JP4313830B2 - 半導体放射線検出器及び半導体放射線撮像装置 - Google Patents

半導体放射線検出器及び半導体放射線撮像装置 Download PDF

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JP4313830B2
JP4313830B2 JP2007185494A JP2007185494A JP4313830B2 JP 4313830 B2 JP4313830 B2 JP 4313830B2 JP 2007185494 A JP2007185494 A JP 2007185494A JP 2007185494 A JP2007185494 A JP 2007185494A JP 4313830 B2 JP4313830 B2 JP 4313830B2
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semiconductor
electrode
semiconductor radiation
radiation detector
axis
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Expired - Fee Related
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JP2007185494A
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Japanese (ja)
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JP2008004949A (ja
JP2008004949A5 (enExample
Inventor
一磨 横井
博司 北口
崇章 石津
健介 雨宮
雄一郎 上野
一俊 土屋
憲史 柳田
進一 小嶋
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Hitachi Ltd
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Hitachi Ltd
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  • Nuclear Medicine (AREA)
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JP2007185494A 2007-07-17 2007-07-17 半導体放射線検出器及び半導体放射線撮像装置 Expired - Fee Related JP4313830B2 (ja)

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JP2007185494A JP4313830B2 (ja) 2007-07-17 2007-07-17 半導体放射線検出器及び半導体放射線撮像装置

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JP2007185494A JP4313830B2 (ja) 2007-07-17 2007-07-17 半導体放射線検出器及び半導体放射線撮像装置

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JP2003342685A Division JP2005109269A (ja) 2003-09-30 2003-09-30 半導体放射線検出器及び半導体放射線撮像装置

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JP2008004949A JP2008004949A (ja) 2008-01-10
JP2008004949A5 JP2008004949A5 (enExample) 2008-06-26
JP4313830B2 true JP4313830B2 (ja) 2009-08-12

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102272626B (zh) * 2009-02-16 2013-06-26 株式会社岛津制作所 射线断层摄影装置
JP5027832B2 (ja) * 2009-02-17 2012-09-19 株式会社日立製作所 放射線検出モジュール及び放射線撮像装置

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JP2008004949A (ja) 2008-01-10

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