coupled excitation of solid state resonant arrays
DE602007005631D1 (en) * 2007-07-27 2010-05-12 Integrated Circuit Testing Electrostatic lens arrangement
US7791053B2 (en) 2007-10-10 2010-09-07 Virgin Islands Microsystems, Inc. Depressed anode with plasmon-enabled devices such as ultra-small resonant structures
JP5702552B2 (en) * 2009-05-28 2015-04-15 エフ イー アイ カンパニＦｅｉ Ｃｏｍｐａｎｙ Control method of dual beam system
JP5023199B2 (en) * 2010-07-29 2012-09-12 株式会社日立ハイテクノロジーズ Charged particle beam emission system
US9679741B2 (en) 2010-11-09 2017-06-13 Fei Company Environmental cell for charged particle beam system
EP2573796B1 (en) * 2011-09-22 2014-05-07 Carl Zeiss Microscopy Limited Particle beam system having a hollow light guide
EP2592314B1 (en) 2011-11-10 2016-08-24 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Charged particle beam device, vacuum valve therefore and operation thereof
US9541382B2 (en) 2011-12-19 2017-01-10 Kabushiki Kaisha Topcon Rotation angle detecting apparatus and surveying instrument
JP6055179B2 (en) * 2011-12-19 2016-12-27 株式会社トプコン Rotation angle detection device and surveying device
JP5936424B2 (en) * 2012-04-20 2016-06-22 株式会社日立ハイテクノロジーズ Charged particle beam equipment
EP2879155B1 (en) * 2013-12-02 2018-04-25 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Multi-beam system for high throughput EBI
US20160090976A1 (en) * 2014-09-30 2016-03-31 Honeywell International Inc. Systems and methods for a dual purpose getter container
US10832885B2 (en) * 2015-12-23 2020-11-10 Massachusetts Institute Of Technology Electron transparent membrane for cold cathode devices
JP2019003863A (en) * 2017-06-16 2019-01-10 株式会社島津製作所 Electron beam apparatus, x-ray generating apparatus including the same, and scanning electron microscope

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US4713543A (en) * 1984-08-13 1987-12-15 Siemens Aktiengesellschaft Scanning particle microscope
NL9000057A (en) * 1990-01-10 1991-08-01 Philips Nv THERMALLY CONTROLLED VACUUM VALVE FOR PARTICULATE BUNDLE DEVICE.
JP3148353B2 (en) * 1991-05-30 2001-03-19 ケーエルエー・インストルメンツ・コーポレーション Electron beam inspection method and system
JP3730263B2 (en) * 1992-05-27 2005-12-21 ケーエルエー・インストルメンツ・コーポレーション Apparatus and method for automatic substrate inspection using charged particle beam
US5576483A (en) * 1993-10-01 1996-11-19 Hysitron Incorporated Capacitive transducer with electrostatic actuation
US5661235A (en) * 1993-10-01 1997-08-26 Hysitron Incorporated Multi-dimensional capacitive transducer
JPH08195180A (en) * 1995-01-13 1996-07-30 Jeol Ltd Sluice valve control device for electron microscope
US5563415A (en) * 1995-06-07 1996-10-08 Arch Development Corporation Magnetic lens apparatus for a low-voltage high-resolution electron microscope
US6051839A (en) * 1996-06-07 2000-04-18 Arch Development Corporation Magnetic lens apparatus for use in high-resolution scanning electron microscopes and lithographic processes
US5998790A (en) * 1997-06-18 1999-12-07 The Regents Of The University Of California Transmission electron microscope CCD camera
US6023060A (en) * 1998-03-03 2000-02-08 Etec Systems, Inc. T-shaped electron-beam microcolumn as a general purpose scanning electron microscope
DE60011031T2 (en) * 2000-02-01 2005-06-23 ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH Optical column for particle beam device
US6700127B2 (en) * 2002-01-09 2004-03-02 Biomed Solutions Llc Point source for producing electrons beams
JP4261806B2 (en) * 2002-02-15 2009-04-30 株式会社日立ハイテクノロジーズ Electron beam apparatus and high voltage discharge prevention method thereof

Also Published As

Publication number Publication date
US20030155521A1 (en) 2003-08-21
US6936817B2 (en) 2005-08-30
JP3905382B2 (en) 2007-04-18
WO2001057910A1 (en) 2001-08-09
JP2003522381A (en) 2003-07-22
CN1222980C (en) 2005-10-12
DE60011031D1 (en) 2004-07-01
EP1122761A1 (en) 2001-08-08
DE60011031T2 (en) 2005-06-23
EP1122761B1 (en) 2004-05-26
KR20020077411A (en) 2002-10-11
KR100496496B1 (en) 2005-06-22
CN1406391A (en) 2003-03-26

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