JP4157621B2 - Sputtering deposition system - Google Patents

Sputtering deposition system Download PDF

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Publication number
JP4157621B2
JP4157621B2 JP20549198A JP20549198A JP4157621B2 JP 4157621 B2 JP4157621 B2 JP 4157621B2 JP 20549198 A JP20549198 A JP 20549198A JP 20549198 A JP20549198 A JP 20549198A JP 4157621 B2 JP4157621 B2 JP 4157621B2
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Japan
Prior art keywords
sputtering
target
substrate
moving
moving body
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Expired - Fee Related
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JP20549198A
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Japanese (ja)
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JP2000038670A (en
Inventor
智 池田
孝 小松
賀文 太田
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Ulvac Inc
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Ulvac Inc
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Description

【0001】
【発明の属する技術分野】
本発明は、主としてインライン式のスパッタリング成膜装置に関する。
【0002】
【従来の技術】
従来、真空成膜室内に設けたスパッタターゲットの前方に基板を移動通過させて該基板へスパッタリング成膜する装置は公知であり、該ターゲットをその移動経路に沿って複数基設け、通過する基板に各ターゲットからのスパッタ粒子で成膜するインライン式の装置も公知である。
【0003】
【発明が解決しようとする課題】
該スパッタターゲットに例えば導電性のカーボンを使用し、スパッタリングにより該基板にダイヤモンドライクカーボン(DLC)の絶縁膜を形成する場合、該DLCの膜がターゲットの表面すなわちスパッタ面にも部分的に付着してしまうことがある。このような膜はノジュール(Nodule)ともいわれ、絶縁膜が付着した部分のターゲットはスパッタされなくなり、その膜が厚くなると異常放電を生じ、基板や膜を損傷することになって好ましくない。このような付着物が付着すると、真空成膜室を開け、ターゲットを交換するかスパッタ面を清掃して取り除いていたが、真空成膜室内を大気に曝すとスパッタ再開までの時間が長くなる不都合を伴う。
【0004】
本発明は、真空成膜室を開けずにターゲット表面の付着物を除去することを目的とするものである。
【0005】
【課題を解決するための手段】
本発明では、真空成膜室内に設けたスパッタターゲットの前方に基板を移動通過させて該基板へスパッタリング成膜する装置に於いて、該基板の移動経路に沿って移動する移動体を設けてこれに該ターゲットのスパッタ面の付着物を除去する擦り部材を取り付けることにより、上記の目的を達成するようにした。該擦り部材はブラシで構成される。
【0006】
【発明の実施の形態】
本発明の実施の形態を図面に基づき説明すると、図1に於いて符号1は真空ポンプ2により真空に排気され両端にローディング室3とアンローディング室4を連設した長手の真空成膜室を示し、該ローディング室3に用意した基板5を該真空成膜室1内の移動経路6に沿って移動手段7により移動させ、その移動中にスパッタカソード8に取り付けたスパッタターゲット9により該基板5に成膜処理を施し、アンローディング室4に収容される。10は高周波電源等のスパッタリング電源、11はバイアス印加用電源である。該移動手段7は、レール7a、該レール7aを走行する車輪7bを備えたホルダー7c、該ホルダー7cの下面に設けたラック7d、該レール7aに沿って配置され電動機により回転されてラック7dと噛み合うギア7eで構成した。
【0007】
該カソード8を複数基設けてインライン式に構成し、そのうちの少なくとも1基がカーボン(導電性)のターゲットを備えて基板5にDLCの絶縁膜をスパッタリング成膜する場合、その絶縁性のスパッタ粒子が各ターゲット8のスパッタ面に付着してノジュールを形成し、前記したような不都合をもたらすが、本発明では該移動経路6に沿って移動する例えば図3に示したような移動体12を設け、これに該ターゲット9のスパッタ面の付着物を除去する擦り部材13を取り付けした。
【0008】
該擦り部材13は例えば合成樹脂製ブラシやヘラで形成され、該移動体12にバネ14で弾発されて揺動自在の支持部材15に取り付けられる。また、該移動体12には車輪16及びラック17を設け、ギア7eの回転によりレール7aに沿って移動するようにした。
【0009】
該ターゲット9のスパッタ面の付着物は、スパッタ時間の経過と共に多くなり膜状に成長するもので、該移動体12を付着開始時期の初期に走行させてスパッタ面を擦り部材13で擦ると比較的簡単に該付着物を取り除くことができ、付着物のために成膜レートが低下したり、異常放電が発生することを防げ、真空成膜室1に大気を導入する必要がなく真空状態を維持したままその取り除き作業を行える。尚、移動体12は複数のターゲットを清掃するために走行体で構成したが、ターゲットの数が少ない場合はシリンダ等で往復する移動体で構成してもよい。
【0010】
【表1】

Figure 0004157621
【0011】
【発明の効果】
以上のように本発明によるときは、基板をターゲットの前方を移動させてスパッタリング成膜する装置に於いて、基板の移動経路に沿って移動する移動体を設けてこれに該ターゲットのスパッタ面を擦る部材を設けたので、該スパッタ面に付着物が発生した頃に該移動体を作動させ、真空成膜室を真空状態としたまま擦り部材で該スパッタ面を擦ることによりその付着物を取り除け、短時間にその取り除き作業を終えることができ、装置の運転効率が高まる等の効果がある。
【図面の簡単な説明】
【図1】本発明を適用するスパッタリング装置の側面線図
【図2】図1の装置に本発明を適用した状態の側面図
【符号の説明】
1 真空成膜室、5 基板、6 移動経路、7 移動手段、9 スパッタターゲット、12 移動体、13 擦り部材、[0001]
BACKGROUND OF THE INVENTION
The present invention mainly relates to an in-line type sputtering film forming apparatus.
[0002]
[Prior art]
Conventionally, an apparatus for moving a substrate in front of a sputtering target provided in a vacuum film formation chamber to perform sputtering film formation on the substrate is known, and a plurality of targets are provided along the movement path, and the substrate is passed through. An in-line apparatus for forming a film with sputtered particles from each target is also known.
[0003]
[Problems to be solved by the invention]
When, for example, conductive carbon is used for the sputter target and a diamond-like carbon (DLC) insulating film is formed on the substrate by sputtering, the DLC film partially adheres to the surface of the target, that is, the sputtering surface. May end up. Such a film is also referred to as a nodule, and the target on the part to which the insulating film is adhered is not sputtered. If the film becomes thick, abnormal discharge occurs, which is not preferable because it damages the substrate and the film. When such deposits are attached, the vacuum film formation chamber is opened and the target is exchanged or the sputtering surface is cleaned and removed. However, if the vacuum film formation chamber is exposed to the atmosphere, it takes a long time to resume sputtering. Accompanied by.
[0004]
An object of the present invention is to remove deposits on a target surface without opening a vacuum film formation chamber.
[0005]
[Means for Solving the Problems]
In the present invention, in an apparatus for moving a substrate in front of a sputtering target provided in a vacuum film formation chamber and performing sputtering film formation on the substrate, a moving body that moves along the movement path of the substrate is provided. The above-mentioned object is achieved by attaching a rubbing member for removing deposits on the sputtering surface of the target. The rubbing member is composed of a brush.
[0006]
DETAILED DESCRIPTION OF THE INVENTION
An embodiment of the present invention will be described with reference to the drawings. In FIG. 1, reference numeral 1 denotes a longitudinal vacuum film forming chamber in which a vacuum pump 2 is evacuated and a loading chamber 3 and an unloading chamber 4 are connected to both ends. The substrate 5 prepared in the loading chamber 3 is moved by the moving means 7 along the moving path 6 in the vacuum film forming chamber 1, and the substrate 5 is moved by the sputter target 9 attached to the sputter cathode 8 during the movement. The film is subjected to a film forming process and accommodated in the unloading chamber 4. 10 is a sputtering power source such as a high frequency power source, and 11 is a bias applying power source. The moving means 7 includes a rail 7a, a holder 7c having wheels 7b running on the rail 7a, a rack 7d provided on the lower surface of the holder 7c, a rack 7d arranged along the rail 7a and rotated by an electric motor. The meshing gear 7e is used.
[0007]
In the case where a plurality of the cathodes 8 are provided to form an in-line type, and at least one of them includes a carbon (conductive) target and a DLC insulating film is formed on the substrate 5 by sputtering, the insulating sputtered particles Adheres to the sputtered surface of each target 8 to form nodules, resulting in the disadvantages described above. In the present invention, for example, a moving body 12 as shown in FIG. The rubbing member 13 for removing the deposits on the sputtering surface of the target 9 was attached thereto.
[0008]
The rubbing member 13 is formed of, for example, a synthetic resin brush or spatula, and is attached to a swingable support member 15 that is ejected from the moving body 12 by a spring 14. Further, the moving body 12 is provided with wheels 16 and a rack 17 so as to move along the rail 7a by the rotation of the gear 7e.
[0009]
The deposit on the sputtering surface of the target 9 increases as the sputtering time elapses and grows into a film. Compared with the case where the moving body 12 is run at the beginning of the deposition start time and the sputtering surface is rubbed with the rubbing member 13. The deposits can be removed easily, and the deposition rate is prevented from lowering due to the deposits and abnormal discharge is prevented, and it is not necessary to introduce the atmosphere into the vacuum deposition chamber 1 so that the vacuum state is maintained. It can be removed while maintaining it. In addition, although the moving body 12 was comprised with the traveling body in order to clean a some target, you may comprise with the moving body reciprocated with a cylinder etc. when there are few targets.
[0010]
[Table 1]
Figure 0004157621
[0011]
【The invention's effect】
As described above, according to the present invention, in the apparatus for sputtering deposition by moving the substrate in front of the target, a moving body that moves along the movement path of the substrate is provided, and the sputtering surface of the target is provided on this. Since the rubbing member is provided, the moving body is operated when deposits are generated on the sputtering surface, and the deposits are removed by rubbing the sputtering surface with the rubbing member while the vacuum film forming chamber is kept in a vacuum state. The removal operation can be completed in a short time, and the operation efficiency of the apparatus is increased.
[Brief description of the drawings]
FIG. 1 is a side view of a sputtering apparatus to which the present invention is applied. FIG. 2 is a side view of the sputtering apparatus to which the present invention is applied.
1 vacuum film forming chamber, 5 substrate, 6 moving path, 7 moving means, 9 sputter target, 12 moving body, 13 rubbing member,

Claims (2)

真空成膜室内に設けたスパッタターゲットの前方に基板を移動通過させて該基板へスパッタリング成膜する装置に於いて、該基板の移動経路に沿って移動する移動体を設けてこれに該ターゲットのスパッタ面の付着物を除去する擦り部材を取り付けたことを特徴とするスパッタリング成膜装置。In an apparatus for moving a substrate in front of a sputtering target provided in a vacuum film formation chamber and performing sputtering film formation on the substrate, a moving body that moves along the movement path of the substrate is provided, and the target A sputtering film forming apparatus comprising a rubbing member for removing deposits on a sputtering surface. 上記擦り部材をブラシで構成したことを特徴とする請求項1に記載のスパッタリング成膜装置。The sputtering film forming apparatus according to claim 1, wherein the rubbing member is constituted by a brush.
JP20549198A 1998-07-21 1998-07-21 Sputtering deposition system Expired - Fee Related JP4157621B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20549198A JP4157621B2 (en) 1998-07-21 1998-07-21 Sputtering deposition system

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Application Number Priority Date Filing Date Title
JP20549198A JP4157621B2 (en) 1998-07-21 1998-07-21 Sputtering deposition system

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JP4157621B2 true JP4157621B2 (en) 2008-10-01

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Publication number Priority date Publication date Assignee Title
KR100442143B1 (en) * 2001-06-30 2004-07-27 동부전자 주식회사 Apparatus for cleaning deposition residue attached ceramic guide of apcvd system
JP5646397B2 (en) * 2011-06-10 2014-12-24 住友重機械工業株式会社 Rotary sputtering cathode and film forming apparatus equipped with rotary sputtering cathode

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