JP2008004949A5 - - Google Patents
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- Publication number
- JP2008004949A5 JP2008004949A5 JP2007185494A JP2007185494A JP2008004949A5 JP 2008004949 A5 JP2008004949 A5 JP 2008004949A5 JP 2007185494 A JP2007185494 A JP 2007185494A JP 2007185494 A JP2007185494 A JP 2007185494A JP 2008004949 A5 JP2008004949 A5 JP 2008004949A5
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- semiconductor
- detector according
- radiation detector
- semiconductor elements
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims 13
- 230000005855 radiation Effects 0.000 claims 6
- 239000011810 insulating material Substances 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 2
- 238000003384 imaging method Methods 0.000 claims 1
- 238000002600 positron emission tomography Methods 0.000 claims 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007185494A JP4313830B2 (ja) | 2007-07-17 | 2007-07-17 | 半導体放射線検出器及び半導体放射線撮像装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007185494A JP4313830B2 (ja) | 2007-07-17 | 2007-07-17 | 半導体放射線検出器及び半導体放射線撮像装置 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003342685A Division JP2005109269A (ja) | 2003-09-30 | 2003-09-30 | 半導体放射線検出器及び半導体放射線撮像装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008004949A JP2008004949A (ja) | 2008-01-10 |
| JP2008004949A5 true JP2008004949A5 (enExample) | 2008-06-26 |
| JP4313830B2 JP4313830B2 (ja) | 2009-08-12 |
Family
ID=39009029
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007185494A Expired - Fee Related JP4313830B2 (ja) | 2007-07-17 | 2007-07-17 | 半導体放射線検出器及び半導体放射線撮像装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4313830B2 (enExample) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010092623A1 (ja) * | 2009-02-16 | 2010-08-19 | 株式会社島津製作所 | 放射線断層撮影装置 |
| JP5027832B2 (ja) * | 2009-02-17 | 2012-09-19 | 株式会社日立製作所 | 放射線検出モジュール及び放射線撮像装置 |
-
2007
- 2007-07-17 JP JP2007185494A patent/JP4313830B2/ja not_active Expired - Fee Related
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