JP4235778B2 - 投影光学系、投影光学装置、走査型露光装置、光加工方法および露光方法 - Google Patents
投影光学系、投影光学装置、走査型露光装置、光加工方法および露光方法 Download PDFInfo
- Publication number
- JP4235778B2 JP4235778B2 JP14160799A JP14160799A JP4235778B2 JP 4235778 B2 JP4235778 B2 JP 4235778B2 JP 14160799 A JP14160799 A JP 14160799A JP 14160799 A JP14160799 A JP 14160799A JP 4235778 B2 JP4235778 B2 JP 4235778B2
- Authority
- JP
- Japan
- Prior art keywords
- lens group
- wavelength
- negative
- negative lens
- positive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70358—Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Laser Beam Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14160799A JP4235778B2 (ja) | 1998-05-21 | 1999-05-21 | 投影光学系、投影光学装置、走査型露光装置、光加工方法および露光方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10-140285 | 1998-05-21 | ||
| JP14028598 | 1998-05-21 | ||
| JP14160799A JP4235778B2 (ja) | 1998-05-21 | 1999-05-21 | 投影光学系、投影光学装置、走査型露光装置、光加工方法および露光方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000039557A JP2000039557A (ja) | 2000-02-08 |
| JP2000039557A5 JP2000039557A5 (OSRAM) | 2008-01-24 |
| JP4235778B2 true JP4235778B2 (ja) | 2009-03-11 |
Family
ID=26472854
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14160799A Expired - Fee Related JP4235778B2 (ja) | 1998-05-21 | 1999-05-21 | 投影光学系、投影光学装置、走査型露光装置、光加工方法および露光方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4235778B2 (OSRAM) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5205683B2 (ja) | 2000-04-19 | 2013-06-05 | 株式会社ニコン | 光学装置、露光装置、および露光方法 |
| JP2002023055A (ja) * | 2000-07-10 | 2002-01-23 | Nikon Corp | 結像光学系および該結像光学系を備えた露光装置 |
| JP2004006783A (ja) * | 2002-04-18 | 2004-01-08 | Nikon Corp | 投影光学系、露光装置、露光方法及びマイクロデバイスの製造方法 |
| JP2004354909A (ja) * | 2003-05-30 | 2004-12-16 | Orc Mfg Co Ltd | 投影露光装置および投影露光方法 |
| JP4618531B2 (ja) * | 2004-03-15 | 2011-01-26 | 株式会社ニコン | レーザ加工用光学系及びこれを用いたレーザ加工装置 |
| CN100388056C (zh) * | 2006-06-02 | 2008-05-14 | 上海微电子装备有限公司 | 一种投影物镜光学系统 |
| US7760425B2 (en) * | 2007-09-05 | 2010-07-20 | Carl Zeiss Smt Ag | Chromatically corrected catadioptric objective and projection exposure apparatus including the same |
| CN114859515B (zh) * | 2022-05-23 | 2024-01-12 | 张家港中贺自动化科技有限公司 | 一种用于投影光刻的折反式物镜光学系统及投影光刻系统 |
| CN115452828B (zh) * | 2022-09-22 | 2024-08-23 | 苏州灵猴机器人有限公司 | 一种物料的光学检测系统 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4171871A (en) * | 1977-06-30 | 1979-10-23 | International Business Machines Corporation | Achromatic unit magnification optical system |
| JP3747951B2 (ja) * | 1994-11-07 | 2006-02-22 | 株式会社ニコン | 反射屈折光学系 |
| JPH0756090A (ja) * | 1993-08-17 | 1995-03-03 | Topcon Corp | 走査型投影光学系 |
| JPH08179217A (ja) * | 1994-08-19 | 1996-07-12 | Tamarack Scient Co Inc | ダイソンレンズ系 |
| US5557469A (en) * | 1994-10-28 | 1996-09-17 | Ultratech Stepper, Inc. | Beamsplitter in single fold optical system and optical variable magnification method and system |
| JPH08211294A (ja) * | 1995-02-02 | 1996-08-20 | Nikon Corp | 投影露光装置 |
| US5585972A (en) * | 1995-02-15 | 1996-12-17 | Ultratech Stepper, Inc. | Arbitrarily wide lens array with an image field to span the width of a substrate |
-
1999
- 1999-05-21 JP JP14160799A patent/JP4235778B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2000039557A (ja) | 2000-02-08 |
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