JP4303108B2 - リニアイオントラップ型質量分析計における空間電荷低減方法 - Google Patents

リニアイオントラップ型質量分析計における空間電荷低減方法 Download PDF

Info

Publication number
JP4303108B2
JP4303108B2 JP2003522975A JP2003522975A JP4303108B2 JP 4303108 B2 JP4303108 B2 JP 4303108B2 JP 2003522975 A JP2003522975 A JP 2003522975A JP 2003522975 A JP2003522975 A JP 2003522975A JP 4303108 B2 JP4303108 B2 JP 4303108B2
Authority
JP
Japan
Prior art keywords
mass spectrometer
ion
ion trap
ions
quadrupole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003522975A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005500662A (ja
JP2005500662A5 (enExample
Inventor
ダブリュ ヘイガー，ジェイムズ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mds Inc Doing Business Mds Sciex AS
Original Assignee
Mds Inc Doing Business Mds Sciex AS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mds Inc Doing Business Mds Sciex AS filed Critical Mds Inc Doing Business Mds Sciex AS
Publication of JP2005500662A publication Critical patent/JP2005500662A/ja
Publication of JP2005500662A5 publication Critical patent/JP2005500662A5/ja
Application granted granted Critical
Publication of JP4303108B2 publication Critical patent/JP4303108B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/4265—Controlling the number of trapped ions; preventing space charge effects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H01J49/4225—Multipole linear ion traps, e.g. quadrupoles, hexapoles
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00—Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/143—Electron beam

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2003522975A 2001-08-30 2002-08-14 リニアイオントラップ型質量分析計における空間電荷低減方法 Expired - Fee Related JP4303108B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US31571501P 2001-08-30 2001-08-30
PCT/CA2002/001257 WO2003019614A2 (en) 2001-08-30 2002-08-14 A method of reducing space charge in a linear ion trap mass spectrometer

Publications (3)

Publication Number Publication Date
JP2005500662A JP2005500662A (ja) 2005-01-06
JP2005500662A5 JP2005500662A5 (enExample) 2006-01-05
JP4303108B2 true JP4303108B2 (ja) 2009-07-29

Family

ID=23225723

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003522975A Expired - Fee Related JP4303108B2 (ja) 2001-08-30 2002-08-14 リニアイオントラップ型質量分析計における空間電荷低減方法

Country Status (8)

Country Link
US (2) US20040238737A1 (enExample)
EP (1) EP1421600B1 (enExample)
JP (1) JP4303108B2 (enExample)
AT (1) ATE298463T1 (enExample)
AU (1) AU2002322895A1 (enExample)
CA (1) CA2457631C (enExample)
DE (1) DE60204785T2 (enExample)
WO (1) WO2003019614A2 (enExample)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7060972B2 (en) * 2000-07-21 2006-06-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
US6720554B2 (en) * 2000-07-21 2004-04-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
CA2457631C (en) * 2001-08-30 2010-04-27 Mds Inc., Doing Business As Mds Sciex A method of reducing space charge in a linear ion trap mass spectrometer
US7045797B2 (en) * 2002-08-05 2006-05-16 The University Of British Columbia Axial ejection with improved geometry for generating a two-dimensional substantially quadrupole field
US6897438B2 (en) * 2002-08-05 2005-05-24 University Of British Columbia Geometry for generating a two-dimensional substantially quadrupole field
EP1586104A2 (en) * 2003-01-24 2005-10-19 Thermo Finnigan LLC Controlling ion populations in a mass analyzer
GB0312940D0 (en) * 2003-06-05 2003-07-09 Shimadzu Res Lab Europe Ltd A method for obtaining high accuracy mass spectra using an ion trap mass analyser and a method for determining and/or reducing chemical shift in mass analysis
JP5027507B2 (ja) * 2003-09-25 2012-09-19 エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス 選択された六重極成分を有する２次元の実質的四重極電場を提供するための方法及び装置
DE102004001514A1 (de) * 2004-01-09 2005-08-04 Marcus Dr.-Ing. Gohl Verfahren und Vorrichtung zur Bestimmung des Schmierölgehalts in einem Abgasgemisch
EP1889282A4 (en) * 2005-05-18 2011-01-19 Mds Inc Dba Mds Sciex METHOD AND DEVICE FOR MASS-ACTIVE AXIAL TRANSPORT USING FOUR-POINT DC-DC
GB0511083D0 (en) 2005-05-31 2005-07-06 Thermo Finnigan Llc Multiple ion injection in mass spectrometry
DE102005025498B4 (de) * 2005-06-03 2008-12-24 Bruker Daltonik Gmbh Füllstandsregelung in Ionenzyklotronresonanz- Massenspetrometern
JP4636943B2 (ja) * 2005-06-06 2011-02-23 株式会社日立ハイテクノロジーズ 質量分析装置
JP4369454B2 (ja) 2006-09-04 2009-11-18 株式会社日立ハイテクノロジーズ イオントラップ質量分析方法
US7633059B2 (en) 2006-10-13 2009-12-15 Agilent Technologies, Inc. Mass spectrometry system having ion deflector
GB0624679D0 (en) * 2006-12-11 2007-01-17 Shimadzu Corp A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
US7629575B2 (en) * 2007-12-19 2009-12-08 Varian, Inc. Charge control for ionic charge accumulation devices
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
US8822916B2 (en) 2008-06-09 2014-09-02 Dh Technologies Development Pte. Ltd. Method of operating tandem ion traps
US8766170B2 (en) * 2008-06-09 2014-07-01 Dh Technologies Development Pte. Ltd. Method of operating tandem ion traps
CA2720249C (en) * 2008-06-09 2015-12-08 Dh Technologies Development Pte. Ltd. A multipole ion guide for providing an axial electric field whose strength increases with radial position, and a method of operating a multipole ion guide having such an axial electric field
GB0810599D0 (en) 2008-06-10 2008-07-16 Micromass Ltd Mass spectrometer
US20100096544A1 (en) * 2008-10-16 2010-04-22 Battelle Memorial Institute Surface Sampling Probe for Field Portable Surface Sampling Mass Spectrometer
GB0900917D0 (en) 2009-01-20 2009-03-04 Micromass Ltd Mass spectrometer
US20100237236A1 (en) * 2009-03-20 2010-09-23 Applera Corporation Method Of Processing Multiple Precursor Ions In A Tandem Mass Spectrometer
CN102422129B (zh) * 2009-05-11 2015-03-25 萨莫芬尼根有限责任公司 在具有质量选择性传送光学器件的质谱仪中的离子布居控制
GB2511582B (en) * 2011-05-20 2016-02-10 Thermo Fisher Scient Bremen Method and apparatus for mass analysis
US9318310B2 (en) * 2011-07-11 2016-04-19 Dh Technologies Development Pte. Ltd. Method to control space charge in a mass spectrometer
EP2786399B1 (en) * 2011-11-29 2019-10-09 Thermo Finnigan LLC Method for automated checking and adjustment of mass spectrometer calibration
EP2795665A4 (en) 2011-12-23 2015-08-12 Dh Technologies Dev Pte Ltd METHOD AND SYSTEM FOR QUANTITATIVE AND QUALITATIVE ANALYSIS USING MASS SPECTROMETRY
US8759752B2 (en) 2012-03-12 2014-06-24 Thermo Finnigan Llc Corrected mass analyte values in a mass spectrum
WO2014140622A1 (en) 2013-03-14 2014-09-18 Micromass Uk Limited Improved method of data dependent control
US8969794B2 (en) * 2013-03-15 2015-03-03 1St Detect Corporation Mass dependent automatic gain control for mass spectrometer
GB201307404D0 (en) * 2013-04-24 2013-06-05 Micromass Ltd Improved ion mobility spectrometer
US10088451B2 (en) 2013-04-24 2018-10-02 Micromass Uk Limited Ion mobility spectrometer
GB201316164D0 (en) 2013-09-11 2013-10-23 Thermo Fisher Scient Bremen Targeted mass analysis
EP3321953B1 (en) 2016-11-10 2019-06-26 Thermo Finnigan LLC Systems and methods for scaling injection waveform amplitude during ion isolation
US10128099B1 (en) * 2017-07-20 2018-11-13 Thermo Finnigan Llc Systems and methods for regulating the ion population in an ion trap for MSn scans
EP3918629A1 (en) * 2019-02-01 2021-12-08 DH Technologies Development Pte. Ltd. Auto gain control for optimum ion trap filling
GB201906546D0 (en) 2019-05-09 2019-06-26 Thermo Fisher Scient Bremen Gmbh Charge detection for ion current control

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT528250A (enExample) * 1953-12-24
US5107109A (en) * 1986-03-07 1992-04-21 Finnigan Corporation Method of increasing the dynamic range and sensitivity of a quadrupole ion trap mass spectrometer
US4755670A (en) * 1986-10-01 1988-07-05 Finnigan Corporation Fourtier transform quadrupole mass spectrometer and method
US5179278A (en) * 1991-08-23 1993-01-12 Mds Health Group Limited Multipole inlet system for ion traps
DE4326549C1 (de) * 1993-08-07 1994-08-25 Bruker Franzen Analytik Gmbh Verfahren für eine Regelung der Raumladung in Ionenfallen
US6011259A (en) * 1995-08-10 2000-01-04 Analytica Of Branford, Inc. Multipole ion guide ion trap mass spectrometry with MS/MSN analysis
US5420425A (en) * 1994-05-27 1995-05-30 Finnigan Corporation Ion trap mass spectrometer system and method
US5572022A (en) * 1995-03-03 1996-11-05 Finnigan Corporation Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer
US6177668B1 (en) * 1996-06-06 2001-01-23 Mds Inc. Axial ejection in a multipole mass spectrometer
CA2457631C (en) * 2001-08-30 2010-04-27 Mds Inc., Doing Business As Mds Sciex A method of reducing space charge in a linear ion trap mass spectrometer

Also Published As

Publication number Publication date
AU2002322895A1 (en) 2003-03-10
EP1421600A2 (en) 2004-05-26
WO2003019614A3 (en) 2003-06-19
US6627876B2 (en) 2003-09-30
ATE298463T1 (de) 2005-07-15
DE60204785T2 (de) 2006-05-04
US20030042415A1 (en) 2003-03-06
US20040238737A1 (en) 2004-12-02
WO2003019614A2 (en) 2003-03-06
DE60204785D1 (de) 2005-07-28
CA2457631A1 (en) 2003-03-06
CA2457631C (en) 2010-04-27
JP2005500662A (ja) 2005-01-06
EP1421600B1 (en) 2005-06-22

Similar Documents

Publication Publication Date Title
JP4303108B2 (ja) リニアイオントラップ型質量分析計における空間電荷低減方法
US9698002B2 (en) Method and apparatus for mass analysis utilizing ion charge feedback
JP4481164B2 (ja) 軸方向電場及びガスのカウンターフローを備えるイオンガイドを利用してイオンの移動度分離を実施するための装置及び方法
JP4659395B2 (ja) 質量分析装置及び質量分析方法
JP5624558B2 (ja) 質量分析計及び質量分析方法
US8552365B2 (en) Ion population control in a mass spectrometer having mass-selective transfer optics
US10705048B2 (en) Mass spectrometer
US6015972A (en) Boundary activated dissociation in rod-type mass spectrometer
JP5916856B2 (ja) 質量分析計の中の空間電荷を制御する方法
US7034287B2 (en) Mass spectrometer and method of use
US7186973B2 (en) Ion trap/time-of-flight mass analyzing apparatus and mass analyzing method
US7196327B2 (en) Quadrupole mass spectrometer with spatial dispersion
US7601952B2 (en) Method of operating a mass spectrometer to provide resonant excitation ion transfer
CN113366609B (zh) 用于优化离子阱填充的自动增益控制
US7112787B2 (en) Ion trap mass spectrometer and method for analyzing ions

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050726

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050726

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20071029

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20071106

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20080206

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20080214

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080507

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080902

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20081202

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20081209

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090105

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20090324

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20090423

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120501

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4303108

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120501

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130501

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140501

Year of fee payment: 5

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees