JP4181089B2 - Appearance inspection equipment - Google Patents

Description

  The present invention relates to an appearance inspection apparatus for inspecting the appearance of an inspection object.

  Conventionally, there is JP-A-2000-35322 as a technology in such a field. In this publication, an appearance inspection apparatus for inspecting an upper surface of a work that is an inspection object and has an annular shape, an appearance inspection apparatus for inspecting an outer peripheral surface of the work, and an inner peripheral surface of the work are inspected. An external appearance inspection apparatus is disclosed.

  An appearance inspection apparatus that inspects the upper surface of a workpiece includes a holder that holds the workpiece on its outer peripheral surface, and is configured to illuminate the upper surface of the workpiece with an annular illuminator and to image the upper surface of the workpiece with a camera.

  In addition, an appearance inspection apparatus for inspecting the outer peripheral surface of a work includes a holder that holds the work in an inner hole of the work, a reflector that is disposed on the side of the work, and has a reflective surface formed in an inward conical shape. It has. The reflector is disposed away from the outer peripheral surface of the workpiece. Further, an annular illuminator is disposed above the reflector, and the light emitted from the illuminator is once reflected by the reflector to illuminate the outer peripheral surface of the workpiece.

In addition, an appearance inspection apparatus for inspecting the inner peripheral surface of a ring-shaped workpiece includes a holder for holding the workpiece on its outer peripheral surface, and an illuminator is disposed below the workpiece, so that The light is directed toward the surface, and the inner peripheral surface of the work is imaged by the camera from above the work.
JP 2000-35322 A

  However, in the above appearance inspection apparatus, in order to inspect the upper surface, the outer peripheral surface, and the inner peripheral surface of the workpiece, an appearance inspection device corresponding to the surface to be inspected must be used. Therefore, it is necessary to transport the work between the respective appearance inspection apparatuses, which complicates the entire apparatus.

  In addition, in the appearance inspection apparatus for inspecting the outer peripheral surface of the workpiece, the annular illuminator that illuminates the outer peripheral surface of the workpiece reflects the irradiated light to a single reflector so that the outer peripheral surface of the workpiece is Illuminated. For this reason, the illuminance for illuminating the outer peripheral surface of the workpiece decreases. Further, since the reflecting surface of the reflector is arranged away from the outer peripheral surface of the workpiece, the image of the outer peripheral surface of the workpiece reflected on the reflecting surface is blurred, and there is a possibility that a reliable inspection cannot be performed.

  In addition, in the appearance inspection apparatus for inspecting the inner peripheral surface of the annular workpiece, the inner peripheral surface of the workpiece is imaged by the camera from above the workpiece. The inner peripheral surface of the work is imaged from the side, and the inner peripheral surface of the work cannot be reliably inspected.

  Then, an object of this invention is to provide the apparatus for external appearance inspection which can test | inspect the external appearance of a test object reliably.

  An appearance inspection apparatus according to the present invention is an appearance inspection apparatus for performing an appearance inspection of an inspection object having an outer peripheral surface that has a cylindrical surface shape, and has a truncated cone surface whose inner diameter decreases from one end to the other end. And an annular illuminator arranged to face the pedestal on the one end side, the illuminator being inside the frustoconical surface and concentrically with the frustoconical surface. The main surface and the outer peripheral surface facing the illuminator of the inspection object arranged are directly illuminated, and the outer peripheral surface of the inspection object is projected onto the truncated cone surface.

  According to this appearance inspection device, when performing an appearance inspection of an inspection object having an outer peripheral surface that is formed into a cylindrical surface, if the inspection object is arranged concentrically with the truncated cone surface inside the truncated cone surface, The outer peripheral surface of the inspection object is projected onto the truncated cone surface, and the main surface and outer peripheral surface of the inspection object are directly illuminated by the illuminator. Therefore, if the inspection object is observed from the illuminator side, the main surface of the inspection object is directly illuminated by the illuminator, so that the appearance of the main surface can be inspected with high definition. Furthermore, since the outer peripheral surface of the inspection object is also directly illuminated by the illuminator, there is almost no reduction in illuminance compared to the case where it is indirectly illuminated. Therefore, if observed from the illuminator side, the outer peripheral surface of the inspection object projected onto the truncated cone surface can be inspected with high definition. In this way, the main surface and the outer peripheral surface of the inspection object can be reliably inspected.

  Furthermore, in the above-described visual inspection apparatus, it is preferable that the illuminator directly illuminates the main surface and the outer peripheral surface facing the illuminator of the object to be inspected arranged with the entire circumference of one end in contact with the truncated cone surface. . If such a configuration is adopted, the main surface and the outer peripheral surface of the inspection object are arranged by the illuminator by arranging the inspection object so that the entire circumference of one edge of the inspection object contacts the truncated cone surface. Directly illuminated. Therefore, if the inspection object is observed from the illuminator side, the appearance of the main surface of the inspection object can be inspected with high definition. Further, since the outer peripheral surface of the inspection object and the truncated cone surface are close to each other, the outer peripheral surface of the inspection object is clearly projected onto the truncated cone surface. Therefore, coupled with the fact that the outer peripheral surface of the inspection object is directly illuminated by the illuminator, the outer peripheral surface of the inspection object projected onto the truncated cone surface can be inspected with high definition. Further, from the illuminator side, the main surface and the outer peripheral surface of the object to be inspected are observed in a row, so that it is easy to perform an appearance inspection.

  An appearance inspection apparatus according to the present invention is an appearance inspection apparatus for performing an appearance inspection of an inspection object having an inner peripheral surface formed into a cylindrical surface, and has an outer diameter from one end to the other end. A base having a truncated cone surface formed thereon is provided, and the inner peripheral surface of the object to be inspected arranged by inserting an inner hole formed by the inner peripheral surface into the portion of the base where the truncated cone surface is formed is a cone. It is characterized by being projected onto the surface of the table.

  According to this appearance inspection apparatus, since the inner peripheral surface of the inner hole of the inspection object is projected onto the portion where the truncated cone surface is formed, the inner peripheral surface of the inspection object projected onto the truncated cone surface is It can be observed, and its inner peripheral surface can be reliably inspected.

  In this appearance inspection apparatus, it is preferable that the frustoconical surface is brought into contact with the entire inner end edge of the inspection object. By adopting this configuration, the inner peripheral surface of the object to be inspected and the frustoconical surface are close to each other, so that the inner peripheral surface of the object to be inspected is more clearly projected on the frustoconical surface. Therefore, the inner peripheral surface of the inspection object can be inspected with high definition.

  Further, an appearance inspection apparatus according to the present invention is an appearance inspection apparatus for performing an appearance inspection of an inspection object having an outer peripheral surface and an inner peripheral surface that are formed in a cylindrical surface shape, from one end to the other end. A first truncated cone surface is formed in a first base in which a first truncated cone surface having a smaller inner diameter is formed and a hole is formed along the central axis of the first truncated cone surface, and in the first base hole. And a second base with a second truncated cone surface having an outer diameter increasing from one end to the other end, the first truncated cone surface and the second truncated cone surface being a center It is characterized by facing in the same direction on the axis.

  According to this appearance inspection apparatus, when inspecting the inspection object, the inspection object is formed by the inner peripheral surface of the inspection object so as to be concentric with the first and second truncated cone surfaces. The inner hole is inserted into the second truncated cone surface so that the inspection object is located on the inner side of the first truncated cone surface. As a result, the outer peripheral surface of the inspection object is projected onto the first truncated cone surface, and the inner peripheral surface of the inspection object is projected onto the second truncated cone surface. Therefore, if the object to be inspected is observed from the side where the first and second truncated cone surfaces are directed, the main surface facing the same side as the first and second truncated cone surfaces can be inspected, and the first The outer peripheral surface of the inspection object can be inspected by observing the first truncated cone surface, and the inner peripheral surface of the inspection object can be inspected by observing the second frustoconical surface. In this way, the main surface, outer peripheral surface, and inner peripheral surface of the inspection object can be reliably inspected.

  In such an appearance inspection apparatus, it is preferable to further include a base moving means for relatively moving the first base and the second base along the central axis. By adopting this configuration, the first base and the second base are moved along the central axis by the base moving means even when the outer diameter and the inner diameter are different for each inspection object. By moving the inspection object relatively, the outer peripheral surface of the inspection object can be projected onto the first truncated cone surface, and the inner peripheral surface of the inspection object can be projected onto the second truncated cone surface.

  In this appearance inspection apparatus, both the first truncated cone surface and the second truncated cone surface face upward, and the base moving means moves the second base up and down relative to the first base. The inspection object is preferably positioned on the first truncated cone surface. With such a configuration, when the inspection object is arranged concentrically with respect to the first truncated cone surface, the inspection object is placed on the first truncated cone surface in an eccentric state. In this case, it is necessary to correct the posture of the inspection object and arrange the inspection object concentrically with respect to the first truncated cone surface. Therefore, since the second truncated cone surface is directed upward, the second moving base is moved upward with respect to the first base by the base moving means, so that the second hole is formed in the inner hole of the inspection object. By inserting the two truncated cone surfaces, the inspection object can be supported by the second truncated cone surfaces. At this time, when the inspection object having an eccentric posture is supported by the second base, the posture is corrected to be concentric with the second truncated cone surface. In this state, the object to be inspected is arranged concentrically with respect to the first base by moving the second base downward with respect to the first base by the base moving means. Will be positioned. In this case, if the correction cannot be made by simply moving the second base once by the base moving means, the relative movement of the second base by the base moving means is repeatedly performed, so that the object to be inspected can be obtained. The object is modified and positioned.

  Further, in this visual inspection apparatus, an annular illuminator disposed so as to face the first base and concentric with the first and second truncated cone surfaces, and the illuminator It is preferable to further include an illuminator moving means for relatively moving the first and second bases and the illuminator while maintaining the above posture. With this configuration, the main surface on the illuminator side of the inspection object is obtained by relatively moving the first and second bases and the illuminator while maintaining the posture of the illuminator by the illuminator moving means. Of the outer peripheral surface and the inner peripheral surface, the surface to be illuminated can be changed.

  Further, in the above-described visual inspection apparatus, a plurality of first bases are arranged on the circumference, arranged below the first table plate, and a plurality of first base plates are arranged. A second table plate arranged and fixed on the circumference, the first table plate and the second table plate are arranged concentrically, and a plurality of second table plates The circumference in which one frustoconical surface is arranged and the circumference in which a plurality of second frustoconical surfaces are arranged have the same size, and the first table plate is relatively relative to the second table plate. Rotating means for rotating is provided, and the base moving means may move the second table plate up and down relatively with respect to the first table plate. If this configuration is adopted, the inspection object arranged on the first truncated cone surface can be moved by rotating the first table plate relative to the second table plate by the rotating means. Further, by moving the second table plate up and down relative to the first table plate by the base moving means, the inspection object placed on the first truncated cone surface can be positioned, and the inspection can be performed. The main surface and the outer peripheral surface on the illuminator side of the object can be inspected. Further, if the second truncated cone surface is inserted into the inner hole formed by the inner peripheral surface of the inspection object, the inner peripheral surface of the inspection object can also be inspected.

  Further, an appearance inspection apparatus according to the present invention is an appearance inspection apparatus for performing an appearance inspection of an inspection object having a cylindrical outer peripheral surface and an inner peripheral surface, and has an inner diameter from one end to the other end. The first frustoconical surface for abutting the entire circumference of one outer edge of the object to be inspected is formed, and a hole is formed along the central axis of the first frustoconical surface. In the hole of the base and the first base, it is arranged concentrically with the first frustoconical surface, and contacts the entire circumference of one inner end edge of the object to be inspected, so that the outer diameter is from one end to the other end. And a second base on which a second truncated cone surface is formed, wherein the first and second truncated cone surfaces are oriented in the same direction on the central axis.

  According to this appearance inspection apparatus, the entire outer edge of one inspection object is brought into contact with the first truncated cone surface, and the entire inner edge of the inspection object is applied to the second truncated cone surface. If the inspection object is arranged so as to be in contact, the outer peripheral surface of the inspection object is close to the first truncated cone surface, so that it is clearly projected on the first truncated cone surface. Moreover, since the inner peripheral surface of the inspection object is close to the second truncated cone surface, it is clearly projected on the second truncated cone surface. Therefore, if observed from the one end side of the first truncated cone surface, the main surface, the outer circumferential surface, and the inner circumferential surface on the one end side of the first truncated cone surface in the inspection object can be reliably inspected. Moreover, since the inner peripheral surface projected on the second truncated cone surface and the outer peripheral surface projected on the main surface and the first truncated cone surface are continuous, it is easy to inspect.

  According to the present invention, the appearance of an inspection object can be reliably inspected.

  Hereinafter, preferred embodiments of an appearance inspection apparatus according to the present invention will be described in detail with reference to the drawings.

  FIG. 1 is a schematic configuration diagram of an appearance inspection apparatus 1. As shown in FIG. 1, the appearance inspection device 1 includes an inspection object imaging unit 2, an image processing device 3, and a monitor 4. Then, the image signal of the inspection object 7 imaged by the cameras 6A and 6B in the inspection object imaging unit 2 is output to the image processing device 3, and the image signal processed by the image processing device 3 is displayed on the monitor 4. The The cameras 6A and 6B have a focus adjustment function. By observing the inspection object 7 displayed on the monitor 4, the appearance of the inspection object 7 can be inspected. This inspection object 7 has an annular shape having a cylindrical outer peripheral surface and an inner peripheral surface, and is, for example, an electronic component such as a ring varistor.

  In the inspection object imaging unit 2, a first table plate 8 and a second table plate 9 are arranged horizontally and concentrically up and down. The 1st table board 8 is comprised so that the 1st base 11 for projecting the outer peripheral surface of the test target object 7 may be arranged on the circumference by multiple places at equal intervals. Further, a plurality of second bases 12 for projecting the inner peripheral surface of the inspection object 7 are erected and fixed on the second table plate 9 at equal intervals. The second base 12 is also arranged on the second table plate 9 on the circumference. The number of the first bases 11 formed and the number of the second bases 12 are the same, and the sizes of the arranged circumferences are also the same. Therefore, the position of the 1st base 11 and the position of the 2nd base 12 can be matched up and down.

  Moreover, the 1st table board 8 is hold | maintained by the rotating shaft 13 extended perpendicularly | vertically in the center, and the rotating shaft 13 rotates to the arrow P direction (clockwise) by a rotation means (not shown). As a result, the first table plate 8 rotates in the arrow Q (clockwise) in the same direction. Further, the second table plate 9 is held by a plurality of support portions 14, and the support portion 14 can be moved up and down by a base moving means (not shown). As a result, the second base 12 can be moved relative to the first base 11.

  In addition, annular illuminators 16A and 16B are arranged between the cameras 6A and 6B and the first table plate 8, respectively. The camera 6 captures an image of the inspection object 7 through a space that passes through the center of the annular illuminator 16. The illuminators 16A and 16B can be moved up and down by illuminator moving means (not shown) while maintaining the posture of the illuminators 16A and 16B.

  FIG. 2 is a cross-sectional view of the first base 11 showing a state in which the upper surface (main surface) 7a and the outer peripheral surface 7b of the inspection object 7 are being inspected. As shown in FIG. 2, the first base 11 has a first truncated cone surface 17 whose inner diameter decreases from one upper end to the other lower end. The first truncated cone surface 17 is processed into a mirror surface. The first truncated cone surface 17 may be formed by applying a reflective film on the conical surface. Furthermore, a cylindrical hole 18 is formed in the first base 11 along the central axis of the first truncated cone surface 17. On the first truncated cone surface 17, the annular inspection object 7 is arranged concentrically with the first truncated cone surface 17. At this time, the lower edge of the outer periphery of the inspection object 7 is in contact with the first truncated cone surface 17 over the entire periphery.

  The illuminator 16 is disposed so as to face the first base 11, and a plurality of light sources 19 that irradiate light with directivity are arranged on the circumference of the illuminator 16. An LED is employed as the light source 19. The illuminator 16 illuminates the light source 19 along the first truncated cone surface 17 with a cone angle substantially the same as the cone angle of the first truncated cone surface 17. Therefore, the illuminator 16 directly irradiates the upper surface 7a and the outer peripheral surface 7b of the inspection object 7 with light. Thus, the upper surface 7a and the outer peripheral surface 7b of the inspection object 7 are illuminated without reducing the illuminance.

  In addition, since the reported edge of the outer periphery of the inspection object 7 is in contact with the first truncated cone surface 17 over the entire circumference, the outer peripheral surface 7b of the inspection object 7 and the first truncated cone surface 17 are close to each other. In order to reach the distance, the outer peripheral surface 7 b of the inspection object 7 is clearly projected onto the first truncated cone surface 17. Therefore, coupled with the fact that the upper surface 7a and the outer peripheral surface 7b of the inspection object 7 are directly illuminated by the illuminator 16, the inspection is performed by the camera 6 installed on the opening side of the first truncated cone surface 17, that is, the illuminator side. The upper surface 7a of the object 7 and the outer peripheral surface 7b of the inspection object 7 projected onto the first frustoconical surface 17 can be clearly imaged with good contrast. Therefore, the appearance of the upper surface 7a and the outer peripheral surface 7b of the inspection object 7 can be reliably inspected. Moreover, since the upper surface 7a and the outer peripheral surface 7b of the inspection object 7 are continuously imaged, it is easy to perform an appearance inspection.

  FIG. 3 is a cross-sectional view of the first base 11 showing a state in which the upper surface 7a and the inner peripheral surface 7c of the inspection object 7 are being inspected. As shown in FIG. 3, the second base 12 is inserted into the hole 18. This is because the second table plate 9 is raised and the second base 12 is raised due to the support 14 being moved upward by the base moving means. At this time, the second base 12 is positioned concentrically with the first truncated cone surface 17 in the hole 18. The base moving means can adjust the position of the second base 12 relative to the first base 11 according to the size of the inspection object 7 such as the outer diameter and the inner diameter, and the second The vertical movement speed of the base 12 can also be adjusted.

  Further, the distal end portion of the second base 12 has a second truncated cone surface 21 having a truncated cone shape whose outer diameter increases from one upper end to the other lower end. The second truncated cone surface 21 is also processed into a mirror surface. In addition, you may form the 2nd truncated cone surface 21 by apply | coating a reflective film to this conical surface. The cone angle of the second truncated cone surface 21 is substantially the same as the cone angle of the first truncated cone surface 17. The second truncated cone surface 21 faces the same upper side as the first truncated cone surface 17 on its central axis. The inspection object 7 is in contact with the second truncated cone surface 21 over the entire circumference of the lower inner peripheral edge and is in contact with the first truncated cone surface 17 over the entire outer peripheral edge of the lower part. Arranged.

  The illuminator 16 is raised by the illuminator moving means while maintaining the posture of the illuminator 16. Thereby, the upper surface 7 a and the inner peripheral surface 7 c of the inspection object 7 are directly illuminated by the illuminator 16. Therefore, the upper surface 7a and the inner peripheral surface 7c of the inspection object 7 are clearly illuminated without reducing the illuminance.

  Moreover, since the edge of the inner peripheral side of the inspection object 7 is in contact with the second truncated cone surface 21 over the entire circumference, the inner peripheral surface 7c and the second truncated cone surface 21 of the inspection object 7 are different from each other. In order to become a short distance, the inner peripheral surface 7 c of the inspection object 7 is clearly projected on the second truncated cone surface 21. Therefore, combined with the fact that the upper surface 7a and the inner peripheral surface 7c of the inspection object 7 are directly illuminated by the illuminator 16, the image is projected onto the upper surface 7a of the inspection object 7 and the second truncated cone surface 21 by the camera 6. The inner peripheral surface 7c of the inspection object 7 thus obtained can be imaged clearly with a good contrast. Therefore, the appearance of the upper surface 7a and the inner peripheral surface 7c of the inspection object 7 can be reliably inspected. Moreover, since the upper surface 7a and the inner peripheral surface 7c of the inspection object 7 are continuously imaged, it is easy to perform an appearance inspection. Furthermore, since the outer peripheral surface 7b of the inspection object 7 is also projected onto the first truncated cone surface, the outer peripheral surface 7b can also be inspected. The inspection object 7 in FIG. 2 and the inspection object 7 in FIG. 3 are both in an annular shape, but are slightly different in size. However, it goes without saying that the inspection object 7 having the same size can be inspected in the state shown in FIGS.

  Next, positioning of the inspection object 7 will be described with reference to FIG.

  4A shows that when the inspection object 7 is arranged concentrically with respect to the first truncated cone surface 17, the inspection object 7 is placed on the first truncated cone surface 17 in an eccentric state. It shows the placed state. In this case, it is necessary to correct the posture of the inspection object 7 and arrange the inspection object 7 concentrically with respect to the first truncated cone surface 17. Therefore, as shown in FIG. 4B, the second base 12 is moved upward by the base moving means, and the second truncated cone surface 21 is inserted into the inner hole 22 of the inspection object 7. The inspection object 7 is lifted and supported by the second base 12. Then, when the inspection object 7 having an eccentric posture is supported by the second base 12, the posture thereof is corrected to be concentric with respect to the second truncated cone surface 21. In this state, as shown in FIG. 4C, the inspection object 7 is concentric with the first base 11 by moving the second base 12 downward by the base moving means. It will be arranged and positioned in the shape of a shaft. In this case, when the second base 12 by the base moving means can not be corrected only by moving up and down once, by repeatedly performing the vertical movement of the second base 12 by the base moving means, The posture of the inspection object 7 can be corrected and positioned.

  Next, positioning of the disk-shaped inspection object 23 will be described with reference to FIG.

  FIG. 5A shows that when the inspection object 23 is arranged on the first truncated cone surface 17, the inspection object 23 is placed on the first truncated cone surface 17 in a state of being eccentric with respect to the first truncated cone surface 17. The mounted state is shown. In order to correct the posture of the inspection object 23, as shown in FIG. 5B, the second base 12 is moved upward by the base moving means, and the top of the second base 12 is moved. The inspection object 23 is lifted and supported by the surface 24. Then, when the inspection object 23 having an eccentric posture is supported by the top surface 24 of the second base 12, the posture is corrected and becomes horizontal, and is concentric with the first truncated cone surface 17. It becomes a shaft. In this state, as shown in FIG. 5C, the inspection object 23 is concentric with the first truncated cone surface 17 by moving the second base 12 downward by the base moving means. It will be arranged and positioned in the shape of a shaft.

  As described above, based on the description regarding the inspection of the upper surface 7a, the outer peripheral surface 7b, and the inner peripheral surface 7c of the inspection object 7, the flow of inspection of the inspection object 7 in the appearance inspection apparatus 1 will be described with reference to FIG. .

  First, the inspection object 7 is arranged on the first truncated cone surface of the first base 11 indicated by the arrow R. Then, the first table plate 8 is rotated in the direction of arrow P by the rotating means, and the inspection object 7 is positioned below the camera 6A. At this time, when the inspection object 7 is arranged in an eccentric state with respect to the first truncated cone surface 17, the posture of the inspection object 7 is corrected and positioned by the method shown in FIG. In addition, as shown in FIG. 2, the upper surface 7a and the outer peripheral surface 7b of the inspection object 7 are imaged by the camera 6A. The image signal output by the camera 6 </ b> A is processed by the image processing device 3 and displayed on the monitor 4. Since the appearance of the upper surface 7a and the outer peripheral surface 7b of the inspection object 7 is clearly displayed with good contrast on the monitor 4, this is observed and inspected.

  Further, as shown in FIG. 3, the illuminator 16A is raised by the illuminator moving means, and the upper surface 7a and the inner peripheral surface 7c of the inspection object 7 are imaged by the camera 6A. The image signal output by the camera 6A is processed by the image processing device 3 and displayed on the monitor 4. Since the appearance of the upper surface 7a and the inner peripheral surface 7c of the inspection object 7 is clearly displayed with a good contrast on the monitor 4, this is observed and inspected.

  Subsequently, the first table plate 8 is rotated by the same angle in the direction of the arrow P by the rotating means, and as shown by the arrow S, the inspection object 7 is reversed by a reversing mechanism such as an arm robot, for example. It arrange | positions on the 1st truncated cone surface in another 1st base 11 adjacent to the rotation direction of the one table board 8. FIG. Further, the first table plate 8 is rotated by the same angle in the direction of arrow P by the rotating means, and the inspection object 7 is positioned below the camera 6B. Also at this time, when the inspection object 7 is arranged in an eccentric state with respect to the first truncated cone surface 17, the posture of the inspection object 7 is corrected and positioned by the method shown in FIG. To do.

  Then, the camera 6B captures an image of the surface opposite to the upper surface 7a of the inspection object 7 imaged by the camera 6A. The image signal output by the camera 6B is processed by the image processing device 3 and displayed on the monitor 4. Since the back surface of the inspection object 7 is clearly displayed with good contrast on the monitor 4, this is observed and inspected. When the inspection object 7 is disposed below the camera 6B, the back surface, the outer peripheral surface 7b, and the inner peripheral surface 7c of the inspection object 7 may be inspected as shown in FIGS.

  When the inspection of the inspection object 7 is completed, the first table plate 8 is further rotated in the direction of arrow P by the rotating means. Then, as indicated by arrows T and U, the inspection object 7 is sorted by distinguishing between good and bad. Here, whether the inspection object 7 is good or bad is determined by the presence or absence of cracks, cracks or cracks on the surface of the inspection object 7.

  FIG. 6 is an example of an inspection screen of the ring varistor 7 that is captured by the camera 6 with the configuration shown in FIG. 3 and displayed on the monitor 4 when the ring varistor that is the inspection object 7 is defective. As shown in FIG. 6, the top surface 24 of the second base 12 is displayed at the center of the screen, and the second truncated cone surface 21 is displayed around it. Further, there are an inner peripheral surface 7c of the ring varistor 7 projected on the second truncated cone surface 21 around the periphery, an upper surface 7a, and an outer peripheral surface of the ring varistor 7 projected on the first truncated cone surface 17. 7b is displayed. Three side surface electrode portions 26 appear on the outer peripheral surface 7 b, and an electrode gap portion 27 is formed between the adjacent side surface electrode portions 26 and 26. Further, a first truncated cone surface 17 is displayed around the periphery. In such an image, for example, when a crack as indicated by reference numeral 28 occurs, it is handled as a defective product.

  In addition, this invention is not limited to the said embodiment. For example, in the above-described embodiment, the ring varistor is exemplified as the inspection object 7, but a ring magnet, a ring core, or the like may be used.

It is a schematic structure figure showing one embodiment of a device for appearance inspection concerning the present invention. It is sectional drawing which shows a mode that the upper surface and outer peripheral surface of a test target object are test | inspected. It is sectional drawing which shows a mode that the upper surface and inner peripheral surface of a test target object are test | inspected. FIG. 4A is a view for explaining the positioning of an annular inspection object, and FIG. 4A shows a state in which the inspection object is placed on the first truncated cone surface in an eccentric state. FIG. 4B is a diagram illustrating a state in which the inspection object is lifted and supported by the second base. FIG. 4C is a diagram illustrating a state in which the posture of the inspection target is corrected and positioned with respect to the first base. FIG. 5A is a diagram illustrating the positioning of a disk-shaped inspection object, and FIG. 5A shows a state in which the inspection object is placed on the first truncated cone surface in an eccentric state. FIG. 5B is a diagram showing a state in which the inspection object is lifted and supported by the second base. FIG. 5C is a diagram illustrating a state in which the posture of the inspection target is corrected and positioned with respect to the first base. It is an example of the inspection screen of a ring varistor.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Appearance inspection apparatus, 7, 23 ... Inspection object, 8 ... 1st table board, 9 ... 2nd table board, 11 ... 1st base, 12 ... 2nd base, 16 ... Illumination 17 ... first frustoconical surface, 18 ... hole, 19 ... light source, 21 ... second frustoconical surface, 22 ... inner hole, 24 ... top surface.

Claims (3)

An appearance inspection apparatus for performing an appearance inspection of an inspection object having an outer peripheral surface that has a cylindrical surface shape,
An inner diameter is reduced from one end to the other end, and a mirror-like first truncated cone surface for contacting the entire outer periphery of one outer edge of the object to be inspected is formed, and the central axis of the first truncated cone surface A first base having a hole formed along
In the first base the hole of a first frustoconical surface and coaxially shaped, whereas mirror-like second frustoconical surface whose outer diameter increases toward the other end from the end is formed, inspected A second base that contacts the object;
Base movement means for relatively moving the first base and the second base along the central axis;
An annular illuminator arranged to face the first base and arranged to be concentric with the first and second truncated cone surfaces;
While maintaining the posture of the illuminator, the first and second bases and the illumination so as to irradiate direct light from the illuminator on the outer peripheral surface of the inspection object and the main surface facing the illuminator. Illuminator moving means for relatively moving the fixture in the vertical direction ,
The first and second frustoconical surfaces are directed in the same direction and upward on the central axis,
The visual inspection apparatus characterized in that the base moving means moves the second base up and down relative to the first base to position an inspection object on the first truncated cone surface. . The object to be inspected further has an inner peripheral surface that has a cylindrical surface shape,
The base moving means relatively moves the first base and the second base along the central axis, and moves the entire inner edge of one of the inspection objects around the second end. In contact with the frustoconical surface of
The illuminator moving means includes the first and second bases and the illuminator so as to irradiate direct light from the illuminator on an inner peripheral surface of an inspection object and a main surface facing the illuminator. The apparatus for visual inspection according to claim 1, wherein the device is relatively moved in the vertical direction . A first table plate configured by arranging a plurality of the first bases on a circumference;
A second table plate disposed below the first table plate, the plurality of second bases being arranged and fixed on the circumference,
The first table plate and the second table plate are arranged concentrically, and a circumference in which the plurality of first truncated cone surfaces are arranged and the plurality of second truncated cone surfaces are arranged. The arranged circumferences are the same size,
Furthermore, a rotating means for rotating the first table plate relative to the second table plate is provided,
The appearance inspection apparatus according to claim 1, wherein the base moving unit moves the second table plate up and down relatively with respect to the first table plate.

Images