JP4162440B2 - Substrate holder and plating apparatus - Google Patents

Substrate holder and plating apparatus Download PDF

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Publication number
JP4162440B2
JP4162440B2 JP2002213208A JP2002213208A JP4162440B2 JP 4162440 B2 JP4162440 B2 JP 4162440B2 JP 2002213208 A JP2002213208 A JP 2002213208A JP 2002213208 A JP2002213208 A JP 2002213208A JP 4162440 B2 JP4162440 B2 JP 4162440B2
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JP
Japan
Prior art keywords
substrate
holding member
substrate holder
movable holding
plating
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Expired - Lifetime
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JP2002213208A
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Japanese (ja)
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JP2004052059A (en
Inventor
賢 森上
誉綱 郭
邦明 堀江
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Ebara Corp
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Ebara Corp
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Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Priority to JP2002213208A priority Critical patent/JP4162440B2/en
Priority to KR1020047000836A priority patent/KR100980051B1/en
Priority to EP03760917A priority patent/EP1516357A2/en
Priority to CNB038008459A priority patent/CN100370578C/en
Priority to US10/482,476 priority patent/US7601248B2/en
Priority to CN2008100040249A priority patent/CN101281858B/en
Priority to PCT/JP2003/007855 priority patent/WO2004001813A2/en
Priority to TW092116755A priority patent/TWI316097B/en
Publication of JP2004052059A publication Critical patent/JP2004052059A/en
Priority to JP2008075616A priority patent/JP4722955B2/en
Priority to JP2008075615A priority patent/JP4669020B2/en
Application granted granted Critical
Publication of JP4162440B2 publication Critical patent/JP4162440B2/en
Priority to US12/585,141 priority patent/US7901551B2/en
Priority to US13/017,294 priority patent/US8337680B2/en
Priority to US13/684,902 priority patent/US8936705B2/en
Priority to US14/565,841 priority patent/US9388505B2/en
Priority to US15/180,457 priority patent/US9624596B2/en
Priority to US15/180,448 priority patent/US9506162B2/en
Priority to US15/180,477 priority patent/US9593430B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]

Description

【0001】
【発明の属する技術分野】
本発明は、例えば基板の被めっき面にめっきを施すめっき装置、特に半導体ウエハ等の表面に設けられた微細な配線用溝やホール、レジスト開口部にめっき膜を形成したり、半導体ウエハの表面にパッケージの電極等と電気的に接続するバンプ(突起状電極)を形成したりするめっき装置等に使用される基板ホルダ、及び係る基板ホルダを備えためっき装置に関する。
【0002】
【従来の技術】
例えば、TAB(Tape Automated Bonding)やフリップチップにおいては、配線が形成された半導体チップの表面の所定箇所(電極)に金、銅、はんだ、或いはニッケル、更にはこれらを多層に積層した突起状接続電極(バンプ)を形成し、このバンプを介してパッケージの電極やTAB電極と電気的に接続することが広く行われている。このバンプの形成方法としては、電解めっき法、蒸着法、印刷法、ボールバンプ法といった種々の手法があるが、半導体チップのI/O数の増加、細ピッチ化に伴い、微細化が可能で性能が比較的安定している電解めっき法が多く用いられるようになってきている。
【0003】
ここで、電解めっき法は、半導体ウエハ等の基板の被めっき面を下向き(フェースダウン)にして水平に置き、めっき液を下から噴き上げてめっきを施す噴流式またはカップ式と、めっき槽の中に基板を垂直に立て、めっき液をめっき槽の下から注入しオーバーフローさせつつめっきを施すディップ式に大別される。ディップ方式を採用した電解めっき法は、めっきの品質に悪影響を与える泡の抜けが良く、フットプリントが小さいという利点を有しており、このため、めっき穴の寸法が比較的大きく、めっきにかなりの時間を要するバンプめっきに適していると考えられる。
【0004】
従来のディップ方式を採用した電解めっき装置にあっては、半導体ウエハ等の基板をその端面と裏面をシールし表面(被めっき面)を露出させて着脱自在に保持する基板ホルダを備え、この基板ホルダを基板ごとめっき液中に浸漬させて基板の表面にめっきを施すようにしており、気泡が抜けやすくできる利点を有している。
【0005】
基板ホルダは、めっき液中に浸漬させて使用するため、この基板ホルダで基板を保持した時に、基板の裏面(反被めっき面)側へめっき液が周り込まないよう、基板の外周部を確実にシールする必要がある。このため、例えば、一対のサポート(保持部材)で基板を着脱自在に保持するようにした基板ホルダにあっては、一方のサポートにシール部材を取付け、このシール部材を他方のサポートに載置保持した基板の周縁部に圧接させることで、基板の外周部をシールするようにしている。
【0006】
【発明が解決しようとする課題】
従来のこの種の基板ホルダにあっては、シール部材の形状や固定方法等を最適化したり、定期的(毎葉を含む)にシール部材を洗浄したり、定期的にシール部材を交換したり、更には、基板の前処理(シード層やフォトレジスト膜の生成)の精度を向上させたり、基板の基板ホルダへのセッティング誤差の最小化を図るとともに、定期的な再調整を行ったりして、めっき液等の漏れをなくすようにしている。
【0007】
しかし、シール部材の劣化等により、シールの完全性を図ることはかなり困難である。特に、めっきを施して、微細な凹部の内部にめっき膜を埋め込むようにする時には、微細な凹部内にめっき液が容易かつ確実に浸入するようにするため、一般に浸透性の良好なめっき液が使用されており、このため、完全なシールを施すことは更に困難となる。また、めっき液等の漏れを検出することも一般に困難であった。そして、一旦めっき液の漏れが発生すると、基板ホルダの内部に漏れためっき液が基板の裏面に付着し、基板搬送機器に乗り移って装置全体をめっき液で汚してしまうばかりでなく、漏れためっき液が接点を腐食させて通電を妨げてしまう。
【0008】
更に、前述のように、一方のサポートにシール部材を取付け、このシール部材を他方のサポートに載置保持した基板の周縁部に圧接させることで、基板の外周部をシールするようにしているため、めっき終了後に、シール部材を取付けたサポートを開いて基板を基板ホルダから取出す際に、基板がシール部材にくっついたままサポートが開き、基板が脱落してしまうことがあり、この弊害防止のための何らかの対策を施す必要がある。
【0009】
本発明は上記事情に鑑みて為されたもので、シール部材によるシールのより完全性を図るとともに、基板を容易かつ確実に取出すことができるようにした基板ホルダ及び該基板ホルダを備えためっき装置を提供することを目的とする。
【0020】
【課題を解決するための手段】
請求項1に記載の発明は、固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、前記可動保持部材を前記固定保持部材に向けて押圧して基板を保持するようにした基板ホルダにおいて、前記可動保持部材に、前記可動保持部材と前記固定保持部材での基板の保持を解く際に、基板を前記固定保持部材に向けて付勢し、前記可動保持部材と前記固定保持部材で基板を保持する時に基板の外周部に弾性的に接触するように構成された板状の板ばね部材を取付けたことを特徴とする基板ホルダである。
【0021】
これにより、めっき終了後、可動保持部材を移動させ基板の保持を解いて、基板を基板ホルダから取出す際に、板状の板ばね部材で基板の動きを規制して、可動保持部材に取付けたシール部材を基板から引き離すことで、基板がシール部材にひっついたまま該シール部材と一緒に移動してしまうことを防止することができる。
しかも、基板ホルダで基板を保持する過程で、ばね性を有する板ばね部材の弾性力で基板を内方に付勢することで、この板ばね部材を介して、基板の基板ホルダに対する位置決め(センタリング)を行うことができる。
【0022】
請求項に記載の発明は、前記板ばね部材は、板ばね形状の2枚以上の板体を重ね合わせた重ね板ばねからなることを特徴とする請求項記載の基板ホルダである。これにより、かなり狭い設置スペースであっても、ばねの塑性変形を起こすことなく、長いストロークを確保することができる板ばね部材(重ね板ばね)の設置が可能となる。
【0024】
請求項に記載の発明は、前記可動保持部材が、前記シール部材に対する基板の位置決め機能を有していることを特徴とする請求項記載の基板ホルダである。
【0025】
請求項に記載の発明は、前記板ばね部材は、基板に接触して通電する電気接点を兼用していることを特徴とする請求項記載の基板ホルダである。これにより、板ばね部材を別途設ける必要をなくして、構造の簡素化を図ることができる。
【0026】
請求項に記載の発明は、前記可動保持部材が、前記シール部材と前記電気接点に対する基板の位置決め機能を有することを特徴とする請求項記載の基板ホルダである。
【0027】
このように、可動保持部材に基板のシール部材、(基板への給電のための電気接点)及び基板のセンタリング機構を設けることで、予め基板の可動保持部材と基板のシール部材(及び基板への給電のための電気接点)の中心を合わせて製作しておき、その基板の可動保持部材が基板のセンタリング機能を有することで、可動保持部材が基板の載置された固定保持部材と係合されるときに上記基板のセンタリング機能で基板を可動保持部材中心とほぼ合致させた位置に移動させて係合することが可能となる。これにより、基板と基板のシール部材(及び基板への給電のための電気接点)との中心を、可動保持部材が固定保持部材に係合される時に自動的に合致させることができる。
【0028】
基板の有効使用エリアが時代と共に基板の外周側へ移行しいわゆる基板のエッジ・エクスクルージョン(Edge exclusion)領域が非常に狭い状況においても、その狭い領域内で確実に基板のシールと基板への給電を実施することが可能となる。
【0029】
請求項に記載の発明は、前記可動保持部材に基板に接触して通電する電気接点を取付けたことを特徴とする請求項記載の基板ホルダである。
【0034】
請求項に記載の発明は、固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、前記可動保持部材を前記固定保持部材に向けて押圧して基板を保持するようにした基板ホルダであって、前記可動保持部材に、前記可動保持部材と前記固定保持部材での基板の保持を解く際に、基板を前記固定保持部材に向けて付勢し、前記可動保持部材と前記固定保持部材で基板を保持する時に基板の外周部に弾性的に接触するように構成された板状の板ばね部材を取付けた基板ホルダを用いることを特徴とするめっき装置である。
【0036】
【発明の実施の形態】
以下、本発明の実施の形態を図面を参照して説明する。
図1は、本発明の実施の形態の基板ホルダを備えためっき装置の全体配置図を示す。図1に示すように、このめっき装置には、半導体ウエハ等の基板Wを収納したカセット10を搭載する2台のカセットテーブル12と、基板Wのオリフラやノッチなどの位置を所定の方向に合わせるアライナ14と、めっき処理後の基板Wを高速回転させて乾燥させるスピンドライヤ16が備えられている。更に、この近くには、基板を着脱自在に保持する基板ホルダ18を載置して基板Wの該基板ホルダ18との着脱を行う基板着脱部20が設けられ、これらのユニットの中央には、これらの間で基板Wを搬送する搬送用ロボットからなる基板搬送装置22が配置されている。
【0037】
そして、基板着脱部20側から順に、基板ホルダ18の保管及び一時仮置きを行うストッカ24、基板Wを純水に浸漬させるプリウェット槽26、基板Wの表面に形成したシード層500(図17参照)表面の酸化膜をエッチング除去するプリソーク槽28、基板Wの表面を純水で水洗する第1の水洗槽30a、洗浄後の基板Wの水切りを行うブロー槽32、第2の水洗槽30b及びめっき槽34が順に配置されている。このめっき槽34は、オーバーフロー槽36の内部に複数の銅めっきユニット38を収納して構成され、各銅めっきユニット38は、内部に1個の基板Wを収納して、銅めっき等のめっきを施すようになっている。なお、この例では、銅めっきについて説明するが、ニッケルやはんだ、銀、更には金めっきにおいても同様であることは勿論である。
【0038】
更に、これらの各機器の側方に位置して、これらの各機器の間で基板ホルダ18を基板Wとともに搬送する、例えばリニアモータ方式を採用した基板ホルダ搬送装置40が備えられている。この基板ホルダ搬送装置40は、基板着脱部20とストッカ24との間で基板Wを搬送する第1のトランスポータ42と、ストッカ24、プリウェット槽26、プリソーク槽28、水洗槽30a,30b、ブロー槽32及びめっき槽34との間で基板Wを搬送する第2のトランスポータ44を有している。なお、第2のトランスポータ44を備えることなく、第1のトランスポータ42のみを備えるようにしてもよい。
【0039】
また、この基板ホルダ搬送装置40のオーバーフロー槽36を挟んだ反対側には、各銅めっきユニット38の内部に位置してめっき液を攪拌する掻き混ぜ棒としてのパドル(図示せず)を駆動するパドル駆動装置46が配置されている。
【0040】
基板着脱部20は、レール50に沿って横方向にスライド自在な平板状の載置プレート52を備えており、この載置プレート52に2個の基板ホルダ18を水平状態で並列に載置して、この一方の基板ホルダ18と基板搬送装置22との間で基板Wの受渡しを行った後、載置プレート52を横方向にスライドさせて、他方の基板ホルダ18と基板搬送装置22との間で基板Wの受渡しを行うようになっている。
【0041】
前記基板ホルダ18は、図2乃至図7に示すように、例えば塩化ビニル製で矩形平板状の固定保持部材54と、この固定保持部材54にヒンジ56を介して開閉自在に取付けた可動保持部材58とを有している。なお、この例では、可動保持部材58を、ヒンジ56を介して開閉自在に構成した例を示しているが、例えば可動保持部材58を固定保持部材54に対峙した位置に配置し、この可動保持部材58を固定保持部材54に向けて前進させて開閉するようにしてもよい。
【0042】
この可動保持部材58は、基部58aと、この例ではリング状の支持部58bとを有し、例えば塩化ビニル製で、下記の押えリング60との滑りを良くしており、その支持部58bの固定保持部材54と反対側の表面には、基板Wの周縁部に圧接してここをシールするシール部材(以下、内側シール部材という)62がボルト64(図6参照)を介して内方に突出して取付けられている。一方、固定保持部材54側の表面には、蟻溝状のシール溝66が設けられ、このシール溝66の内部に、固定保持部材54と可動保持部材58とをシールするシール部材(同じく外側シール部材)68が装着されている。
【0043】
内側シール部材62は、基板ホルダ18で基板Wを保持した時、基板Wの表面(被めっき面)の周縁部に圧接して、ここをシールするためのものであり、内周端に、尖塔状に可動保持部材58側に突出して基板Wの周縁部と線状に接触するシール部62aが設けられている。そして、この内側シール部材62は、これを保持する、例えばチタン製の保持部材70に一体的に取付けられている。つまり、内側シール部材62は、保持部材70のほぼ全表面を被覆した状態で該保持部材70に貼着されて、保持部材70から剥離したり脱落したりしないようになっている。
【0044】
このように、内側シール部材62を保持する保持部材70に内側シール部材62を一体的に取付けることで、めっき終了後、可動保持部材58を移動させ基板Wの保持を解いて、基板Wを基板ホルダ18から取出す際に、内側シール部材62のシール部62aが基板Wに付着して内側シール部材62が保持部材70から捲れてしまうことを防止して、内側シール部材62と基板Wとの剥離性を向上させることができる。しかも、シール部62aを介して、内側シール部材62が基板Wと線状に接触するようにすることで、低締付け圧で確実にシールするとともに、基板Wのパターン形成領域として有効に利用できる面積を広めることができる。
【0045】
一方、外側シール部材68は、基板ホルダ18で基板Wを保持した時、内側シール部材62の外周において、固定保持部材54の可動保持部材58側表面に圧接して、ここをシールするためのものであり、この例では、外側シール部材68として、幅方向にほぼ中央の上下面にシール部68a,68bを有し、シール溝66の底部方向に向けて末広がりで、ここを幅方向に押圧すると容易に潰れて幅が狭まり、この押圧力を解くと弾性力で外方に復帰する、横断面W字状のものが使用されている。これにより、外側シール部材68を蟻溝形状のシール溝66へ装着する際に、外側シール部材68の装着側端部を幅方向に潰すことで、外側シール部材68のシール溝66内への装着を容易に行うとともに、装着後の外側シール部材68をその弾性力で外方に拡がらせることで、外側シール部材68のシール溝66からの脱出を確実に防止することができる。
【0046】
また、シール溝66の側壁面に外側シール部材68の側面が一定の弾性力を持って接触するようにすることで、図7に示すように、蟻溝状のシール溝66を形成する時に生じる工具取出し用の切欠66aによって、シール溝66内にめっき液が浸入して変質あるいは固化し、これによって、外側シール部材68のシール性が悪化してしまうが、本構造により上記薬液の浸入を防止することができ、シールの確実性の向上及びシール材の耐久性の向上も可能となる。
【0047】
可動保持部材58の外周部には、段部が設けられ、この段部に、押えリング60が押え板72を介して脱出不能かつ回転自在に装着されている。この押えリング60は、酸化性環境に対して耐食性に優れ、十分な剛性を有する、例えばチタンから構成されている。
【0048】
押えリング60の外側方に位置して、固定保持部材54には、内方に突出する突出部を有する逆L字状のクランパ74が円周方向に沿って等間隔で立設されている。そして、押えリング60の表面及び該表面を覆うように位置するクランパ74の内方突出部の下面は、回転方向に沿って互いに逆方向に傾斜するテーパ面となっている。更に、押えリング60の円周方向に沿った複数箇所(例えば4カ所)には、下記のように、内部に回転ピン112を挿入し、この回転ピン112を回転させることで、押えリング60を回転させる長孔60aが設けられている。
【0049】
これにより、可動保持部材58を開いた状態で、固定保持部材54の中央部に基板Wを挿入し、ヒンジ56を介して可動保持部材58を閉じ、押えリング60を時計回りに回転させて、押えリング60の外周部をクランパ74の内方突出部の内部に滑り込ませることで、押えリング60とクランパ74にそれそれぞれ設けたテーパ面を介して、固定保持部材54と可動保持部材58とを互いに締付けてロックし、押えリング60を反時計回りに回転させて逆L字状のクランパ74の突出部から引き抜くことで、このロックを解くようになっている。そして、このようにして可動保持部材58をロックした時、内側シール部材62のシール部62aが基板Wの表面に、外側シール部材68にあっては、そのシール部68aが固定保持部材54の表面に、シール部68bがシール溝66の底面にそれぞれ圧接し、シール部材62,68を均一に押圧して、ここを確実にシールするようになっている。
【0050】
固定保持部材54の中央部には、基板Wの大きさに合わせてリング状に突出し、表面が基板Wの周縁部に当接して該基板Wを支持する支持面80となる突条部82が設けられており、この突条部82の円周方向に沿った所定位置に凹部84が設けられている。
【0051】
そして、図2及び図5に示すように、この各凹部84内に、下記のハンド120に設けた外部接点から延びる複数の配線にそれぞれ接続した複数(図示では12個)の導電体(電気接点)86が配置されて、固定保持部材54の支持面80上に基板Wを載置した際、この導電体86の端部が基板Wの側方で固定保持部材54の表面にばね性を有した状態で露出するようになっている。
【0052】
一方、可動保持部材58の支持部58bの導電体86に対向した位置に、電気接点88の脚部88aが固着されている。この電気接点88は、板ばね形状に形成され、更に基板Wの位置決め(センタリング)機能と、めっき後の基板Wを基板ホルダ18から取出す際に、基板Wが内側シール部材62のシール部62aにひっついて、基板Wと共に持ち上がることを防止する機能を有している。つまり、この電気接点88は、内側シール部材62の外方に位置して、内方に板ばね状に突出する接点部88bを有しており、この接点部88bにおいて、その弾性力によるばね性を有して容易に屈曲し、しかも固定保持部材54と可動保持部材58で基板Wを保持した時に、電気接点88の接点部88bが、固定保持部材54の支持面80上に支持された基板Wの外周面に弾性的に接触するように構成されている。
【0053】
そして、図5(a)に示すように、固定保持部材54の支持面80上に基板Wを載置し、更に図5(b)〜図5(c)に示すように、可動保持部材58を固定保持部材54の方向に移動させロックして基板Wを保持した時、導電体86の露出部が電気接点88の脚部88aの下面に導電体86の露出部の弾性力を介して弾性的に接触して電気的に接続され、基板Wが電気接点88の接点部88bに該接点部88bの弾性力を介して弾性的に接触する。これによって、基板Wをシール部材62,68でシールして基板ホルダ18で保持した状態で、電気接点88を介して基板Wに給電が行えるようになっている。
【0054】
このように、電気接点88を板ばね形状に形成し、この電気接点88自体の弾性力を介して電気接点88の接点部88bの先端が基板Wに接触するようにすることで、接点不良を減少させ、しかも、電気接点88が基板Wのより外周部で該基板Wと接触するようにして、基板Wのパターン形成領域として有効に利用できる面積を広めることができる。更に、基板ホルダ18で基板Wを保持する際に、基板Wを板ばね形状の電気接点88の接点部88bの弾性力で内方に付勢することで、この電気接点88を介して、基板Wの基板ホルダ18に対する位置決め(センタリング)を行うことができる。しかも、可動保持部材58にシール部材62と電気接点88を設け、この電気接点88を介して基板Wの基板ホルダ18に対する位置決めを行うことで、基板Wを基板ホルダ18で保持した時に、基板W、シール部材62及び電気接点88の位置関係が常に一定となるようにすることができる。
【0055】
そして、一連の処理を終了して、基板ホルダ18で保持した基板Wを取出す時には、可動保持部材58を固定保持部材54から離れる方向に移動させるのであるが、この時、上記とは逆に、図5(c)〜図5(b)に示すように、電気接点88の接点部88bが基板Wの外周部に圧接して、基板Wを固定保持部材54側に付勢しているため、この電気接点88によって、基板Wの動きが規制される。このため、例えシール部材62に基板Wがひっついていたとしても、シール部材62と可動保持部材58のみが上昇して、基板Wがシール部材62から強制的に切り離される。そして、可動保持部材58が更に上昇すると、電気接点88の接点部88bは基板Wから離れて、図5(a)に示す元の状態に復帰する。
【0056】
これにより、めっき終了後、可動保持部材58を移動させ基板Wの保持を解いて、基板Wを基板ホルダ18から取出す際に、基板Wがシール部材62にひっついたまま該シール部材62と一緒に移動してしまうことを防止することができる。
なお、導電体86の表面の、少なくとも電気接点88との当接面に、例えば金または白金めっきを施して被覆することが好ましい。
【0057】
また、図6に示すように、固定保持部材54の突条部82の一部には、尖塔状のテーパ面を有するテーパ部82aが設けられ、また、可動保持部材58の支持部58bの内周面の該テーパ部82aと対向する位置には、該テーパ部82aのテーパ面と逆テーパ面で、固定保持部材54と可動保持部材58とで基板Wを保持した時に互いに係合して両者54,58の中心に対する位置決めを行うテーパ部90が設けられている。つまり、図6(a)に示すように、固定保持部材54の支持面80上に基板Wを載置し、更に図6(b)〜図6(c)に示すように、可動保持部材58を固定保持部材54の方向に移動させロックして基板Wを保持する際、テーパ部82a,90が互いに案内となって、可動保持部材58の固定保持部材54に対する(またはその逆の)位置決めが行われるようになっている。
【0058】
このように、固定保持部材54の突条部82と可動保持部材58の支持部58bに互いに係合するテーパ部82a,90を設けることにより、固定保持部材54と可動保持部材58が離れた位置では両者54,58の位置合わせが正確でなくとも、基板Wを固定保持部材54と可動保持部材58で保持する過程で、互いに係合するテーパ部82a,90を介して、両者54,58の中心に対する位置決めを自動的に行うことができる。
【0059】
これにより、前述のようにして、基板Wを固定保持部材54と可動保持部材58で保持する過程で、両者54,58の中心に対する位置決めを行い、更に板ばね形状の電気接点88を介して、基板Wの基板ホルダ18、ひいては内側シール部材62に対する位置決め(センタリング)を同時に行うことができる。
【0060】
しかし、上記互いに係合するテーパ部82a,90によるセンタリングのみでは確実なセンタリングができない。それはお互いが容易に係合するためには少なくとも微小なクリアランスが両者の間に必要だからである。従って、上記互いに係合するテーパ部82a,90のみでは基板W中心と可動保持部材58の中心がそのクリアランス分ずれてしまうことになる。そこで可動保持部材58に、下記のように、複数個の板ばね部材140を基板W外周部に弾性的に接触するように設置することで、基板Wを可動保持部材58の外周からそれぞれ同一の力で中心に向けて移動させる力を働かせ、可動保持部材58が固定保持部材54と係合するとき、より確実に基板Wのセンタを可動保持部材58のセンタと合致するよう基板をずらすことができる。上記複数個の板ばねが、基板の外周に亘り、一つの一体構造を取っても構わないことは勿論である。
尚、可動保持部材と固定保持部材はヒンジで連結されている必要はなく、完全に分離された構造であっても構わないのは勿論である。
【0061】
更に、図2に示すように、固定保持部材54の突条部82には、ヒンジ56の反対側に位置して、やや幅広な凹部92が、この例では2カ所に設けられ、この各凹部92内に吸着パッド94が収容配置されている。この吸着パッド94は、図7に詳細に示すように、ゴム等の可撓性材料からなり、内部を減圧部とした円錐状のカップ部96を有し、ボルト100を介して固定保持部材54に取付けられている。そして、基板ホルダ18で基板Wを保持した時、この基板Wがカップ部96の開口部を押圧し、このカップ部96を外方に押し拡げて、内部気体を外部へ押出すことによりこの内部の減圧部の圧力を減じることで、基板Wの裏面側を吸着するようになっている。
【0062】
これにより、めっき終了後、可動保持部材58を移動させ基板Wの保持を解いて、基板Wを基板ホルダ18から取出す際に、吸着パッド94で基板Wの裏面側を吸着することで、基板Wが内側シール部材62にひっついたまま該シール部材62と一緒に移動することを防止することができる。しかも、自動搬送装置を用いて自動運転する場合に、基板Wが持ち上がったりすることがないので、常に安定して基板Wを基板ホルダ18から取出すことができる。この吸着パッド94の吸着力は、前述のように、基板Wを基板ホルダ18から取出す際に、基板Wを吸着面から平行に移動し、吸着面と基板面を解離させることで真空を破壊させることができ、基板Wをシール部材62から容易に分離でき、かつロボットとの間で基板の受渡しが行える大きさに設定される。即ち、吸着パッド94は吸着面に垂直方向には強い密着性を有し、基板Wを保持することに有効であるが、平行方向には容易にずれ、分離を容易にすることが可能である。
【0063】
吸着パッド94の配置位置及び個数は、任意に設定できるが、吸着パッド94を、基板ホルダ18で保持した基板Wの中心を挟んだヒンジ56の反対側の基板Wの周縁部に対応する位置に設けることで、ヒンジ56を介して可動保持部材58を開く際に、内側シール部材62に付着して最初に持ち上がろうとする箇所の持ち上がりを吸着パッド94で防止して、基板Wを内側シール部材62から効果的に分離することができる。
【0064】
なお、この吸着パッドとしては、いわゆる真空吸着タイプのものを使用しても良い。つまり、図示しないが、固定保持部材54の内部に真空ラインを張り巡らし、基板ホルダ18で基板を保持した時に、吸着パッドの内部と真空ラインとが互いに連通するようにして、この真空ラインを介して吸着パッドの内部を真空引きすることで、基板を吸着するようにしてもよい。これにより、真空ラインを真空引きすることで基板の容易を容易且つ確実に保持し、この真空引きを解除することで、基板の保持を解くことができる。
【0065】
可動保持部材58の開閉は、図示しないシリンダと可動保持部材58の自重によって行われる。つまり、固定保持部材54には通孔54aが設けられ、載置プレート52の上に基板ホルダ18を載置した時に該通孔54aに対向する位置にシリンダが設けられている。これにより、シリンダロッドを伸展させ、通孔54aを通じて押圧棒で可動保持部材58の基部58aを上方に押上げることで可動保持部材58を開き、シリンダロッドを収縮させることで、可動保持部材58をその自重で閉じるようになっている。
【0066】
この例にあっては、押えリング60を回転させることにより、可動保持部材58のロック・アンロックを行うようになっている。図8及び図9に、このロック・アンロック機構110を示す。このロック・アンロック機構110は、天井側に設けられており、載置プレート52の上に載置した基板ホルダ18内に基板Wを入れ、ヒンジ56を介して可動保持部材58を閉じた時、この中央側に位置する基板ホルダ18の押えリング60の各長孔60aに対応する位置に位置させた回転ピン112を有しており、この回転ピン112は、正逆回転可能な回転板114の下面に垂設されている。更に、上下動自在で、載置プレート52の上に載置した基板ホルダ18の可動保持部材58の支持部58bを固定保持部材54に向けて押圧する押圧ロッド116が備えられ、回転板114の該押圧ロッド116に対向する位置には、円周方向に延びる長孔114aが設けられている。
【0067】
これによって、前述のようにして、基板Wを入れて可動保持部材58を閉じた基板ホルダ18を載置プレート52とともに上昇させ、押えリング60の長孔60a内に回転ピン112を位置させた後、押圧ロッド116を下降させて、可動保持部材58を下方に押圧し、これによって、先ずシール部材62,68を潰して可動保持部材58を回転しないようにしておき、この状態で、回転ピン112を回転させて押えリング60を回転させ、押えリング60をクランパ74内に入り込ませて、可動保持部材58をロックするようになっている。
【0068】
このように、先ず押圧ロッド116を下降させて可動保持部材58が回転しないようにした状態で、回転ピン112を介して押えリング60を回転させることで、この押えリング60の回転を低摩擦で行うことができる。これによって、押えリング60とクランパ74、更には可動保持部材58の摩耗を減らし、しかも、可動保持部材58の押えリング60の回転に伴う共廻りによる位置ずれを防止して、基板Wのセンタリングに影響を与えたり、シール部材62,68が捻れてこれらのシール性が悪化したりすることを防止することができる。
【0069】
なお、回転体としてリング状のものを、また押圧ロッド116の代わりに、図9に斜線で示す円筒状の押圧部材116aをそれぞれ使用し、これによって、この押圧部材116aによって、可動保持部材58の支持部58bをその全周に亘ってより均一に押圧するようにしてもよい。
【0070】
このロック・アンロック機構110は、1個備えられ、載置プレート52の上に載置した2個の基板ホルダ18の一方をロック(またはアンロック)した後、載置プレート52を横方向にスライドさせて、他方の基板ホルダ18をロック(またはアンロック)するようになっている。また、基板ホルダ18には、基板Wを装着した時の該基板Wと接点との接触状態を確認するセンサが備えられ、このセンサからの信号がコントローラ(図示せず)に入力されるようになっている。
【0071】
基板ホルダ18の固定保持部材54の端部には、基板ホルダ18を搬送したり、吊下げ支持したりする際の支持部となる一対の略T字状のハンド120が連接されている。そして、ストッカ24内においては、この周壁上面にハンド120の突出端部を引っ掛けることで、これを垂直に吊下げ保持し、この吊下げ保持した基板ホルダ18のハンド120を基板ホルダ搬送装置40のトランスポータ42で把持して基板ホルダ18を搬送するようになっている。なお、プリウェット槽26、プリソーク槽28、水洗槽30a,30b、ブロー槽32及びめっき槽34内においても、基板ホルダ18は、ハンド120を介してそれらの周壁に吊下げ保持される。
【0072】
このように構成しためっき装置による一連のバンプめっき処理を説明する。先ず、図17(a)に示すように、表面に給電層としてのシード層500を成膜し、このシード層500の表面に、例えば高さHが20〜120μmのレジスト502を全面に塗布した後、このレジスト502の所定の位置に、例えば直径Dが20〜200μm程度の開口部502aを設けた基板をその表面(被めっき面)を上にした状態でカセット10に収容し、このカセット10をカセットテーブル12に搭載する。
【0073】
このカセットテーブル12に搭載したカセット10から、基板搬送装置22で基板を1枚取出し、アライナ14に載せてオリフラやノッチなどの位置を所定の方向に合わせる。このアライナ14で方向を合わせた基板を基板搬送装置22で基板着脱部20まで搬送する。
【0074】
基板着脱部20においては、ストッカ24内に収容されていた基板ホルダ18を基板ホルダ搬送装置40のトランスポータ42で2基同時に把持して、基板着脱部20まで搬送する。そして、基板ホルダ18を水平な状態として下降させ、これによって、2基の基板ホルダ18を基板着脱部20の載置プレート52の上に同時に載置し、シリンダを作動させて基板ホルダ18の可動保持部材58を開いた状態にしておく。
【0075】
この状態で、中央側に位置する基板ホルダ18に基板搬送装置22で搬送した基板を挿入し、シリンダを逆作動させて可動保持部材58を閉じ、しかる後、ロック・アンロック機構で可動保持部材58をロックする。そして、一方の基板ホルダ18への基板の装着が完了した後、載置プレート52を横方向にスライドさせて、同様にして、他方の基板ホルダ18に基板を装着し、しかる後、載置プレート52を元の位置に戻す。
【0076】
これにより、基板Wは、そのめっき処理を行う面を基板ホルダ18の開口部から露出させた状態で、周囲をシール部材62,68でめっき液が浸入しないようにシールされ、シールによってめっき液に触れない部分において複数の接点と電気的に導通するように固定される。ここで、接点からは基板ホルダ18のハンド120まで配線が繋がっており、ハンド120の部分に電源を接続することにより基板のシード層500に給電することができる。
【0077】
次に、基板Wを装着した基板ホルダ18を基板ホルダ搬送装置40のトランスポータ42で2基同時に把持し、ストッカ24まで搬送する。そして、基板ホルダ18を垂直な状態となして下降させ、これによって、2基の基板ホルダ18をストッカ24に吊下げ保持(仮置き)する。
【0078】
これらの基板搬送装置22、基板着脱部20及び基板ホルダ搬送装置40のトランスポータ42においては、前記作業を順次繰り返して、ストッカ24内に収容された基板ホルダ18に順次基板を装着し、ストッカ24の所定の位置に順次吊り下げ保持(仮置き)する。
なお、基板ホルダ18に備えられていた基板と接点との接触状態を確認するセンサで、この接触状態が不良であると判断した時には、その信号をコントローラ(図示せず)に入力する。
【0079】
一方、基板ホルダ搬送装置40の他方のトランスポータ44にあっては、基板を装着しストッカ24に仮置きした基板ホルダ18を2基同時に把持し、プリウェット槽26まで搬送して下降させ、これによって、2基の基板ホルダ18をプリウェット槽26内に入れる。
【0080】
なお、この時、基板ホルダ18に備えられていた基板と接点との接触状態を確認するセンサで、この接触状態が不良であると判断した基板を収納した基板ホルダ18は、ストッカ24に仮置きしたままにしておく。これにより、基板ホルダ18に基板を装着した時に該基板と接点との間に接触不良が生じても、装置を停止させることなく、めっき作業を継続することができる。この接触不良を生じた基板にはめっき処理が施されないが、この場合には、カセットを戻した後にめっき未処理の基板をカセットから排除することで、これに対処することができる。
【0081】
次に、この基板を装着した基板ホルダ18を、前記と同様にして、プリソーク槽28に搬送し、プリソーク槽28で酸化膜をエッチングし、清浄な金属面を露出させる。更に、この基板を装着した基板ホルダ18を、前記と同様にして、水洗槽30aに搬送し、この水洗槽30aに入れた純水で基板の表面を水洗する。
【0082】
水洗が終了した基板を装着した基板ホルダ18を、前記と同様にして、めっき液を満たしためっき槽34に搬送し、めっきユニット38に吊り下げ保持する。基板ホルダ搬送装置40のトランスポータ44は、上記作業を順次繰り返し行って、基板を装着した基板ホルダ18を順次めっき槽34のめっきユニット38に搬送して所定の位置に吊下げ保持する。
【0083】
全ての基板ホルダ18の吊下げ保持が完了した後、オーバーフロー槽36のめっき液を循環させ、かつ、オーバーフローさせながら、めっき槽34内のアノード(図示せず)と基板Wとの間にめっき電圧を印加し、同時にパドル駆動装置46によりパドルを基板の表面と平行に往復移動させることで、基板の表面にめっきを施す。この時、基板ホルダ18は、めっきユニット38の上部でハンド120により吊り下げられて固定され、めっき電源から導電体86及び電気接点88を通して、シード層500(図17参照)に給電される。
【0084】
めっきが終了した後、めっき電源の印加、めっき液の供給及びパドル往復運動を停止し、めっき後の基板Wを装着した基板ホルダ18を基板ホルダ搬送装置40のトランスポータ44で2基同時に把持し、前述と同様にして、水洗槽30bまで搬送し、この水洗槽30bに入れた純水に浸漬させて基板の表面を純水洗浄する。次に、この基板Wを装着した基板ホルダ18を、前記と同様にして、ブロー槽32に搬送し、ここで、エアーの吹き付けによって基板ホルダ18に付着した水滴を除去する。しかる後、この基板Wを装着した基板ホルダ18を、前記と同様にして、ストッカ24の所定の位置に戻して吊下げ保持する。
【0085】
基板ホルダ搬送装置40のトランスポータ44は、上記作業を順次繰り返し、めっきが終了した基板を装着した基板ホルダ18を順次ストッカ24の所定の位置に戻して吊下げ保持する。
【0086】
一方、基板ホルダ搬送装置40の他方のトランスポータ42にあっては、めっき処理後の基板Wを装着しストッカ24に戻した基板ホルダ18を2基同時に把持し、前記と同様にして、基板着脱部20の載置プレート52の上に載置する。この時、基板ホルダ18に備えられていた基板と接点との接触状態を確認するセンサで、この接触状態が不良であると判断した基板を装着しストッカ24に仮置きしたままの基板ホルダ18も同時に搬送して載置プレート52の上に載置する。
【0087】
そして、中央側に位置する基板ホルダ18の可動保持部材58のロックを、ロック・アンロック機構を介して解き、シリンダを作動させて可動保持部材58を開く。この時、前述のように、基板Wが可動保持部材58にくっついたまま可動保持部材58が開くことが防止される。この状態で、基板ホルダ18内のめっき処理後の基板Wを基板搬送装置22で取出して、スピンドライヤ16に運び、このスピンドライヤ16の高速回転によってスピンドライ(水切り)した基板を基板搬送装置22でカセット10に戻す。
【0088】
そして、一方の基板ホルダ18に装着した基板をカセット10に戻した後、或いはこれと並行して、載置プレート52を横方向にスライドさせて、同様にして、他方の基板ホルダ18に装着した基板をスピンドライしてカセット10に戻す。
【0089】
載置プレート52を元の状態に戻した後、基板を取出した基板ホルダ18を基板ホルダ搬送装置40のトランスポータ42で2基同時に把持し、前記と同様にして、これをストッカ24の所定の場所に戻す。しかる後、めっき処理後の基板を装着しストッカ24に戻した基板ホルダ18を基板ホルダ搬送装置40で2基同時に把持し、前記と同様にして、基板着脱部20の載置プレート52の上に載置して、前記と同様な作業を繰り返す。
【0090】
そして、めっき処理後の基板を装着しストッカ24に戻した基板ホルダ18から全ての基板を取出し、スピンドライしてカセット10に戻して作業を完了する。これにより、図17(b)に示すように、レジスト502に設けた開口部502a内にめっき膜504を成長させた基板Wが得られる。
次に、前述のようにしてスピンドライした基板Wを、例えば温度が50〜60℃のアセトン等の溶剤に浸漬させて、図17(c)に示すように、基板W上のレジスト502を剥離除去する。そして、図17(d)に示すように、めっき後の外部に露出する不要となったシード層500を除去して、めっき膜504からなるバンプを形成する。
【0091】
なお、この例では、基板着脱部20と銅めっきユニット38との間に基板ホルダ18を縦置きで収納するストッカ24を配置し、基板着脱部20とストッカ24との間での基板ホルダ18の搬送を基板ホルダ搬送装置40の第1のトランスポータ42で、ストッカ24と銅めっきユニット38との間での基板ホルダ18の搬送を第2のトランスポータ44でそれぞれ行うことで、不使用時の基板ホルダ18をストッカ24に保管しておき、またストッカ24を挟んだ前後における基板ホルダ18の搬送をスムーズに行ってスループットを向上させるようにしている。1つのトランスポータで全ての搬送を行うようにしても良いことは勿論である。
【0092】
また、基板搬送装置22として、ドライハンドとウェットハンドを有するロボットを使用し、基板ホルダ18からめっき後の基板を取出す時にのみウェットハンドを使用し、他はドライハンドを使用するようにしている。基板ホルダ18のシールによって基板の裏面はめっき液に接触しないように保たれており、原則的にはウェットハンドとすることは必ずしも必要ではないが、このようにハンドを使い分けることで、リンス水の回り込みやシール不良によるめっき液汚染が生じ、この汚染が新しい基板の裏面を汚染することを防止することができる。
【0093】
なお、上記の例では、電気接点88として、基板Wの位置決め(センタリング)機能と、めっき後の基板Wを基板ホルダ18から取出す際に、基板Wが内側シール部材62のシール部62aにひっついて、基板Wと共に持ち上がることを防止する機能を備えたものを使用して、構造的に簡素化した例を示している。図10に示すように、基板Wの位置決め(センタリング)機能と、めっき後の基板Wを基板ホルダ18から取出す際に、基板Wが内側シール部材62のシール部62aにひっついて、基板Wと共に持ち上がることを防止する機能を備えた、ばね性を有する板ばね部材140を、電気接点とは別に、可動保持部材58に設けるようにしても良い。この板ばね部材140は、例えば電気接点に挟まれた位置に配置される。この板ばね部材140の作用は、前述の図5に示す電気接点88とほぼ同様であるので、ここではその説明を省略する。
【0094】
これにより、基板ホルダ18で基板Wを保持する過程で、ばね性を有する板ばね部材140の弾性力で基板Wを内方に付勢することで、この板ばね部材140を介して、基板Wの基板ホルダ18に対する位置決め(センタリング)を行い、しかも、可動保持部材58にシール部材62、電気接点及び板ばね部材140を設け、この板ばね部材140を介して基板Wの位置決めを行うことで、基板Wを基板ホルダ18で保持した時に、板ばね部材140を介して、基板W、シール部材62及び電気接点の位置関係が常に一定となるようにすることができる。
【0095】
つまり、上記互いに係合するテーパ部82a,90によるセンタリングのみではまた確実なセンタリングができない。それはお互いが容易に係合するためには少なくとも微小なクリアランスが両者の間に必要だからである。従って、上記互いに係合するテーパ部82a,90のみでは基板中心と可動保持部材の中心がそのクリアランス分ずれてしまうことになる。そこで可動保持部材58に複数個の板ばね部材140を基板W外周部に弾性的に接触するように設置することで、基板Wを可動保持部材58の外周からそれぞれ同一の力で中心に向けて移動させる力を働かせ、可動保持部材58が固定保持部材54と係合するとき、より確実に基板Wのセンタを可動保持部材58のセンタと合致するよう基板をずらすことができる。
【0096】
上記の例では、板ばね部材140を1枚の板ばね形状に形成された板体で構成した例を示しているが、図11に示すように、板ばね形状の2枚以上の板体122a,122bを重ね合わせた重ね板ばね124で板ばね部材140を構成するよにしてもよい。
【0097】
これにより、設置スペースがかなり狭い場所であっても、ばねの塑性変形を起こすことなく、長いストロークを確保することができる板ばね部材140(重ね板ばね124)を設置し、この板ばね部材140(重ね板ばね124)を介して、基板ホルダ18で基板Wを保持する過程で、基板Wの基板ホルダ18に対する位置決め(センタリング)を行うとともに、めっき後の基板Wを基板ホルダ18から取出す際に、基板Wが内側シール部材62のシール部62aにひっついて、基板Wと共に持ち上がることを防止することができる。
【0098】
また、図12乃至図14に示すように、内側シール部材62として、幅方向の両側に2個のリング状シール部126a,126bを有し、更に、円周方向に沿った所定の位置に、幅方向に延びる仕切りシール部126cを設けた多重シール構造体128を使用してもよい。これにより、基板Wの周縁部を多重シール構造体128からなるシール部材62で多重にシールし、シール幅を実質的に広くして、基板のセンタリングが完全でなくても、ここでのシール性のより完全性を図るとともに、仕切りシール部126cで内側シール部材62の円周方向に沿った所定箇所を幅方向にシールすることで、内側シール部材62がダメージを受けても、シール性が問題とならないようにすることができる。
【0099】
つまり、例えば図13(a),13(b)に示すように、基板Wのセンタリングにずれが生じ、例えば基板の表面の段差を有するレジストラインR上に内側に位置するシール部126bが跨ったり(図13(a))、外側に位置するシール部126aが跨ったり(図13(b))しても、図13(a),13(b)に斜線で示すように、この跨っている箇所を除いた、少なくとも一方のシール部126a,126bがシールラインとなり、この跨った部分で液漏れが生じても、確実にシールすることができる。しかも、例えば図13(b)において、リング状シール部126a,126bの互いに仕切りシール部126cを挟んで隣接するX部とX部にダメージを受けても、このダメージを受けたX部とX部との間に位置する仕切りシール部126cでシール性を維持することができる。
【0100】
図15は、他の基板ホルダを示す。この例の前述の基板ホルダと異なる点は、固定保持部材54の可動保持部材58側表面に、可動保持部材58と固定保持部材54で保持した基板Wの裏面側にめっき液が漏れたとき、この漏れためっき液を介して短絡する液漏れ検知用の一対の導電線(導電体)130を、基板Wの裏面周縁部に対応する円周方向に沿ったほぼ全周に亘って連続して設けている点である。この導電線130は、一端で開放され、他端は電気抵抗測定器132に接続されている。その他の構成は、前述のものと同様である。
【0101】
この例によれば、電気抵抗測定器132を介して一対の導電線130間の電気抵抗を測定することで、液漏れが発生したか否かを迅速かつ確実に検知することができる。つまり、この一対の導電線130は、一端に開放されているため、ここに電流を流しても電流が流れないが、液漏れが発生すると、めっき液は導電体であるため、このめっき液が一対の導電線130を短絡した形となって、すなわち、図15の仮想線で示すように、一対の導電線130間が、あたかもめっき液による抵抗Rで短絡した形となって、導電線130に電流が流れる。そこで、この電流を介して電気抵抗を測定することで、液漏れが発生したか否かを検知することができる。
【0102】
なお、この例では、一対の導電線(導電体)を基板の周縁部の全周に亘って連続して設けた例を示している。このように外周シール部の直近の内側に一対の導電線を配置することにより、どこからリークが発生しても直ちにリークを検知することができる。また、この例とは別に、例えば漏れた液がたまりやすい任意の箇所に設けたり、また複数対の導電線を並列的に設けたりしても良い。
【0103】
例えば、図16に示すように、液漏れが発生した時に、めっき液が溜まる固定保持部材54の下部に、一対の電極にそれぞれ接続させた一対の導電板(導電体)142を所定間隔離間させて互いに対峙させて配置し、液漏れが発生して、めっき液が固定保持部材54の下部に溜まった時に、このめっき液を介して導電板142が互いに通電するようにしてもよい。この例によれば、導電板142を固定保持部材54の下部といった、局部的に配置することで、基板ホルダ18の全域に亘る液漏れの検知することができる。
【0104】
以上説明したように、このめっき装置によれば、基板を収納したカセットをカセットテーブルにセットして装置を始動することで、ディップ方式を採用した電解めっきを全自動で行って、基板の表面にバンプ等に適した金属めっき膜を自動的に形成することができる。
【0108】
【発明の効果】
本発明によれば、可動保持部材に、可動保持部材と固定保持部材での基板の保持を解く際に、基板を固定保持部材に向けて付勢する板ばね形状の板ばね部材を取付けることで、めっき終了後、可動保持部材を移動させ基板の保持を解いて、基板を基板ホルダから取出す際に、板ばね形状の板ばね部材で基板の動きを規制して、可動保持部材に取付けたシール部材を基板から引き離し、これによって、基板がシール部材にひっついたまま該シール部材と一緒に移動してしまうことを防止することができる。
【図面の簡単な説明】
【図1】本発明の実施の形態の基板ホルダを備えためっき装置の全体配置図である。
【図2】図1に示す基板ホルダの平面図である。
【図3】図1に示す基板ホルダの右側面図である。
【図4】図1に示す基板ホルダの縦断正面図である。
【図5】図1に示す基板ホルダで基板を保持する時の導電体、電気接点及び基板との関係を工程順に示す断面図である。
【図6】図1に示す基板ホルダで基板を保持する時の固定保持部材のテーパ部と可動保持部材のテーパ部の関係を工程順に示す断面図である。
【図7】図1に示す基板ホルダにおける吸着パッドの装着部の断面図である。
【図8】ロック・アンロック機構で基板ホルダをロックする時の状態を示す断面図である。
【図9】ロック・アンロック機構の平面図である。
【図10】板ばね部材の一例の、基板を保持する時の該板ばね部材と基板との関係を工程順に示す断面図である。
【図11】板ばね部材を重ね板ばねで構成した例を示す断面図である。
【図12】内側シール部材の他の例を示す平面図である。
【図13】図12のA部拡大図である。
【図14】図12の横断面図である。
【図15】 他の基板ホルダを示す平面図である。
【図16】 に他の基板ホルダを示す平面図である。
【図17】基板上にバンプ(突起状電極)を形成する過程を工程順に示す断面図である。
【符号の説明】
10 カセット
12 カセットテーブル
14 アライナ
16 スピンドライヤ
18 基板ホルダ
20 基板着脱部
22 基板搬送装置
24 ストッカ
26 プリウェット槽
28 プリソーク槽
30a,30b 水洗槽
32 ブロー槽
34 めっき槽
36 オーバーフロー槽
38 めっきユニット
40 基板ホルダ搬送装置
42,44 トランスポータ
46 パドル駆動装置
54 固定保持部材
56 ヒンジ
58 可動保持部材
58a 基部
58b 支持部
60 押えリング
62 内側シール部材
66 シール溝
68 外側シール部材
70 保持部材
74 クランパ
80 支持面
82 突条部
82a テーパ部
86 導電体
88 電気接点
90 テーパ部
94 吸着パッド
96 カップ部
98 真空部
110 ロック・アンロック機構
112 回転ピン
114 回転板
116 押圧ロッド
122a,122b 板体
124 重ね板ばね
128 多重シール構造体
130 導電線(導電体)
132 電気抵抗測定器
140 板ばね部材
142 導電板(導電体)
[0001]
BACKGROUND OF THE INVENTION
The present invention can be applied to, for example, a plating apparatus that performs plating on a surface to be plated of a substrate, in particular, a fine wiring groove or hole provided on the surface of a semiconductor wafer or the like, a plating film formed on a resist opening, or the surface of a semiconductor wafer. The present invention relates to a substrate holder used in a plating apparatus or the like for forming bumps (protruding electrodes) that are electrically connected to an electrode of a package and the like, and a plating apparatus including the substrate holder.
[0002]
[Prior art]
For example, in TAB (Tape Automated Bonding) or flip chip, gold, copper, solder, or nickel, and a protruding connection in which these are laminated in multiple layers at a predetermined location (electrode) on the surface of a semiconductor chip on which wiring is formed An electrode (bump) is formed and electrically connected to a package electrode or a TAB electrode through the bump. There are various bump forming methods such as electroplating, vapor deposition, printing, and ball bump. However, miniaturization is possible as the number of I / Os in the semiconductor chip increases and the pitch decreases. Many electrolytic plating methods having relatively stable performance have been used.
[0003]
Here, the electrolytic plating method includes a jet type or cup type in which a surface to be plated of a substrate such as a semiconductor wafer is placed horizontally (face down), and a plating solution is sprayed from below to perform plating, and in a plating tank. The dip type is roughly classified into a dip type in which the substrate is set up vertically and a plating solution is poured from the bottom of the plating tank to cause overflow. The electrolytic plating method using the dip method has the advantages of good bubble removal that adversely affects the quality of plating and a small footprint. It is considered suitable for bump plating that requires a long time.
[0004]
In an electroplating apparatus that employs a conventional dip method, a substrate holder is provided that holds a substrate such as a semiconductor wafer in a detachable manner by sealing the end and back surfaces of the substrate and exposing the surface (surface to be plated). The holder is immersed in the plating solution together with the substrate so that the surface of the substrate is plated. This has the advantage that bubbles can be easily removed.
[0005]
The substrate holder is used by immersing it in the plating solution. When holding the substrate with this substrate holder, ensure that the outer periphery of the substrate does not spill into the back surface (anti-plated surface) side of the substrate. Need to be sealed. For this reason, for example, in a substrate holder in which a substrate is detachably held by a pair of supports (holding members), a seal member is attached to one support, and this seal member is placed and held on the other support. The outer peripheral portion of the substrate is sealed by being brought into pressure contact with the peripheral portion of the substrate.
[0006]
[Problems to be solved by the invention]
In this type of conventional substrate holder, the shape and fixing method of the sealing member are optimized, the sealing member is periodically cleaned (including every leaf), and the sealing member is periodically replaced. Furthermore, the accuracy of substrate pretreatment (seed layer and photoresist film generation) is improved, setting errors of the substrate to the substrate holder are minimized, and periodic readjustment is performed. In order to eliminate leakage of plating solution.
[0007]
However, it is quite difficult to achieve seal integrity due to deterioration of the seal member and the like. In particular, when plating is performed to embed a plating film in a fine recess, a plating solution having a good permeability is generally used so that the plating solution can easily and surely enter the fine recess. This makes it more difficult to provide a complete seal. Also, it is generally difficult to detect leakage of plating solution or the like. And once the plating solution leaks, the plating solution leaked inside the substrate holder adheres to the back of the substrate and moves to the substrate transport device to contaminate the entire device with the plating solution, as well as the leaked plating The liquid will corrode the contacts and prevent energization.
[0008]
Further, as described above, the seal member is attached to one support, and the seal member is pressed against the peripheral portion of the substrate placed and held on the other support, thereby sealing the outer peripheral portion of the substrate. When the support with the seal member attached is opened and the substrate is taken out from the substrate holder after the plating is completed, the support may be opened while the substrate is stuck to the seal member, and the substrate may fall off. It is necessary to take some measures.
[0009]
SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances. A substrate holder and a plating apparatus provided with the substrate holder, which can more easily and reliably take out a substrate while ensuring the completeness of sealing by a sealing member. The purpose is to provide.
[0020]
[Means for Solving the Problems]
  According to the first aspect of the present invention, the substrate is interposed between the fixed holding member and the movable holding member to which the seal member is attached, and the movable holding member is pressed toward the fixed holding member to hold the substrate. In the above substrate holder, the movable holding member is biased toward the fixed holding member when the holding of the substrate by the movable holding member and the fixed holding member is released.And configured to elastically contact the outer periphery of the substrate when the substrate is held by the movable holding member and the fixed holding member.A substrate holder having a plate-like leaf spring member attached thereto.
[0021]
  Thus, after the plating is finished, the movable holding member is moved to release the holding of the substrate, and when the substrate is taken out from the substrate holder, the movement of the substrate is regulated by the plate-like leaf spring member and attached to the movable holding member. By separating the sealing member from the substrate, it is possible to prevent the substrate from moving together with the sealing member while being attached to the sealing member.
  In addition, in the process of holding the substrate by the substrate holder, the substrate is urged inward by the elastic force of the leaf spring member having spring properties, so that the substrate is positioned relative to the substrate holder via the leaf spring member (centering). )It can be performed.
[0022]
  Claim2The invention according to claim 2, wherein the leaf spring member is a stacked leaf spring in which two or more leaf spring-shaped plates are overlapped.1It is a board | substrate holder of description. This makes it possible to install a leaf spring member (lap leaf spring) that can ensure a long stroke without causing plastic deformation of the spring even in a rather narrow installation space.
[0024]
  Claim3The invention according to claim 2, wherein the movable holding member has a function of positioning the substrate with respect to the seal member.1It is a board | substrate holder of description.
[0025]
  Claim4The invention according to claim 2, wherein the leaf spring member also serves as an electrical contact for contacting and energizing the substrate.1It is a board | substrate holder of description. Thereby, it is not necessary to separately provide a leaf spring member, and the structure can be simplified.
[0026]
  Claim5According to the invention described in item 3, the movable holding member has a function of positioning the substrate with respect to the seal member and the electrical contact.4It is a board | substrate holder of description.
[0027]
As described above, by providing the movable holding member with the substrate sealing member (electrical contact for supplying power to the substrate) and the centering mechanism of the substrate, the movable holding member of the substrate and the sealing member of the substrate (and the substrate) The center of the electric contact for power supply) is made to be aligned, and the movable holding member of the substrate has a centering function of the substrate, so that the movable holding member is engaged with the fixed holding member on which the substrate is placed. In this case, the substrate can be engaged by moving the substrate to a position substantially matching the center of the movable holding member by the centering function of the substrate. Thereby, the center of the substrate and the sealing member of the substrate (and the electrical contact for supplying power to the substrate) can be automatically matched when the movable holding member is engaged with the fixed holding member.
[0028]
Even when the effective use area of the board shifts to the outer periphery side of the board with the times and the so-called edge exclusion area of the board is very narrow, the sealing of the board and the board can be surely performed within the narrow area. Power supply can be performed.
[0029]
  Claim6The invention according to claim 1, wherein the movable holding member is provided with an electrical contact for contacting and energizing the substrate.1It is a board | substrate holder of description.
[0034]
  Claim7In the invention described in the above, a substrate is interposed between a fixed holding member and a movable holding member to which a seal member is attached, and the substrate is held by pressing the movable holding member toward the fixed holding member. A holder for biasing the movable holding member toward the fixed holding member when releasing the holding of the substrate by the movable holding member and the fixed holding member;When the substrate is held by the movable holding member and the fixed holding member, a plate-like shape configured to elastically contact the outer peripheral portion of the substrateA plating apparatus using a substrate holder to which a leaf spring member is attached.
[0036]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 shows an overall layout of a plating apparatus provided with a substrate holder according to an embodiment of the present invention. As shown in FIG. 1, in this plating apparatus, two cassette tables 12 on which a cassette 10 containing a substrate W such as a semiconductor wafer is mounted, and the orientation flats and notches of the substrate W are aligned in a predetermined direction. An aligner 14 and a spin dryer 16 that rotates the substrate W after the plating process at high speed are provided. Further, a substrate attaching / detaching portion 20 is provided near the substrate holder 18 for detachably holding the substrate and attaching / detaching the substrate W to / from the substrate holder 18. In the center of these units, A substrate transfer device 22 composed of a transfer robot for transferring the substrate W is disposed between them.
[0037]
Then, in order from the substrate attaching / detaching unit 20 side, a stocker 24 for storing and temporarily holding the substrate holder 18, a prewetting bath 26 for immersing the substrate W in pure water, and a seed layer 500 formed on the surface of the substrate W (FIG. 17). Reference) Pre-soak tank 28 for removing the oxide film on the surface by etching, first water washing tank 30a for washing the surface of the substrate W with pure water, blow tank 32 for draining the substrate W after washing, and a second water washing tank 30b. And the plating tank 34 is arrange | positioned in order. The plating tank 34 is configured by accommodating a plurality of copper plating units 38 inside an overflow tank 36, and each copper plating unit 38 accommodates a single substrate W therein to perform plating such as copper plating. It has come to give. In this example, copper plating will be described, but it goes without saying that the same applies to nickel, solder, silver, and gold plating.
[0038]
Furthermore, a substrate holder transport device 40 that employs, for example, a linear motor system is provided that is located on the side of each device and transports the substrate holder 18 together with the substrate W between these devices. The substrate holder transport device 40 includes a first transporter 42 that transports the substrate W between the substrate attaching / detaching unit 20 and the stocker 24, a stocker 24, a pre-wet tank 26, a pre-soak tank 28, washing tanks 30a and 30b, A second transporter 44 for transporting the substrate W between the blow tank 32 and the plating tank 34 is provided. Note that only the first transporter 42 may be provided without providing the second transporter 44.
[0039]
Further, on the opposite side of the substrate holder transport device 40 across the overflow tank 36, a paddle (not shown) is driven as a stirring rod that is located inside each copper plating unit 38 and stirs the plating solution. A paddle drive 46 is arranged.
[0040]
The board attaching / detaching unit 20 includes a flat plate-like mounting plate 52 that is slidable in the lateral direction along the rail 50. Two board holders 18 are placed in parallel on the mounting plate 52 in a horizontal state. Then, after delivering the substrate W between the one substrate holder 18 and the substrate transport device 22, the mounting plate 52 is slid in the lateral direction, and the other substrate holder 18 and the substrate transport device 22 The substrate W is delivered between them.
[0041]
As shown in FIGS. 2 to 7, the substrate holder 18 is made of, for example, a vinyl chloride rectangular flat plate-shaped fixed holding member 54, and a movable holding member attached to the fixed holding member 54 via a hinge 56 so as to be opened and closed. 58. In this example, the movable holding member 58 is configured to be openable and closable via the hinge 56. However, for example, the movable holding member 58 is disposed at a position facing the fixed holding member 54, and the movable holding member 58 is movable. The member 58 may be advanced toward the fixed holding member 54 to be opened and closed.
[0042]
The movable holding member 58 has a base portion 58a and a ring-shaped support portion 58b in this example, and is made of, for example, vinyl chloride, and is excellent in sliding with the presser ring 60 described below. A seal member (hereinafter referred to as an inner seal member) 62 that presses and seals the peripheral edge of the substrate W is provided on the surface opposite to the fixed holding member 54 inward via a bolt 64 (see FIG. 6). Protrusively installed. On the other hand, a dovetail seal groove 66 is provided on the surface of the fixed holding member 54, and a seal member (similarly, an outer seal) seals the fixed holding member 54 and the movable holding member 58 inside the seal groove 66. Member) 68 is mounted.
[0043]
When the substrate holder 18 holds the substrate W, the inner seal member 62 is for press-contacting the peripheral portion of the surface (surface to be plated) of the substrate W to seal it, and at the inner peripheral end, the spire A seal portion 62a that protrudes toward the movable holding member 58 and comes into linear contact with the peripheral edge of the substrate W is provided. The inner seal member 62 is integrally attached to a holding member 70 made of, for example, titanium that holds the inner seal member 62. That is, the inner seal member 62 is attached to the holding member 70 in a state where almost the entire surface of the holding member 70 is covered, and is not peeled off or dropped off from the holding member 70.
[0044]
In this manner, by integrally attaching the inner seal member 62 to the holding member 70 that holds the inner seal member 62, the movable holding member 58 is moved after the completion of plating to release the substrate W, and the substrate W is removed from the substrate. When taking out from the holder 18, the seal portion 62 a of the inner seal member 62 is prevented from adhering to the substrate W and the inner seal member 62 is prevented from dripping from the holding member 70, and the inner seal member 62 and the substrate W are separated from each other. Can be improved. In addition, the inner seal member 62 is in linear contact with the substrate W via the seal portion 62a, so that it can be reliably sealed with a low tightening pressure and can be effectively used as a pattern formation region of the substrate W. Can spread.
[0045]
On the other hand, the outer seal member 68 is for pressing and sealing the outer peripheral surface of the inner seal member 62 against the movable holding member 58 side surface of the fixed holding member 54 when holding the substrate W by the substrate holder 18. In this example, as the outer seal member 68, there are seal portions 68a and 68b on the upper and lower surfaces of the substantially central portion in the width direction, and spread toward the bottom direction of the seal groove 66. When this is pressed in the width direction, A material having a W-shaped cross section that is easily crushed and narrows in width and returns to the outside by an elastic force when the pressing force is released is used. Accordingly, when the outer seal member 68 is mounted in the dovetail-shaped seal groove 66, the mounting side end of the outer seal member 68 is crushed in the width direction, whereby the outer seal member 68 is mounted in the seal groove 66. The outer seal member 68 after mounting is expanded outward by its elastic force, so that the outer seal member 68 can be reliably prevented from escaping from the seal groove 66.
[0046]
Further, by making the side surface of the outer seal member 68 come into contact with the side wall surface of the seal groove 66 with a certain elastic force, this occurs when the dovetail seal groove 66 is formed as shown in FIG. Due to the notch 66a for taking out the tool, the plating solution penetrates into the seal groove 66 and changes in quality or solidifies. As a result, the sealing performance of the outer seal member 68 deteriorates, but this structure prevents the chemical solution from entering. It is possible to improve the reliability of the seal and the durability of the sealing material.
[0047]
A step portion is provided on the outer peripheral portion of the movable holding member 58, and a presser ring 60 is attached to the step portion via a presser plate 72 so as not to be able to escape and to be rotated. The presser ring 60 is made of, for example, titanium having excellent corrosion resistance against an oxidizing environment and sufficient rigidity.
[0048]
Located on the outer side of the presser ring 60, inverted L-shaped clampers 74 having protruding portions protruding inward are erected on the fixed holding member 54 at equal intervals along the circumferential direction. And the lower surface of the inner protrusion part of the clamper 74 located so that the surface of the presser ring 60 and this surface may be covered is a taper surface which inclines in a mutually reverse direction along a rotation direction. Furthermore, the rotation ring 112 is inserted into a plurality of locations (for example, four locations) along the circumferential direction of the presser ring 60, and the presser ring 60 is rotated by rotating the rotation pin 112 as described below. A long hole 60a for rotation is provided.
[0049]
Thus, with the movable holding member 58 opened, the substrate W is inserted into the center of the fixed holding member 54, the movable holding member 58 is closed via the hinge 56, and the presser ring 60 is rotated clockwise, By sliding the outer peripheral portion of the presser ring 60 into the inwardly protruding portion of the clamper 74, the fixed holding member 54 and the movable holding member 58 are connected to each other through the tapered surfaces provided on the presser ring 60 and the clamper 74, respectively. The lock is released by tightening each other and rotating the presser ring 60 counterclockwise and pulling it out from the protruding portion of the reverse L-shaped clamper 74. When the movable holding member 58 is locked in this way, the seal portion 62a of the inner seal member 62 is on the surface of the substrate W, and in the outer seal member 68, the seal portion 68a is the surface of the fixed holding member 54. In addition, the seal portions 68b are in pressure contact with the bottom surfaces of the seal grooves 66, respectively, and the seal members 62 and 68 are pressed uniformly to ensure sealing.
[0050]
At the center of the fixed holding member 54, there is a protrusion 82 that protrudes in a ring shape in accordance with the size of the substrate W and whose surface abuts on the peripheral edge of the substrate W and serves as a support surface 80 that supports the substrate W. A concave portion 84 is provided at a predetermined position along the circumferential direction of the protruding portion 82.
[0051]
As shown in FIGS. 2 and 5, a plurality (12 in the figure) of conductors (electrical contacts) respectively connected to a plurality of wirings extending from external contacts provided in the following hand 120 in the respective recesses 84. ) 86 is disposed, and when the substrate W is placed on the support surface 80 of the fixed holding member 54, the end of the conductor 86 has a spring property on the surface of the fixed holding member 54 on the side of the substrate W. It is supposed to be exposed in the state.
[0052]
On the other hand, the leg portion 88a of the electrical contact 88 is fixed at a position facing the conductor 86 of the support portion 58b of the movable holding member 58. The electrical contact 88 is formed in a leaf spring shape, and further, when the substrate W after plating is taken out from the substrate holder 18, the substrate W is attached to the seal portion 62 a of the inner seal member 62. It has a function to prevent it from being lifted together with the substrate W. That is, the electrical contact 88 has a contact portion 88b that is located outside the inner seal member 62 and protrudes in the shape of a leaf spring inward, and the contact portion 88b has a spring property due to its elastic force. The substrate is supported by the contact portion 88b of the electrical contact 88 on the support surface 80 of the fixed holding member 54 when the substrate W is held by the fixed holding member 54 and the movable holding member 58. It is comprised so that it may contact the outer peripheral surface of W elastically.
[0053]
Then, as shown in FIG. 5A, the substrate W is placed on the support surface 80 of the fixed holding member 54, and as shown in FIGS. 5B to 5C, the movable holding member 58 is placed. Is moved in the direction of the fixed holding member 54 and locked to hold the substrate W, the exposed portion of the conductor 86 is elastically applied to the lower surface of the leg portion 88a of the electrical contact 88 through the elastic force of the exposed portion of the conductor 86. And the substrate W is elastically brought into contact with the contact portion 88b of the electrical contact 88 through the elastic force of the contact portion 88b. As a result, power can be supplied to the substrate W via the electrical contacts 88 in a state where the substrate W is sealed by the sealing members 62 and 68 and held by the substrate holder 18.
[0054]
In this way, the electrical contact 88 is formed in the shape of a leaf spring, and the tip of the contact portion 88b of the electrical contact 88 is brought into contact with the substrate W through the elastic force of the electrical contact 88 itself. In addition, the area that can be effectively used as the pattern formation region of the substrate W can be widened by making the electrical contact 88 come into contact with the substrate W at the outer peripheral portion of the substrate W. Further, when the substrate W is held by the substrate holder 18, the substrate W is urged inward by the elastic force of the contact portion 88 b of the leaf spring-shaped electrical contact 88, and the substrate is connected via the electrical contact 88. Positioning (centering) of W with respect to the substrate holder 18 can be performed. In addition, the movable holding member 58 is provided with the sealing member 62 and the electrical contact 88, and the substrate W is positioned with respect to the substrate holder 18 through the electrical contact 88, so that the substrate W is held when the substrate W is held by the substrate holder 18. The positional relationship between the seal member 62 and the electrical contact 88 can be always constant.
[0055]
Then, when the series of processing is completed and the substrate W held by the substrate holder 18 is taken out, the movable holding member 58 is moved in a direction away from the fixed holding member 54. At this time, contrary to the above, As shown in FIG. 5C to FIG. 5B, the contact portion 88 b of the electrical contact 88 is pressed against the outer peripheral portion of the substrate W to urge the substrate W toward the fixed holding member 54. The electric contact 88 restricts the movement of the substrate W. For this reason, even if the substrate W is stuck to the seal member 62, only the seal member 62 and the movable holding member 58 are raised, and the substrate W is forcibly separated from the seal member 62. When the movable holding member 58 is further raised, the contact portion 88b of the electrical contact 88 is separated from the substrate W and returns to the original state shown in FIG.
[0056]
Thus, after the plating is finished, the movable holding member 58 is moved to release the holding of the substrate W, and when the substrate W is taken out from the substrate holder 18, the substrate W remains attached to the sealing member 62 together with the sealing member 62. It can prevent moving.
It is preferable that at least the contact surface of the surface of the conductor 86 with the electrical contact 88 is coated with, for example, gold or platinum plating.
[0057]
Further, as shown in FIG. 6, a part of the protrusion 82 of the fixed holding member 54 is provided with a tapered portion 82 a having a spire-like tapered surface, and the inside of the support portion 58 b of the movable holding member 58 is provided. At a position facing the tapered portion 82a of the peripheral surface, the tapered surface 82a is opposite to the tapered surface, and when the substrate W is held by the fixed holding member 54 and the movable holding member 58, the two are engaged with each other. A tapered portion 90 is provided for positioning with respect to the centers of 54 and 58. That is, as shown in FIG. 6A, the substrate W is placed on the support surface 80 of the fixed holding member 54, and further, as shown in FIGS. 6B to 6C, the movable holding member 58 is placed. Is moved in the direction of the fixed holding member 54 and locked to hold the substrate W, the tapered portions 82a and 90 serve as a guide to each other, and the movable holding member 58 is positioned relative to the fixed holding member 54 (or vice versa). To be done.
[0058]
Thus, by providing the taper portions 82 a and 90 that engage with the protrusion 82 of the fixed holding member 54 and the support portion 58 b of the movable holding member 58, the fixed holding member 54 and the movable holding member 58 are separated from each other. In the process of holding the substrate W by the fixed holding member 54 and the movable holding member 58, even though the alignment of the both 54 and 58 is not accurate, the both 54 and 58 are connected via the taper portions 82 a and 90 that are engaged with each other. Positioning with respect to the center can be performed automatically.
[0059]
Thus, as described above, in the process of holding the substrate W by the fixed holding member 54 and the movable holding member 58, positioning with respect to the centers of the both 54 and 58 is performed, and further, via the leaf spring-shaped electrical contact 88, Positioning (centering) of the substrate W with respect to the substrate holder 18 and consequently the inner seal member 62 can be performed simultaneously.
[0060]
However, reliable centering cannot be achieved only by centering by the tapered portions 82a and 90 engaged with each other. This is because at least a minute clearance is required between the two in order for them to easily engage with each other. Therefore, the center of the substrate W and the center of the movable holding member 58 are shifted by the clearance only by the tapered portions 82a and 90 that are engaged with each other. Therefore, the plurality of leaf spring members 140 are installed on the movable holding member 58 so as to be elastically in contact with the outer peripheral portion of the substrate W as described below, so that the substrate W is identical to the outer periphery of the movable holding member 58. When the movable holding member 58 is engaged with the fixed holding member 54 by using a force to move toward the center by force, the substrate can be shifted more securely so that the center of the substrate W matches the center of the movable holding member 58. it can. Of course, the plurality of leaf springs may have a single integrated structure over the outer periphery of the substrate.
Of course, the movable holding member and the fixed holding member do not need to be connected by a hinge, and may be of a completely separated structure.
[0061]
Further, as shown in FIG. 2, the protrusions 82 of the fixed holding member 54 are provided with two slightly wide recesses 92 located on the opposite side of the hinge 56 in this example. A suction pad 94 is accommodated in 92. As shown in detail in FIG. 7, the suction pad 94 is made of a flexible material such as rubber, has a conical cup portion 96 whose inside is a decompression portion, and is fixed and held through a bolt 100. Installed on. When the substrate W is held by the substrate holder 18, the substrate W presses the opening of the cup portion 96, the cup portion 96 is expanded outwardly, and the internal gas is pushed out. The back surface side of the substrate W is adsorbed by reducing the pressure of the decompression part.
[0062]
Accordingly, after the plating is finished, the movable holding member 58 is moved to release the holding of the substrate W, and when the substrate W is taken out from the substrate holder 18, the back surface side of the substrate W is sucked by the suction pad 94, thereby the substrate W. Can be prevented from moving together with the seal member 62 while being attached to the inner seal member 62. In addition, when the automatic operation is performed using the automatic transfer apparatus, the substrate W is not lifted, so that the substrate W can be always taken out from the substrate holder 18 stably. As described above, the suction force of the suction pad 94 is such that when the substrate W is taken out from the substrate holder 18, the substrate W is moved in parallel from the suction surface, and the vacuum is broken by dissociating the suction surface and the substrate surface. The substrate W can be easily separated from the seal member 62, and the substrate can be transferred to and from the robot. That is, the suction pad 94 has strong adhesion in the direction perpendicular to the suction surface and is effective for holding the substrate W, but can easily be displaced in the parallel direction to facilitate separation. .
[0063]
The position and number of the suction pads 94 can be arbitrarily set, but the suction pads 94 are positioned at positions corresponding to the peripheral edge of the substrate W on the opposite side of the hinge 56 across the center of the substrate W held by the substrate holder 18. By providing, when the movable holding member 58 is opened via the hinge 56, the suction pad 94 prevents the portion that first adheres to the inner seal member 62 and tries to lift up, so that the substrate W is sealed inside. It can be effectively separated from the member 62.
[0064]
As the suction pad, a so-called vacuum suction type may be used. That is, although not shown, when a vacuum line is stretched around the fixed holding member 54 and the substrate is held by the substrate holder 18, the inside of the suction pad and the vacuum line are communicated with each other via the vacuum line. The substrate may be sucked by evacuating the inside of the suction pad. As a result, the substrate can be easily and reliably held easily by evacuating the vacuum line, and the substrate can be released by releasing the evacuation.
[0065]
The movable holding member 58 is opened and closed by the weight of a cylinder (not shown) and the movable holding member 58. That is, the through hole 54 a is provided in the fixed holding member 54, and the cylinder is provided at a position facing the through hole 54 a when the substrate holder 18 is placed on the placement plate 52. As a result, the cylinder rod is extended, the movable holding member 58 is opened by pushing the base 58a of the movable holding member 58 upward with a pressing rod through the through hole 54a, and the movable holding member 58 is contracted by contracting the cylinder rod. It closes with its own weight.
[0066]
In this example, the movable holding member 58 is locked / unlocked by rotating the presser ring 60. 8 and 9 show the lock / unlock mechanism 110. FIG. The lock / unlock mechanism 110 is provided on the ceiling side, and when the substrate W is placed in the substrate holder 18 placed on the placement plate 52 and the movable holding member 58 is closed via the hinge 56. The rotation pin 112 is located at a position corresponding to each elongated hole 60a of the holding ring 60 of the substrate holder 18 located on the center side, and the rotation pin 112 is a rotation plate 114 that can rotate forward and backward. It is suspended from the lower surface of. Further, a pressing rod 116 that is movable up and down and presses the support portion 58b of the movable holding member 58 of the substrate holder 18 placed on the placement plate 52 toward the fixed holding member 54 is provided. A long hole 114 a extending in the circumferential direction is provided at a position facing the pressing rod 116.
[0067]
Thus, as described above, after the substrate holder 18 having the substrate W inserted therein and the movable holding member 58 closed is lifted together with the mounting plate 52, the rotation pin 112 is positioned in the long hole 60 a of the presser ring 60. Then, the pressing rod 116 is lowered, and the movable holding member 58 is pressed downward, whereby the seal members 62 and 68 are first crushed so that the movable holding member 58 is not rotated. , And the presser ring 60 is rotated so that the presser ring 60 enters the clamper 74 and the movable holding member 58 is locked.
[0068]
In this way, the press ring 116 is first lowered to prevent the movable holding member 58 from rotating, and the press ring 60 is rotated via the rotary pin 112 to rotate the press ring 60 with low friction. It can be carried out. As a result, the wear of the presser ring 60, the clamper 74, and the movable holding member 58 is reduced, and the misalignment due to the rotation of the presser ring 60 of the movable holding member 58 is prevented so that the substrate W is centered. It is possible to prevent the sealing members 62 and 68 from being twisted and the sealing performance from being deteriorated.
[0069]
In addition, a ring-shaped member is used as the rotating body, and a cylindrical pressing member 116a indicated by hatching in FIG. 9 is used instead of the pressing rod 116, whereby the pressing member 116a allows the movable holding member 58 to be moved. You may make it press the support part 58b more uniformly over the perimeter.
[0070]
One lock / unlock mechanism 110 is provided. After locking (or unlocking) one of the two substrate holders 18 placed on the placement plate 52, the placement plate 52 is moved in the lateral direction. By sliding, the other substrate holder 18 is locked (or unlocked). In addition, the substrate holder 18 is provided with a sensor for confirming the contact state between the substrate W and the contact when the substrate W is mounted, and a signal from this sensor is input to a controller (not shown). It has become.
[0071]
A pair of substantially T-shaped hands 120 serving as support portions when the substrate holder 18 is transported or supported by being suspended are connected to the end portion of the fixed holding member 54 of the substrate holder 18. In the stocker 24, the protruding end of the hand 120 is hooked on the upper surface of the peripheral wall so that the hand 120 is suspended vertically, and the hand 120 of the substrate holder 18 that is suspended is held by the substrate holder transport device 40. The substrate holder 18 is conveyed by being gripped by the transporter 42. Note that the substrate holder 18 is also suspended and held on the peripheral walls via the hand 120 in the pre-wet tank 26, the pre-soak tank 28, the washing tanks 30a and 30b, the blow tank 32, and the plating tank 34.
[0072]
A series of bump plating processes by the plating apparatus configured as described above will be described. First, as shown in FIG. 17A, a seed layer 500 as a power feeding layer is formed on the surface, and a resist 502 having a height H of 20 to 120 μm, for example, is applied to the entire surface of the seed layer 500. Thereafter, a substrate provided with an opening 502a having a diameter D of about 20 to 200 μm, for example, at a predetermined position of the resist 502 is accommodated in the cassette 10 with its surface (surface to be plated) facing upward. Is mounted on the cassette table 12.
[0073]
One substrate is taken out from the cassette 10 mounted on the cassette table 12 by the substrate transfer device 22 and placed on the aligner 14 so that the positions of the orientation flat and the notch are aligned in a predetermined direction. The substrate whose direction is adjusted by the aligner 14 is transferred to the substrate attaching / detaching unit 20 by the substrate transfer device 22.
[0074]
In the substrate attaching / detaching unit 20, two substrate holders 18 accommodated in the stocker 24 are simultaneously held by the transporter 42 of the substrate holder transporting device 40 and transported to the substrate attaching / detaching unit 20. Then, the substrate holder 18 is lowered in a horizontal state, whereby the two substrate holders 18 are simultaneously placed on the placement plate 52 of the substrate attaching / detaching portion 20 and the cylinder is operated to move the substrate holder 18. The holding member 58 is left open.
[0075]
In this state, the substrate transported by the substrate transport device 22 is inserted into the substrate holder 18 positioned on the center side, the cylinder is operated reversely to close the movable holding member 58, and then the movable holding member is locked and unlocked by the lock / unlock mechanism. 58 is locked. Then, after the mounting of the substrate on one substrate holder 18 is completed, the mounting plate 52 is slid in the horizontal direction, and the substrate is mounted on the other substrate holder 18 in the same manner, and then the mounting plate. 52 is returned to the original position.
[0076]
As a result, the substrate W is sealed so that the plating solution does not enter by the seal members 62 and 68 with the surface to be plated exposed from the opening of the substrate holder 18, and the seal is made into the plating solution by the seal. It is fixed so as to be electrically connected to a plurality of contacts at a portion that is not touched. Here, wiring is connected from the contact point to the hand 120 of the substrate holder 18, and power can be supplied to the seed layer 500 of the substrate by connecting a power source to the portion of the hand 120.
[0077]
Next, the two substrate holders 18 loaded with the substrates W are simultaneously held by the transporter 42 of the substrate holder transfer device 40 and transferred to the stocker 24. Then, the substrate holder 18 is lowered to a vertical state, whereby the two substrate holders 18 are suspended and held (temporarily placed) on the stocker 24.
[0078]
In the substrate transport device 22, the substrate attachment / detachment unit 20, and the transporter 42 of the substrate holder transport device 40, the above operations are sequentially repeated, and the substrate is sequentially mounted on the substrate holder 18 accommodated in the stocker 24. Are sequentially suspended and held at a predetermined position.
When the sensor for confirming the contact state between the substrate and the contact provided in the substrate holder 18 determines that the contact state is defective, the signal is input to a controller (not shown).
[0079]
On the other hand, in the other transporter 44 of the substrate holder transport device 40, the two substrate holders 18 mounted with the substrates and temporarily placed on the stocker 24 are simultaneously gripped, transported to the pre-wet tank 26, and lowered. Thus, the two substrate holders 18 are placed in the pre-wet tank 26.
[0080]
At this time, the substrate holder 18 storing the substrate determined to be defective by the sensor for checking the contact state between the substrate and the contact provided in the substrate holder 18 is temporarily placed on the stocker 24. Leave it alone. Thereby, even if a contact failure occurs between the substrate and the contact point when the substrate is mounted on the substrate holder 18, the plating operation can be continued without stopping the apparatus. The substrate having the contact failure is not subjected to the plating process. In this case, the substrate can be dealt with by removing the unplated substrate from the cassette after returning the cassette.
[0081]
Next, the substrate holder 18 to which the substrate is mounted is transferred to the pre-soak tank 28 in the same manner as described above, and the oxide film is etched in the pre-soak tank 28 to expose a clean metal surface. Further, in the same manner as described above, the substrate holder 18 to which the substrate is mounted is transported to the washing tank 30a, and the surface of the substrate is washed with pure water placed in the washing tank 30a.
[0082]
In the same manner as described above, the substrate holder 18 mounted with the substrate that has been washed with water is transferred to the plating tank 34 filled with the plating solution, and is suspended and held in the plating unit 38. The transporter 44 of the substrate holder transport device 40 sequentially repeats the above operations to sequentially transport the substrate holder 18 with the substrate mounted thereon to the plating unit 38 of the plating tank 34 and suspend and hold it at a predetermined position.
[0083]
After all the substrate holders 18 are suspended and held, the plating solution in the overflow tank 36 is circulated and overflowed, and the plating voltage is applied between the anode (not shown) in the plating tank 34 and the substrate W. At the same time, the paddle driving device 46 reciprocates the paddle in parallel with the surface of the substrate, thereby plating the surface of the substrate. At this time, the substrate holder 18 is suspended and fixed by the hand 120 on the upper part of the plating unit 38, and power is supplied to the seed layer 500 (see FIG. 17) from the plating power source through the conductor 86 and the electrical contact 88.
[0084]
After the plating is finished, the application of the plating power supply, the supply of the plating solution and the reciprocating motion of the paddle are stopped, and the two substrate holders 18 on which the substrate W after plating is mounted are simultaneously held by the transporter 44 of the substrate holder transport device 40. In the same manner as described above, the substrate is transported to the rinsing tank 30b and immersed in pure water in the rinsing tank 30b to clean the surface of the substrate with pure water. Next, the substrate holder 18 with the substrate W mounted thereon is conveyed to the blow tank 32 in the same manner as described above, and here, water droplets attached to the substrate holder 18 are removed by blowing air. Thereafter, the substrate holder 18 on which the substrate W is mounted is returned to a predetermined position of the stocker 24 and suspended and held in the same manner as described above.
[0085]
The transporter 44 of the substrate holder transport device 40 sequentially repeats the above operations, and returns the substrate holder 18 mounted with the plated substrate to a predetermined position of the stocker 24 in a suspended manner.
[0086]
On the other hand, in the other transporter 42 of the substrate holder transport apparatus 40, two substrate holders 18 to which the substrate W after the plating process is mounted and returned to the stocker 24 are gripped at the same time, and the substrate is attached and detached in the same manner as described above. Place on the placement plate 52 of the unit 20. At this time, the substrate holder 18 that is provided with the substrate holder 18 and that has been temporarily placed on the stocker 24 is mounted with a substrate that is determined to be defective by a sensor that confirms the contact state between the substrate and the contact point. At the same time, it is transported and placed on the placement plate 52.
[0087]
Then, the movable holding member 58 of the substrate holder 18 located on the center side is unlocked via the lock / unlock mechanism, and the cylinder is operated to open the movable holding member 58. At this time, as described above, the movable holding member 58 is prevented from being opened while the substrate W is stuck to the movable holding member 58. In this state, the substrate W after the plating process in the substrate holder 18 is taken out by the substrate transport device 22 and transported to the spin dryer 16, and the substrate that has been spin-dried (drained) by the high speed rotation of the spin dryer 16. Return to cassette 10.
[0088]
And after returning the board | substrate with which one board | substrate holder 18 was mounted | worn to the cassette 10, or in parallel with this, the mounting plate 52 was slid to the horizontal direction, and was similarly mounted | worn with the other board | substrate holder 18. The substrate is spin-dried and returned to the cassette 10.
[0089]
After returning the mounting plate 52 to the original state, the substrate holder 18 from which the substrate has been taken out is simultaneously held by the transporter 42 of the substrate holder transport device 40, and in the same manner as described above, the substrate holder 18 is fixed to a predetermined stocker 24. Return to place. Thereafter, two substrate holders 18 to which the substrate after plating treatment is mounted and returned to the stocker 24 are simultaneously held by the substrate holder transport device 40 and are placed on the mounting plate 52 of the substrate attaching / detaching unit 20 in the same manner as described above. Then, the same operation as described above is repeated.
[0090]
Then, all the substrates are taken out from the substrate holder 18 mounted with the substrates after plating and returned to the stocker 24, spin-dried and returned to the cassette 10 to complete the operation. As a result, as shown in FIG. 17B, a substrate W on which a plating film 504 is grown in the opening 502a provided in the resist 502 is obtained.
Next, the substrate W spin-dried as described above is immersed in a solvent such as acetone having a temperature of 50 to 60 ° C., for example, and the resist 502 on the substrate W is removed as shown in FIG. Remove. Then, as shown in FIG. 17D, the unnecessary seed layer 500 exposed outside after plating is removed, and a bump made of a plating film 504 is formed.
[0091]
In this example, a stocker 24 for vertically storing the substrate holder 18 is disposed between the substrate attaching / detaching portion 20 and the copper plating unit 38, and the substrate holder 18 between the substrate attaching / detaching portion 20 and the stocker 24 is arranged. By transporting the substrate holder 18 between the stocker 24 and the copper plating unit 38 with the second transporter 44 by the first transporter 42 of the substrate holder transporting device 40, respectively, when not in use. The substrate holder 18 is stored in the stocker 24, and the substrate holder 18 is smoothly transported before and after the stocker 24 is sandwiched to improve the throughput. Of course, all transport may be performed by one transporter.
[0092]
In addition, a robot having a dry hand and a wet hand is used as the substrate transfer device 22, and the wet hand is used only when the substrate after plating is taken out from the substrate holder 18, and the other is a dry hand. The back surface of the substrate is kept from coming into contact with the plating solution by the seal of the substrate holder 18, and in principle, it is not always necessary to use a wet hand. It is possible to prevent the plating solution from being contaminated due to the wraparound and the seal failure, and this contamination can be prevented from contaminating the back surface of the new substrate.
[0093]
In the above example, as the electrical contact 88, the function of positioning (centering) the substrate W and when the substrate W after plating is taken out from the substrate holder 18, the substrate W is stuck to the seal portion 62a of the inner seal member 62. An example in which the structure is simplified by using a substrate having a function of preventing the substrate W from being lifted up is shown. As shown in FIG. 10, when the substrate W is positioned (centering) and the substrate W after plating is taken out from the substrate holder 18, the substrate W sticks to the seal portion 62 a of the inner seal member 62 and is lifted together with the substrate W. A leaf spring member 140 having a function of preventing this may be provided on the movable holding member 58 separately from the electrical contact. The leaf spring member 140 is disposed, for example, at a position sandwiched between electrical contacts. Since the action of the leaf spring member 140 is substantially the same as that of the electrical contact 88 shown in FIG. 5, the description thereof is omitted here.
[0094]
Thus, in the process of holding the substrate W by the substrate holder 18, the substrate W is biased inward by the elastic force of the leaf spring member 140 having a spring property, so that the substrate W is interposed via the leaf spring member 140. Is positioned (centering) with respect to the substrate holder 18, and the movable holding member 58 is provided with the seal member 62, the electrical contact and the leaf spring member 140, and the substrate W is positioned via the leaf spring member 140. When the substrate W is held by the substrate holder 18, the positional relationship among the substrate W, the seal member 62, and the electrical contacts can be always constant via the leaf spring member 140.
[0095]
That is, reliable centering cannot be achieved only by centering with the tapered portions 82a and 90 engaged with each other. This is because at least a minute clearance is required between the two in order for them to easily engage with each other. Accordingly, the center of the substrate and the center of the movable holding member are shifted by the clearance only with the tapered portions 82a and 90 that are engaged with each other. Therefore, by installing a plurality of leaf spring members 140 on the movable holding member 58 so as to elastically contact the outer peripheral portion of the substrate W, the substrate W is directed from the outer periphery of the movable holding member 58 to the center with the same force. When the moving force is applied and the movable holding member 58 engages with the fixed holding member 54, the substrate can be shifted more reliably so that the center of the substrate W matches the center of the movable holding member 58.
[0096]
In the above example, the leaf spring member 140 is configured by a single plate spring formed in a plate spring shape, but as shown in FIG. 11, two or more plate springs 122a having a plate spring shape are shown. , 122b may be used to form the leaf spring member 140.
[0097]
Thereby, even if the installation space is quite narrow, the leaf spring member 140 (lap leaf spring 124) that can secure a long stroke without causing plastic deformation of the spring is installed. In the process of holding the substrate W by the substrate holder 18 via the (overlapping plate spring 124), the substrate W is positioned (centered) with respect to the substrate holder 18, and when the plated substrate W is taken out from the substrate holder 18. The substrate W can be prevented from sticking to the seal portion 62a of the inner seal member 62 and being lifted together with the substrate W.
[0098]
Further, as shown in FIGS. 12 to 14, the inner seal member 62 has two ring-shaped seal portions 126a and 126b on both sides in the width direction, and further, at a predetermined position along the circumferential direction. A multiple seal structure 128 provided with a partition seal portion 126c extending in the width direction may be used. As a result, the peripheral edge of the substrate W is sealed in multiples by the seal member 62 made of the multiple seal structure 128, the seal width is substantially widened, and the sealing performance is provided here even if the centering of the substrate is not complete. In addition, the partition seal portion 126c seals a predetermined portion along the circumferential direction of the inner seal member 62 in the width direction, so that even if the inner seal member 62 is damaged, the sealing performance is a problem. Can be prevented.
[0099]
That is, for example, as shown in FIGS. 13A and 13B, the centering of the substrate W is displaced, and for example, the seal portion 126b positioned on the inner side of the resist line R having a step on the surface of the substrate may be straddled. (FIG. 13 (a)), even if the seal portion 126a located on the outside straddles (FIG. 13 (b)), this straddles as shown by hatching in FIGS. 13 (a) and 13 (b). At least one of the seal portions 126a and 126b excluding the portion serves as a seal line, and even if liquid leakage occurs in the straddling portion, it can be surely sealed. Moreover, for example, in FIG. 13B, the ring-shaped seal portions 126a and 126b are adjacent to each other across the partition seal portion 126c.1Department and X2Even if the part is damaged, this damaged X1Department and X2The sealing performance can be maintained by the partition seal portion 126c positioned between the two portions.
[0100]
  FIG.otherA substrate holder is shown. The difference from the above-described substrate holder in this example is that when the plating solution leaks to the surface of the fixed holding member 54 on the movable holding member 58 side, the back side of the substrate W held by the movable holding member 58 and the fixed holding member 54, A pair of liquid leakage detection conductors (conductors) 130 that are short-circuited through the leaked plating solution are continuously provided over substantially the entire circumference along the circumferential direction corresponding to the peripheral edge of the back surface of the substrate W. It is a point that is provided. The conductive wire 130 is opened at one end, and the other end is connected to the electrical resistance measuring device 132. Other configurations are the same as those described above.
[0101]
According to this example, by measuring the electrical resistance between the pair of conductive wires 130 via the electrical resistance measuring device 132, it is possible to quickly and reliably detect whether or not liquid leakage has occurred. In other words, since the pair of conductive wires 130 are open at one end, no current flows even if a current is passed therethrough. However, when a liquid leak occurs, the plating solution is a conductor, so this plating solution The pair of conductive wires 130 are short-circuited, that is, as shown by the phantom lines in FIG. 15, the pair of conductive wires 130 are short-circuited with the resistance R by the plating solution, and the conductive wires 130 are formed. Current flows through Therefore, it is possible to detect whether or not liquid leakage has occurred by measuring the electrical resistance via this current.
[0102]
In this example, a pair of conductive wires (conductors) is provided continuously over the entire periphery of the peripheral portion of the substrate. As described above, by arranging the pair of conductive wires inside the immediate vicinity of the outer peripheral seal portion, it is possible to immediately detect the leak no matter where the leak occurs. In addition to this example, for example, it may be provided at an arbitrary place where the leaked liquid easily collects, or a plurality of pairs of conductive wires may be provided in parallel.
[0103]
For example, as shown in FIG. 16, when a liquid leak occurs, a pair of conductive plates (conductors) 142 respectively connected to a pair of electrodes are separated from each other by a predetermined distance below the fixed holding member 54 where the plating solution is accumulated. The conductive plates 142 may be energized with each other through the plating solution when the solution leaks and the plating solution accumulates in the lower portion of the fixed holding member 54. According to this example, liquid leakage over the entire area of the substrate holder 18 can be detected by locally arranging the conductive plate 142 such as the lower part of the fixed holding member 54.
[0104]
As described above, according to this plating apparatus, by setting the cassette containing the substrate on the cassette table and starting the apparatus, electrolytic plating employing the dip method is performed fully automatically on the surface of the substrate. A metal plating film suitable for bumps and the like can be automatically formed.
[0108]
【The invention's effect】
  According to the present invention,A plate spring-shaped plate spring member that urges the substrate toward the fixed holding member when unmoving the substrate held by the movable holding member and the fixed holding member is attached to the movable holding member. When the holding member is moved to release the substrate and the substrate is taken out from the substrate holder, the movement of the substrate is regulated by a leaf spring-shaped leaf spring member, and the seal member attached to the movable holding member is pulled away from the substrate. Accordingly, it is possible to prevent the substrate from moving together with the sealing member while being stuck to the sealing member.
[Brief description of the drawings]
FIG. 1 is an overall layout view of a plating apparatus provided with a substrate holder according to an embodiment of the present invention.
FIG. 2 is a plan view of the substrate holder shown in FIG.
3 is a right side view of the substrate holder shown in FIG. 1. FIG.
4 is a longitudinal front view of the substrate holder shown in FIG. 1. FIG.
5 is a cross-sectional view showing a relationship among a conductor, an electrical contact, and a substrate in order of steps when the substrate is held by the substrate holder shown in FIG. 1;
6 is a cross-sectional view showing the relationship between the taper portion of the fixed holding member and the taper portion of the movable holding member when the substrate is held by the substrate holder shown in FIG.
7 is a cross-sectional view of a suction pad mounting portion in the substrate holder shown in FIG. 1. FIG.
FIG. 8 is a sectional view showing a state when the substrate holder is locked by the lock / unlock mechanism.
FIG. 9 is a plan view of a lock / unlock mechanism.
FIG. 10 is a cross-sectional view illustrating an example of a leaf spring member, showing the relationship between the leaf spring member and the substrate when the substrate is held in the order of steps.
FIG. 11 is a cross-sectional view showing an example in which the leaf spring member is configured by a laminated leaf spring.
FIG. 12 is a plan view showing another example of the inner seal member.
13 is an enlarged view of a part A in FIG.
14 is a cross-sectional view of FIG.
FIG. 15otherIt is a top view which shows a substrate holder.
FIG. 16FurtherTo othersBase ofIt is a top view which shows a plate holder.
FIG. 17 is a cross-sectional view showing a process of forming bumps (protruding electrodes) on a substrate in the order of steps.
[Explanation of symbols]
10 cassettes
12 Cassette table
14 Aligner
16 Spin dryer
18 Substrate holder
20 Board attach / detach section
22 Substrate transfer device
24 Stocker
26 Pre-wet tank
28 Pre-soak tank
30a, 30b Flush tank
32 Blow tank
34 Plating tank
36 Overflow tank
38 Plating unit
40 Substrate holder transfer device
42,44 transporter
46 Paddle drive
54 Fixed holding member
56 Hinge
58 Movable holding member
58a base
58b support
60 Presser ring
62 Inner seal member
66 Seal groove
68 Outer seal member
70 Holding member
74 Clamper
80 Support surface
82 ridge
82a Taper part
86 Conductor
88 Electrical contacts
90 Taper
94 Suction pad
96 cups
98 vacuum section
110 Lock / Unlock mechanism
112 Rotating pin
114 Rotating plate
116 Press rod
122a, 122b plate
124 Laminated leaf spring
128 Multiple seal structure
130 Conductive wire (conductor)
132 Electrical resistance measuring instrument
140 Leaf spring member
142 Conductive plate (conductor)

Claims (7)

固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、前記可動保持部材を前記固定保持部材に向けて押圧して基板を保持するようにした基板ホルダにおいて、
前記可動保持部材に、前記可動保持部材と前記固定保持部材での基板の保持を解く際に、基板を前記固定保持部材に向けて付勢し、前記可動保持部材と前記固定保持部材で基板を保持する時に基板の外周部に弾性的に接触するように構成された板状の板ばね部材を取付けたことを特徴とする基板ホルダ。
A substrate holder in which a substrate is interposed between a fixed holding member and a movable holding member attached with a seal member, and the movable holding member is pressed against the fixed holding member to hold the substrate.
When releasing the holding of the substrate by the movable holding member and the fixed holding member to the movable holding member, the substrate is urged toward the fixed holding member, and the substrate is moved by the movable holding member and the fixed holding member. A substrate holder comprising a plate-like plate spring member configured to elastically contact an outer peripheral portion of a substrate when held .
前記板ばね部材は、板ばね形状の2枚以上の板体を重ね合わせた重ね板ばねからなることを特徴とする請求項1記載の基板ホルダ。  2. The substrate holder according to claim 1, wherein the leaf spring member is a laminated leaf spring in which two or more leaf spring-shaped plates are overlapped. 前記可動保持部材が、前記シール部材に対する基板の位置決め機能を有していることを特徴とする請求項記載の基板ホルダ。It said movable holding member, the substrate holder according to claim 1, characterized in that it has a function of positioning the substrate with respect to the sealing member. 前記板ばね部材は、基板に接触して通電する電気接点を兼用していることを特徴とする請求項記載の基板ホルダ。The plate spring member, the substrate holder according to claim 1, characterized in that it serves an electrical contact energized by contact with the substrate. 前記可動保持部材が、前記シール部材及び前記電気接点に対する基板の位置決め機能を有することを特徴とする請求項記載の基板ホルダ。The substrate holder according to claim 4 , wherein the movable holding member has a function of positioning the substrate with respect to the seal member and the electrical contact. 前記可動保持部材に基板に接触して通電する電気接点を取付けたことを特徴とする請求項記載の基板ホルダ。Substrate holder according to claim 1, wherein the attached electrical contacts energized in contact with the substrate on the movable holding member. 固定保持部材とシール部材を取付けた可動保持部材との間に基板を介在させ、前記可動保持部材を前記固定保持部材に向けて押圧して基板を保持するようにした基板ホルダであって、
前記可動保持部材に、前記可動保持部材と前記固定保持部材での基板の保持を解く際に、基板を前記固定保持部材に向けて付勢し、前記可動保持部材と前記固定保持部材で基板を保持する時に基板の外周部に弾性的に接触するように構成された板状の板ばね部材を取付けた基板ホルダを用いることを特徴とするめっき装置。
A substrate holder in which a substrate is interposed between a fixed holding member and a movable holding member to which a seal member is attached, and the movable holding member is pressed toward the fixed holding member to hold the substrate;
When releasing the holding of the substrate by the movable holding member and the fixed holding member to the movable holding member, the substrate is urged toward the fixed holding member, and the substrate is moved by the movable holding member and the fixed holding member. A plating apparatus using a substrate holder to which a plate-like leaf spring member configured to elastically contact an outer peripheral portion of a substrate when held is used.
JP2002213208A 2002-06-21 2002-07-22 Substrate holder and plating apparatus Expired - Lifetime JP4162440B2 (en)

Priority Applications (17)

Application Number Priority Date Filing Date Title
JP2002213208A JP4162440B2 (en) 2002-07-22 2002-07-22 Substrate holder and plating apparatus
KR1020047000836A KR100980051B1 (en) 2002-06-21 2003-06-20 Substrate holder and plating apparatus
EP03760917A EP1516357A2 (en) 2002-06-21 2003-06-20 Substrate holder and plating apparatus
CNB038008459A CN100370578C (en) 2002-06-21 2003-06-20 Substrate holder and plating apparatus
US10/482,476 US7601248B2 (en) 2002-06-21 2003-06-20 Substrate holder and plating apparatus
CN2008100040249A CN101281858B (en) 2002-06-21 2003-06-20 Substrate holder and plating apparatus
PCT/JP2003/007855 WO2004001813A2 (en) 2002-06-21 2003-06-20 Substrate holder and plating apparatus
TW092116755A TWI316097B (en) 2002-06-21 2003-06-20 Substrate holder and plating apparatus
JP2008075616A JP4722955B2 (en) 2002-07-22 2008-03-24 Substrate holder and electrolytic plating apparatus
JP2008075615A JP4669020B2 (en) 2002-07-22 2008-03-24 Substrate holder and electrolytic plating apparatus
US12/585,141 US7901551B2 (en) 2002-06-21 2009-09-04 Substrate holder and plating apparatus
US13/017,294 US8337680B2 (en) 2002-06-21 2011-01-31 Substrate holder and plating apparatus
US13/684,902 US8936705B2 (en) 2002-06-21 2012-11-26 Electrochemical deposition apparatus
US14/565,841 US9388505B2 (en) 2002-06-21 2014-12-10 Electrochemical deposition method
US15/180,457 US9624596B2 (en) 2002-07-22 2016-06-13 Electrochemical deposition method
US15/180,448 US9506162B2 (en) 2002-06-21 2016-06-13 Electrochemical deposition method
US15/180,477 US9593430B2 (en) 2002-07-22 2016-06-13 Electrochemical deposition method

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