JP4311952B2 - 3次元座標測定方法 - Google Patents
3次元座標測定方法 Download PDFInfo
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- JP4311952B2 JP4311952B2 JP2003061070A JP2003061070A JP4311952B2 JP 4311952 B2 JP4311952 B2 JP 4311952B2 JP 2003061070 A JP2003061070 A JP 2003061070A JP 2003061070 A JP2003061070 A JP 2003061070A JP 4311952 B2 JP4311952 B2 JP 4311952B2
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- 238000012360 testing method Methods 0.000 claims description 393
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- 238000000465 moulding Methods 0.000 description 2
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Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2003061070A JP4311952B2 (ja) | 2002-03-08 | 2003-03-07 | 3次元座標測定方法 |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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JP2002062993 | 2002-03-08 | ||
JP2002320810 | 2002-11-05 | ||
JP2003061070A JP4311952B2 (ja) | 2002-03-08 | 2003-03-07 | 3次元座標測定方法 |
Publications (3)
Publication Number | Publication Date |
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JP2004205478A JP2004205478A (ja) | 2004-07-22 |
JP2004205478A5 JP2004205478A5 (enrdf_load_stackoverflow) | 2006-04-13 |
JP4311952B2 true JP4311952B2 (ja) | 2009-08-12 |
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JP2003061070A Expired - Fee Related JP4311952B2 (ja) | 2002-03-08 | 2003-03-07 | 3次元座標測定方法 |
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JP (1) | JP4311952B2 (enrdf_load_stackoverflow) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5236962B2 (ja) * | 2008-02-18 | 2013-07-17 | 株式会社ミツトヨ | 被測定物の表裏面測定方法 |
JP2010237054A (ja) * | 2009-03-31 | 2010-10-21 | Toyota Motor Corp | 組み付け精度測定方法および測定装置 |
US20150096707A1 (en) * | 2012-03-12 | 2015-04-09 | Actech Gmbh | Method for positioning and fixing mold parts in casting molds |
CN103341929B (zh) * | 2013-06-27 | 2015-07-22 | 信义汽车玻璃(深圳)有限公司 | 一体注塑产品模型制作方法 |
WO2016143395A1 (ja) * | 2015-03-11 | 2016-09-15 | ナルックス株式会社 | 位置測定部を備えた部品及び測定方法 |
CN110567425B (zh) * | 2019-07-26 | 2024-04-19 | 赛诺威盛科技(北京)股份有限公司 | 用于精密对准装调探测器模块与后准直器的装置及方法 |
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JP2004205478A (ja) | 2004-07-22 |
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